Patents by Inventor Toru Takagi

Toru Takagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8013927
    Abstract: Solid-state image sensors are disclosed that include one or more pixels formed on a semiconductor substrate. Each pixel includes a photoelectric converter to convert light to an electric signal, and a microlens above the photoelectric converter. The microlens has a plan profile in which the direct distance from a center to a lens edge is variable. The microlens has first base regions and second base regions not including the first base regions. The first base regions are provided near n positions (n being a natural number) of the lens edge from which the direct distance is relatively long. The vertical height of the first base regions from an upper surface of the photoelectric converter is less than the vertical height of the second base regions from the upper surface of the photoelectric converter.
    Type: Grant
    Filed: May 17, 2006
    Date of Patent: September 6, 2011
    Assignee: Nikon Corporation
    Inventor: Toru Takagi
  • Patent number: 7745784
    Abstract: The present invention provides an electron beam apparatus for evaluating a sample surface, which has a primary electro-optical system for irradiating a sample with a primary electron beam, a detecting system, and a secondary electro-optical system for directing secondary electron beams emitted from the sample surface by the irradiation of the primary electron beam to the detecting system.
    Type: Grant
    Filed: June 25, 2007
    Date of Patent: June 29, 2010
    Assignee: Ebara Corporation
    Inventors: Mamoru Nakasuji, Tohru Satake, Kenji Watanabe, Takeshi Murakami, Nobuharu Noji, Hirosi Sobukawa, Tsutomu Karimata, Shoji Yoshikawa, Toshifumi Kimba, Shin Oowada, Mitsumi Saito, Muneki Hamashima, Toru Takagi, Naoto Kihara, Hiroshi Nishimura
  • Patent number: 7706969
    Abstract: A guide system terminal device is provided to facilitate group operation vehicles. The guide system terminal device has a transceiver that receives the traveling environment information from another vehicle, such as for the turn signal, vehicle speed, running position, a road change judgment module that judges course changes by the other vehicle based on the traveling environment information of the other vehicle, and a user interface that outputs the judgment result obtained by road change judgment module. For example, the road change judgment module judges a left/right turn to have occurred when the blinker information acquired by turn signal sensor lasts longer than a prescribed time, and when the maximum value of the change in vehicle speed exceeds a prescribed level.
    Type: Grant
    Filed: December 22, 2005
    Date of Patent: April 27, 2010
    Assignee: Nissan Motor Co., Ltd.
    Inventors: Toru Takagi, Susumu Fujita, Masao Yamane
  • Patent number: 7610138
    Abstract: A vehicle information processing system 100 conducts wireless communications between a preceding vehicle 200 and a succeeding vehicle 201, and exhibits information on a winker operation of the preceding vehicle 200 to a driver of the succeeding vehicle 201, and includes vehicle-mounted apparatuses 1 in the preceding and succeeding vehicles, of which one 1 in the preceding vehicle 200 wirelessly transmits information on a winker operation of the preceding vehicle, and the other 1 in the succeed vehicle 201 receives the wirelessly transmitted information on the winker state, and exhibits same to a driver of the succeeding vehicle 201, while the apparatus 1 in the succeeding vehicle 201 estimates a relationship between the preceding vehicle 200 and the succeeding vehicle 201, judges whether an exhibition liming of the information on the winker state is to be hastened or delayed based on an estimation result, and exhibits the information on the winker state at the judged timing.
    Type: Grant
    Filed: January 25, 2006
    Date of Patent: October 27, 2009
    Assignee: Nissan Motor Co., Ltd.
    Inventors: Toru Takagi, Susumu Fujita, Masao Yamane
  • Patent number: 7601972
    Abstract: An inspection apparatus and a semiconductor device manufacturing method using the same. The inspection apparatus is used for defect inspection, line width measurement, surface potential measurement or the like of a sample such as a wafer. In the inspection apparatus, a plurality of charged particles is delivered from a primary optical system to the sample, and secondary charged particles emitted from the sample are separated from the primary optical system and introduced through a secondary optical system to a detector. Irradiation of the charged particles is conducted while moving the sample. Irradiation spots of the charged particles are arranged by N rows along a moving direction of the sample and by M columns along a direction perpendicular thereto. Every row of the irradiation spots of the charged particles is shifted successively by a predetermined amount in a direction perpendicular to the moving direction of the sample.
    Type: Grant
    Filed: October 9, 2007
    Date of Patent: October 13, 2009
    Assignee: Ebara Corporation
    Inventors: Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Toshifumi Kimba, Hirosi Sobukawa, Shoji Yoshikawa, Tsutomu Karimata, Shin Oowada, Mutsumi Saito, Muneki Hamashima, Toru Takagi
  • Publication number: 20090225205
    Abstract: Solid-state image sensors are disclosed that include one or more pixels formed on a semiconductor substrate. Each pixel includes a photoelectric converter to convert light to an electric signal, and a microlens above the photoelectric converter. The microlens has a plan profile in which the direct distance from a center to a lens edge is variable. The microlens has first base regions and second base regions not including the first base regions. The first base regions are provided near n positions (n being a natural number) of the lens edge from which the direct distance is relatively long. The vertical height of the first base regions from an upper surface of the photoelectric converter is less than the vertical height of the second base regions from the upper surface of the photoelectric converter.
