Patents by Inventor Toshijiro Ohashi

Toshijiro Ohashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7379788
    Abstract: A manufactured article treatment processing method and system includes reading out from a manufactured article being subjected to treatment information of component parts of the article and specific properties of the component parts, extraction of the component parts to be separated on the basis of predetermined specific properties serving as information for detachment and specific properties of the component parts, and treatment of the component parts to be separated and other components parts through different processes, respectively.
    Type: Grant
    Filed: July 21, 2000
    Date of Patent: May 27, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Yuzo Hiroshige, Yuji Ochiai, Takashi Kitamura, Takahiro Tachi, Masakatsu Hayashi
  • Publication number: 20080103956
    Abstract: A method for mediating transactions between firms including receiving registration demands and relevant product and firm information from purchasing firms and supplier firms, performing various mediating processing, and ultimately providing to the purchasing firm, the information that relates to selected supplier firm and products that the supplier firm wishes to supply, when the supplier firm communicates a desire to transact with the purchasing firm, or the supplier firm is selected by the comparison processing of the requested transaction conditions information.
    Type: Application
    Filed: October 5, 2007
    Publication date: May 1, 2008
    Inventors: Tatsuya SUZUKI, Toshijiro Ohashi, Kichie Matsuzaki, Yumiko Sawada
  • Publication number: 20080071412
    Abstract: A manufactured article treatment processing method and system includes reading out from a manufactured article being subjected to treatment information of component parts of the article and specific properties of the component parts, extraction of the component parts to be separated on the basis of predetermined specific properties serving as information for detachment and specific properties of the component parts, and treatment of the component parts to be separated and other components parts through different processes, respectively.
    Type: Application
    Filed: October 31, 2007
    Publication date: March 20, 2008
    Inventors: Tatsuya SUZUKI, Toshijiro OHASHI, Yuzo HIROSHIGE, Yugi OCHIAI, Takashi KITAMURA, Takahiro TACHI, Masakatsu HAYASHI
  • Patent number: 6895350
    Abstract: A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
    Type: Grant
    Filed: February 13, 2003
    Date of Patent: May 17, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Publication number: 20040083019
    Abstract: A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
    Type: Application
    Filed: February 13, 2003
    Publication date: April 29, 2004
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Patent number: 6625511
    Abstract: Method and apparatus for evaluating quality of a product, and a recording medium therefor. The invention includes creating and storing in advance a workshop evaluating database, extracting from the prepared workshop evaluating database those failure occurrence ratio indexes which correspond to workshop facility levels of an input manufacturing workshop for workshop-conditioned failure influential items thereof, respectively, and evaluating/estimating failure occurrence likelihood for standard manufacturing works in the manufacturing workshop, the failure occurrence likelihood being then stored as workshop index in a product evaluating database, and evaluating/estimating a quality indicating a work-related defective ratio for the products to be manufactured through a plurality of manufacturing works in the manufacturing workshop by using the workshop indexes concerning that manufacturing workshop which has been stored in the article evaluating database in the workshop evaluating step.
    Type: Grant
    Filed: March 16, 2000
    Date of Patent: September 23, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Patent number: 6553273
    Abstract: A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
    Type: Grant
    Filed: May 8, 2000
    Date of Patent: April 22, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Patent number: 6526326
    Abstract: A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
    Type: Grant
    Filed: August 13, 2001
    Date of Patent: February 25, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Publication number: 20020107780
    Abstract: In conventional transactions between firms, it is difficult to make objective, quantitative evaluations in advance of firms with which no past transactions have been performed or of the quality of items supplied by a supplier firm with which few transactions have been made. Thus, a firm will not necessarily be able to negotiate with a firm that can supply high-quality items. As a result, a purchasing firm may not be able to purchase high-quality items efficiently, leading to increases in production costs and shipping details. Also, product quality may be lowered because high-quality items could not be obtained. When global purchasing is to be performed, the majority of negotiations will be with firms with which there have been no past transactions. Thus, there is a need for a system that allows efficient purchasing of high-quality products.
