Patents by Inventor Vamsi Rayaprolu
Vamsi Rayaprolu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240127900Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a set of memory cells of the memory device; responsive to determining that the data validity metric value satisfies a first threshold criterion, performing a data integrity check on the set of memory cells to obtain a data integrity metric value; and responsive to determining that the data integrity metric value satisfies a second threshold criterion, performing an error handling operation on the data stored on the set of memory cells to generate corrected data.Type: ApplicationFiled: December 22, 2023Publication date: April 18, 2024Inventors: Vamsi Rayaprolu, Ashutosh Malshe, Gary Besinga, Roy Leonard
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Patent number: 11887681Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.Type: GrantFiled: February 18, 2022Date of Patent: January 30, 2024Assignee: Micron Technology, Inc.Inventors: Vamsi Rayaprolu, Ashutosh Malshe, Gary Besinga, Roy Leonard
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Patent number: 11740805Abstract: A distribution statistic is generated for a data block of a memory component based on a reliability statistic for memory cells sampled in the data block. The distribution statistic is indicative of at least one of a uniformity or a non-uniformity of read disturb stress on the sampled memory cells. At least a subset of the data block is relocated to another data block of the memory component in view of the distribution statistic.Type: GrantFiled: June 10, 2022Date of Patent: August 29, 2023Assignee: Micron Technology, Inc.Inventors: Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Vamsi Rayaprolu, Harish R. Singidi
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Publication number: 20230268018Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.Type: ApplicationFiled: February 18, 2022Publication date: August 24, 2023Inventors: Vamsi Rayaprolu, Ashutosh Malshe, Gary Besinga, Roy Leonard
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Patent number: 11726874Abstract: A request to retrieve user data stored at a memory device is received and a first error control operation associated with the user data is performed. An indication of a failure of the first error control operation is received, and in response, a subset of system data stored at the memory device is identified. A second error control operation is performed on the subset of the system data to retrieve the subset of the system data stored at the memory device, and the user data is read by using the subset of the system data retrieved based on the performing of the second error control operation.Type: GrantFiled: March 1, 2021Date of Patent: August 15, 2023Assignee: Micron Technology, Inc.Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla
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Publication number: 20220391104Abstract: A distribution statistic is generated for a data block of a memory component based on a reliability statistic for memory cells sampled in the data block. The distribution statistic is indicative of at least one of a uniformity or a non-uniformity of read disturb stress on the sampled memory cells. At least a subset of the data block is relocated to another data block of the memory component in view of the distribution statistic.Type: ApplicationFiled: June 10, 2022Publication date: December 8, 2022Inventors: Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Vamsi Rayaprolu, Harish R. Singidi
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Publication number: 20210191816Abstract: A request to retrieve user data stored at a memory device is received and a first error control operation associated with the user data is performed. An indication of a failure of the first error control operation is received, and in response, a subset of system data stored at the memory device is identified. A second error control operation is performed on the subset of the system data to retrieve the subset of the system data stored at the memory device, and the user data is read by using the subset of the system data retrieved based on the performing of the second error control operation.Type: ApplicationFiled: March 1, 2021Publication date: June 24, 2021Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla
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Patent number: 11024394Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.Type: GrantFiled: April 9, 2020Date of Patent: June 1, 2021Assignee: MICRON TECHNOLOGY, INC.Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, Jr., Michael Miller
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Patent number: 10963340Abstract: User data that is to be stored at a memory system can be received. System data associated with the memory system can be identified and the user data and the system data can be stored at the memory system based on an error control operation. A subset of the system data can be identified and the subset of the system data can be stored at the memory system based on another error control operation.Type: GrantFiled: July 6, 2018Date of Patent: March 30, 2021Assignee: MICRON TECHNOLOGY, INC.Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla
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Publication number: 20200234775Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.Type: ApplicationFiled: April 9, 2020Publication date: July 23, 2020Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, JR., Michael Miller
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Patent number: 10658047Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.Type: GrantFiled: October 31, 2018Date of Patent: May 19, 2020Assignee: Micron Technology, Inc.Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, Jr., Michael Miller
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Publication number: 20200135279Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.Type: ApplicationFiled: October 31, 2018Publication date: April 30, 2020Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, JR., Michael Miller
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Publication number: 20190227870Abstract: User data that is to be stored at a memory system can be received. System data associated with the memory system can be identified and the user data and the system data can be stored at the memory system based on an error control operation. A subset of the system data can be identified and the subset of the system data can be stored at the memory system based on another error control operation.Type: ApplicationFiled: July 6, 2018Publication date: July 25, 2019Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla