Patents by Inventor Valquirio Nazare Carvalho

Valquirio Nazare Carvalho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for testing devices inside of carriers
    Patent number: 10983145
    Abstract: An example test system includes a carrier having a test socket to receive a device to test. The test socket includes electrical connections. The test system also includes a lid assembly having a socket cap to contact the device to apply pressure to cause the device to connect electrically to the electrical connections. The socket cap includes a material having a thermal conductivity that exceeds a defined value. The lid assembly also includes one or more structures configured to provide surface area over which heat from the device dissipates. The one or more structures are made of a material having a thermal conductivity that exceeds the defined value.
    Type: Grant
    Filed: April 24, 2018
    Date of Patent: April 20, 2021
    Assignee: TERADYNE, INC.
    Inventors: Larry W. Akers, Philip Campbell, Valquirio Nazare Carvalho, Shant Orchanian
  • System for testing devices inside of carriers
    Patent number: 10775408
    Abstract: An example test system includes a test carrier to receive a device to test. The test carrier includes test components to perform at least a structural test on the device. The example test system also includes a slot to receive the test carrier. The slot includes an interface to which the test carrier connects to enable the test carrier to communicate with a system that is part of the test system or external to the test system.
    Type: Grant
    Filed: August 20, 2018
    Date of Patent: September 15, 2020
    Assignee: TERADYNE, INC.
    Inventors: Valquirio Nazare Carvalho, Shant Orchanian, Peter Addison Reichert
  • CARRIER-BASED TEST SYSTEM
    Publication number: 20200057093
    Abstract: An example test system includes a test carrier to receive a device to test. The test carrier includes test components to perform at least a structural test on the device. The example test system also includes a slot to receive the test carrier. The slot includes an interface to which the test carrier connects to enable the test carrier to communicate with a system that is part of the test system or external to the test system.
    Type: Application
    Filed: August 20, 2018
    Publication date: February 20, 2020
    Inventors: Valquirio Nazare Carvalho, Shant Orchanian, Peter Addison Reichert
  • THERMAL CONTROL IN A TEST SYSTEM
    Publication number: 20190324056
    Abstract: An example test system includes a carrier having a test socket to receive a device to test. The test socket includes electrical connections. The test system also includes a lid assembly having a socket cap to contact the device to apply pressure to cause the device to connect electrically to the electrical connections. The socket cap includes a material having a thermal conductivity that exceeds a defined value. The lid assembly also includes one or more structures configured to provide surface area over which heat from the device dissipates. The one or more structures are made of a material having a thermal conductivity that exceeds the defined value.
    Type: Application
    Filed: April 24, 2018
    Publication date: October 24, 2019
    Inventors: Larry W. Akers, Philip Campbell, Valquirio Nazare Carvalho, Shant Orchanian