Patents by Inventor Walter L. Smith
Walter L. Smith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11944779Abstract: An intravenous fluid bag supporting assembly includes a mobile base having a plurality of wheels, a telescoping pole having a lower end connected with the base and an inverted polyhedron structure connected with an upper end of the pole and configured to receive at least one intravenous fluid bag. An adjustable light assembly is arranged on the pole in spaced relation between the inverted polyhedron structure and the base. A support platform is arranged on the pole in spaced relation between the light assembly and the base, the support platform supporting a plurality of housings configured to receive a plurality of displays and pumps or other medical instruments, respectively. A hang grip and basket are also arranged on the pole.Type: GrantFiled: October 19, 2020Date of Patent: April 2, 2024Inventor: Walter L. Smith
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Publication number: 20220118175Abstract: An intravenous fluid bag supporting assembly includes a mobile base having a plurality of wheels, a telescoping pole having a lower end connected with the base and an inverted polyhedron structure connected with an upper end of the pole and configured to receive at least one intravenous fluid bag. An adjustable light assembly is arranged on the pole in spaced relation between the inverted polyhedron structure and the base. A support platform is arranged on the pole in spaced relation between the light assembly and the base, the support platform supporting a plurality of housings configured to receive a plurality of displays and pumps or other medical instruments, respectively. A hang grip and basket are also arranged on the pole.Type: ApplicationFiled: October 19, 2020Publication date: April 21, 2022Inventor: Walter L. Smith
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Patent number: 6993707Abstract: A method of saving and retrieving a selected string on an HTML-based document. A cursor is placed at a location on the document. The number of HTML tags are counted between the beginning of the document and the position of the cursor. The count of HTML tags is saved in association with the URL of the document. When the document at the URL is retrieved at a later time, the string at the location of the previously set cursor is retrieved and communicated to the end user.Type: GrantFiled: August 6, 2004Date of Patent: January 31, 2006Assignee: Freedom Scientific, Inc.Inventors: David Baker, Walter L. Smith
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Publication number: 20020195388Abstract: An improved leaf disc filter segment having a central drainage plate and a hub defining a central cavity. The drainage plate has radial beams and diametrical rings. The diametrical rings extend generally one-half of the height of the radial beams and are configured to alternately extend from either an upper surface or a lower surface of the radial beams such that the diametrical rings are alternately positioned in either an upper portion or lower portion of the drainage plate. The radial beams and diametrical rings define radial flow paths through the drainage plate to the central cavity through openings in the hub. The radial beams and diametrical rings are configured to provide trapezoidal openings of generally constant area to the flow channels of the drainage plate.Type: ApplicationFiled: May 20, 2002Publication date: December 26, 2002Inventors: Stephen E. Sierens, Walter L. Smith, James Allen Morton, Stephen Neubert, James A. McGrath
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Publication number: 20020092804Abstract: A polymer filtration unit with a filter housing that is adapted to receive a removable housing insert. The housing insert adapts the housing to receiving multiple fluid flow rates through the filter housing while enabling the fluid to remain in the housing for the same residence time. The housing insert can enable the housing to be formed of a first material while the housing insert is formed of a second material.Type: ApplicationFiled: November 19, 2001Publication date: July 18, 2002Inventor: Walter L. Smith
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Patent number: 6408882Abstract: An apparatus and method is disclosed for an improved diverter valve comprising a valve housing defining an internal chamber. A main port and a first and a second port communicate with the internal chamber in a Y-shape configuration. A spool valve element is slidably disposed within the internal chamber of the valve housing. An actuator moves the spool valve element between a first position and a second position for diverting fluid between the main port and the first port and the main port and the second port. The improved diverter valve is suitable for use with viscous fluids operating under high or low temperature and high pressure.Type: GrantFiled: November 8, 2000Date of Patent: June 25, 2002Inventor: Walter L. Smith, Jr.
