Patents by Inventor Yasuhiko Kaneko
Yasuhiko Kaneko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240428379Abstract: An image processing apparatus includes a processor, and the processor is configured to make a determination whether or not imaging targets are included in generation target images used for generation of a composite image among a plurality of images obtained by imaging the imaging targets from a plurality of positions and feature information required for the generation satisfies a predetermined condition, and perform frequency emphasis processing on the generation target images in a case where the feature information satisfies the predetermined condition. The determination and the frequency emphasis processing are iterated until the feature information does not satisfy the predetermined condition.Type: ApplicationFiled: September 8, 2024Publication date: December 26, 2024Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Publication number: 20240404184Abstract: An image processing apparatus includes a processor. The processor is configured to: display, on a screen, a plurality of two-dimensional images that are used to generate a three-dimensional image showing a target object in a real space and that are associated with a plurality of portions of the three-dimensional image, and the three-dimensional image in a state in which the plurality of two-dimensional images and the three-dimensional image are comparable with each other; select a two-dimensional image of interest from among the plurality of two-dimensional images in response to a given selection instruction; and display, on the screen, a portion of interest corresponding to the two-dimensional image of interest among the plurality of portions in a state in which the portion of interest is visually specifiable.Type: ApplicationFiled: August 13, 2024Publication date: December 5, 2024Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Publication number: 20240404183Abstract: An image processing apparatus includes a processor, in which the processor is configured to: acquire a plurality of three-dimensional coordinates for specifying positions of a plurality of pixels included in a three-dimensional image showing a target object in a real space, and a plurality of two-dimensional coordinates for specifying positions corresponding to the plurality of pixels in a screen on which the three-dimensional image is rendered; acquire unit length information indicating a relationship between a first unit length of a three-dimensional coordinate system defining the three-dimensional coordinates, and a second unit length of the real space; generate an object of which the second unit length is specifiable, based on the plurality of three-dimensional coordinates, the plurality of two-dimensional coordinates, and the unit length information; and output a first image in which the object and the three-dimensional image are shown in a comparable manner.Type: ApplicationFiled: August 13, 2024Publication date: December 5, 2024Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Patent number: 12131455Abstract: An image list indicating a group of captured images obtained by image capturing of a photographic subject from different image capture positions and in different image capture directions relative to the photographic subject is displayed on a display unit, and an instruction for selecting any captured image from the image list is accepted in accordance with a user operation. A three-dimensional model of the photographic subject is displayed on the display unit, and a mark indicating the position of the captured image for which the instruction for selection has been given is superimposed and displayed on the displayed three-dimensional model. Accordingly, the user can easily grasp a portion of the photographic subject (three-dimensional model) corresponding to the selected captured image.Type: GrantFiled: January 5, 2022Date of Patent: October 29, 2024Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Patent number: 12069224Abstract: When a three-dimensional model of a photographic subject is displayed on a display, and a view operation for, enlarging the three-dimensional model is performed, a desired position on the photographic subject can be easily specified. After a desired position on the photographic subject is specified, a three-dimensional position, on the three-dimensional model, corresponding to the position is identified, and a plurality of captured images each including a pixel corresponding to the identified three-dimensional position are retrieved from a group of captured images obtained by image capturing of the photographic subject. An optimum captured image is determined from among the plurality of retrieved captured images or the priority levels of the plurality of retrieved captured images are determined. The determined optimum captured image is displayed on the display or some or all of the plurality of captured images are displayed on the display in accordance with the determined priority levels.Type: GrantFiled: January 13, 2022Date of Patent: August 20, 2024Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Publication number: 20240089593Abstract: There is provided an imaging support apparatus including a processor and a memory connected to or built into the processor, in which the processor is configured to control, in a state in which projection light, which represents at least a position of an imaging target region in a subject, is projected onto the subject by a projection apparatus, and in a case where the imaging target region is imaged by an imaging apparatus, the projection apparatus to transition to a state in which the projection light is suppressed.Type: ApplicationFiled: November 17, 2023Publication date: March 14, 2024Inventor: Yasuhiko KANEKO
