Patents by Inventor Tsuguhiko SATOU

Tsuguhiko SATOU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11860177
    Abstract: An analysis method of an automatic analyzer is provided. The automatic analyzer includes: an insertion unit into which a rack is inserted; a transport line that transports the rack; a detection unit that detects a rack identifier from a rack or an attribute from a sample container which accommodates therein a sample as an object to be examined and which is mounted on a rack; an analysis module that includes a light source and a spectrometer which measures a measurement value to analyze a sample; a rack standby unit in which a rack stands by; and, a rack recovery unit that recovers a rack. In the automatic analyzer, a rack stands by in the rack standby unit until a measurement result in the analysis module is output; and is then recovered to the rack recovery unit.
    Type: Grant
    Filed: July 7, 2020
    Date of Patent: January 2, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Satoshi Shibuya, Tsuguhiko Satou, Toshihide Hanawa
  • Publication number: 20200333367
    Abstract: An analysis method of an automatic analyzer is provided. The automatic analyzer includes: an insertion unit into which a rack is inserted; a transport line that transports the rack; a detection unit that detects a rack identifier from a rack or an attribute from a sample container which accommodates therein a sample as an object to be examined and which is mounted on a rack; an analysis module that includes a light source and a spectrometer which measures a measurement value to analyze a sample; a rack standby unit in which a rack stands by; and, a rack recovery unit that recovers a rack. In the automatic analyzer, a rack stands by in the rack standby unit until a measurement result in the analysis module is output; and is then recovered to the rack recovery unit.
    Type: Application
    Filed: July 7, 2020
    Publication date: October 22, 2020
    Inventors: Satoshi SHIBUYA, Tsuguhiko SATOU, Toshihide HANAWA
  • Patent number: 10746755
    Abstract: Provided is an automatic analyzer capable of switching an apparatus operation mode, such as automatic reexamination, without stopping measurement by efficiently using a rack. The automatic analyzer includes a storage unit that stores an operation mode, such as automatic reexamination, of the automatic analyzer, a detection unit that detects an operation mode switching rack inserted into an insertion unit, and a control unit that switches the operation mode stored in the storage unit on the basis of the detection of the operation mode switching rack by the detection unit. The control unit applies the switched operation mode to an examination object rack transported from the insertion unit to a transport line after the operation mode switching rack.
    Type: Grant
    Filed: February 1, 2016
    Date of Patent: August 18, 2020
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Satoshi Shibuya, Tsuguhiko Satou, Toshihide Hanawa
  • Patent number: 10234472
    Abstract: Disclosed is an automatic analysis device in which a check item at a time of an analysis start can be set in accordance with a skill level of an operator, an analysis can be performed after the check item being displayed and confirmed, and erroneous measurement caused due to a missed check can be prevented. The check item such as checking the remaining quantity of a reagent or the like displayed in a check screen before the analysis start can be set for each type of operator, each day, each time. The set check item is configured to be displayed in a screen before the analysis start, and unless the operator confirms the check item, the analysis start is not allowed in principle. An automatic analysis device which can prevent erroneous measurement caused due to a missed check of the operator before the analysis start is realized.
    Type: Grant
    Filed: April 7, 2015
    Date of Patent: March 19, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hirofumi Sasaki, Toshihide Hanawa, Tsuguhiko Satou, Yoshihiro Naitou
  • Publication number: 20180217173
    Abstract: Provided is an automatic analyser capable of switching an apparatus operation mode, such as automatic reexamination, without stopping measurement by efficiently using a rack. The automatic analyser includes a storage unit that stores an operation mode, such as automatic reexamination, of the automatic analyser, a detection unit that detects an operation mode switching rack inserted into an insertion unit, and a control unit that switches the operation mode stored in the storage unit on the basis of the detection of the operation mode switching rack by the detection unit. The control unit applies the switched operation mode to an examination object rack transported from the insertion unit to a transport line after the operation mode switching rack.
    Type: Application
    Filed: February 1, 2016
    Publication date: August 2, 2018
    Inventors: Satoshi SHIBUYA, Tsuguhiko SATOU, Toshihide HANAWA
  • Publication number: 20170212137
    Abstract: Disclosed is an automatic analysis device in which a check item at a time of an analysis start can be set in accordance with a skill level of an operator, an analysis can be performed after the check item being displayed and confirmed, and erroneous measurement caused due to a missed check can be prevented. The check item such as checking the remaining quantity of a reagent or the like displayed in a check screen before the analysis start can be set for each type of operator, each day, each time. The set check item is configured to be displayed in a screen before the analysis start, and unless the operator confirms the check item, the analysis start is not allowed in principle. An automatic analysis device which can prevent erroneous measurement caused due to a missed check of the operator before the analysis start is realized.
    Type: Application
    Filed: April 7, 2015
    Publication date: July 27, 2017
    Inventors: Hirofumi SASAKI, Toshihide HANAWA, Tsuguhiko SATOU, Yoshihiro NAITOU