Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. The first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. The processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. The processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. The processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data.

Abstract: According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires manufacturing data including a manufacturing condition data group and a quality data group. The processing circuitry calculates one or more degrees of influence exerted by first manufacturing condition data included in the manufacturing condition data group on respective pieces of quality data included in the quality data group by analyzing the manufacturing data. The processing circuitry, in a case where one or more degrees of influence satisfy a determination condition, generates output data related to at least one of the first manufacturing condition data, one or more pieces of quality data on which the first manufacturing condition data has exerted the degrees of influence satisfying the determination condition, or the degrees of influence satisfying the determination condition.

Abstract: According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires first factor data indicative of first manufacturing conditions of a first product, and acquires second factor data indicative of second manufacturing conditions of a second product. The processing circuitry computes, based on the first factor data, a first index value relating to a degree by which each of the first manufacturing conditions contributes to an abnormality, and computes, based on the second factor data, a second index value relating to a degree by which each of the second manufacturing conditions contributes to an abnormality. The processing circuitry computes a similarity between the first index value and the second index value.

Abstract: An assembly for an LSI test supplies a test signal output from an LSI tester to a target LSI to be tested and outputs, to the LSI tester, a test result signal generated by processing of the target LSI performed in accordance with the test signal. The assembly for an LSI test includes: a peripheral circuit coupled to the target LSI and allowing the target LSI to operate in the same manner as in the application environment; and a printed circuit board on which the peripheral circuit is mounted.

Abstract: First and second transmission lines and are connected to each other in series. A first terminator is connected to the first transmission line in parallel, and is provided externally of a semiconductor device. A second terminator is connected to the second transmission line in parallel, and is provided inside the semiconductor device. The values of the first and second terminator are adjusted so that the combined resistance value of first and second terminator and the second transmission line matches with the impedance of the first transmission line. Impedance matching of the entire transmission line can be achieved with this simple construction, thus, a stable, high quality signal can be transmitted.

Abstract: First and second transmission lines and are connected to each other in series. A first terminator is connected to the first transmission line in parallel, and is provided externally of a semiconductor device. A second terminator is connected to the second transmission line in parallel, and is provided inside the semiconductor device. The values of the first and second terminator are adjusted so that the combined resistance value of first and second terminator and the second transmission line matches with the impedance of the first transmission line. Impedance matching of the entire transmission line can be achieved with this simple construction, thus, a stable, high quality signal can be transmitted.

Abstract: An assembly for an LSI test supplies a test signal output from an LSI tester to a target LSI to be tested and outputs, to the LSI tester, a test result signal generated by processing of the target LSI performed in accordance with the test signal. The assembly for an LSI test includes: a peripheral circuit coupled to the target LSI and allowing the target LSI to operate in the same manner as in the application environment; and a printed circuit board on which the peripheral circuit is mounted.

Abstract: A clutch-actuating device includes a master cylinder actuated by depression of a clutch pedal, an operating cylinder actuated by fluid pressure fed from the master cylinder through a conduit which is connected to the master cylinder or the operating cylinder via a coupling member, and a restriction mechanism for restricting the flow of hydraulic fluid returning from the operating cylinder to the master cylinder, the restriction mechanism being incorporated in the coupling member. The operating cylinder (or master cylinder) of this clutch-actuating device can be commonly used regardless of whether a torque shock protection valve should be incorporated.

Abstract: A clutch-actuating device includes a master cylinder actuated by depression of a clutch pedal, an operating cylinder actuated by fluid pressure fed from the master cylinder through a conduit which is connected to the master cylinder or the operating cylinder via a coupling member, and a restriction mechanism for restricting the flow of hydraulic fluid returning from the operating cylinder to the master cylinder, the restriction mechanism being incorporated in the coupling member. The operating cylinder (or master cylinder) of this clutch-actuating device can be commonly used regardless of whether a torque shock protection valve should be incorporated.

Abstract: A radiation image which has been recorded on a recording medium is read out at predetermined sampling intervals in order to obtain an image signal. A method for generating a radiation image signal comprises the steps of, in the course of the radiation image being read out, first applying sampling intervals corresponding to a second spatial frequency fsw higher than a first spatial frequency fss, which is the maximum of a desired spatial frequency range, along at least one direction on the recording medium in order to obtain an original image signal. The original image signal is then subjected to filtering processing in order to transmit spatial frequency components below the first spatial frequency fss, and to reduce or eliminate spatial frequency components above the first spatial frequency fss. Lastly, the original image signal which has been obtained from the filtering processing is sampled at sampling intervals corresponding to the first spatial frequency fss in order to obtain an image signal.