Abstract: A measuring system and a measuring method of an antenna pattern based on near field to far field transformation (NFTF) are provided. The measuring system includes a probe antenna, a reference antenna, and a control system. The probe antenna measures an electric field radiated by an antenna under test to obtain electric field information. The reference antenna measures the electric field to obtain a reference phase. The control system is coupled to the antenna under test, the probe antenna, and the reference antenna, wherein the control system applies near field focusing to the reference antenna to configure a focus point of the reference antenna on the antenna under test, and the control system performs the NFTF according to the electric field information and the reference phase to output far field patterns.

Abstract: A semiconductor device and a manufacturing method thereof are provided. The device includes a dielectric layer, a ring waveguide embedded in the dielectric layer, and an input/output (I/O) waveguide embedded in the dielectric layer and optically coupled to the ring waveguide in a vertical manner. Materials of the dielectric layer, the ring waveguide, and the I/O waveguide are different.

Abstract: A high linearity voltage-current converter able to compensate for mobility degradation comprises a first constant current source circuit, a first current mirror unit, a second constant current source circuit, a second current mirror unit, a seventh MOS transistor and an eighth MOS transistor. The first current mirror unit is coupled to the first constant current source circuit, and the second current mirror unit is coupled to the second constant current source circuit. The seventh MOS transistor, the first current mirror unit and the second current mirror unit are coupled to each other at a third joint point of a first conducting wire. The eighth MOS transistor is coupled to the seventh MOS transistor. Thereby, the electronic components used in the present invention can operate more efficiently.