Abstract: A nonvolatile memory apparatus includes a memory cell array including a plurality of sub arrays. A plurality of analog-to-digital converters (ADCs) configured to sense sensing voltages outputted from memory cells of the plurality of sub arrays and a path selection unit configured to electrically couple the plurality of sub arrays with the plurality of ADCs in one-to-one correspondence in a first operation mode, and electrically couple the plurality of ADCs with a terminal of a power supply voltage in a second operation mode.

Abstract: A write driver is configured to determine a magnitude and an application time of a pre-emphasis current pulse in response to control codes generated according to parasitic components on a path from a write driver to a program target cell and a resistance value of the program target cell, and supply a preset program current to a memory circuit block by adding a pre-emphasis current to the preset program current in a program mode.

Abstract: A world line driver circuit according to an embodiment includes a driving unit configured to output a sub word line driving signal in response to a word line select signal and a main word line driving signal, a transmission unit configured to transmit the sub word line driving signal to a word line in response to a first enable signal, and a precharge unit configured to precharge a potential of the word line.

Abstract: A semiconductor memory apparatus may include a read/write circuit unit configured to receive an external voltage, to read data from a memory cell array, and to generate a pre-read signal, while an internal voltage is generated during a test mode, and a controller configured to selectively drive a write circuit unit in response to the pre-read signal.

Abstract: A semiconductor memory apparatus includes a column address decoding unit configured to decode a column address and generate a column select signal; a row address decoding unit configured to decode a row address and generate a word line select signal; a driving driver unit configured to provide different voltages to a plurality of resistive memory elements in response to the column select signal; a sink current control unit configured to generate a plurality of sink voltages with different voltage levels in response to the word line select signal; and a plurality of current sink units configured to flow current from the plurality of respective resistive memory elements to a ground terminal in response to the plurality of sink voltages.

Abstract: Provided an electronic device including a semiconductor memory unit. The semiconductor memory unit includes: a plurality of storage cells each including a variable resistance element of which resistance is changed in response to a current flowing across the variable resistance element and a selecting element coupled to one end of the variable resistance element; a plurality of word lines corresponding to the respective storage cells and each coupled to a selecting element of a corresponding storage cell; a first line coupled to one ends of the plurality of storage cells; a second line coupled to the other ends of the plurality of storage cells; a voltage adjuster configured to adjust the voltage levels of back bias voltages of the selecting elements of the plurality of storage cells; and an access control unit electrically coupled to the first and second lines and passing an access current to a selected storage cell among the plurality of storage cells.

Abstract: A nonvolatile memory apparatus includes a memory cell array including a plurality of sub arrays. A plurality of analog-to-digital converters (ADCs) configured to sense sensing voltages outputted from memory cells of the plurality of sub arrays and a path selection unit configured to electrically couple the plurality of sub arrays with the plurality of ADCs in one-to-one correspondence in a first operation mode, and electrically couple the plurality of ADCs with a terminal of a power supply voltage in a second operation mode.

Abstract: Provided is an electronic device including a power supply circuit. The power supply circuit includes: a voltage driving unit configured to pull-up drive an output node and generate an output voltage; and a driving control unit configured to receive the output voltage, disable the voltage driving unit from the time at which a divided voltage obtained by dividing the output voltage at a set ratio becomes higher than a first level, and enable the voltage driving unit from the time at which the divided voltage becomes lower than a second level, which is higher than the first level.

Abstract: A write control device includes a switching unit configured to selectively supply a write current in response to a driving control signal, a driving unit configured to supply a driving current to a memory cell corresponding to the write current applied through the switching unit, and an over-driving control unit coupled to an output node of the driving unit and configured to over-drive the output node in response to the driving control signal.

Abstract: A nonvolatile memory apparatus includes a memory cell configured to receive a first current and a second current through a bit line which is connected to a sensing node; a sensing node level control unit configured to be driven in response to a control signal, compare a reference voltage and a voltage of the sensing node, and output a driving signal to a driving node; a first current driving unit configured to output the first current to the driving node by using a first driving voltage in response to the driving signal; and a current control unit configured to perform a discharge operation of the bit line or electrically connect the driving node and the sensing node, in response to the control signal.

