Patents by Inventor Yesheng SUN

Yesheng SUN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10539613
    Abstract: An analog circuit fault diagnosis method using a single testable node comprises the following steps: (1) obtaining prior sample data vectors under each fault mode; (2) computing a statistical average of the prior sample data vectors under each of the fault modes; (3) decomposing a signal by an orthogonal Haar wavelet filter set; (4) extracting the feature factor of the prior sample fault modes; (5) extracting a fault-mode-to-be-tested feature factor; (6) computing a correlation coefficient matrix and correlation metric parameters between the feature factor of the prior sample fault modes and the feature factor of the fault-mode-to-be-tested; and (7) determining a fault mode according to a maximal correlation principle by comparing the correlation metric parameters.
    Type: Grant
    Filed: November 25, 2015
    Date of Patent: January 21, 2020
    Assignee: HEFEI UNIVERSITY OF TECHNOLOGY
    Inventors: Yigang He, Lifen Yuan, Lei Wu, Yesheng Sun, Chaolong Zhang, Ying Long, Zhen Cheng, Zhijie Yuan, Deqin Zhao
  • Patent number: 10110026
    Abstract: A wireless sensor network sensor network charging method for multi-charge nodes, including the following steps: (1) establishing a WSNs model; (2) dividing field ranges of charging trolleys; and (3) charging the charging trolleys: (a) initializing: l=0 and j=0, wherein l is the total number of received alarm nodes, and j is the serial number of an alarmed node; (b) receiving an alarm signal, updating values of l and j, generating a shortest charging path sl, and computing an energy discriminate vector; (c) if a vector element satisfies Qlj?5% B and j=1, 2, . . .
    Type: Grant
    Filed: November 24, 2015
    Date of Patent: October 23, 2018
    Assignee: HEFEI UNIVERSITY OF TECHNOLOGY
    Inventors: Lifen Yuan, Peng Chen, Yigang He, Shuai Luo, Zhijie Yuan, Zhen Cheng, Deqin Zhao, Yesheng Sun, Lei Wu
  • Publication number: 20180038909
    Abstract: An analog circuit fault diagnosis method using a single testable node comprises the following steps: (1) obtaining prior sample data vectors under each fault mode; (2) computing a statistical average of the prior sample data vectors under each of the fault modes; (3) decomposing a signal by an orthogonal Haar wavelet filter set; (4) extracting the feature factor of the prior sample fault modes; (5) extracting a fault-mode-to-be-tested feature factor; (6) computing a correlation coefficient matrix and correlation metric parameters between the feature factor of the prior sample fault modes and the feature factor of the fault-mode-to-be-tested; and (7) detennining a fault mode according to a maximal correlation principle by comparing the correlation metric parameters.
    Type: Application
    Filed: November 25, 2015
    Publication date: February 8, 2018
    Applicant: HEFEI UNIVERSITY OF TECHNOLOGY
    Inventors: Yigang HE, Lifen YUAN, Lei WU, Yesheng SUN, Chaolong ZHANG, Ying LONG, Zhen CHENG, Zhijie YUAN, Deqin ZHAO
  • Publication number: 20170353044
    Abstract: A wireless sensor network sensor network charging method for multi-charge nodes, including the following steps: (1) establishing a WSNs model; (2) dividing field ranges of charging trolleys; and (3) charging the charging trolleys: (a) initializing: l=0 and j=0, wherein l is the total number of received alarm nodes, and j is the serial number of an alarmed node; (b) receiving an alarm signal, updating values of l and j, generating a shortest charging path sl, and computing an energy discriminate vector; (c) if a vector element satisfies Qlj?5% B and j=1, 2, . . .
    Type: Application
    Filed: November 24, 2015
    Publication date: December 7, 2017
    Applicant: HEFEI UNIVERSITY OF TECHNOLOGY
    Inventors: Lifen YUAN, Peng CHEN, Yigang HE, Shuai LUO, Zhijie YUAN, Zhen CHENG, Deqin ZHAO, Yesheng SUN, Lei WU