Patents by Inventor Toshiyuki Ono

Toshiyuki Ono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240402082
    Abstract: An optical sensor chip includes a spot-size conversion unit to receive a first optical signal from outside, a changer unit to change the first optical signal depending on a state of a specimen, a spot-size conversion unit to output the first optical signal to the outside, a spot-size conversion unit to receive a second optical signal from the outside, a multiplexer unit to multiplex a first optical signal changed by the changer unit depending on the state of the specimen and the second optical signal, and a spot-size conversion unit to output an optical signal multiplexed by the multiplexer unit to the outside.
    Type: Application
    Filed: August 13, 2024
    Publication date: December 5, 2024
    Applicant: Mitsubishi Electric Corporation
    Inventors: Akihiro FUJIE, Hiroshi OTSUKA, Masayuki BABA, Toshiyuki ANDO, Hitomi ONO, Yuta TAKEMOTO
  • Publication number: 20240401966
    Abstract: A light emitting device is located inside a vehicle and emits light toward an occupant compartment where an occupant is seated. The light emitting device comprises a light emitting unit and a control unit. The light emitting unit has a plurality of light emission regions. The plurality of light emission regions are arranged along one direction. The control unit controls the light emission region using at least one of first information related to an operation of the vehicle in which the light emitting device is mounted and second information related to an operation of an output unit that performs output toward the occupant compartment of the vehicle.
    Type: Application
    Filed: June 12, 2023
    Publication date: December 5, 2024
    Inventors: Naoki MITSUNAGA, Naoki FUJIMURA, Yoshikazu SAKAI, Mizuki SUGURU, Hideki NAGATA, Hideki ONO, Teruaki KAIYA, Isao KURATA, Makoto YAJI, Toshiyuki MURATA, Takuya HIROSE
  • Publication number: 20240385118
    Abstract: An optical sensor sheet includes a plurality of optical sensor chips to change a characteristic of an input optical signal depending on a state of a specimen and to output an optical signal with a changed characteristic, an optical path to propagate an optical signal input to and output from the plurality of optical sensor chips, and a sheet member including the plurality of optical sensor chips.
    Type: Application
    Filed: July 30, 2024
    Publication date: November 21, 2024
    Applicant: Mitsubishi Electric Corporation
    Inventors: Akihiro FUJIE, Hiroshi OTSUKA, Hitomi ONO, Toshiyuki ANDO
  • Patent number: 12112018
    Abstract: An information displaying device comprises: an input unit that receives operations from a user; a movement state evaluating unit that evaluates a state of movement of the mobile entity; a display information generating unit that generates screen information including UI elements (user interface elements) to be displayed on a display, based on a layout selected from layouts according to the evaluated state of movement of the mobile entity; and an operation detecting unit that detects the operations on each of the UI elements, and counts frequency of the operations on each of the UI elements while the movement state evaluating unit evaluates that the mobile entity is traveling; wherein, in the screen information based on the layout selected when the mobile entity is traveling, the UI elements with higher frequencies of the operations, which are detected by the operation detecting unit, are preferentially displayed on the screen of the display.
    Type: Grant
    Filed: March 8, 2023
    Date of Patent: October 8, 2024
    Assignee: Faurecia Clarion Electronics Co., Ltd.
    Inventors: Haruki Ono, Kazunori Sato, Kazuya Ninomiya, Shingo Takei, Taishin Konishi, Toshiyuki Takatani
  • Publication number: 20240321499
    Abstract: A coil device including a first winding unit around which a first wire is wound, a second winding unit around which a second wire is wound, a middle leg core disposed radially inside the first winding portion and the second winding portion, an outer leg core disposed radially outside the first winding unit and the second winding unit, and a first combining core coupling the middle leg core with the outer leg core. At least one of an inner circumferential surface of the first winding portion and an inner circumferential surface of the second winding portion is in contact with an outer circumferential surface of the middle leg core.
    Type: Application
    Filed: February 27, 2024
    Publication date: September 26, 2024
    Applicant: TDK CORPORATION
    Inventors: Toshiyuki HORIKAWA, Shinichiro KOKUBO, Ryoji ONO
  • Patent number: 12086731
    Abstract: In order to assist participants in thinking of an idea by acquiring audio data, it is provided a workshop assistance system, which includes a computer having an arithmetic apparatus configured to execute predetermined processing, a storage device coupled to the arithmetic apparatus, and a communication interface coupled to the arithmetic apparatus, the computer being configured to access solved problem case data including information of solved cases that correspond to problem data, the workshop assistance system comprising: a problem processing module configured to search, by the arithmetic apparatus, solved cases based on problem data that is generated from a discussion among participants; and an idea generation module configured to present, by the arithmetic apparatus, idea data including the generated problem data and information of the solved case found in the search to the participants.
    Type: Grant
    Filed: January 31, 2019
    Date of Patent: September 10, 2024
    Assignee: Hitachi, Ltd.
    Inventors: Shuhei Furuya, Yo Takeuchi, Kiyoshi Kumagai, Toshiyuki Ono, Masao Ishiguro, Tatsuya Tokunaga, Chisa Nagai, Takashi Sumiyoshi, Naoyuki Kanda, Kenji Nagamatsu, Kenji Ohya
  • Publication number: 20240281824
    Abstract: According to one embodiment, a troubleshooting support apparatus includes processing circuitry. The processing circuitry acquires multiple pieces of document data which describe content of a problem relating to multiple articles or services. The processing circuitry extracts, from the multiple pieces of document data, multiple first keywords relating to the multiple articles or services together with attribute information. The processing circuitry records the multiple first keywords in a memory for the respective pieces of attribute information. The processing circuitry determines, based on a rate of occurrence of each of multiple second keywords relating to predetermined attribute information among the first keywords recorded in the memory, a display manner of first data relating to each of the multiple second keywords.
    Type: Application
    Filed: October 13, 2023
    Publication date: August 22, 2024
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Jumpei ANDO, Wataru WATANABE, Toshiyuki ONO, Shintaro YAMAMOTO, Kenzo ISOGAWA
  • Patent number: 12061467
    Abstract: A data processing apparatus includes a processor. The processor generates visualization data for displaying estimation results of manufacturing conditions based on estimation results and relationship data. The relationship data includes first relationship data as a relationship between first manufacturing conditions recorded during an analysis, and second relationship data as a relationship between second manufacturing conditions corresponding. The processor divides the estimation results of the manufacturing conditions into a first group based on the first relationship data, and into a second group based on the second relationship data. The processor generates the visualization data based on a change in manufacturing condition relationship between the first group and the second group.
    Type: Grant
    Filed: February 28, 2022
    Date of Patent: August 13, 2024
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Wataru Watanabe, Takayuki Itoh, Jumpei Ando, Keisuke Kawauchi, Toshiyuki Ono
  • Publication number: 20240185581
    Abstract: A training apparatus includes a circuitry. The circuitry inputs a bag that is a set of an instance to an identifier and outputs a probability sequence including a probability that each instance belonging to the bag corresponds to a target. The circuitry calculates a bag likelihood that is a probability that specific instances corresponding to the target are included in the bag. The circuitry outputs an expected instance quantity regarding a quantity of the specific instances included in the bag. The circuitry calculates a parameter update amount based on teaching data, the bag likelihood, and the expected instance quantity, and updates a parameter of the identifier based on the parameter update amount.
    Type: Application
    Filed: August 29, 2023
    Publication date: June 6, 2024
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Kenzo ISOGAWA, Toshiyuki ONO
  • Publication number: 20240185064
    Abstract: According to one embodiment, a learning apparatus includes processing circuitry. The processing circuitry generates a first converted feature values and a second converted feature values by stochastically converting at least one of first feature values and second feature values. The processing circuitry calculates a first loss related to similarity between the first converted feature values and the second converted feature values. The processing circuitry obtains a first processing result by processing based on one or more third parameters with respect to the first converted feature values. The processing circuitry updates a parameter of at least one of the first parameters and the third parameters such that a value based on the first loss and a second loss calculated from the first processing result and a label is minimized.
    Type: Application
    Filed: August 30, 2023
    Publication date: June 6, 2024
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Tenta SASAYA, Takashi WATANABE, Toshiyuki ONO
  • Publication number: 20240094091
    Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires manufacturing data including a manufacturing condition data group and a quality data group. The processing circuitry calculates one or more degrees of influence exerted by first manufacturing condition data included in the manufacturing condition data group on respective pieces of quality data included in the quality data group by analyzing the manufacturing data. The processing circuitry, in a case where one or more degrees of influence satisfy a determination condition, generates output data related to at least one of the first manufacturing condition data, one or more pieces of quality data on which the first manufacturing condition data has exerted the degrees of influence satisfying the determination condition, or the degrees of influence satisfying the determination condition.
    Type: Application
    Filed: February 22, 2023
    Publication date: March 21, 2024
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Wataru WATANABE, Keisuke KAWAUCHI, Takayuki ITOH, Jumpei ANDO, Toshiyuki ONO
  • Publication number: 20240094092
    Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. The first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. The processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. The processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. The processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data.
    Type: Application
    Filed: February 28, 2023
    Publication date: March 21, 2024
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Wataru WATANABE, Keisuke KAWAUCHI, Takayuki ITOH, Jumpei ANDO, Toshiyuki ONO
  • Publication number: 20240085899
    Abstract: According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires first factor data indicative of first manufacturing conditions of a first product, and acquires second factor data indicative of second manufacturing conditions of a second product. The processing circuitry computes, based on the first factor data, a first index value relating to a degree by which each of the first manufacturing conditions contributes to an abnormality, and computes, based on the second factor data, a second index value relating to a degree by which each of the second manufacturing conditions contributes to an abnormality. The processing circuitry computes a similarity between the first index value and the second index value.
    Type: Application
    Filed: February 28, 2023
    Publication date: March 14, 2024
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Jumpei ANDO, Wataru WATANABE, Takayuki ITOH, Keisuke KAWAUCHI, Toshiyuki ONO
  • Patent number: 11927570
    Abstract: According to one embodiment, an estimation device includes a processor. The processor accepts information. The information is acquired by each of a plurality of ultrasonic sensors transmitting an ultrasonic wave in a second direction toward a weld portion and receiving a reflected wave. The ultrasonic sensors are arranged in a first direction. The second direction crosses the first direction. The processor estimates a range of the weld portion in the second direction based on an intensity distribution of the reflected wave in the second direction. The processor calculates a centroid position of an intensity distribution of the reflected wave in the first direction for each of a plurality of points in the second direction, and estimates a range of the weld portion in the first direction based on a plurality of the centroid positions.
    Type: Grant
    Filed: September 22, 2022
    Date of Patent: March 12, 2024
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Masahiro Saito, Yasunori Chiba, Akira Ushijima, Toshiyuki Ono, Atsushi Matsumura
  • Patent number: 11921137
    Abstract: According to one embodiment, an anomaly detection apparatus includes a processing circuit configured to calculate a reconstruction error of an input signal being a time-series signal, calculate cycle information indicating cyclic property of the reconstruction error, and determine presence/absence of an anomaly signal in the input signal on the basis of the cycle information or the cycle information and the reconstruction error.
    Type: Grant
    Filed: February 16, 2022
    Date of Patent: March 5, 2024
    Assignees: KABUSHIKI KAISHA TOSHIBA, Toshiba Infrastructure Systems & Solutions Corporation
    Inventors: Tenta Sasaya, Takashi Watanabe, Toshiyuki Ono
  • Publication number: 20240046449
    Abstract: An inspection apparatus includes processing circuitry. The processing circuitry is configured to: acquire a first image and a second image for inspecting an inspection target; generate a plurality of deformed images by applying a plurality of deformation processes to at least one of the first image or the second image; calculate, for each pixel, a difference value between a pixel value of the first image and a pixel value of the second image, using the deformed images; calculate a pixel-by-pixel integrated difference value by integrating a plurality of difference values calculated for the respective deformed images; and detect an anomaly of the inspection target based on the pixel-by-pixel integrated difference value.
    Type: Application
    Filed: July 31, 2023
    Publication date: February 8, 2024
    Applicants: KABUSHIKI KAISHA TOSHIBA, NuFlare Technology, Inc.
    Inventors: Takashi Watanabe, Hiromu Inoue, Toshiyuki Ono
  • Publication number: 20230333064
    Abstract: According to one embodiment, a control method includes setting a transmission angle of an ultrasonic wave to a standard angle. The control method further includes transmitting an ultrasonic wave at the set transmission angle and detecting an intensity of a reflected wave from an object. The control method further includes calculating a tilt angle based on a gradient of the intensity. The tilt angle indicates a tilt of the object. The control method further includes resetting the transmission angle based on the tilt angle.
    Type: Application
    Filed: June 8, 2023
    Publication date: October 19, 2023
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Toshiyuki ONO, Atsushi MATSUMURA
  • Patent number: 11782426
    Abstract: An abnormality score calculation apparatus according to an embodiment includes a processing circuit configured to: acquire first data concerning a status of a product or a manufacturing process; calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types; and convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.
    Type: Grant
    Filed: February 26, 2021
    Date of Patent: October 10, 2023
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Jumpei Ando, Wataru Watanabe, Takayuki Itoh, Toshiyuki Ono
  • Patent number: 11775512
    Abstract: According to one embodiment, a data analysis apparatus includes a processor. The processor acquires, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product. The processor calculates, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.
    Type: Grant
    Filed: August 31, 2021
    Date of Patent: October 3, 2023
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Wataru Watanabe, Takayuki Itoh, Jumpei Ando, Keisuke Kawauchi, Toshiyuki Ono
  • Patent number: 11747424
    Abstract: A magnetic resonance imaging apparatus according to an embodiment includes an MRI system and a processing circuitry. The MRI system includes a receiving coil to receive a magnetic resonance signal. The processing circuitry is configured to generate an image based on the magnetic resonance signal, the image including a plurality of pixels; calculate a feature value corresponding to a signal value of the pixel; correct the feature values based on a sensitivity of the receiving coil; and reduce noise in the image based on distribution of the corrected feature values.
    Type: Grant
    Filed: March 2, 2022
    Date of Patent: September 5, 2023
    Assignee: CANON MEDICAL SYSTEMS CORPORATION
    Inventors: Kenzo Isogawa, Toshiyuki Ono, Kenichi Shimoyama, Nobuyuki Matsumoto, Shuhei Nitta, Satoshi Kawata, Toshimitsu Kaneko, Mai Murashima