Patents by Inventor Yanyan Wu

Yanyan Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190011901
    Abstract: A system includes a collaborative design system that includes a processor configured to display an industrial plant layout on a display. The processor is also configured to overlay the industrial plant layout onto a geographic image. Further, the processor is configured to receive one or more inputs from a plurality of remote users. In addition, the processor is configured to manipulate the layout with respect to the geographic image based on the one or more inputs. Moreover, the processor is configured to create an industrial plant design based on the industrial plant layout and the geographic image.
    Type: Application
    Filed: July 6, 2018
    Publication date: January 10, 2019
    Inventors: Yanyan Wu, Michael Poole, Siva Chockalingam, Cherine Foutch, Daniel Kessler, William Masters
  • Patent number: 9921446
    Abstract: The present application discloses a display panel test structure for testing whether signal lines of a display panel are defective, the signal lines at least comprising a plurality of data lines which are divided into N groups, the display panel test structure comprising N first shorting bars arranged in a test area of the display panel, each of which being configured to short-circuit a group of data lines, wherein the display panel test structure further comprises a plurality of first test pads arranged in the test area, each of which connects with one shorting bar corresponding thereto, and each of the first test pads is configured to load a signal to a group of data lines corresponding thereto during a test.
    Type: Grant
    Filed: August 3, 2016
    Date of Patent: March 20, 2018
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., BEIJING BOE DISPLAY TECHNOLOGY CO., LTD.
    Inventors: Fengwu Yu, Jinhu Cao, Minghui Ma, Bin Cao, Namin Kwon, Yanyan Wu, Wei Li, Mian Gao, Long Guo
  • Publication number: 20180000142
    Abstract: The invention describes compositions that include a stevia sweetener and a salt of a steviol glycoside, wherein the concentration of the components provide an improved taste profile where bitterness, after taste and/or lingering of the stevia sweetener is decreased or eliminated.
    Type: Application
    Filed: September 18, 2017
    Publication date: January 4, 2018
    Inventors: JINGANG SHI, Hansheng WANG, Mingming DENG, Jien DING, Yanyan WU
  • Patent number: 9795156
    Abstract: The invention describes compositions that include a stevia sweetener and a salt of a steviol glycoside, wherein the concentration of the components provide an improved taste profile where bitterness, after taste and/or lingering of the stevia sweetener is decreased or eliminated.
    Type: Grant
    Filed: March 16, 2012
    Date of Patent: October 24, 2017
    Assignee: E.P.C (Beijing) Plant Pharmaceutical Technology Co., Ltd
    Inventors: Jingang Shi, Hansheng Wang, Mingming Deng, Jien Ding, Yanyan Wu
  • Publication number: 20170192326
    Abstract: The present application discloses a display panel test structure for testing whether signal lines of a display panel are defective, the signal lines at least comprising a plurality of data lines which are divided into N groups, the display panel test structure comprising N first shorting bars arranged in a test area of the display panel, each of which being configured to short-circuit a group of data lines, wherein the display panel test structure further comprises a plurality of first test pads arranged in the test area, each of which connects with one shorting bar corresponding thereto, and each of the first test pads is configured to load a signal to a group of data lines corresponding thereto during a test.
    Type: Application
    Filed: August 3, 2016
    Publication date: July 6, 2017
    Inventors: Fengwu YU, Jinhu CAO, Minghui MA, Bin CAO, Namin KWON, Yanyan WU, Wei LI, Mian GAO, Long GUO
  • Patent number: 9416652
    Abstract: A wellhead assembly having a tubular magnetized in at least one selected location, and a sensor proximate the magnetized location that monitors a magnetic field from the magnetized location. The magnetic field changes in response to changes in mechanical stress of the magnetized location, so that signals from the sensor represent loads applied to the tubular. Analyzing the signals over time provides fatigue loading data useful for estimating structural integrity of the tubular and its fatigue life. Example tubulars include a low pressure housing, a high pressure housing, conductor pipes respectively coupled with the housings, a string of tubing, a string of casing, housing and tubing connections, housing and tubing seals, tubing hangers, tubing risers, and other underwater structural components that require fatigue monitoring, or can be monitored for fatigue.
    Type: Grant
    Filed: August 8, 2013
    Date of Patent: August 16, 2016
    Assignee: Vetco Gray Inc.
    Inventors: Yuri Alexeyevich Plotnikov, Teresa Chen-Keat, Yanyan Wu, Chad Eric Yates, Xichang Zhang, Li Zheng, Pinghai Yang
  • Publication number: 20150041119
    Abstract: A wellhead assembly having a tubular magnetized in at least one selected location, and a sensor proximate the magnetized location that monitors a magnetic field from the magnetized location. The magnetic field changes in response to changes in mechanical stress of the magnetized location, so that signals from the sensor represent loads applied to the tubular. Analyzing the signals over time provides fatigue loading data useful for estimating structural integrity of the tubular and its fatigue life. Example tubulars include a low pressure housing, a high pressure housing, conductor pipes respectively coupled with the housings, a string of tubing, a string of casing, housing and tubing connections, housing and tubing seals, tubing hangers, tubing risers, and other underwater structural components that require fatigue monitoring, or can be monitored for fatigue.
    Type: Application
    Filed: August 8, 2013
    Publication date: February 12, 2015
    Applicant: Vetco Gray Inc.
    Inventors: Yuri Alexeyevich Plotnikov, Teresa Chen-Keat, Yanyan Wu, Chad Eric Yates, Xichang Zhang, Li Zheng, Pinghai Yang
  • Publication number: 20130071537
    Abstract: The invention describes compositions that include a stevia sweetener and a salt of a steviol glycoside, wherein the concentration of the components provide an improved taste profile where bitterness, after taste and/or lingering of the stevia sweetener is decreased or eliminated.
