Patents by Inventor Walter Lee Smith
Walter Lee Smith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240090491Abstract: An insert for an arthropod trapping device. The insert comprising a substrate and a frame for supporting the substrate, where a surface of the substrate has an adhesive disposed thereon, an optional mounting bracket spaced apart from the adhesive surface of the insert and located at a first end of the insert, and an optional graspable tab extending from the frame at a second end of the insert.Type: ApplicationFiled: November 20, 2023Publication date: March 21, 2024Inventors: Christopher Lawrence SMITH, Benjamin Patrick HALE, Adam James BURT, Erik John HASENOEHRL, Danilo ROSSI, Andrea PEDROTTI, Walter SORDO, Alessio GIOVANELLI, Brian Lee FLOYD, Hirotaka UCHIYAMA, Thomas Bernard WALKER, III, Anthony Xavier Jean-Yves CLERC
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Publication number: 20230263726Abstract: A layered edible product includes a core and at least one active layer that is supported by the core. The at least one active layer can include a respective API. The edible product is configured to be placed against a mucosal surface of the oral cavity, which causes the respective API of the at least one active layer to enter the bloodstream through the mucosal surface. The core can be ingested gastrointestinally or can be dissolvable against the mucosal surface or both. The core can include a core API, or optionally the core can be API-free.Type: ApplicationFiled: February 17, 2023Publication date: August 24, 2023Inventors: Walter Lee Smith, William Warren
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Publication number: 20230118618Abstract: Methods and apparatus are described for delivering API to a smokable structures and tea bags that contain a fill material. The fill material can include cannabis plant matter, such as cannabis flowers. In one example, an injection tube can be inserted into a smokable structure, and the API can be emitted as a spray. Other methods examples of delivering API to smokable structures are disclosed.Type: ApplicationFiled: October 18, 2022Publication date: April 20, 2023Inventors: William Warren, Walter Lee Smith, David A. Doyle
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Publication number: 20230077762Abstract: This present disclosure provides reliable methods and apparatus for delivering microdroplets containing an active pharmaceutical ingredient (API) to underlying substrates. A control system is provided to ensure that the API dosage is both accurate and repeatable.Type: ApplicationFiled: September 14, 2022Publication date: March 16, 2023Inventors: William Warren, Walter Lee Smith
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Publication number: 20220386670Abstract: This present disclosure provides reliable methods and apparatus for delivering a pharmaceutical active ingredient to a food product that is produced in a batch process. In one example, the active pharmaceutical ingredient is added after the batch food product has been cooked and cooled. The food product can be a candy, a baked good, or any alternative food product that is mixed as a batch and subsequently cooked and cooled.Type: ApplicationFiled: June 6, 2022Publication date: December 8, 2022Inventors: William Warren, Walter Lee Smith
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Patent number: 8543557Abstract: An optical metrology includes a library, a metrology tool and a library evolution tool. The library is generated to include a series of predicted measurements. Each predicted measurement is intended to match the measurements that a metrology device would record when analyzing a corresponding physical structure. The metrology tool compares its empirical measurements to the predicted measurements in the library. If a match is found, the metrology tool extracts a description of the corresponding physical structure from the library. The library evolution tool operates to improve the efficiency of the library. To make these improvements, the library evolution tool statistically analyzes the usage pattern of the library. Based on this analysis, the library evolution tool increases the resolution of commonly used portions of the library. The library evolution tool may also optionally reduce the resolution of less used portions of the library.Type: GrantFiled: April 1, 2005Date of Patent: September 24, 2013Assignee: KLA-Tencor CorporationInventors: David M. Aikens, Youxian Wen, Walter Lee Smith
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Patent number: 7400402Abstract: An apparatus for scatterometry measurements is disclosed. The apparatus includes a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample and the modulated optical response is measured. The measured data is subjected to a scatterometry analysis in order to evaluate geometrical sample features that induce light scattering.Type: GrantFiled: January 24, 2007Date of Patent: July 15, 2008Assignee: KLA-Tencor Corp.Inventor: Walter Lee Smith
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Patent number: 7239390Abstract: An apparatus for scatterometry measurements is disclosed. The apparatus includes a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample and the modulated optical response is measured. The measured data is subjected to a scatterometry analysis in order to evaluate geometrical sample features that induce light scattering.Type: GrantFiled: March 24, 2005Date of Patent: July 3, 2007Assignee: Therma-Wave, Inc.Inventor: Walter Lee Smith
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Patent number: 6982567Abstract: A combination metrology tool is disclosed for analyzing samples, and in particular semiconductor samples. The device includes a first measurement module for determining electrical characteristics of the sample. In general, such a measurement module will monitor electrical characteristics to derive information such as carrier lifetimes, diffusion lengths and surface doping. The device also includes a second measurement module for determining compositional characteristics such as layer thickness, index of refraction and extinction coefficient. The second measurement module will include a light source for generating a probe beam which interacts with the sample. A detection system is provided for monitoring either the change in magnitude or polarization state of the probe beam. The output signals from both measurement modules are combined by a processor to more accurately evaluate the sample.Type: GrantFiled: May 11, 2004Date of Patent: January 3, 2006Assignee: Therma-Wave, Inc.Inventor: Walter Lee Smith
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Patent number: 6950190Abstract: The use of scatterometry measurements is proposed for the evaluation of the implantation or annealing of dopants in a semiconductor. In accordance with the subject method, a probe beam of light illuminates the wafer having the dopants implanted therein. The light reflected from the sample is measured and subjected to a scatterometry analysis. The information derived is correlated to the implant region so that parameters of the implant, such as depth of a junction and lateral spreading of the implant or the dose of implanted ions can be evaluated.Type: GrantFiled: January 9, 2003Date of Patent: September 27, 2005Assignee: Therma-Wave, Inc.Inventor: Walter Lee Smith
