Patents by Inventor Vamsi Rayaprolu

Vamsi Rayaprolu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240127900
    Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a set of memory cells of the memory device; responsive to determining that the data validity metric value satisfies a first threshold criterion, performing a data integrity check on the set of memory cells to obtain a data integrity metric value; and responsive to determining that the data integrity metric value satisfies a second threshold criterion, performing an error handling operation on the data stored on the set of memory cells to generate corrected data.
    Type: Application
    Filed: December 22, 2023
    Publication date: April 18, 2024
    Inventors: Vamsi Rayaprolu, Ashutosh Malshe, Gary Besinga, Roy Leonard
  • Patent number: 11887681
    Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.
    Type: Grant
    Filed: February 18, 2022
    Date of Patent: January 30, 2024
    Assignee: Micron Technology, Inc.
    Inventors: Vamsi Rayaprolu, Ashutosh Malshe, Gary Besinga, Roy Leonard
  • Patent number: 11740805
    Abstract: A distribution statistic is generated for a data block of a memory component based on a reliability statistic for memory cells sampled in the data block. The distribution statistic is indicative of at least one of a uniformity or a non-uniformity of read disturb stress on the sampled memory cells. At least a subset of the data block is relocated to another data block of the memory component in view of the distribution statistic.
    Type: Grant
    Filed: June 10, 2022
    Date of Patent: August 29, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Vamsi Rayaprolu, Harish R. Singidi
  • Publication number: 20230268018
    Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.
    Type: Application
    Filed: February 18, 2022
    Publication date: August 24, 2023
    Inventors: Vamsi Rayaprolu, Ashutosh Malshe, Gary Besinga, Roy Leonard
  • Patent number: 11726874
    Abstract: A request to retrieve user data stored at a memory device is received and a first error control operation associated with the user data is performed. An indication of a failure of the first error control operation is received, and in response, a subset of system data stored at the memory device is identified. A second error control operation is performed on the subset of the system data to retrieve the subset of the system data stored at the memory device, and the user data is read by using the subset of the system data retrieved based on the performing of the second error control operation.
    Type: Grant
    Filed: March 1, 2021
    Date of Patent: August 15, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla
  • Publication number: 20220391104
    Abstract: A distribution statistic is generated for a data block of a memory component based on a reliability statistic for memory cells sampled in the data block. The distribution statistic is indicative of at least one of a uniformity or a non-uniformity of read disturb stress on the sampled memory cells. At least a subset of the data block is relocated to another data block of the memory component in view of the distribution statistic.
    Type: Application
    Filed: June 10, 2022
    Publication date: December 8, 2022
    Inventors: Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Vamsi Rayaprolu, Harish R. Singidi
  • Publication number: 20210191816
    Abstract: A request to retrieve user data stored at a memory device is received and a first error control operation associated with the user data is performed. An indication of a failure of the first error control operation is received, and in response, a subset of system data stored at the memory device is identified. A second error control operation is performed on the subset of the system data to retrieve the subset of the system data stored at the memory device, and the user data is read by using the subset of the system data retrieved based on the performing of the second error control operation.
    Type: Application
    Filed: March 1, 2021
    Publication date: June 24, 2021
    Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla
  • Patent number: 11024394
    Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
    Type: Grant
    Filed: April 9, 2020
    Date of Patent: June 1, 2021
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, Jr., Michael Miller
  • Patent number: 10963340
    Abstract: User data that is to be stored at a memory system can be received. System data associated with the memory system can be identified and the user data and the system data can be stored at the memory system based on an error control operation. A subset of the system data can be identified and the subset of the system data can be stored at the memory system based on another error control operation.
    Type: Grant
    Filed: July 6, 2018
    Date of Patent: March 30, 2021
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla
  • Publication number: 20200234775
    Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
    Type: Application
    Filed: April 9, 2020
    Publication date: July 23, 2020
    Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, JR., Michael Miller
  • Patent number: 10658047
    Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: May 19, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, Jr., Michael Miller
  • Publication number: 20200135279
    Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
    Type: Application
    Filed: October 31, 2018
    Publication date: April 30, 2020
    Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, JR., Michael Miller
  • Publication number: 20190227870
    Abstract: User data that is to be stored at a memory system can be received. System data associated with the memory system can be identified and the user data and the system data can be stored at the memory system based on an error control operation. A subset of the system data can be identified and the subset of the system data can be stored at the memory system based on another error control operation.
    Type: Application
    Filed: July 6, 2018
    Publication date: July 25, 2019
    Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla