Patents by Inventor Yuichi Hirano

Yuichi Hirano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10533849
    Abstract: An analysis apparatus includes: a storage unit configured to store a learned neural network; an acquisition unit configured to acquire determination image data obtained by capturing an image of a surface in which at least a surface layer of a coating layer stacked on the coating irregularity generated in the coating surface to be determined has been abraded; a determination unit configured to input the determination image data acquired by the acquisition unit to the learned neural network read out from the storage unit and determine the cause of occurrence of the coating irregularity generated in the coating surface to be determined; and an output unit configured to output information regarding the cause of occurrence determined by the determination unit.
    Type: Grant
    Filed: April 4, 2019
    Date of Patent: January 14, 2020
    Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Yohei Sano, Yuichi Hirano
  • Patent number: 10522325
    Abstract: There is provided a charged particle beam device which includes a charged particle beam source, a charged particle beam optical system that irradiates a sample with a charged particle beam from the charged particle beam source, a detector that detects a secondary signal generated from the sample by irradiation with the charged particle beam, and an image processing unit that executes integration processing of image data obtained from the secondary signal and outputting an integrated image, and in which the image processing unit executes a normalization integration computation of outputting an integrated image in which a luminance value of the integrated image is always “1” in an integration process.
    Type: Grant
    Filed: November 27, 2015
    Date of Patent: December 31, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masato Kamio, Masashi Watanabe, Katsunori Hirano, Yoshinobu Hoshino, Shigeru Kawamata, Yuichi Sakurai
  • Publication number: 20190355719
    Abstract: A semiconductor device includes first to fourth cells sequentially disposed on a substrate, first to third diffusion break structures, a first fin structure configured to protrude from the substrate, the first fin structure comprising first to fourth fins separated from each other by the first to third diffusion break structures, a second fin structure configured to protrude from the substrate, to be spaced apart from the first fin structure, the second fin structure comprising fifth to eighth fins separated from each other by the first to third diffusion break structures, the first to fourth gate electrodes being disposed in the first to fourth cells, respectively, and the number of fins in one cell of the first to fourth cells is different from the number of fins in an other cell of the first to fourth cells.
    Type: Application
    Filed: April 1, 2019
    Publication date: November 21, 2019
    Inventors: Shigenobu MAEDA, Sung Chul PARK, Chul Hong PARK, Yoshinao HARADA, Sung Min KANG, Ji Wook KWON, Ha-Young KIM, Yuichi HIRANO
  • Publication number: 20190331483
    Abstract: An analysis apparatus includes: a storage unit configured to store a learned neural network; an acquisition unit configured to acquire determination image data obtained by capturing an image of a surface in which at least a surface layer of a coating layer stacked on the coating irregularity generated in the coating surface to be determined has been abraded; a determination unit configured to input the determination image data acquired by the acquisition unit to the learned neural network read out from the storage unit and determine the cause of occurrence of the coating irregularity generated in the coating surface to be determined; and an output unit configured to output information regarding the cause of occurrence determined by the determination unit.
    Type: Application
    Filed: April 4, 2019
    Publication date: October 31, 2019
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Yohei SANO, Yuichi HIRANO
  • Publication number: 20190257706
    Abstract: A method for measuring an axial-force of a bolt fastened to a component to be fastened, includes temporarily fastening the bolt to the component to be fastened with a temporarily-tightening torque, the temporarily-tightening torque being a torque which is determined in advance and by which a depression is formed on a head of the bolt, measuring a first axial force of the temporarily-fastened bolt, regularly fastening the bolt to the component to be fastened with a regularly-tightening torque, the regularly-tightening torque being torque which is determined in advance and larger than the temporarily-tightening torque, measuring a second axial force of the regularly-fastened bolt, and measuring an estimated axial force of the regularly-fastened bolt by using the torque with which the bolt is temporarily fastened, the torque with which the bolt is regularly fastened, and a difference between the first and second axial forces.
    Type: Application
    Filed: January 7, 2019
    Publication date: August 22, 2019
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Masahito SAKAKIBARA, Yuichi HIRANO
  • Publication number: 20190199006
    Abstract: A terminal fitting (T) includes an inner conductor (11) and an outer conductor (12). The inner conductor (11) has a mating connecting portion (15) to be connected to a mating terminal fitting and a center conductor crimping portion (16) to be crimped to a center conductor of a shielded cable. The outer conductor (12) has a tubular portion (19) configured to surround the mating connecting portion (15). A coupling (21) is behind the tubular portion (19). The center conductor crimping portion is inside the coupling (21). A shield crimping portion (22) is behind the coupling (21) and is to be crimped to a shield layer of the shielded cable. A conductive member (60) extends in a front-rear direction and includes a bridge (61) to electrically contact the tubular portion (19) and the shield crimping portion (22) across the coupling (21).
