Patents by Inventor Yanko K Sheiretov

Yanko K Sheiretov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11959880
    Abstract: System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
    Type: Grant
    Filed: August 16, 2021
    Date of Patent: April 16, 2024
    Assignee: JENTEK Sensors, Inc.
    Inventors: Scott A Denenberg, Yanko K Sheiretov, Neil J Goldfine, Todd M Dunford, Andrew P Washabaugh, Don Straney, Brian L Manning
  • Patent number: 11841245
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Grant
    Filed: January 6, 2023
    Date of Patent: December 12, 2023
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Publication number: 20230157748
    Abstract: Devices, systems, and methods of the present disclosure are directed to controlling distribution of electrical energy moving from an ablation electrode at a treatment site within a patient to a plurality of return electrodes on skin of the patient. Control over the distribution of electrical energy moving from the ablation electrode to the plurality of return electrodes can reduce or eliminate the need for manual intervention (e.g., repositioning the plurality of return electrodes on the skin of the patient, repositioning the patient, etc.) to achieve a suitable distribution of the electrical energy. Additionally, or alternatively, the devices, systems, and methods of the present disclosure can respond rapidly and automatically to changes in distribution of the electrical energy to reduce the likelihood and magnitude of inadvertent changes in the distribution of electrical energy over the course of a medical procedure.
    Type: Application
    Filed: September 27, 2022
    Publication date: May 25, 2023
    Inventors: Doron Harlev, Ilya Bystryak, Alexander Shrabstein, Yanko K. Sheiretov, Joseph Harlev, Paul B. Hultz
  • Publication number: 20230160728
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Application
    Filed: January 6, 2023
    Publication date: May 25, 2023
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Patent number: 11549831
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Grant
    Filed: September 16, 2019
    Date of Patent: January 10, 2023
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Publication number: 20220373367
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Application
    Filed: September 16, 2019
    Publication date: November 24, 2022
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Patent number: 11490958
    Abstract: Devices, systems, and methods of the present disclosure are directed to controlling distribution of electrical energy moving from an ablation electrode at a treatment site within a patient to a plurality of return electrodes on skin of the patient. Control over the distribution of electrical energy moving from the ablation electrode to the plurality of return electrodes can reduce or eliminate the need for manual intervention (e.g., repositioning the plurality of return electrodes on the skin of the patient, repositioning the patient, etc.) to achieve a suitable distribution of the electrical energy. Additionally, or alternatively, the devices, systems, and methods of the present disclosure can respond rapidly and automatically to changes in distribution of the electrical energy to reduce the likelihood and magnitude of inadvertent changes in the distribution of electrical energy over the course of a medical procedure.
    Type: Grant
    Filed: March 8, 2018
    Date of Patent: November 8, 2022
    Assignee: Affera, Inc.
    Inventors: Doron Harlev, Ilya Bystryak, Alexander Shrabstein, Yanko K. Sheiretov, Joseph Harlev, Paul B. Hultz
  • Publication number: 20210372968
    Abstract: System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
    Type: Application
    Filed: August 16, 2021
    Publication date: December 2, 2021
    Applicant: JENTEK Sensors, Inc.
    Inventors: Scott A. Denenberg, Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Andrew P. Washabaugh, Don Straney, Brian L. Manning
  • Patent number: 11092571
    Abstract: System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
    Type: Grant
    Filed: June 6, 2019
    Date of Patent: August 17, 2021
    Assignee: JENTEK Sensors, Inc.
    Inventors: Scott A Denenberg, Yanko K Sheiretov, Neil J Goldfine, Don Straney
  • Publication number: 20210080297
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Application
    Filed: September 16, 2019
    Publication date: March 18, 2021
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
  • Patent number: 10732096
    Abstract: Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.
    Type: Grant
    Filed: November 16, 2017
    Date of Patent: August 4, 2020
    Assignee: JENTEK Sensors, Inc.