Abstract: A reference voltage generator generates a reference voltage having a stable voltage level insensitive to a temperature variation. A reference voltage generator includes a current generating unit configured to generate a reference current proportional to temperature increase, a voltage adjusting unit configured to adjust a reference voltage corresponding to a current level of the reference current, and a start-up driving unit configured to drive and amplify the reference voltage while the voltage adjusting unit operates.

Abstract: An internal voltage generating circuit includes a divided voltage generator configured to generate a divided voltage by dividing a feedback internal voltage level at a division ratio corresponding to an operation mode control signal, a voltage detector configured to detect a level of the divided voltage based on a reference voltage level, an internal voltage generator configured to receive a supply voltage as power source and generate the internal voltage in response to an output signal of the voltage detector, and an under-driving unit configured to under-drive an internal voltage terminal to a supply voltage in an under-driving operation region that is determined in response to the operation mode control signal.

Abstract: A nonvolatile memory apparatus includes a memory cell configured to receive a first current and a second current through a bit line which is connected to a sensing node; a sensing node level control unit configured to be driven in response to a control signal, compare a reference voltage and a voltage of the sensing node, and output a driving signal to a driving node; a first current driving unit configured to output the first current to the driving node by using a first driving voltage in response to the driving signal; and a current control unit configured to perform a discharge operation of the bit line or electrically connect the driving node and the sensing node, in response to the control signal.

Abstract: A nonvolatile semiconductor device and a method for testing the same are provided. The nonvolatile semiconductor device includes a current generating unit configured to generate a set write current depending on a step pulse that is generated based on a reference current and output the set write current to a memory cell, and a current measuring unit configured to measure a step duration of the step pulse and output a measured result outside of a chip during an activation period of a test enable signal.

Abstract: An internal voltage generating circuit includes a divided voltage generator configured to generate a divided voltage by dividing a feedback internal voltage level at a division ratio corresponding to an operation mode control signal, a voltage detector configured to detect a level of the divided voltage based on a reference voltage level, an internal voltage generator configured to receive a supply voltage as power source and generate the internal voltage in response to an output signal of the voltage detector, and an under-driving unit configured to under-drive an internal voltage terminal to a supply voltage in an under-driving operation region that is determined in response to the operation mode control signal.

Abstract: An internal voltage generating circuit includes a divided voltage generator configured to generate a divided voltage by dividing a feedback internal voltage level at a division ratio corresponding to an operation mode control signal, a voltage detector configured to detect a level of the divided voltage based on a reference voltage level, an internal voltage generator configured to receive a supply voltage as power source and generate the internal voltage in response to an output signal of the voltage detector, and an under-driving unit configured to under-drive an internal voltage terminal to a supply voltage in an under-driving operation region that is determined in response to the operation mode control signal.

Abstract: A write control device includes a switching unit configured to selectively supply a write current in response to a driving control signal, a driving unit configured to supply a driving current to a memory cell corresponding to the write current applied through the switching unit, and an over-driving control unit coupled to an output node of the driving unit and configured to over-drive the output node in response to the driving control signal.

Abstract: A nonvolatile semiconductor device and a method for testing the same are provided. The nonvolatile semiconductor device includes a current generating unit configured to generate a set write current depending on a step pulse that is generated based on a reference current and output the set write current to a memory cell, and a current measuring unit configured to measure a step duration of the step pulse and output a measured result outside of a chip during an activation period of a test enable signal.

Abstract: A reference voltage generator generates a reference voltage having a stable voltage level insensitive to a temperature variation. A reference voltage generator includes a current generating unit configured to generate a reference current proportional to temperature increase, a voltage adjusting unit configured to adjust a reference voltage corresponding to a current level of the reference current, and a start-up driving unit configured to drive and amplify the reference voltage while the voltage adjusting unit operates.

Abstract: A current control apparatus of a phase change memory includes a temperature sensing block having an output voltage level which varies depending on temperature of an internal circuit and a write driver configured to control an amount of program current provided to a memory cell in response to the output voltage level of the temperature sensing block.