    Type: Application
    Filed: April 27, 2001
    Publication date: August 8, 2002
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Kichie Matsuzaki, Yumiko Sawada
  • Patent number: 6401000
    Abstract: A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
    Type: Grant
    Filed: May 8, 2000
    Date of Patent: June 4, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Publication number: 20010047218
    Abstract: A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
    Type: Application
    Filed: August 13, 2001
    Publication date: November 29, 2001
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Patent number: 6226617
    Abstract: A treatment processing system for determining proper and appropriate treatment methods and procedures in accordance with states of discarded articles and outputting the determined procedures. Treatment methods are decided which are desirable for manufactured articles for carrying out corresponding treatments of the manufactured articles. The treatment processing system includes a unit for reading out information affixed to the discarded articles, a unit for storing databases for required information, a treatment procedure decision unit, a treatment procedure altering unit, and a detector for detecting whether or not treatment is being executed in conformance with the relevant treatment procedure.
    Type: Grant
    Filed: June 10, 1998
    Date of Patent: May 1, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Yuzo Hiroshige, Yuji Ochiai, Takashi Kitamura, Takahiro Tachi, Masakatsu Hayashi
  • Patent number: 6223092
    Abstract: A designed object workability evaluating system for evaluating quantitatively at a stage of designing an article whether a structure of the article as designed can be realized with work easy to do in a manufacturing stage for thereby selectively determining a best structure from a plurality of design plans through comparative evaluation thereof. A server machine section of the system includes an evaluation-destined element estimating module for estimating the evaluation-destined elements to be performed on parts constituting an article given by a design plan subjected to evaluation, a part workability evaluation module for evaluating easiness of works to be performed on the parts, an article workability evaluation module for evaluating easiness of works involved in realizing the article, and a best design plan selection/determination module for selectively determining a best structure on the basis of comparative evaluation of a plurality of design plans.
    Type: Grant
    Filed: March 24, 1997
    Date of Patent: April 24, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Seii Miyakawa, Syoji Arimoto, Manabu Ikeda, Toshijiro Ohashi, Minoru Iwata, Mitsuharu Hayakawa
  • Patent number: 6108586
    Abstract: A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
    Type: Grant
    Filed: March 27, 1998
    Date of Patent: August 22, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano, Takashi Kubota
  • Patent number: 5907488
    Abstract: A method of evaluating quantitatively in a design stage degrees of difficulty of works and processings to be performed on an article or parts at various stage of life thereof such as manufacturing, sale, use, maintenance/inspection/repair, recovery, dismantling, disassembling, recycling for resources, nontoxication and scrapping. Part elimination scores E.sub.i representing degrees of difficulty of the works and processings to be performed on the parts are regarded to be a function of indexes indicating the degrees of difficulty of the works and the processings for the parts and expressed by E.sub.i =f(G.sub.i), while an article evaluation score E representing the degrees of difficulty of the work and the processing for the article is regarded to be a function of a mean value of the part evaluation scores E.sub.i or an index G (=.SIGMA.G.sub.i) indicating the degrees of difficulty of the work and the processing for the article and expressed by E=f(G)=f(.SIGMA.G.sub.i).
    Type: Grant
    Filed: September 19, 1996
    Date of Patent: May 25, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Syoji Arimoto, Yuuzoo Hiroshige, Kiyoshi Suzuki, Tatsuya Suzuki, Toshijiro Ohashi
  • Patent number: 5767848
    Abstract: A development support system for supporting new product development activities including designing, manufacturing experimental models and testing the functions of the experimental models and for providing an environment for the cooperative activities of a plurality of members of a development project team has a model storage for storing product models, resource models of resources to be used for product development and product development activity models; a target storage for storing target values of schedules of product development, and the cost and the performance of the product; an estimating unit for estimating schedules of product development and the cost and the performance of the product on the basis of the models stored in the model storage; a support unit for support the operations of the members of the development project team for making reference to the models, the target values and the estimated values, and changing and particularizing the models, the target values and the estimated values; a noti
    Type: Grant
    Filed: December 13, 1994
    Date of Patent: June 16, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Kichie Matsuzaki, Keiichi Okamoto, Hideaki Suzuki, Hiroshi Makita, Hisashi Onari, Toshijiro Ohashi, Mitsuharu Hayakawa, Roberto Kishikawa, Hiroshi Kitazawa
  • Patent number: 5717598
    Abstract: A designed object workability evaluating system for evaluating quantitatively at a stage of designing an article whether a structure of the article as designed can be realized easily in a manufacturing stage for thereby selectively determining a best structure from a plurality of design plans through comparative evaluation thereof. The system includes a client machine section including a guide information generating unit for generating information for guiding operations of a user, an input device for allowing the user to input commands and data and a display unit. A server machine section includes a registering unit storing evaluation elements defined by the user, an index calculating module for calculating indexes indicating degrees of difficulty/ease of work, an evaluation element estimating module, a part workability evaluation module, an article workability evaluation module, and a best design plan selection/determination module.
