Abstract: Disclosed herein is an apparatus that includes a memory cell array including a plurality of word lines each coupled to a plurality of memory cells, and a control circuit configured to activate first and second internal signals in a time-di vision manner in response to a first external command. A first number of the word lines are selected in response to the first internal signal, and a second number of the word line is selected in response to the second internal signal, the second number is smaller than the first number.

Abstract: Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. One or more error correction code (ECC) may be used to determine if the bits of information contain any errors. To mitigate the effects of failures of adjacent memory cells, the information may be divided into a first group and a second group, where each group contains information from memory cells which are non-adjacent to other memory cells of that group. Each group of information may include data bits and parity bits used to correct those data bits. For example, as part of a read operation, a first ECC circuit may receive information from even numbered memory cells, while a second ECC circuit may receive information from odd numbered memory cells.

Abstract: Disclosed herein is an apparatus that includes a memory cell array including a plurality of word lines each coupled to a plurality of memory cells, and a control circuit configured to activate first and second internal signals in a time-di vision manner in response to a first external command. A first number of the word lines are selected in response to the first internal signal, and a second number of the word line is selected in response to the second internal signal, the second number is smaller than the first number.

Abstract: Disclosed herein is an apparatus that includes first and second digit lines, a sense amplifier configured to amplify a potential difference between the first and second digit lines, a driver circuit configured to drive each of the first and second digit lines to different one of first and second logic levels from each other, a first transistor coupled between the driver circuit and the first digit line, a second transistor coupled between the driver circuit and the second digit line, and a control circuit configured to supply a first potential to control electrodes of the first and second transistors in response to a write command, and supply a second potential different from the first potential to the control electrodes of the first and second transistors in response to a read command.

Abstract: In some examples, a memory device may include an internal synchronization circuit that provides for double data rate operation of the memory device when external single data rate signals are provided to the memory device. The external signals may be command and/or address signals provided by an external testing circuits in some examples. The internal synchronization circuit may latch and/or delay at least some of the external signals such that different external commands are provided at the rising and falling edges of the clock signal of the memory device. The memory device may latch the external signals at both the rising and falling edges of the clock signal for double data rate operation of the memory device.

Abstract: Apparatuses, systems, and methods for error correction. A memory array may be coupled to an error correction code (ECC) circuit along a read bus and a write bus. The ECC circuit includes a read portion and a write portion. As part of a mask write operation, read data and read parity may be read out along the read bus to the read portion of the ECC circuit and write data may be received along data terminals by the write portion of the ECC circuit. The write portion of the ECC circuit may generate amended write data based on the write data and the read data, and may generate amended parity based on the read parity and the amended write data. The amended write data and amended parity may be written back to the memory array along the write bus.

Abstract: Memory devices are disclosed. A memory device may include a number of fuses and a number of transmit lines configured to transmit data from the number of fuses. The memory device may also include a number of monitoring circuits. Each monitoring circuit of the number of monitoring circuits is coupled to a transmit line of the number of transmit lines. Each monitoring circuit comprises logic configured to receive the data from the number fuses via the transmit line. The logic is further configured to generate a result responsive to the data and indicative of pass/fail status of the transmit line. Associated methods and systems are also disclosed.

Abstract: Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. One or more error correction code (ECC) may be used to determine if the bits of information contain any errors. To mitigate the effects of failures of adjacent memory cells, the information may be divided into a first group and a second group, where each group contains information from memory cells which are non-adjacent to other memory cells of that group. Each group of information may include data bits and parity bits used to correct those data bits. For example, as part of a read operation, a first ECC circuit may receive information from even numbered memory cells, while a second ECC circuit may receive information from odd numbered memory cells.

Abstract: Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. One or more error correction code (ECC) may be used to determine if the bits of information contain any errors. To mitigate the effects of failures of adjacent memory cells, the information may be divided into a first group and a second group, where each group contains information from memory cells which are non-adjacent to other memory cells of that group. Each group of information may include data bits and parity bits used to correct those data bits. For example, as part of a read operation, a first ECC circuit may receive information from even numbered memory cells, while a second ECC circuit may receive information from odd numbered memory cells.

Abstract: Methods of operating a memory device are disclosed. A method may include enabling a first and second row section units a number of row section units of a memory device in response to a row address. The method may also include comparing a selected column address to a number of column addresses of defective memory cells of a first row section of the first row section unit. Moreover, in response to the selected column address matching a first column address of the number of column addresses, the method may include activating a second row section of the second row section unit, conveying a redundant column select signal to the memory array to select a redundant memory cell of the second row section. Memory devices and systems are also disclosed.

Abstract: A system for refresh operations in semiconductor memories, and an apparatus and method therefore, are described. The system includes, for example, memory cells in memory banks that are refreshed during a self-refresh operation or an auto refresh operation. The self-refresh operation includes a different number of refresh activations than the auto refresh operation. The system further includes a row control circuit configured to refresh the memory cells in the memory banks based on refresh control signals received from a refresh control circuit, the refresh control signals provided by the refresh control circuit based on internal control signals received by the refresh control circuit from a command control circuit. The auto refresh operation includes a per bank refresh operation configured to refresh a corresponding memory bank or an all-bank refresh operation configured to refresh all memory banks.

