Abstract: An air conditioning device for a vehicle includes: a housing having an inside divided into an inflow space, a heat exchange space, and an outflow space, which are straightly arranged, and having a plurality of discharge ports, which communicates with an interior, at the inflow space; a blowing unit disposed at the inflow space of the housing and configured to blow air; a heat exchange unit disposed at the heat exchange space of the housing and configured to adjust a temperature of conditioned air by exchanging heat with air; and an opening-closing door disposed at the outflow space of the housing and configured to open and close the plurality of discharge ports such that conditioned air at an adjusted temperature selectively flows to the plurality of discharge ports. The air conditioning device adjusts the temperature of conditioned air for respective modes and reduces a flow resistance of air.

Abstract: An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.

Abstract: A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.

Abstract: A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.

Abstract: An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.

Abstract: An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.

Abstract: A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.

Abstract: An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.

Abstract: An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.

Abstract: An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.

Abstract: An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.

Abstract: An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.

Abstract: An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.

Abstract: An image sensor operating in a skip mode and reading out a pixel signal provided by at least one of a plurality of pixels and compensating for fixed pattern noise (FPN) in column-parallel pipelines.

Abstract: In one embodiment, an image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter configured to convert analog pixel signals output from the pixels into digital signals, a first cluster configured to store a first group of digital signals among the digital signals and to output first image data, a second cluster configured to store a second group of digital signals among the digital signals and to output second image data, and at least one cluster switch connected to the first cluster and the second cluster, a first channel, and a second channel. The image sensor is configured to transmit at least one among the first image data and the second image data to at least one among the first channel and the second channel based on an operation mode.

Abstract: A data transmission circuit includes a data output unit (DOU) connected to a positive data transmission line and a negative data transmission line. The DOU generates a recovered data signal based on data signals communicated via the positive and negative data transmission lines. Data signal driving units are respectively connected at different points along the positive and negative data transmission lines, where each data signal driving unit generates and provides a positive data signal and a negative data signal based on a data input signal and a data transmission distance between the data signal driving unit and the data output unit.

Abstract: An image sensor includes a pixel array, a column signal processor, and a column mismatch compensator. The pixel array outputs a pixel signal from each column line during a pixel measuring time, and outputs a reference signal during a reference measuring time. The column signal processor performs correlated double sampling (CDS) on the reference signal to generate a reference CDS signal, and performs CDS on the pixel signal to generate a pixel CDS signal. The column mismatch compensator compensates the pixel CDS signal based on the reference CDS signal.

Abstract: An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.

Abstract: An image sensor operating in a skip mode and reading out a pixel signal provided by at least one of a plurality of pixels and compensating for fixed pattern noise (FPN) in column-parallel pipelines.

Abstract: An image sensor includes a comparator configured to compare a pixel signal with a ramp signal and generate a comparison signal and a counter configured to be reset by a counter reset value based on an offset of the comparator and to generate a digital pixel signal according to the comparison signal.