Patents by Inventor Yasuaki TSURUOKA

Yasuaki TSURUOKA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11598724
    Abstract: A measuring apparatus includes a flow cell through which a sample containing particles flows, a light source for irradiating light on the sample flowing through the flow cell, a fluorescence detector for detecting the fluorescence generated from the sample irradiated with light from the light source, and a control unit for flowing a positive control sample containing a fluorescent dye through the flow cell, measuring the fluorescence generated from the positive control sample irradiated by the light from the light source via the fluorescence detector, comparing the obtained measurement value and a reference value, and adjusting the detection sensitivity of the fluorescence detector according to the comparison result.
    Type: Grant
    Filed: July 17, 2020
    Date of Patent: March 7, 2023
    Assignee: SYSMEX CORPORATION
    Inventors: Yasuaki Tsuruoka, Tomohiro Tsuji, Hiroo Tatsutani, Motoi Kinishi, Yuji Masuda
  • Publication number: 20210018438
    Abstract: A measuring apparatus includes a flow cell through which a sample containing particles flows, a light source for irradiating light on the sample flowing through the flow cell, a fluorescence detector for detecting the fluorescence generated from the sample irradiated with light from the light source, and a control unit for flowing a positive control sample containing a fluorescent dye through the flow cell, measuring the fluorescence generated from the positive control sample irradiated by the light from the light source via the fluorescence detector, comparing the obtained measurement value and a reference value, and adjusting the detection sensitivity of the fluorescence detector according to the comparison result.
    Type: Application
    Filed: July 17, 2020
    Publication date: January 21, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Yasuaki TSURUOKA, Tomohiro TSUJI, Hiroo TATSUTANI, Motoi KINISHI, Yuji MASUDA
  • Publication number: 20200103333
    Abstract: Disclosed is a measurement apparatus that includes: a measurement unit configured to measure a control sample for quality control; a display unit; and a processing unit configured to cause the display unit to display an input screen for setting an evaluation criterion used in the quality control, and, in the measurement apparatus, the processing unit causes the display unit to display a quality control result of a test item, based on the evaluation criterion and a measurement result of the control sample.
    Type: Application
    Filed: September 27, 2019
    Publication date: April 2, 2020
    Inventors: Hiroo TATSUTANI, Motoi KINISHI, Tomohiro TSUJI, Yasuaki TSURUOKA, Satoshi YONEDA