Abstract: A winding-start receiving groove in which a winding-start lead wire of a field coil is received is formed in an inner surface of a flange of an insulation bobbin. A holder is disposed on the flange and located on a radially outer side of the winding-start receiving groove. The holder is formed with a holder groove located on an extension line of the winding-start receiving groove and extending at an angle relative to a radial direction of the insulation bobbin. The winding-start lead wire of the field coil is received in the winding-start receiving groove and the holder groove and held by the holder. This makes it possible to obtain a rotor of a rotary electrical machine with a simplified configuration at low cost not only to improve winding workability but also to enhance electrical reliability and durability.

Abstract: A system for refresh operations including multiple refresh activations, and a method and an apparatus therefore, are described. The system includes, for example, a memory array; a command address input circuit configured to provide a command for a per bank refresh operation or an all-bank refresh operation, a command control circuit configured to receive the command, and provide first and second internal control signals; a refresh control circuit configured to provide a first refresh control signal; and a row control circuit configured to provide a second refresh control signal. The provided first internal control signal is based on the provided command. For the per bank refresh operation, the provided second internal control signal is based on the second refresh control signal, and, for the all-bank refresh operation, the provided second internal control signal is based on the first internal control signal delayed by the command control circuit.

Abstract: Methods of operating a memory device are disclosed. A method may include enabling a first and second row section units a number of row section units of a memory device in response to a row address. The method may also include comparing a selected column address to a number of column addresses of defective memory cells of a first row section of the first row section unit. Moreover, in response to the selected column address matching a first column address of the number of column addresses, the method may include activating a second row section of the second row section unit, conveying a redundant column select signal to the memory array to select a redundant memory cell of the second row section. Memory devices and systems are also disclosed.

Abstract: The present invention is a surface-modified carbon material including chemical addends added to the surface of graphene, such that a one-dimensional periodicity corresponding to a large number of addition positions of the chemical addends can be observed in a Fourier-transformed image of a scanning probe microscopic image of the surface of graphene. The surface-modified carbon material of the present invention has a bandgap and therefore can be used as a sensor capable of electronically controlling an operation or another electronic device.

Abstract: A system for refresh operations including multiple refresh activations, and a method and an apparatus therefore, are described. The system includes, for example, a memory array; a command address input circuit configured to provide a command for a per bank refresh operation or an all-bank refresh operation, a command control circuit configured to receive the command, and provide first and second internal control signals; a refresh control circuit configured to provide a first refresh control signal; and a row control circuit configured to provide a second refresh control signal. The provided first internal control signal is based on the provided command. For the per bank refresh operation, the provided second internal control signal is based on the second refresh control signal, and, for the all-bank refresh operation, the provided second internal control signal is based on the first internal control signal delayed by the command control circuit.

Abstract: Disclosed herein is an apparatus that includes a memory cell array including a plurality of word lines each coupled to a plurality of memory cells, and a control circuit configured to activate first and second internal signals in a time-division manner in response to a first external command. A first number of the word lines are selected in response to the first internal signal, and a second number of the word line is selected in response to the second internal signal, the second number is smaller than the first number.

Abstract: A system for refresh operations including multiple refresh activations, and a method and an apparatus therefore, are described. The system includes, for example, a memory array; a command address input circuit configured to provide a command for a per bank refresh operation or an all-bank refresh operation, a command control circuit configured to receive the command, and provide first and second internal control signals; a refresh control circuit configured to provide a first refresh control signal; and a row control circuit configured to provide a second refresh control signal. The provided first internal control signal is based on the provided command. For the per bank refresh operation, the provided second internal control signal is based on the second refresh control signal, and, for the all-bank refresh operation, the provided second internal control signal is based on the first internal control signal delayed by the command control circuit.

Abstract: Disclosed herein is an apparatus that includes a memory cell array including a plurality of word lines each coupled to a plurality of memory cells, and a control circuit configured to activate first and second internal signals in a time-di vision manner in response to a first external command. A first number of the word lines are selected in response to the first internal signal, and a second number of the word line is selected in response to the second internal signal, the second number is smaller than the first number.

Abstract: A system for refresh operations in semiconductor memories, and an apparatus and method therefore, are described. The system includes, for example, memory cells in memory banks that are refreshed during a self-refresh operation or an auto refresh operation. The self-refresh operation includes a different number of refresh activations than the auto refresh operation. The system further includes a row control circuit configured to refresh the memory cells in the memory banks based on refresh control signals received from a refresh control circuit, the refresh control signals provided by the refresh control circuit based on internal control signals received by the refresh control circuit from a command control circuit. The auto refresh operation includes a per bank refresh operation configured to refresh a corresponding memory bank or an all-bank refresh operation configured to refresh all memory banks.