Abstract: A quantum dot, a quantum dot composite, a composition for preparing a quantum dot composite, a display panel including the quantum dot composite, and an electronic device including the display panel, wherein the quantum dot includes a core including a semiconductor nanocrystal including indium and phosphorus, a shell disposed on the core and including a semiconductor nanocrystal, and a compound represented by Chemical Formula 1 and a compound represented by Chemical Formula 2, both of which are present on the surface of the shell:

Abstract: A method of distributing an encoding/decoding program and a symmetric key in a security domain environment, and a device divider and data injector therefor are provided. The method includes selecting, at a highest-level security domain, an encoding/decoding program and a symmetric key to be distributed to a plurality of lower-level security domains; dividing the selected encoding/decoding program and the symmetric key into pieces as many as the number of lower-level security domains; and distributing the divided encoding/decoding program pieces and the symmetric key pieces to devices belonging to the lower-level security domains.

Abstract: A method of distributing an encoding/decoding program and a symmetric key in a security domain environment, and a device divider and data injector therefor are provided. The method includes selecting, at a highest-level security domain, an encoding/decoding program and a symmetric key to be distributed to a plurality of lower-level security domains; dividing the selected encoding/decoding program and the symmetric key into pieces as many as the number of lower-level security domains; and distributing the divided encoding/decoding program pieces and the symmetric key pieces to devices belonging to the lower-level security domains.

Abstract: A hard disk drive with a reduced read channel optimization test time and a reduced test time difference determines whether or not the time limit for testing the hard disk drive has elapsed whenever the test by the zones and heads is completed, so that the test time difference between the respective drives may be prevented. Further, the test progresses from the last zone to the first zone. Thus, although the test is halted in the course of performing the test, the zone with the high error rate can be tested. In addition, a determination is made as to whether or not the error rate is high or not at the steps of selecting the test track and determining the test off-track. If it is determined that the error rate is high, the total number of sectors to be read for the test will be adjusted, thereby reducing the test time delay due to the high error rate.