Patents by Inventor Toyohiko Yamauchi

Toyohiko Yamauchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11698520
    Abstract: Systems and methods are provided for Quantitative Phase Microscopes (QPM) having laser systems including one or more of laser scissors and laser tweezers. In one embodiment, the system includes one or more structural elements, such as a stage and dichroic plate for operation of a QPM with laser scissors/tweezers. Another embodiment is directed to a method of operating a QPM system having laser scissors/tweezers. One or more solutions are provided for biodmedical applications of a QPM system including simulation and analysis of trauma on cellular structures and organelles. Processes are also provided for simulation and analysis of traumatic injury, including imaging and analysis of astrocytes.
    Type: Grant
    Filed: September 7, 2021
    Date of Patent: July 11, 2023
    Assignee: The Regents of the University of California
    Inventors: Michael W. Berns, Nicole Wakida, Daryl Preece, Toyohiko Yamauchi, Pegah Pouladian
  • Patent number: 11630059
    Abstract: An interference image acquisition apparatus includes a light source, a beam splitter, a second reflection mirror, an imager, and a first reflection mirror. A cell is placed on one side of a transparent material, and the first reflection mirror is placed on the other side of the transparent material. In a two-beam interferometer, an optical path difference between an optical path length of a first light beam reflected by the first reflection mirror and an optical path length of a second light beam reflected by the second reflection mirror is set to a coherence length of light output from the light source or less. The imager acquires an interference image in a state in which the cell is placed at a position conjugate to an imaging plane in a first optical system between the imaging plane and the first reflection mirror.
    Type: Grant
    Filed: November 22, 2018
    Date of Patent: April 18, 2023
    Assignees: HAMAMATSU PHOTONICS K.K., NATIONAL UNIVERSITY CORPORATION HAMAMATSU UNIVERSITY SCHOOL OF MEDICINE
    Inventors: Toyohiko Yamauchi, Kentaro Goto, Hisayuki Matsui, Satoshi Hirakawa, Hidenao Yamada
  • Patent number: 11530434
    Abstract: An evaluation method is a method for evaluating a cell mass containing a plurality of aggregated cells, and includes an imaging step of capturing an image of light obtained from the cell mass by irradiating the cell mass with light, an analysis step of setting a reference point for the cell mass included in image data obtained by the imaging step, setting sampling circles centered on the reference point, and determining a parameter for a state of the cell mass based on image data included in regions on the sampling circles, and an evaluation step of evaluating the cell mass based on the parameter.
    Type: Grant
    Filed: March 13, 2018
    Date of Patent: December 20, 2022
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Kentaro Goto, Toyohiko Yamauchi, Hidenao Yamada
  • Publication number: 20220107488
    Abstract: Systems and methods are provided for Quantitative Phase Microscopes (QPM) having laser systems including one or more of laser scissors and laser tweezers. In one embodiment, the system includes one or more structural elements, such as a stage and dichroic plate for operation of a QPM with laser scissors/tweezers. Another embodiment is directed to a method of operating a QPM system having laser scissors/tweezers. One or more solutions are provided for biodmedical applications of a QPM system including simulation and analysis of trauma on cellular structures and organelles. Processes are also provided for simulation and analysis of traumatic injury, including imaging and analysis of astrocytes.
    Type: Application
    Filed: September 7, 2021
    Publication date: April 7, 2022
    Applicant: The Regents of the University of California
    Inventors: Michael W. BERNS, Nicole WAKIDA, Daryl PREECE, Toyohiko YAMAUCHI, Pegah POULADIAN
  • Patent number: 11204324
    Abstract: A fluorescence measurement apparatus includes a fluorescence image acquisition unit that acquires a fluorescence image containing an object, an interference image acquisition unit that acquires an interference image containing the object, and an operation unit. The operation unit determines an optical thickness image based on the interference image acquired by the interference image acquisition unit, and determines, in a region of interest set in common in both of the fluorescence image acquired by the fluorescence image acquisition unit and the optical thickness image, a fluorescence expression rate of the object based on an integrated value of a fluorescence intensity in the fluorescence image and an integrated value of an optical thickness in the optical thickness image.
    Type: Grant
    Filed: October 30, 2018
    Date of Patent: December 21, 2021
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Hidenao Yamada
  • Patent number: 11156448
    Abstract: An interference observation apparatus includes a light source, a splitting beam splitter, a combining beam splitter, a mirror, a beam splitter, a mirror, a piezo element, a stage, a photodetector, an image acquisition unit, and a current control unit. An interference optical system from the splitting beam splitter to the combining beam splitter forms a Mach-Zehnder interferometer. The current control unit controls a wavelength of laser light output from the light source to adjust a phase difference between two split light components at the combining by the combining beam splitter.
