Yanwei REN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
Abstract: The present disclosure provides an array substrate, a display panel and a display device. The array substrate includes a first conductive pattern and a second conductive pattern forming a ground (GND) protection circuit. The first conductive pattern includes a plurality of first conductive segments spaced apart from each other, and adjacent first conductive segments are connected to each other by the second conductive pattern, an insulating layer is arranged between the first conductive segments and the second conductive pattern, and the first conductive segments are connected to the second conductive pattern through via holes penetrating through the insulating layer. In addition, the present disclosure provides a display panel including the above array substrate. Furthermore, the present disclosure provides a display device including the above array substrate.
Abstract: Embodiments of the present disclosure pertain to a circuit board, a display panel and a display device. The circuit board includes a ground protection circuit, disposed in a peripheral area of the circuit board. The ground protection circuit includes one or more first wires arranged in parallel, a bridging connection part and a plurality of second wires arranged in parallel, where one end of each first wire is grounded and the other end connects to the bridging connection part electrically, while one end of each second wire connects to the bridging connection part electrically and the other end is grounded. The display panel includes the circuit board and the display device includes the display panel.
Abstract: The present disclosure discloses a display panel and a display device. The display panel includes an array substrate and an opposite substrate arranged opposite to each other; the array substrate includes a box alignment area facing the opposite substrate, a circuit test area located on a side of the box alignment area; the opposite substrate includes a base substrate, a conductive black matrix arranged on a side of the base substrate facing the array substrate; the display panel further includes an electrostatic discharging layer electrically connected respectively with the conductive black matrix and a GND wire in the circuit test area; the conductive black matrix is provided with a thickened area in at least an area in contact with the electrostatic discharging layer; a thickness of the thickened area of the conductive black matrix is more than a thickness of other areas of the conductive black matrix.
Abstract: The present disclosure provides a TFT, a manufacturing method thereof, an array substrate and a manufacturing method thereof. The TFT includes a substrate, a p-Si active layer arranged on the substrate, and a first a-Si layer arranged on a surface of the p-Si active layer at a side adjacent to the substrate. An orthogonal projection of the p-Si active layer onto the substrate at least partially overlaps an orthogonal projection of the first a-Si layer onto the substrate.
Abstract: An array substrate is disclosed. The array substrate includes: an underlying substrate, a light incident surface of the underlying substrate including a display region and a non-display region surrounding the display region; and a first conductive pattern arranged within the non-display region of the light incident surface of the underlying substrate. A display panel and a display device utilizing the array substrate are also disclosed.
Abstract: The present invention provides a detecting device and a detecting method thereof. The detecting device serves to detect defects on the display substrate and comprises: a detecting unit for searching for defects on the display substrate and taking pictures of areas in which the defects are located; and a control unit for comparing and analyzing the pictures sent from the detecting unit to assist the detecting unit to search for the defects on the display substrate, and classifying and counting the pictures of areas in which the defects are located. The detecting device can automatically search for and analyze defects on the display substrate, thereby time for analyzing defects on the display substrate is reduced, and defect analyzing efficiency is improved.