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Publication number: 20230400974Abstract: One embodiment of the present invention provides an interpretation support server, an interpretation support system, an interpretation support method, an interpretation support program, and an interpretation terminal that enable a plurality of users to efficiently perform interpretation. The interpretation support server according to one aspect of the present invention classifies an operation received from a first terminal into a display operation that permits display of an operation result on a second terminal and a hide operation that prohibits display of the operation result on the second terminal, causes the second terminal to display a result of performed display operation in real time in a case where the display operation is performed at the first terminal, and prohibits the second terminal from displaying a result of performed hide operation in a case where the hide operation is performed at the first terminal.Type: ApplicationFiled: August 24, 2023Publication date: December 14, 2023Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Publication number: 20230351122Abstract: Provided are a recommendation information presentation device, an operation method of a recommendation information presentation device, and an operation program of a recommendation information presentation device capable of presenting recommendation information filled with unexpectedness to a user. A CPU of an image management server includes a second analysis unit, a creation unit, an information acquisition unit, and a distribution control unit. The second analysis unit analyzes an image to generate analysis information. The creation unit inputs the analysis information into a model for story creation and causes a story configured of a set of sentences describing a fictitious event based on the analysis information to be output from the model for story creation. The information acquisition unit selects recommendation information according to the story. The distribution control unit presents the recommendation information to the user.Type: ApplicationFiled: July 13, 2023Publication date: November 2, 2023Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Patent number: 11386542Abstract: Provided are a training data creation method and device, and a defect inspection method and device capable of securing the accuracy of defect inspection even though the number of samples of a defect to be used in creating training data is small.Type: GrantFiled: March 18, 2020Date of Patent: July 12, 2022Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Publication number: 20220141441Abstract: When a three-dimensional model of a photographic subject is displayed on a display, and a view operation for, enlarging the three-dimensional model is performed, a desired position on the photographic subject can be easily specified. After a desired position on the photographic subject is specified, a three-dimensional position, on the three-dimensional model, corresponding to the position is identified, and a plurality of captured images each including a pixel corresponding to the identified three-dimensional position are retrieved from a group of captured images obtained by image capturing of the photographic subject. An optimum captured image is determined from among the plurality of retrieved captured images or the priority levels of the plurality of retrieved captured images are determined. The determined optimum captured image is displayed on the display or some or all of the plurality of captured images are displayed on the display in accordance with the determined priority levels.Type: ApplicationFiled: January 13, 2022Publication date: May 5, 2022Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Publication number: 20220130029Abstract: An image list indicating a group of captured images obtained by image capturing of a photographic subject from different image capture positions and in different image capture directions relative to the photographic subject is displayed on a display unit, and an instruction for selecting any captured image from the image list is accepted in accordance with a user operation. A three-dimensional model of the photographic subject is displayed on the display unit, and a mark indicating the position of the captured image for which the instruction for selection has been given is superimposed and displayed on the displayed three-dimensional model. Accordingly, the user can easily grasp a portion of the photographic subject (three-dimensional model) corresponding to the selected captured image.Type: ApplicationFiled: January 5, 2022Publication date: April 28, 2022Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Patent number: 11156567Abstract: There are provided a defect inspection apparatus, method, and program for, in a case of using an image of an inspection-target industrial product (test object) to conduct an inspection to check whether defects are present, allowing an image interpreter to precisely and efficiently detect defects. A possible-defect image D3 indicating a crack-like defect and a simulation result image P3 indicating the predicted growth of the crack-like defect are displayed. Sliders L1 and L2 and checkboxes CB1 are used to enable selection of possible defects and simulation results to be displayed. An image interpreter