    Type: Grant
    Filed: September 22, 1995
    Date of Patent: February 10, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Seii Miyakawa, Syoji Arimoto, Manabu Ikeda, deceased, Toshijiro Ohashi, Minoru Iwata, Mitsuharu Hayakawa
  • Patent number: 5586022
    Abstract: A method of evaluating quantitatively in a design stage degrees of difficulty of works and processings to be performed on an article or parts at various stage of life thereof such as manufacturing, sale, use, maintenance/inspection/repair, recovery, dismantling, disassembling, recycling for resources, nontoxication and scrapping. Part elimination scores E.sub.i representing degrees of difficulty of the works and processings to be performed on the parts are regarded to be a function of indexes indicating the degrees of difficulty of the works and the processings for the parts and expressed by E.sub.i =f(G.sub.i), while an article evaluation score E representing the degrees of difficulty of the work and the processing for the article is regarded to be a function of a mean value of the part evaluation scores E.sub.i or an index G (.SIGMA.G.sub.i) indicating the degrees of difficulty of the work and the processing for the article and expressed by E=f(G)=f(.SIGMA.G.sub.i).
    Type: Grant
    Filed: August 15, 1994
    Date of Patent: December 17, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Syoji Arimoto, Yuuzoo Hiroshige, Kiyoshi Suzuki, Tatsuya Suzuki, Toshijiro Ohashi
  • Patent number: 4872618
    Abstract: An apparatus suitable for use in winding a coil on a toroidal core of a magnetic head of a video tape recorder or magnetic disc player by passing a wire through a minuscule aperture, with the apparatus including an annular wire guide formed with a cutout, a plurality of pairs of feed rollers having axes disposed perpendicular to a plane in which the annular wire guide is disposed, the rollers of each pair engaging each other inside the annular wire guide, and at least one core holding unit for holding a core in such a manner as to be positioned in the cutout of the annular wire guide. By repeatedly performing the operations of feeding a wire by the feed rollers, guiding the movement of the wire by the annular wire guide and inserting the wire through a core window of the toroidal core after transporting the wire to the wire insertion position, it is possible to wind a coil positively with increased speed and reliability.
    Type: Grant
    Filed: May 3, 1988
    Date of Patent: October 10, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Sato, Toshijiro Ohashi, Toyohide Hamada, Yukimori Umakoshi, Takamichi Suzuki, Yuuji Wada, Shigeo Hara, Youshuke Fukumoto
  • Patent number: 4771956
    Abstract: A method of and an apparatus suitable for use in winding a coil on a toroidal core of a magnetic head of a video tape recorder or magnetic disc player by passing a wire through a minuscule aperture. The apparatus includes an annular wire guide formed with a cutout, a plurality of pairs of feed rollers having axes disposed perpendicular to a plane in which the annular wire guide is disposed, the rollers of each pair engaging each other inside the annular wire guide, and at least one core holding unit for holding a core in such a manner as to be positioned in the cutout of the annular wire guide. By repeatedly performing the operations of feeding a wire by the feed rollers, guiding the movement of the wire by the annular wire guide and inserting the wire through a core window of the toroidal core after transporting the wire to the wire insertion position, it is possible to wind a coil positively with increased speed and reliability.
    Type: Grant
    Filed: July 23, 1986
    Date of Patent: September 20, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Sato, Toshijiro Ohashi, Toyohide Hamada, Yukimori Umakoshi, Takamichi Suzuki, Yuuji Wada, Shigeo Hara, Youshuke Fukumoto