Abstract: A vehicle state detection unit detects whether a vehicle including an information apparatus is in motion or stopped. A display control unit displays operation items related to various functions provided by the information apparatus on a display. A function execution unit executes a function corresponding to a selected operation item. An identification unit identifies the frequency of use of each operation item by classifying the items according to whether the vehicle is in motion or stopped. The display control unit further displays on a prescribed menu screen in which some of the operation items are aggregated. On the prescribed menu screen, when the vehicle is in motion, the operation item identified as having a high frequency of use when the vehicle is in motion is displayed, and when the vehicle is stopped, the operation item identified as having a high frequency of use when the vehicle is stopped is displayed.

Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. The first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. The processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. The processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. The processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data.

Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires manufacturing data including a manufacturing condition data group and a quality data group. The processing circuitry calculates one or more degrees of influence exerted by first manufacturing condition data included in the manufacturing condition data group on respective pieces of quality data included in the quality data group by analyzing the manufacturing data. The processing circuitry, in a case where one or more degrees of influence satisfy a determination condition, generates output data related to at least one of the first manufacturing condition data, one or more pieces of quality data on which the first manufacturing condition data has exerted the degrees of influence satisfying the determination condition, or the degrees of influence satisfying the determination condition.

Abstract: According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires first factor data indicative of first manufacturing conditions of a first product, and acquires second factor data indicative of second manufacturing conditions of a second product. The processing circuitry computes, based on the first factor data, a first index value relating to a degree by which each of the first manufacturing conditions contributes to an abnormality, and computes, based on the second factor data, a second index value relating to a degree by which each of the second manufacturing conditions contributes to an abnormality. The processing circuitry computes a similarity between the first index value and the second index value.

Abstract: According to one embodiment, an estimation device includes a processor. The processor accepts information. The information is acquired by each of a plurality of ultrasonic sensors transmitting an ultrasonic wave in a second direction toward a weld portion and receiving a reflected wave. The ultrasonic sensors are arranged in a first direction. The second direction crosses the first direction. The processor estimates a range of the weld portion in the second direction based on an intensity distribution of the reflected wave in the second direction. The processor calculates a centroid position of an intensity distribution of the reflected wave in the first direction for each of a plurality of points in the second direction, and estimates a range of the weld portion in the first direction based on a plurality of the centroid positions.

Abstract: A remote control manipulator system includes: a manipulator being controlled by an operator remotely to handle an object; a stereoscopic display device that displays a right-eye image and a left-eye image so as to be stereoscopically viewed; a model image generator that generates a model image being an image of an integrated three-dimensional model viewed from a viewpoint designated by the operator, the integrated three-dimensional model being a three-dimensional model obtained by integrating the manipulator model and a surrounding environment model being generated by performing image processing on the right-eye image and the left-eye image and being a three-dimensional model of the object and a surrounding environment thereof; and a model image display device that displays the model image and is configured to be able to be viewed by the operator switching between the stereoscopic display device and the model image display device through moving the head of the operator.

Abstract: According to one embodiment, an anomaly detection apparatus includes a processing circuit configured to calculate a reconstruction error of an input signal being a time-series signal, calculate cycle information indicating cyclic property of the reconstruction error, and determine presence/absence of an anomaly signal in the input signal on the basis of the cycle information or the cycle information and the reconstruction error.

Abstract: An inspection apparatus includes processing circuitry. The processing circuitry is configured to: acquire a first image and a second image for inspecting an inspection target; generate a plurality of deformed images by applying a plurality of deformation processes to at least one of the first image or the second image; calculate, for each pixel, a difference value between a pixel value of the first image and a pixel value of the second image, using the deformed images; calculate a pixel-by-pixel integrated difference value by integrating a plurality of difference values calculated for the respective deformed images; and detect an anomaly of the inspection target based on the pixel-by-pixel integrated difference value.

Abstract: According to one embodiment, a control method includes setting a transmission angle of an ultrasonic wave to a standard angle. The control method further includes transmitting an ultrasonic wave at the set transmission angle and detecting an intensity of a reflected wave from an object. The control method further includes calculating a tilt angle based on a gradient of the intensity. The tilt angle indicates a tilt of the object. The control method further includes resetting the transmission angle based on the tilt angle.

