Abstract: A universal logic card is disclosed which contains both pre-programmed functional circuitry for actuating channel logic and dedicated test circuitry for system controller test and for constant and looping interrogation of the pre-programmed channel logic in absence of self-test system controller test. The disclosed card resides as a channel in a self-test system for a nuclear power plant supplementing the nuclear reaction protection system. The card is pre-programmed in digital logic to act equivalent to an analog circuit during actual plant operation. Additionally, the card responds to system controlled surveillance of the nuclear protection system. In system controlled surveillance, a central microprocessor serially addresses system circuit cards such as the one disclosed and loads these cards at predetermined input points with test commands. The addressed cards are thereafter simultaneously activated by a system-wide command.