Patents by Inventor Toyohiko Yamauchi
Toyohiko Yamauchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11698520Abstract: Systems and methods are provided for Quantitative Phase Microscopes (QPM) having laser systems including one or more of laser scissors and laser tweezers. In one embodiment, the system includes one or more structural elements, such as a stage and dichroic plate for operation of a QPM with laser scissors/tweezers. Another embodiment is directed to a method of operating a QPM system having laser scissors/tweezers. One or more solutions are provided for biodmedical applications of a QPM system including simulation and analysis of trauma on cellular structures and organelles. Processes are also provided for simulation and analysis of traumatic injury, including imaging and analysis of astrocytes.Type: GrantFiled: September 7, 2021Date of Patent: July 11, 2023Assignee: The Regents of the University of CaliforniaInventors: Michael W. Berns, Nicole Wakida, Daryl Preece, Toyohiko Yamauchi, Pegah Pouladian
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Patent number: 11630059Abstract: An interference image acquisition apparatus includes a light source, a beam splitter, a second reflection mirror, an imager, and a first reflection mirror. A cell is placed on one side of a transparent material, and the first reflection mirror is placed on the other side of the transparent material. In a two-beam interferometer, an optical path difference between an optical path length of a first light beam reflected by the first reflection mirror and an optical path length of a second light beam reflected by the second reflection mirror is set to a coherence length of light output from the light source or less. The imager acquires an interference image in a state in which the cell is placed at a position conjugate to an imaging plane in a first optical system between the imaging plane and the first reflection mirror.Type: GrantFiled: November 22, 2018Date of Patent: April 18, 2023Assignees: HAMAMATSU PHOTONICS K.K., NATIONAL UNIVERSITY CORPORATION HAMAMATSU UNIVERSITY SCHOOL OF MEDICINEInventors: Toyohiko Yamauchi, Kentaro Goto, Hisayuki Matsui, Satoshi Hirakawa, Hidenao Yamada
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Patent number: 11530434Abstract: An evaluation method is a method for evaluating a cell mass containing a plurality of aggregated cells, and includes an imaging step of capturing an image of light obtained from the cell mass by irradiating the cell mass with light, an analysis step of setting a reference point for the cell mass included in image data obtained by the imaging step, setting sampling circles centered on the reference point, and determining a parameter for a state of the cell mass based on image data included in regions on the sampling circles, and an evaluation step of evaluating the cell mass based on the parameter.Type: GrantFiled: March 13, 2018Date of Patent: December 20, 2022Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Kentaro Goto, Toyohiko Yamauchi, Hidenao Yamada
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Publication number: 20220107488Abstract: Systems and methods are provided for Quantitative Phase Microscopes (QPM) having laser systems including one or more of laser scissors and laser tweezers. In one embodiment, the system includes one or more structural elements, such as a stage and dichroic plate for operation of a QPM with laser scissors/tweezers. Another embodiment is directed to a method of operating a QPM system having laser scissors/tweezers. One or more solutions are provided for biodmedical applications of a QPM system including simulation and analysis of trauma on cellular structures and organelles. Processes are also provided for simulation and analysis of traumatic injury, including imaging and analysis of astrocytes.Type: ApplicationFiled: September 7, 2021Publication date: April 7, 2022Applicant: The Regents of the University of CaliforniaInventors: Michael W. BERNS, Nicole WAKIDA, Daryl PREECE, Toyohiko YAMAUCHI, Pegah POULADIAN
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Patent number: 11204324Abstract: A fluorescence measurement apparatus includes a fluorescence image acquisition unit that acquires a fluorescence image containing an object, an interference image acquisition unit that acquires an interference image containing the object, and an operation unit. The operation unit determines an optical thickness image based on the interference image acquired by the interference image acquisition unit, and determines, in a region of interest set in common in both of the fluorescence image acquired by the fluorescence image acquisition unit and the optical thickness image, a fluorescence expression rate of the object based on an integrated value of a fluorescence intensity in the fluorescence image and an integrated value of an optical thickness in the optical thickness image.Type: GrantFiled: October 30, 2018Date of Patent: December 21, 2021Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Hidenao Yamada
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Patent number: 11156448Abstract: An interference observation apparatus includes a light source, a splitting beam splitter, a combining beam splitter, a mirror, a beam splitter, a mirror, a piezo element, a stage, a photodetector, an image acquisition unit, and a current control unit. An interference optical system from the splitting beam splitter to the combining beam splitter forms a Mach-Zehnder interferometer. The current control unit controls a wavelength of laser light output from the light source to adjust a phase difference between two split light components at the combining by the combining beam splitter.Type: GrantFiled: December 7, 2016Date of Patent: October 26, 2021Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Hidenao Yamada
