Patents by Inventor Vidushi Walia

Vidushi Walia has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240145037
    Abstract: This disclosure relates generally to identifying candidate genome sequences. Next generation sequencing (NGS) is a massively parallel sequencing technique for identifying candidate genome sequences. The current state-of-the-art techniques for identifying candidate genome sequences does not efficiently address the problem of distributing abundance values across several related strains that are present in the reference under the same species. The disclosed technique proposes a technique for identifying candidate genome sequences by estimating coverage. The disclosed technique includes a local search-based optimization to compute maximum likelihood-based estimates using constrains on coverage/cardinality thresholds for identifying candidate genome sequences.
    Type: Application
    Filed: September 20, 2023
    Publication date: May 2, 2024
    Applicant: Tata Consultancy Services Limited
    Inventors: VIDUSHI WALIA, SAIPRADEEP VANGALA GOVINDAKRISHNAN, NAVEEN SIVADASAN, RAJGOPAL SRINIVASAN
  • Patent number: 11915792
    Abstract: This disclosure relates generally to a method and a system for profiling of metagenome samples. Most state of-art techniques for metagenomic profiling use homology-based, curated database of identified marker sequences generated after complex and costly pre-processing. The disclosed method and system for profiling of metagenome samples are a non-homology based, a non-marker based and an alignment free strain level profiling tools for microbe profiling. The disclosure works with a several k-mer based indexing techniques for constructing a compact and comprehensive multi-level indexing, wherein the multi-level indexing includes a L1-Index and a L2-Index. The multi-level indexing is used for profiling metagenomics by abundance estimation, wherein the abundance estimation includes a relative abundance and an absolute abundance.
    Type: Grant
    Filed: May 5, 2022
    Date of Patent: February 27, 2024
    Assignee: TATA CONSULTANCY SERVICES LIMITED
    Inventors: Vidushi Walia, Naveen Sivadasan, Rajgopal Srinivasan, Kota Krishna Priya
  • Publication number: 20220392565
    Abstract: This disclosure relates generally to a method and a system for profiling of metagenome samples. Most state of-art techniques for metagenomic profiling use homology-based, curated database of identified marker sequences generated after complex and costly pre-processing. The disclosed method and system for profiling of metagenome samples are a non-homology based, a non-marker based and an alignment free strain level profiling tools for microbe profiling. The disclosure works with a several k-mer based indexing techniques for constructing a compact and comprehensive multi-level indexing, wherein the multi-level indexing includes a L1-Index and a L2-Index. The multi-level indexing is used for profiling metagenomics by abundance estimation, wherein the abundance estimation includes a relative abundance and an absolute abundance.
    Type: Application
    Filed: May 5, 2022
    Publication date: December 8, 2022
    Applicant: Tata Consultancy Services Limited
    Inventors: Vidushi Walia, Naveen Sivadasan, Rajgopal Srinivasan, Kota Krishna Priya