    Type: Grant
    Filed: December 7, 2016
    Date of Patent: October 26, 2021
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Hidenao Yamada
  • Publication number: 20210102235
    Abstract: An evaluation method is a method for evaluating a cell mass containing a plurality of aggregated cells, and includes an imaging step of capturing an image of light obtained from the cell mass by irradiating the cell mass with light, an analysis step of setting a reference point for the cell mass included in image data obtained by the imaging step, setting sampling circles centered on the reference point, and determining a parameter for a state of the cell mass based on image data included in regions on the sampling circles, and an evaluation step of evaluating the cell mass based on the parameter.
    Type: Application
    Filed: March 13, 2018
    Publication date: April 8, 2021
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Kentaro GOTO, Toyohiko YAMAUCHI, Hidenao YAMADA
  • Publication number: 20200400562
    Abstract: An interference image acquisition apparatus includes a light source, a beam splitter, a second reflection mirror, an imager, and a first reflection mirror. A cell is placed on one side of a transparent material, and the first reflection mirror is placed on the other side of the transparent material. In a two-beam interferometer, an optical path difference between an optical path length of a first light beam reflected by the first reflection mirror and an optical path length of a second light beam reflected by the second reflection mirror is set to a coherence length of light output from the light source or less. The imager acquires an interference image in a state in which the cell is placed at a position conjugate to an imaging plane in a first optical system between the imaging plane and the first reflection mirror.
    Type: Application
    Filed: November 22, 2018
    Publication date: December 24, 2020
    Applicants: HAMAMATSU PHOTONICS K.K., NATIONAL UNIVERSITY CORPORATION HAMAMATSU UNIVERSITY SCHOOL OF MEDICINE
    Inventors: Toyohiko YAMAUCHI, Kentaro GOTO, Hisayuki MATSUI, Satoshi HIRAKAWA, Hidenao YAMADA
  • Patent number: 10816319
    Abstract: A measurement apparatus includes an interference image acquisition unit, a fluorescence image acquisition unit, an operation unit, and a timing control circuit. The operation unit generates an optical thickness image based on an interference image acquired by the interference image acquisition unit, generates a mask image showing a region in which pixel values in a fluorescence image acquired by the fluorescence image acquisition unit are larger than a threshold value, and determines an integrated value of an optical thickness in the region shown by the mask image in the optical thickness image.
    Type: Grant
    Filed: September 5, 2019
    Date of Patent: October 27, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Osamu Yasuhiko, Hidenao Yamada, Hisayuki Matsui
  • Publication number: 20200333250
    Abstract: A fluorescence measurement apparatus includes a fluorescence image acquisition unit that acquires a fluorescence image containing an object, an interference image acquisition unit that acquires an interference image containing the object, and an operation unit. The operation unit determines an optical thickness image based on the interference image acquired by the interference image acquisition unit, and determines, in a region of interest set in common in both of the fluorescence image acquired by the fluorescence image acquisition unit and the optical thickness image, a fluorescence expression rate of the object based on an integrated value of a fluorescence intensity in the fluorescence image and an integrated value of an optical thickness in the optical thickness image.
    Type: Application
    Filed: October 30, 2018
    Publication date: October 22, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko YAMAUCHI, Hidenao YAMADA
  • Publication number: 20200318942
    Abstract: Provided is an observation target cover for interference observation using first light and second light having a coherent length longer than that of the first light so as to acquire an interference light image of an observation target by the first light while adjusting an optical path length difference based on an interference result of the second light, the observation target cover including: a transmission reflection portion that transmits the first light and reflects the second light; and a support portion for supporting the transmission reflection portion so that a placement surface on which the observation target is placed and the transmission reflection portion face each other with a predetermined gap therebetween.
    Type: Application
    Filed: October 11, 2018
    Publication date: October 8, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko YAMAUCHI, Hidenao YAMADA, Kentaro GOTO
  • Publication number: 20200263972
    Abstract: An interference observation apparatus includes a light source, a splitting beam splitter, a combining beam splitter, a mirror, a beam splitter, a mirror, a piezo element, a stage, a photodetector, an image acquisition unit, and a current control unit. An interference optical system from the splitting beam splitter to the combining beam splitter forms a Mach-Zehnder interferometer. The current control unit controls a wavelength of laser light output from the light source to adjust a phase difference between two split light components at the combining by the combining beam splitter.