    Type: Application
    Filed: March 16, 2012
    Publication date: March 21, 2013
    Applicant: E.P.C (Beijing) Plant Pharmaceutical Technology Co., Ltd
    Inventors: Jingang Shi, Hansheng Wang, Mingming Deng, Jien Ding, Yanyan Wu
  • Patent number: 8240210
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring device, such as a coordinate measuring machine (CMM), and integrating with a plurality of nondestructive examination (NDE) capabilities with a plurality of coordinate measuring device capabilities to form an inspection probe. The method further includes integrating the NDE inspection probe with the coordinate measuring device such that the inspection probe substantially simultaneously measures a plurality of NDE measurements and external/internal geometry and defects of machine component, which are linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed together with a CAD model to enable a direct comparison between the inspection data and the nominal requirements carried on the CAD model.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: August 14, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Dean Michael Robinson, Shridhar Nath, Nicholas Joseph Kray
  • Patent number: 8238642
    Abstract: A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the 2D pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.
    Type: Grant
    Filed: November 20, 2008
    Date of Patent: August 7, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Donald Robert Howard, Harry Israel Ringermacher, Robert August Kaucic, Zhaohui Sun, Francis Howard Little, Xiaodong Tao, Patrick Joseph Howard, Matthew Edward Dragovich, Eric Scott Foster
  • Patent number: 8205500
    Abstract: An ultrasound inspection system is provided for inspecting an object. The inspection system includes an ultrasound probe configured to scan the object and acquire a plurality of ultrasound scan data. The inspection system further includes a processor coupled to the ultrasound probe and configured to apply a transfer function to the ultrasound scan data to compensate for distortion of a plurality of ultrasound signals through the object and thereby generate a plurality of compensated ultrasound scan data, and to process the compensated ultrasonic scan data to characterize a feature in the object.
    Type: Grant
    Filed: November 25, 2008
    Date of Patent: June 26, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Edward James Nieters, Thomas James Batzinger, Nicholas Joseph Kray, James Norman Barshinger, Jian Li, Waseem Ibrahim Faidi, Prabhjot Singh, Francis Howard Little, Michael Everett Keller, Timothy Jesse Sheets
  • Patent number: 8179132
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: May 15, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
  • Patent number: 8041527
    Abstract: Systems and methods are disclosed for consistently translating or converting between geometric dimensioning and tolerancing information and variation parameters for a three dimensional variation analysis tool. The methods and systems may receive geometric dimensioning and tolerancing information; translate, with a computer, the received geometric dimensioning and tolerancing information into variation parameters for a three dimensional variation analysis tool; and output the variation parameters.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: October 18, 2011
    Assignee: The Boeing Company
    Inventors: James A Day, Zuozhi Zhao, Yanyan Wu, Dean M. Robinson
  • Patent number: 8020308
    Abstract: An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: September 20, 2011
    Assignee: General Electric Company
    Inventors: Byungwoo Lee, Yanyan Wu, Nicholas Joseph Kray
  • Patent number: 8010315
    Abstract: An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: August 30, 2011
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Francis Howard Little, Prabhjot Singh
  • Patent number: 7921575
    Abstract: A method is provided for assembling a measurement device for use in measuring a machine component. The method includes providing a coordinate measuring machine (CMM). The method also includes combining ultrasonic inspection (UT) capabilities and CMM capabilities to form an inspection probe. The inspection probe is installed on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures internal boundaries of the machine component with the UT capabilities.
    Type: Grant
    Filed: December 27, 2007
    Date of Patent: April 12, 2011
    Assignee: General Electric Company
    Inventors: Francis Howard Little, Yanyan Wu, Jian Li, Nicholas J. Kray
  • Patent number: 7877888
    Abstract: A method includes measuring a radius of curvature at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe is measured through the first device. A second device is detachably coupled to the plurality of positions along the outer peripheral surface of the predetermined section of the pipe. A wall thickness at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe is measured through the second device. A cross-sectional area of the predetermined section of the pipe is measured based on a measurement data including the radius of curvature and wall thickness at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe.
    Type: Grant
    Filed: October 25, 2007
    Date of Patent: February 1, 2011
    Assignee: General Electric Company
    Inventors: Thomas James Batzinger, Jeffrey David Tilden, Xiaolei Shirley Ao, Waseem Ibrahim Faidi, Yanyan Wu, Nelson Raymond Corby, Jr.
  • Publication number: 20100305876
    Abstract: An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.
    Type: Application
    Filed: May 29, 2009
    Publication date: December 2, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Byungwoo Lee, Yanyan Wu, Nicholas Joseph Kray
  • Patent number: 7840367
    Abstract: An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: November 23, 2010
    Assignee: General Electric Company
    Inventors: Francis Howard Little, Yanyan Wu, Prabhjot Singh
  • Publication number: 20100205816
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring device, such as a coordinate measuring machine (CMM), and integrating with a plurality of nondestructive examination (NDE) capabilities with a plurality of coordinate measuring device capabilities to form an inspection probe. The method further includes integrating the NDE inspection probe with the coordinate measuring device such that the inspection probe substantially simultaneously measures a plurality of NDE measurements and external/internal geometry and defects of machine component, which are linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed together with a CAD model to enable a direct comparison between the inspection data and the nominal requirements carried on the CAD model.
    Type: Application
    Filed: February 18, 2009
    Publication date: August 19, 2010
    Inventors: Yanyan Wu, Dean Michael Robinson, Shridhar Nath, Nicholas Joseph Kray