Patents by Inventor Toshinobu Ikeda

Toshinobu Ikeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of measuring refractive index of thin film and refractive index measuring apparatus therefor
    Patent number: 5414506
    Abstract: A method of measuring the refractive index of a thin film is composed the steps of: (a) forming a dielectric thin film which is transparent, uniform and geometrically and optically identical, on each of a first substrate and a second substrate, with the refractive indexes of the first substrate and the second substrate being different; and (b) measuring the reflectivities of the first and second substrates, each bearing the dielectric thin film thereon, with the application of a light with an identical wavelength to the two substrates, thereby measuring the refractive index of the dielectric thin film.
    Type: Grant
    Filed: August 31, 1993
    Date of Patent: May 9, 1995
    Assignee: Shincron Co., Ltd.
    Inventors: Shinichiro Saisho, Toshinobu Ikeda, Akira Odagiri