Abstract: A system is disclosed for fabricating thin-film electronic components upon a substrate. A unitary metal aperture mask is utilized which includes a plurality of linearly aligned aperture patterns formed in the unitary mask. The mask is coupled with a linear motion assembly, and an electro-optic sensor which reads position indicating alignment marks upon the mask to provide precise and accurate mask alignment during subsequent fabrication steps in the vacuum deposition process. This system avoids the use of individual deposition masks which must be successively aligned.