Patents by Inventor Walter E. Reynolds

Walter E. Reynolds has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of operating ion trap detector in MS/MS mode
    Patent number: 4736101
    Abstract: A simple and economical method of mass analyzing a sample by means of a quadrupole ion trap mass spectrometer in an MS/MS mode comprises the steps of forming ions within a trap structure, changing the RF and DC voltages in such a way that the ions with mass-to-charge ratios within a desired range will be and remain trapped within the trap structure, dissociating such ions into fragments by collisions and increasing the field intensity again so that the generated fragments will become unstable and exit the trap volume sequentially to be detected. A supplementary AC field may be applied additionally to provide various scan modes as well as dissociate the ions.
    Type: Grant
    Filed: August 11, 1987
    Date of Patent: April 5, 1988
    Assignee: Finnigan Corporation
    Inventors: John E. P. Syka, John N. Louris, Paul E. Kelley, George C. Stafford, Walter E. Reynolds
  • Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap
    Patent number: 4650999
    Abstract: The method of operating a quadrupole ion trap in which the mass range of interest is analyzed in segments by trapping ions of successive mass ranges within the segments whereby the operating parameters for each segment may be selected to improve sensitivity and resolution.
    Type: Grant
    Filed: October 22, 1984
    Date of Patent: March 17, 1987
    Assignee: Finnigan Corporation
    Inventors: William J. Fies, Jr., Paul E. Kelley, Walter E. Reynolds, George C. Stafford, Jr., John E. P. Syka
  • Method of operating ion trap detector in MS/MS mode
    Patent number: RE34000
    Abstract: A simple and economical method of mass analyzing a sample by means of a quadrupole ion trap mass spectrometer in an MS/MS mode comprises the steps of forming ions within a trap structure, changing the RF and DC voltages in such a way that the ions with mass-to-charge ratios within a desired range will be and remain trapped within the trap structure, dissociating such ions into fragments by collisions and increasing the field intensity again so that the generated fragments will become unstable and exit the trap volume sequentially to be detected. A supplementary AC field may be applied additionally to provide various scan modes as well as dissociate the ions.
    Type: Grant
    Filed: March 27, 1990
    Date of Patent: July 21, 1992
    Assignee: Finnigan Corporation
    Inventors: John E. P. Syka, John N. Louris, Paul E. Kelley, George C. Stafford, Walter E. Reynolds