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Publication number: 20210102235Abstract: An evaluation method is a method for evaluating a cell mass containing a plurality of aggregated cells, and includes an imaging step of capturing an image of light obtained from the cell mass by irradiating the cell mass with light, an analysis step of setting a reference point for the cell mass included in image data obtained by the imaging step, setting sampling circles centered on the reference point, and determining a parameter for a state of the cell mass based on image data included in regions on the sampling circles, and an evaluation step of evaluating the cell mass based on the parameter.Type: ApplicationFiled: March 13, 2018Publication date: April 8, 2021Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Kentaro GOTO, Toyohiko YAMAUCHI, Hidenao YAMADA
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Publication number: 20200400562Abstract: An interference image acquisition apparatus includes a light source, a beam splitter, a second reflection mirror, an imager, and a first reflection mirror. A cell is placed on one side of a transparent material, and the first reflection mirror is placed on the other side of the transparent material. In a two-beam interferometer, an optical path difference between an optical path length of a first light beam reflected by the first reflection mirror and an optical path length of a second light beam reflected by the second reflection mirror is set to a coherence length of light output from the light source or less. The imager acquires an interference image in a state in which the cell is placed at a position conjugate to an imaging plane in a first optical system between the imaging plane and the first reflection mirror.Type: ApplicationFiled: November 22, 2018Publication date: December 24, 2020Applicants: HAMAMATSU PHOTONICS K.K., NATIONAL UNIVERSITY CORPORATION HAMAMATSU UNIVERSITY SCHOOL OF MEDICINEInventors: Toyohiko YAMAUCHI, Kentaro GOTO, Hisayuki MATSUI, Satoshi HIRAKAWA, Hidenao YAMADA
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Patent number: 10816319Abstract: A measurement apparatus includes an interference image acquisition unit, a fluorescence image acquisition unit, an operation unit, and a timing control circuit. The operation unit generates an optical thickness image based on an interference image acquired by the interference image acquisition unit, generates a mask image showing a region in which pixel values in a fluorescence image acquired by the fluorescence image acquisition unit are larger than a threshold value, and determines an integrated value of an optical thickness in the region shown by the mask image in the optical thickness image.Type: GrantFiled: September 5, 2019Date of Patent: October 27, 2020Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Osamu Yasuhiko, Hidenao Yamada, Hisayuki Matsui
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Publication number: 20200333250Abstract: A fluorescence measurement apparatus includes a fluorescence image acquisition unit that acquires a fluorescence image containing an object, an interference image acquisition unit that acquires an interference image containing the object, and an operation unit. The operation unit determines an optical thickness image based on the interference image acquired by the interference image acquisition unit, and determines, in a region of interest set in common in both of the fluorescence image acquired by the fluorescence image acquisition unit and the optical thickness image, a fluorescence expression rate of the object based on an integrated value of a fluorescence intensity in the fluorescence image and an integrated value of an optical thickness in the optical thickness image.Type: ApplicationFiled: October 30, 2018Publication date: October 22, 2020Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko YAMAUCHI, Hidenao YAMADA
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Publication number: 20200318942Abstract: Provided is an observation target cover for interference observation using first light and second light having a coherent length longer than that of the first light so as to acquire an interference light image of an observation target by the first light while adjusting an optical path length difference based on an interference result of the second light, the observation target cover including: a transmission reflection portion that transmits the first light and reflects the second light; and a support portion for supporting the transmission reflection portion so that a placement surface on which the observation target is placed and the transmission reflection portion face each other with a predetermined gap therebetween.Type: ApplicationFiled: October 11, 2018Publication date: October 8, 2020Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko YAMAUCHI, Hidenao YAMADA, Kentaro GOTO
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Publication number: 20200263972Abstract: An interference observation apparatus includes a light source, a splitting beam splitter, a combining beam splitter, a mirror, a beam splitter, a mirror, a piezo element, a stage, a photodetector, an image acquisition unit, and a current control unit. An interference optical system from the splitting beam splitter to the combining beam splitter forms a Mach-Zehnder interferometer. The current control unit controls a wavelength of laser light output from the light source to adjust a phase difference between two split light components at the combining by the combining beam splitter.Type: ApplicationFiled: December 7, 2016Publication date: August 20, 2020Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko YAMAUCHI, Hidenao YAMADA
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Publication number: 20200080833Abstract: A measurement apparatus includes an interference image acquisition unit, a fluorescence image acquisition unit, an operation unit, and a timing control circuit. The operation unit generates an optical thickness image based on an interference image acquired by the interference image acquisition unit, generates a mask image showing a region in which pixel values in a fluorescence image acquired by the fluorescence image acquisition unit are larger than a threshold value, and determines an integrated value of an optical thickness in the region shown by the mask image in the optical thickness image.Type: ApplicationFiled: September 5, 2019Publication date: March 12, 2020Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko YAMAUCHI, Osamu YASUHIKO, Hidenao YAMADA, Hisayuki MATSUI
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Patent number: 10551294Abstract: An observation apparatus observes an observation object moving in a flow path with a fluid, and includes a light source, a splitting unit, a combining unit, a collimator, a cylindrical lens, an objective lens, a collimator, a cylindrical lens, an objective lens, a modulation unit, an imaging unit, an analysis unit, and the like. The imaging unit includes a plurality of pixels arranged in a direction intersecting with a moving direction of an image of the observation object on a light receiving plane on which the image of the observation object moving in the flow path is formed, and receives combined light output from the combining unit to repeatedly output a detection signal indicating a one-dimensional interference image. The analysis unit generates a two-dimensional image of the observation object on the basis of the detection signal.Type: GrantFiled: March 2, 2017Date of Patent: February 4, 2020Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Hidenao Yamada, Toyohiko Yamauchi
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Patent number: 10451402Abstract: The present invention relates to a full-field reflection phase microscope. In a preferred embodiment, the invention can combine low-coherence interferometry and off-axis digital holographic microscopy (DHM). The reflection-based DHM provides highly sensitive and a single-shot imaging of cellular dynamics while the use of low coherence source provides a depth-selective measurement. A preferred embodiment of the system uses a diffraction grating in the reference arm to generate an interference image of uniform contrast over the entire field-of-view albeit low-coherence light source. With improved path-length sensitivity, the present invention is suitable for full-field measurement of membrane dynamics in live cells with sub-nanometer-scale sensitivity.Type: GrantFiled: January 25, 2012Date of Patent: October 22, 2019Assignees: Massachusetts Institute of Technology, Hamamatsu Photonics K.K.Inventors: Zahid Yaqoob, Wonshik Choi, Toyohiko Yamauchi, Michael Feld, David Feld, Alison Hearn, Jonathan Feld
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Patent number: 10422622Abstract: An interference observation apparatus includes an interference optical apparatus, a microscope housing, an imaging unit, and an objective lens. The interference optical apparatus includes a housing, a light source, a photodetector, beam splitters, a reference mirror, and a control unit. The interference observation apparatus is configured such that the housing of the interference optical apparatus is disposed between the objective lens attachment portion and the objective lens in a microscope apparatus including the imaging unit for capturing an image of the light passing through the objective lens attached to the objective lens attachment portion having an opening.Type: GrantFiled: December 14, 2015Date of Patent: September 24, 2019Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Hidenao Yamada
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Patent number: 10393500Abstract: An interference observation apparatus includes a light source which outputs incoherent light, a beam splitter, a sample holding table, an objective lens, a reference mirror, a lens, an aberration correction plate, a piezo element, a tube lens, a beam splitter, an imaging unit, a photodetector, an image acquisition unit, and a control unit. The control unit obtains an interference intensity of combined light on the basis of a detection signal output from the photodetector, and adjusts an interference optical system to increase the interference intensity.Type: GrantFiled: December 14, 2015Date of Patent: August 27, 2019Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Hidenao Yamada
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Patent number: 10359270Abstract: An interference observation apparatus includes a light source which outputs incoherent light, a beam splitter, a sample holding table, an objective lens, a reference mirror, a lens, an aberration correction plate, a piezo element, a tube lens, a beam splitter, an imaging unit, a photodetector, an image acquisition unit, and a control unit. The control unit obtains an interference intensity of combined light on the basis of a detection signal output from the photodetector, and adjusts an interference optical system to increase the interference intensity.Type: GrantFiled: December 14, 2015Date of Patent: July 23, 2019Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Hidenao Yamada
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Patent number: D901714Type: GrantFiled: June 4, 2018Date of Patent: November 10, 2020Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Hidenao Yamada
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Patent number: D960389Type: GrantFiled: March 20, 2020Date of Patent: August 9, 2022Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toyohiko Yamauchi, Hidenao Yamada