can use the checkboxes CB1 to select a type of possible defect to be displayed, and can use the sliders L1 and L2 to select possible defects to be displayed on the basis of the wall thickness of portions in which possible defects are detected and the size of possible defects.Type: GrantFiled: June 22, 2018Date of Patent: October 26, 2021Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Patent number: 11029255Abstract: An object of the present invention is to provide a defect inspection device, a defect inspection method, and a program that support an image interpreter so that image interpretation can be performed accurately and rapidly.Type: GrantFiled: February 6, 2019Date of Patent: June 8, 2021Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Patent number: 10989672Abstract: A defect inspection device, a defect inspection method, and a computer readable medium accurately and rapidly detect a minute defect and a defect candidate indicated by a signal in a received light image of an inspection object. A defect inspection device includes an image acquisition unit, an input unit, an exposure condition acquisition unit, memory, and a parameter determination unit that determines an image processing parameter for a received light image based on an exposure condition acquired by the exposure condition acquisition unit, a physical feature received by the input unit, and exposure information stored in memory, and an image processing unit extracts a defect candidate image which corresponds to a defect candidate of the inspection object from the received light image by performing image processing of the received light image based on the image processing parameter determined by the parameter determination unit.Type: GrantFiled: February 6, 2019Date of Patent: April 27, 2021Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Publication number: 20210072165Abstract: Provided are a defect display device and method capable of displaying a radiographic image of an industrial product (object) such as a casting so as to support the determination of the severity of the industrial product without interference with the interpretation of the radiographic image.Type: ApplicationFiled: November 17, 2020Publication date: March 11, 2021Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Publication number: 20200219248Abstract: Provided are a training data creation method and device, and a defect inspection method and device capable of securing the accuracy of defect inspection even though the number of samples of a defect to be used in creating training data is small.Type: ApplicationFiled: March 18, 2020Publication date: July 9, 2020Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Patent number: 10571404Abstract: To test object image data IMG1, images (possible-defect images D1 to D3) representing possible defects detected by an image processing unit 22 are added. Adjacent to sliders L1 and L2, a histogram H1 indicating the number of detected possible defects for each wall thickness and a histogram H2 indicating the number of detected possible defects for each size are displayed, respectively. When a checkbox CB1 corresponding to a type of defect is selected by an operation unit 14, only images of possible defects of the selected type are displayed on the test object image IMG1. When the sliders L1 and L2 are operated by the operation unit 14, only images of possible defects within a wall thickness range selected by the slider L1 and within a size range selected by the slider L2 are displayed, and images of possible defects outside the ranges are erased.Type: GrantFiled: June 22, 2018Date of Patent: February 25, 2020Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Publication number: 20190170665Abstract: An object of the present invention is to provide a defect inspection device, a defect inspection method, and a program capable of accurately and rapidly detecting a minute defect and a defect candidate image indicated by a minute signal in a received light image of an inspection object.Type: ApplicationFiled: February 6, 2019Publication date: June 6, 2019Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Publication number: 20190170659Abstract: An object of the present invention is to provide a defect inspection device, a defect inspection method, and a program that support an image interpreter so that image interpretation can be performed accurately and rapidly.Type: ApplicationFiled: February 6, 2019Publication date: June 6, 2019Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO
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Publication number: 20180299389Abstract: To test object image data IMG1, images (possible-defect images D1 to D3) representing possible defects detected by an image processing unit 22 are added. Adjacent to sliders L1 and L2, a histogram H1 indicating the number of detected possible defects for each wall thickness and a histogram H2 indicating the number of detected possible defects for each size are displayed, respectively. When a checkbox CB1 corresponding to a type of defect is selected by an operation unit 14, only images of possible defects of the selected type are displayed on the test object image IMG1. When the sliders L1 and L2 are operated by the operation unit 14, only images of possible defects within a wall thickness range selected by the slider L1 and within a size range selected by the slider L2 are displayed, and images of possible defects outside the ranges are erased.Type: ApplicationFiled: June 22, 2018Publication date: October 18, 2018Applicant: FUJIFILM CorporationInventor: Yasuhiko KANEKO