    Type: Application
    Filed: December 7, 2016
    Publication date: August 20, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko YAMAUCHI, Hidenao YAMADA
  • Publication number: 20200080833
    Abstract: A measurement apparatus includes an interference image acquisition unit, a fluorescence image acquisition unit, an operation unit, and a timing control circuit. The operation unit generates an optical thickness image based on an interference image acquired by the interference image acquisition unit, generates a mask image showing a region in which pixel values in a fluorescence image acquired by the fluorescence image acquisition unit are larger than a threshold value, and determines an integrated value of an optical thickness in the region shown by the mask image in the optical thickness image.
    Type: Application
    Filed: September 5, 2019
    Publication date: March 12, 2020
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko YAMAUCHI, Osamu YASUHIKO, Hidenao YAMADA, Hisayuki MATSUI
  • Patent number: 10551294
    Abstract: An observation apparatus observes an observation object moving in a flow path with a fluid, and includes a light source, a splitting unit, a combining unit, a collimator, a cylindrical lens, an objective lens, a collimator, a cylindrical lens, an objective lens, a modulation unit, an imaging unit, an analysis unit, and the like. The imaging unit includes a plurality of pixels arranged in a direction intersecting with a moving direction of an image of the observation object on a light receiving plane on which the image of the observation object moving in the flow path is formed, and receives combined light output from the combining unit to repeatedly output a detection signal indicating a one-dimensional interference image. The analysis unit generates a two-dimensional image of the observation object on the basis of the detection signal.
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: February 4, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Hidenao Yamada, Toyohiko Yamauchi
  • Patent number: 10451402
    Abstract: The present invention relates to a full-field reflection phase microscope. In a preferred embodiment, the invention can combine low-coherence interferometry and off-axis digital holographic microscopy (DHM). The reflection-based DHM provides highly sensitive and a single-shot imaging of cellular dynamics while the use of low coherence source provides a depth-selective measurement. A preferred embodiment of the system uses a diffraction grating in the reference arm to generate an interference image of uniform contrast over the entire field-of-view albeit low-coherence light source. With improved path-length sensitivity, the present invention is suitable for full-field measurement of membrane dynamics in live cells with sub-nanometer-scale sensitivity.
    Type: Grant
    Filed: January 25, 2012
    Date of Patent: October 22, 2019
    Assignees: Massachusetts Institute of Technology, Hamamatsu Photonics K.K.
    Inventors: Zahid Yaqoob, Wonshik Choi, Toyohiko Yamauchi, Michael Feld, David Feld, Alison Hearn, Jonathan Feld
  • Patent number: 10422622
    Abstract: An interference observation apparatus includes an interference optical apparatus, a microscope housing, an imaging unit, and an objective lens. The interference optical apparatus includes a housing, a light source, a photodetector, beam splitters, a reference mirror, and a control unit. The interference observation apparatus is configured such that the housing of the interference optical apparatus is disposed between the objective lens attachment portion and the objective lens in a microscope apparatus including the imaging unit for capturing an image of the light passing through the objective lens attached to the objective lens attachment portion having an opening.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: September 24, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Hidenao Yamada
  • Patent number: 10393500
    Abstract: An interference observation apparatus includes a light source which outputs incoherent light, a beam splitter, a sample holding table, an objective lens, a reference mirror, a lens, an aberration correction plate, a piezo element, a tube lens, a beam splitter, an imaging unit, a photodetector, an image acquisition unit, and a control unit. The control unit obtains an interference intensity of combined light on the basis of a detection signal output from the photodetector, and adjusts an interference optical system to increase the interference intensity.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: August 27, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Hidenao Yamada
  • Patent number: 10359270
    Abstract: An interference observation apparatus includes a light source which outputs incoherent light, a beam splitter, a sample holding table, an objective lens, a reference mirror, a lens, an aberration correction plate, a piezo element, a tube lens, a beam splitter, an imaging unit, a photodetector, an image acquisition unit, and a control unit. The control unit obtains an interference intensity of combined light on the basis of a detection signal output from the photodetector, and adjusts an interference optical system to increase the interference intensity.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: July 23, 2019
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Hidenao Yamada
  • Patent number: D901714
    Type: Grant
    Filed: June 4, 2018
    Date of Patent: November 10, 2020
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Hidenao Yamada
  • Patent number: D960389
    Type: Grant
    Filed: March 20, 2020
    Date of Patent: August 9, 2022
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toyohiko Yamauchi, Hidenao Yamada