    Inventors: Scott A. Denenberg, Todd M. Dunford, Neil J. Goldfine, Yanko K. Sheiretov
  • Patent number: 10677756
    Abstract: A sensor system has an integrated sensor cartridge, and instrument, and an instrument side connector. The integrated sensor cartridge has a mechanical support, a flexible sensor array, and a rigid connector. The mechanical support is shaped to facilitate sensor measurements on a test object. The rigid connector has a mechanical connection and an electrical connection for simultaneous electrical and mechanical mating of the sensor cartridge to the instrument side connector. The flexible array has a connecting portion, a lead portion, and a sensing portion. The sensing portion is attached to the mechanical support, and the connecting portion interfaces with the rigid connector. The connecting portion may form the electrical connection of the rigid connector or may simply mate internally with the electrical connection. The instrument side connector is connected to the instrument which measures the response of the flexible sensor array.
    Type: Grant
    Filed: May 31, 2016
    Date of Patent: June 9, 2020
    Assignee: JENTEK SENSORS, INC.
    Inventors: Neil J Goldfine, Yanko K Sheiretov, Scott A Denenberg, Karen Walrath, Todd M Dunford, Kevin P Dixon, Christopher T Martin
  • Publication number: 20200069365
    Abstract: Devices, systems, and methods of the present disclosure are directed to controlling distribution of electrical energy moving from an ablation electrode at a treatment site within a patient to a plurality of return electrodes on skin of the patient. Control over the distribution of electrical energy moving from the ablation electrode to the plurality of return electrodes can reduce or eliminate the need for manual intervention (e.g., repositioning the plurality of return electrodes on the skin of the patient, repositioning the patient, etc.) to achieve a suitable distribution of the electrical energy. Additionally, or alternatively, the devices, systems, and methods of the present disclosure can respond rapidly and automatically to changes in distribution of the electrical energy to reduce the likelihood and magnitude of inadvertent changes in the distribution of electrical energy over the course of a medical procedure.
    Type: Application
    Filed: March 8, 2018
    Publication date: March 5, 2020
    Inventors: Doron Harlev, Ilya Bystryak, Alexander Shrabstein, Yanko K. Sheiretov, Joseph Harlev, Paul B. Hultz
  • Publication number: 20190323992
    Abstract: System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
    Type: Application
    Filed: June 6, 2019
    Publication date: October 24, 2019
    Applicant: JENTEK Sensors, Inc.
    Inventors: Scott A. Denenberg, Yanko K. Sheiretov, Neil J. Goldfine, Don Straney
  • Patent number: 10416118
    Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.
    Type: Grant
    Filed: May 12, 2017
    Date of Patent: September 17, 2019
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark D Windoloski
  • Patent number: 10324062
    Abstract: System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
    Type: Grant
    Filed: October 22, 2014
    Date of Patent: June 18, 2019
    Assignee: JENTEK Sensors, Inc.
    Inventors: Scott A Denenberg, Yanko K Sheiretov, Neil J Goldfine, Don Straney, Leon B Kristal
  • Publication number: 20180209894
    Abstract: Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.
    Type: Application
    Filed: November 16, 2017
    Publication date: July 26, 2018
    Inventors: Scott A. Denenberg, Todd M. Dunford, Neil J. Goldfine, Yanko K. Sheiretov
  • Patent number: 10001457
    Abstract: Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.
    Type: Grant
    Filed: April 19, 2012
    Date of Patent: June 19, 2018
    Assignee: JENTEK SENSORS, INC.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Floyd W. Spencer, David A. Jablonski, David C. Grundy, Darrell E. Schlicker
  • Patent number: D830863
    Type: Grant
    Filed: May 11, 2017
    Date of Patent: October 16, 2018
    Inventors: Todd M Dunford, Neil J Goldfine, Stuart D Chaplan, Yanko K Sheiretov, Scott A Denenberg
  • Patent number: D857534
    Type: Grant
    Filed: October 15, 2018
    Date of Patent: August 27, 2019
    Assignee: JENTEK Sensors, Inc.
    Inventors: Todd M Dunford, Neil J Goldfine, Stuart D Chaplan, Yanko K Sheiretov, Scott A Denenberg