Abstract: The present invention discloses an automatic semiconductor device classification system including a current measuring unit, a data memory, a processor connected to the data memory and the current measuring unit, and an output unit connected to the processor. Patterns of curves representing approximate I-V characteristics between predetermined electrodes of semiconductor devices are automatically determined and the approximate I-V characteristics are classified into predetermined categories. The data memory stores the discrete I-V relations, and further stores a first control voltage, a first threshold current value at the first control voltage, a second control voltage corresponding to the second control voltage. The processor includes an acquisition circuit, a comparison circuit and a classification circuit. In the acquisition circuit, the first decision current value at the first control voltage and the second decision current value at the second control voltage are obtained using the measured results.

Abstract: A laser beam machining head of the present invention includes a head supporting member, a first rotating bracket member for guiding a laser beam with the first rotating member being rotatable about a first axis with respect to the head supporting member. A second rotating bracket member guides the laser beam from the first rotating bracket member. The second rotating bracket member is rotatable with respect to the first rotating bracket member about a second axis, the second axis crossing the first axis at a fixed point with a predetermined angle. A laser beam concentrator concentrates the laser beam entering from the second bracket member and projects the beam to the fixed point where the first axis crosses the second rotational axis.