Abstract: An abnormality score calculation apparatus according to an embodiment includes a processing circuit configured to: acquire first data concerning a status of a product or a manufacturing process; calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types; and convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.

Abstract: According to one embodiment, a data analysis apparatus includes a processor. The processor acquires, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product. The processor calculates, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.

Abstract: A magnetic resonance imaging apparatus according to an embodiment includes an MRI system and a processing circuitry. The MRI system includes a receiving coil to receive a magnetic resonance signal. The processing circuitry is configured to generate an image based on the magnetic resonance signal, the image including a plurality of pixels; calculate a feature value corresponding to a signal value of the pixel; correct the feature values based on a sensitivity of the receiving coil; and reduce noise in the image based on distribution of the corrected feature values.

Abstract: According to one embodiment, an image processing apparatus incudes processing circuitry. The processing circuitry generates, for N processed images based on an input image, N being an integer equal to greater than 3, N feature amounts by performing feature amount extraction processing using a neural network, stores process data generated during the feature amount extraction processing in a memory, selects a maximum feature amount by performing two or more comparisons with M combinations among the N feature amounts, M being an integer equal to 2 or more and (N?1) or less, and releases (M?1) or less pieces of process data that correspond to (M?1) or less feature amounts not having been selected from the memory for each of the two or more comparisons.

Abstract: In general, according to one embodiment, a data processing apparatus includes a processor including hardware. The processor acquires state data related to a state of each product and order data related to order related to manufacturing of each product. The processor calculates a first score by using the acquired state data and the acquired order data. The first score regards a change in the acquired state data and is based on a first change model. The first change model represents the change in the state data using the order data. The processor outputs the first score.

Abstract: According to one embodiment, a control method includes setting a transmission angle of an ultrasonic wave to a standard angle. The control method further includes transmitting an ultrasonic wave at the set transmission angle and detecting an intensity of a reflected wave from an object. The control method further includes calculating a tilt angle based on a gradient of the intensity. The tilt angle indicates a tilt of the object. The control method further includes resetting the transmission angle based on the tilt angle.

Abstract: According to one embodiment, a detection apparatus includes a processor. The processor acquires height information at a plurality of points in a subject. The processor determines whether or not one or more steps are present at a height equal to or higher than a predetermined height from a reference in the subject based on the height information. The processor detects that the subject is in a state in which a plurality of objects are overlapped, if the number of the steps is equal to or greater than a first threshold value.

Abstract: According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires a data element group composed of a plurality of data elements, calculates, in regard to a first data element in the data element group, an index value indicative of a conditional dispersion from another data element in the data element group, extracts, based on the index value, a parent element having a high association with the first data element from the data element group, and outputs an analysis result including first information relating to the first data element and the parent element.

Abstract: According to one embodiment, a wall detection device includes an acquirer and processing circuitry. The acquirer acquires a point cloud, which includes a series of coordinates of a plurality of points corresponding to a first wall and a second wall that oppose each other. The processing circuitry detects a first detected wall and a second detected wall based on a model and the acquired point cloud, the model representing a first plane which corresponds to the first detected wall and indicates a surface of the first wall and a second plane which corresponds to the second detected wall and indicates a surface of the second wall, and the model representing the first plane and the second plane being parallel to each other.

Abstract: According to one embodiment, an anomaly detection apparatus includes a processing circuit configured to calculate a reconstruction error of an input signal being a time-series signal, calculate cycle information indicating cyclic property of the reconstruction error, and determine presence/absence of an anomaly signal in the input signal on the basis of the cycle information or the cycle information and the reconstruction error.

Abstract: A data processing apparatus includes a processor. The processor generates visualization data for displaying estimation results of manufacturing conditions based on estimation results and relationship data. The relationship data includes first relationship data as a relationship between first manufacturing conditions recorded during an analysis, and second relationship data as a relationship between second manufacturing conditions corresponding. The processor divides the estimation results of the manufacturing conditions into a first group based on the first relationship data, and into a second group based on the second relationship data. The processor generates the visualization data based on a change in manufacturing condition relationship between the first group and the second group.