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Patent number: 6898596Abstract: An optical metrology includes a library, a metrology tool and a library evolution tool. The library is generated to include a series of predicted measurements. Each predicted measurement is intended to match the measurements that a metrology device would record when analyzing a corresponding physical structure. The metrology tool compares its empirical measurements to the predicted measurements in the library. If a match is found, the metrology tool extracts a description of the corresponding physical structure from the library. The library evolution tool operates to improve the efficiency of the library. To make these improvements, the library evolution tool statistically analyzes the usage pattern of the library. Based on this analysis, the library evolution tool increases the resolution of commonly used portions of the library. The library evolution tool may also optionally reduce the resolution of less used portions of the library.Type: GrantFiled: May 14, 2002Date of Patent: May 24, 2005Assignee: Therma-Wave, Inc.Inventors: David M. Aikens, Youxian Wen, Walter Lee Smith
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Patent number: 6888632Abstract: An apparatus for scatterometry measurements is disclosed. The apparatus includes a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample and the modulated optical response is measured. The measured data is subjected to a scatterometry analysis in order to evaluate geometrical sample features that induce light scattering.Type: GrantFiled: February 28, 2003Date of Patent: May 3, 2005Assignee: Therma-Wave, Inc.Inventor: Walter Lee Smith
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Publication number: 20040207427Abstract: A combination metrology tool is disclosed for analyzing samples, and in particular semiconductor samples. The device includes a first measurement module for determining electrical characteristics of the sample. In general, such a measurement module will monitor electrical characteristics to derive information such as carrier lifetimes, diffusion lengths and surface doping. The device also includes a second measurement module for determining compositional characteristics such as layer thickness, index of refraction and extinction coefficient. The second measurement module will include a light source for generating a probe beam which interacts with the sample. A detection system is provided for monitoring either the change in magnitude or polarization state of the probe beam. The output signals from both measurement modules are combined by a processor to more accurately evaluate the sample.Type: ApplicationFiled: May 11, 2004Publication date: October 21, 2004Inventor: Walter Lee Smith
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Patent number: 6791310Abstract: A combination metrology tool is disclosed for analyzing samples, and in particular semiconductor samples. The device includes a first measurement module for determining electrical characteristics of the sample. In general, such a measurement module will monitor voltage or capacitance characteristics to derive information such as carrier lifetimes, diffusion lengths and surface doping. The device also includes a second measurement module for determining compositional characteristics such as layer thickness, index of refraction and extinction coefficient. The second measurement module will include a light source for generating a probe beam which interacts with the sample. A detection system is provided for monitoring either the change in magnitude or polarization state of the probe beam. The output signals from both measurement modules are combined by a processor to more accurately evaluate the sample.Type: GrantFiled: July 26, 2002Date of Patent: September 14, 2004Assignee: Therma-Wave, Inc.Inventor: Walter Lee Smith
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Publication number: 20040169859Abstract: An apparatus for scatterometry measurements is disclosed. The apparatus includes a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample and the modulated optical response is measured. The measured data is subjected to a scatterometry analysis in order to evaluate geometrical sample features that induce light scattering.Type: ApplicationFiled: February 28, 2003Publication date: September 2, 2004Inventor: Walter Lee Smith
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Publication number: 20040136003Abstract: The use of scatterometry measurements is proposed for the evaluation of the implantation or annealing of dopants in a semiconductor. In accordance with the subject method, a probe beam of light illuminates the wafer having the dopants implanted therein. The light reflected from the sample is measured and subjected to a scatterometry analysis. The information derived is correlated to the implant region so that parameters of the implant, such as depth of a junction and lateral spreading of the implant or the dose of implanted ions can be evaluated.Type: ApplicationFiled: January 9, 2003Publication date: July 15, 2004Inventor: Walter Lee Smith
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Publication number: 20030076511Abstract: An optical metrology includes a library, a metrology tool and a library evolution tool. The library is generated to include a series of predicted measurements. Each predicted measurement is intended to match the measurements that a metrology device would record when analyzing a corresponding physical structure. The metrology tool compares its empirical measurements to the predicted measurements in the library. If a match is found, the metrology tool extracts a description of the corresponding physical structure from the library. The library evolution tool operates to improve the efficiency of the library. To make these improvements, the library evolution tool statistically analyzes the usage pattern of the library. Based on this analysis, the library evolution tool increases the resolution of commonly used portions of the library. The library evolution tool may also optionally reduce the resolution of less used portions of the library.Type: ApplicationFiled: May 14, 2002Publication date: April 24, 2003Inventors: David M. Aikens, Youxian Wen, Walter Lee Smith
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Publication number: 20020186036Abstract: A combination metrology tool is disclosed for analyzing samples, and in particular semiconductor samples. The device includes a first measurement module for determining electrical characteristics of the sample. In general, such a measurement module will monitor voltage or capacitance characteristics to derive information such as carrier lifetimes, diffusion lengths and surface doping. The device also includes a second measurement module for determining compositional characteristics such as layer thickness, index of refraction and extinction coefficient. The second measurement module will include a light source for generating a probe beam which interacts with the sample. A detection system is provided for monitoring either the change in magnitude or polarization state of the probe beam. The output signals from both measurement modules are combined by a processor to more accurately evaluate the sample.Type: ApplicationFiled: July 26, 2002Publication date: December 12, 2002Inventor: Walter Lee Smith