    Type: Application
    Filed: May 17, 2006
    Publication date: September 10, 2009
    Inventor: Toru Takagi
  • Publication number: 20090050822
    Abstract: The present invention provides an electron beam apparatus for evaluating a sample surface, which has a primary electro-optical system for irradiating a sample with a primary electron beam, a detecting system, and a secondary electro-optical system for directing secondary electron beams emitted from the sample surface by the irradiation of the primary electron beam to the detecting system.
    Type: Application
    Filed: June 25, 2007
    Publication date: February 26, 2009
    Applicant: EBARA CORPORATION
    Inventors: Mamoru Nakasuji, Tohru Satake, Kenji Watanabe, Takeshi Murakami, Nobuharu Noji, Hirosi Sobukawa, Tsutomu Karimata, Shoji Yoshikawa, Toshifumi Kimba, Shin Oowada, Mutsumi Saito, Muneki Hamashima, Toru Takagi, Naoto Kihara, Hiroshi Nishimura
  • Publication number: 20090009307
    Abstract: An on-vehicle communication apparatus provided with: endpoint radio communication devices each provided for each one or more on-vehicle units; gateway radio communication devices which are respectively arranged in function networks provided with the above-mentioned one or more on-vehicle units, and performs radio communications with the endpoint radio communication devices that are included in the function network; and power sources each provided for any one of the above-mentioned one or more on-vehicle units and the above-mentioned one or more function networks.
    Type: Application
    Filed: March 2, 2006
    Publication date: January 8, 2009
    Inventors: Toru Takagi, Susumu Fujita, Masao Yamane
  • Publication number: 20080042060
    Abstract: An inspection apparatus and a semiconductor device manufacturing method using the same. The inspection apparatus is used for defect inspection, line width measurement, surface potential measurement or the like of a sample such as a wafer. In the inspection apparatus, a plurality of charged particles is delivered from a primary optical system to the sample, and secondary charged particles emitted from the sample are separated from the primary optical system and introduced through a secondary optical system to a detector. Irradiation of the charged particles is conducted while moving the sample. Irradiation spots of the charged particles are arranged by N rows along a moving direction of the sample and by M columns along a direction perpendicular thereto. Every row of the irradiation spots of the charged particles is shifted successively by a predetermined amount in a direction perpendicular to the moving direction of the sample.
    Type: Application
    Filed: October 9, 2007
    Publication date: February 21, 2008
    Applicant: EBARA CORPORATION
    Inventors: Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Toshifumi Kimba, Hirosi Sobukawa, Shoji Yoshikawa, Tsutomu Karimata, Shin Oowada, Mutsumi Saito, Muneki Hamashima, Toru Takagi
  • Patent number: 7302321
    Abstract: An information providing device installed in a leader vehicle that leads a follower vehicle, for providing the follower vehicle with guidance prepared by the leader vehicle, the information providing device that includes a state detector configured to detect a state change in the leader vehicle to output a detecting signal and a guidance generator configured to receive the detecting signal from the state detector, the guidance generator configured to prepare, in response to the detecting signal, guidance to guide the follower vehicle, the guidance including a photographed image of a view ahead of the leader vehicle.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: November 27, 2007
    Assignee: Nissan Motor Co., Ltd.
    Inventors: Masayasu Suzuki, Toru Takagi, Toshiro Muramatsu, Susumu Fujita, Satoshi Chinomi
  • Patent number: 7297949
    Abstract: An inspection apparatus and a semiconductor device manufacturing method using the same. The inspection apparatus is used for defect inspection, line width measurement, surface potential measurement or the like of a sample such as a wafer. In the inspection apparatus, a plurality of charged particles is delivered from a primary optical system to the sample, and secondary charged particles emitted from the sample are separated from the primary optical system and introduced through a secondary optical system to a detector. Irradiation of the charged particles is conducted while moving the sample. Irradiation spots of the charged particles are arranged by N rows along a moving direction of the sample and by M columns along a direction perpendicular thereto. Every row of the irradiation spots of the charged particles is shifted successively by a predetermined amount in a direction perpendicular to the moving direction of the sample.
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: November 20, 2007
    Assignee: Ebara Corporation
    Inventors: Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Toshifumi Kimba, Hirosi Sobukawa, Shoji Yoshikawa, Tsutomu Karimata, Shin Oowada, Mutsumi Saito, Muneki Hamashima, Toru Takagi
  • Patent number: 7292937
    Abstract: A navigation system, portable information processing device and its control program, data server, information processing server, navigation method, traveling route establishing method, information providing method, and area information providing method are disclosed having a portable terminal (10,54,210) to read out code data, indicative of area information of a destination and routed spots, from a print product (112,114). The code data are converted into area information and stored in a storage unit (23,66,72, 123,223,232,323), from which particular area information is retrieved and transmitted to an on-vehicle navigation device (30,58,104,230) by which a traveling route of the vehicle is established on the basis of area information to guide the vehicle to the destination.