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Patent number: 5228776Abstract: An apparatus is disclosed for evaluating thermal and electrical characteristics of a sample. An intensity modulated pump beam is focused onto the surface of a sample at one spot. A non-modulated probe beam is focused onto the sample at a second spot, spaced laterally and vertically from the first spot. The distance between the two spots is at least two microns. The modulated power of the reflected probe beam that is in phase with the pump beam modulation frequency is monitored to provide information about the characteristics of the sample. The apparatus is particularly useful in evaluating the integrity of metal lines and vias in a semiconductor sample.Type: GrantFiled: May 6, 1992Date of Patent: July 20, 1993Assignee: Therma-Wave, Inc.Inventors: Walter L. Smith, Clifford G. Wells, Allan Rosencwaig
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Patent number: 5042952Abstract: A method and apparatus are disclosed for evaluating surface and subsurface features in a semiconductor sample. In operation, a periodic energy source is applied to the surface of the semiconductor sample to generate a periodic electron-hole plasma. This plasma interacts with features in the sample as it diffuses. The plasma affects the index of refraction of the sample and the changing plasma density is monitored using a radiation probe. In the preferred embodiment, the radiation probe measures the plasma induced periodic changes of reflectivity of the surface of the sample to yield information about the sample, such as ion dopant concentrations, residue deposits and defects.Type: GrantFiled: July 9, 1990Date of Patent: August 27, 1991Assignee: Therma-Wave, Inc.Inventors: Jon Opsal, Allan Rosencwaig, Walter L. Smith
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Patent number: 4952063Abstract: A method and apparatus are disclosed for evaluating surface and subsurface features in a semiconductor sample. In operation, a periodic energy source is applied to the surface of the semiconductor sample to generate a periodic electron-hole plasma. This plasma interacts with features in the sample as it diffuses. The plasma affects the index of refraction of the sample and the changing plasma density is monitored using a radiation probe. In the preferred embodiment, the radiation probe measures the plasma induced periodic changes of reflectivity of the surface of the sample to yield information about the sample, such as ion dopant concentrations, residue deposits and defects.Type: GrantFiled: May 15, 1989Date of Patent: August 28, 1990Assignee: Therma-Wave, Inc.Inventors: Jon Opsal, Allan Rosencwaig, Walter L. Smith
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Patent number: 4854710Abstract: A method and apparatus are disclosed for evaluating surface and subsurface features in a semiconductor sample. In operation, a periodic energy source is applied to the surface of the semiconductor sample to generate a periodic electron-hole plasma. This plasma interacts with features in the sample as it diffuses. The plasma affects the index of refraction of the sample and the changing plasma density is monitored using a radiation probe. In the preferred embodiment, the radiation probe measures the plasma induced periodic changes of reflectivity of the surface of the sample to yield information about the sample, such as ion dopant concentrations, residue deposits and defects.Type: GrantFiled: July 23, 1987Date of Patent: August 8, 1989Assignee: Therma-Wave, Inc.Inventors: Jon Opsal, Allan Rosencwaig, Walter L. Smith
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Patent number: 4750822Abstract: A method and apparatus is disclosed for detecting defect surface states in any material and in particular semiconductors. In the subject device, a periodic localized excitation is generated at the surface of the sample with an intensity modulated pump laser beam. A probe laser beam is directed to the surface of the sample and changes in the probe beam which are in phase with the modulated pump frequency are detected. In the preferred embodiment, periodic changes in the optical reflectivity of the surface of the sample induced by an intensity modulated excitation beam are detected by measuring the corresponding modulations in the reflected power of the probe beam. Any time dependence of the probe beam modulated reflectance signal is monitored. An evaluation of defect surface states is then made by investigating the time dependence of the magnitude and/or phase of this probe beam modulated reflectance signal.Type: GrantFiled: March 28, 1986Date of Patent: June 14, 1988Assignee: Therma-Wave, Inc.Inventors: Allan Rosencwaig, Jon Opsal, Walter L. Smith
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Patent number: 4636088Abstract: An apparatus and method is disclosed for evaluating surface conditions on a sample. The system is particularly suited for detecting thin residues encountered in semiconductor lithographic and etching processes. The system is also capable of measuring ion implanted dopant concentrations prior to annealing. The apparatus includes an intensity modulated laser beam which is focused on the surface of the sample to generate periodic heating. A second light beam is focused onto the periodically heated area of the sample in a manner such that it is reflected to a detector. The intensity changes in the probe beam, resulting from the temperature induced changes of reflectivity at the surface of the sample, are measured and evaluated to determine the absence or presence of residues, or to measure the concentrations of ion implanted dopants.Type: GrantFiled: May 21, 1984Date of Patent: January 13, 1987Assignee: Therma-Wave, Inc.Inventors: Allan Rosencwaig, Walter L. Smith
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Patent number: 4579463Abstract: A method and apparatus is disclosed for detecting thermal waves. This system is based on the measurement of the change in reflectivity at the sample surface which is a function of the changing surface temperature. The apparatus includes a radiation probe beam that is directed on a portion of the area which is being periodically heated. A photodetector is aligned to sense the intensity changes in the reflected radiation probe beam which results from the periodic heating. These signals are processed to detect the presence of thermal waves.Type: GrantFiled: May 21, 1984Date of Patent: April 1, 1986Assignee: Therma-Wave PartnersInventors: Allan Rosencwaig, Jon Opsal, Walter L. Smith, David L. Willenborg