Patents by Inventor Won-joo Jung

Won-joo Jung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MEMORY DEVICE FOR EFFICIENTLY DETERMINING WHETHER TO PERFORM RE-TRAINING OPERATION AND MEMORY SYSTEM INCLUDING THE SAME
    Publication number: 20230205711
    Abstract: A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.
    Type: Application
    Filed: February 17, 2023
    Publication date: June 29, 2023
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Won-joo JUNG, Jang-Woo LEE, Byung-hoon JEONG, Jeong-don IHM
  • Memory device for efficiently determining whether to perform re-training operation and memory system including the same
    Patent number: 11604714
    Abstract: A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: March 14, 2023
    Assignee: Samsung Electronics Co, Ltd.
    Inventors: Won-joo Jung, Jang-woo Lee, Byung-hoon Jeong, Jeong-don Ihm
  • MEMORY DEVICE FOR EFFICIENTLY DETERMINING WHETHER TO PERFORM RE-TRAINING OPERATION AND MEMORY SYSTEM INCLUDING THE SAME
    Publication number: 20200379862
    Abstract: A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.
    Type: Application
    Filed: August 21, 2020
    Publication date: December 3, 2020
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Won-joo Jung, Jang-woo Lee, Byung-hoon Jeong, Jeong-don Ihm
  • Memory device for efficiently determining whether to perform re-training operation and memory system including the same
    Patent number: 10754563
    Abstract: A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.
    Type: Grant
    Filed: February 27, 2018
    Date of Patent: August 25, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Won-joo Jung, Jang-woo Lee, Byung-hoon Jeong, Jeong-don Ihm
  • MEMORY DEVICE FOR EFFICIENTLY DETERMINING WHETHER TO PERFORM RE-TRAINING OPERATION AND MEMORY SYSTEM INCLUDING THE SAME
    Publication number: 20190050159
    Abstract: A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.
    Type: Application
    Filed: February 27, 2018
    Publication date: February 14, 2019
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Won-joo Jung, Jang-woo Lee, Byung-hoon Jeong, Jeong-don Ihm