    Type: Grant
    Filed: August 2, 2006
    Date of Patent: November 6, 2007
    Assignee: Nissan Motor Co., Ltd.
    Inventors: Koichi Kuroda, Takuo Ishiwaka, Toru Takagi, Susumu Fujita
  • Patent number: 7247848
    Abstract: The present invention provides an electron beam apparatus for evaluating a sample surface, which has a primary electro-optical system for irradiating a sample with a primary electron beam, a detecting system, and a secondary electro-optical system for directing secondary electron beams emitted from the sample surface by the irradiation of the primary electron beam to the detecting system.
    Type: Grant
    Filed: May 28, 2003
    Date of Patent: July 24, 2007
    Assignee: Ebara Corporation
    Inventors: Mamoru Nakasuji, Tohru Satake, Kenji Watanabe, Takeshi Murakami, Nobuharu Noji, Hirosi Sobukawa, Tsutomu Karimata, Shoji Yoshikawa, Toshifumi Kimba, Shin Oowada, Mutsumi Saito, Muneki Hamashima, Toru Takagi, Naoto Kihara, Hiroshi Nishimura
  • Patent number: 7228137
    Abstract: A mobile body information system comprises a center system and a vehicle-mounted terminal device. The vehicle-mounted terminal device is configured to determine a density of communication areas of narrow area wireless base stations along a travel route of a vehicle based on a current position of the vehicle and installation data of the narrow area wireless base stations. When the density of communication areas is high, the vehicle-mounted terminal device is configured to recommend to a user a divided download format in which the information is intermittently distributed through a plurality of the narrow area wireless base stations while the vehicle is travelling. When the density of the communication areas is low, the vehicle-mounted terminal device is configured to recommend a batch download format in which the information is distributed through one of the narrow area wireless base stations while the vehicle remains in one communication area.
    Type: Grant
    Filed: September 4, 2003
    Date of Patent: June 5, 2007
    Assignee: Nissan Motor Co., Ltd.
    Inventors: Satoshi Chinomi, Toru Takagi, Susumu Fujita, Masayasu Suzuki
  • Publication number: 20070057186
    Abstract: An inspection apparatus and a semiconductor device manufacturing method using the same. The inspection apparatus is used for defect inspection, line width measurement, surface potential measurement or the like of a sample such as a wafer. In the inspection apparatus, a plurality of charged particles is delivered from a primary optical system to the sample, and secondary charged particles emitted from the sample are separated from the primary optical system and introduced through a secondary optical system to a detector. Irradiation of the charged particles is conducted while moving the sample. Irradiation spots of the charged particles are arranged by N rows along a moving direction of the sample and by M columns along a direction perpendicular thereto. Every row of the irradiation spots of the charged particles is shifted successively by a predetermined amount in a direction perpendicular to the moving direction of the sample.
    Type: Application
    Filed: September 28, 2006
    Publication date: March 15, 2007
    Applicant: EBARA CORPORATION
    Inventors: Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Toshifumi Kimba, Hirosi Sobukawa, Shoji Yoshikawa, Tsutomu Karimata, Shin Oowada, Mutsumi Saito, Muneki Hamashima, Toru Takagi
  • Patent number: 7183562
    Abstract: Charged-particle-beam (CPB) mapping projection-optical systems and adjustment methods for such systems are disclosed that can be performed quickly and accurately. In a typical system, an irradiation beam is emitted from a source, passes through an irradiation-optical system, and enters a Wien filter (“E×B”). Upon passing through the E×B, the irradiation beam passes through an objective-optical system and is incident on an object surface. Such impingement generates an observation beam that returns through the objective-optical system and the E×B in a different direction to a detector via an imaging-optical system. An adjustment-beam source emits an adjustment beam used for adjusting and aligning the position of, e.g., the object surface and/or the Wien's condition of the E×B. The adjustment beam can be off-axis relative to the objective-optical system. For such adjusting and aligning, fiducial marks (situated, e.g.
    Type: Grant
    Filed: April 25, 2006
    Date of Patent: February 27, 2007
    Assignee: Nikon Corporation
    Inventors: Hiroshi Nishimura, Naoto Kihara, Kinya Kato, Toru Takagi, Akihiro Goto, Junji Ikeda, Kazuya Okamoto
  • Patent number: D570742
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: June 10, 2008
    Assignee: Isuzu Motors Limited
    Inventors: Toru Takagi, Yoshio Iwasaki, Keishi Hayashi
  • Patent number: D570743
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: June 10, 2008
    Assignee: Isuzu Motors Limited
    Inventors: Toru Takagi, Yoshio Iwasaki, Keishi Hayashi
  • Patent number: D571260
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: June 17, 2008
    Assignee: Isuzu Motors Limited
    Inventors: Toru Takagi, Keishi Hayashi, Yoshio Iwasaki
  • Patent number: D571690
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: June 24, 2008
    Assignee: Isuzu Motors Limited
    Inventors: Toru Takagi, Keishi Hayashi, Yoshio Iwasaki