    Type: Application
    Filed: December 24, 2018
    Publication date: June 27, 2019
    Inventors: Keisuke Kanemura, Shohei Mitsui, Hidekazu Matsuda, Yuichi Nakanishi, Ai Hirano
  • Publication number: 20190199013
    Abstract: A terminal fitting (T) includes an inner conductor (11), an outer conductor (12) and a dielectric (13) interposed between these conductors. The inner conductor (11) is connected to a core (51) of a shielded cable (W). The outer conductor (12) includes two shield crimping pieces (45) deformable along an outer periphery of a braided wire (53) of the shielded cable (W). Further, the terminal fitting (T) includes a cover (14) including a shield-side surrounding portion (84) for surrounding the shield crimping pieces (45) along outer peripheries thereof.
    Type: Application
    Filed: December 24, 2018
    Publication date: June 27, 2019
    Inventors: Keisuke Kanemura, Yuichi Nakanishi, Ai Hirano, Shohei Mitsui
  • Publication number: 20190199036
    Abstract: A connector housing (20) includes a housing body (21) to which a mating connector housing is to be fit from front. A lock arm (40) has front and rear ends fixed to the housing body (21). A lock (42) is provided in a central part of the lock arm (40) in the front-rear direction and is configured to lock the mating connector housing. A pressing surface (43) is on a rear end part of the lock arm (40) and is configured to displace the lock (42) in an unlocking direction by being pressed. A coupling portion (44) couples the pressing surface (43) to the central part of the lock arm (40) in the front-rear direction.
    Type: Application
    Filed: December 24, 2018
    Publication date: June 27, 2019
    Inventors: Keisuke Kanemura, Teruo Hara, Hidekazu Matsuda, Ai Hirano, Yuichi Nakanishi, Shohei Mitsui
  • Publication number: 20190199014
    Abstract: A terminal fitting (T) includes an inner conductor (11) having a center conductor crimping portion (18) to be crimped to a center conductor of a shielded cable (W) and an outer conductor (12) having a coupling (35). The center conductor crimping portion (18) is disposed inside the coupling by assembling the inner conductor (11). Openings (43, 44) open in the coupling (35). A shield crimping portion (36) is connected to the coupling (35) and to be crimped to a shield layer of the shielded cable W. A dielectric (13) is interposed between the outer and inner conductors (12, 11), and a cover (14) is configured to close the openings (43, 44) and electrically contact the outer conductor (12).
    Type: Application
    Filed: December 24, 2018
    Publication date: June 27, 2019
    Inventors: Keisuke Kanemura, Shohei Mitsui, Yuichi Nakanishi, Ai Hirano
  • Publication number: 20190199008
    Abstract: A connector (C) includes a housing (60), a terminal fitting (10) and a retainer (80). The housing (60) includes a cavity (64) extending in a front-rear direction and a retainer insertion hole (72) intersecting and communicating with the cavity and open in an outer surface. The terminal fitting (10) is inserted into the cavity (64) from behind, and a stabilizer configured to guide an inserting operation into the cavity (64) and restrict the inserting operation in an erroneous posture projects on an outer side. The retainer (80) is inserted into the retainer insertion hole (72) and include a retaining portion (85) configured to face the stabilizer from behind.
    Type: Application
    Filed: December 24, 2018
    Publication date: June 27, 2019
    Inventors: Keisuke Kanemura, Shohei Mitsui, Hidekazu Matsuda, Yuichi Nakanishi, Ai Hirano
  • Patent number: 10325362
    Abstract: At a first timing when a tightening machine temporarily tightens a bolt, a distance sensor acquires a first distance image. A distance sensor controller measures a first recess amount of the head of the bolt at the first timing by the first distance image. A manipulator controller is configured to change a relative posture of an image sensor relative to the head of the bolt in accordance with a rotation angle by which the bolt is rotated from the first timing to a second timing. The distance sensor acquires a second distance image at the second timing, and the distance sensor controller measures a second recess amount of the head of the bolt at the second timing by the second distance image, so as to measure an axial tension of the bolt by use of a difference between the first recess amount and the second recess amount.
    Type: Grant
    Filed: December 6, 2017
    Date of Patent: June 18, 2019
    Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Masahito Sakakibara, Yuichi Hirano
  • Patent number: 10317330
    Abstract: A particle measuring apparatus includes a light source configured to irradiate a gas with light, a first optical detection unit configured to detect an intensity of reflected light from particles contained in the gas, and configured to output a first parameter value corresponding to the intensity of the reflected light, and a storage unit that stores first data indicating corresponding relationships between first parameter values particle components. The particle measuring apparatus further includes a calculation unit configured to compare the first parameter value transmitted from the first optical detection unit with the first data transmitted from the storage unit to determine a component of the particles contained in the gas.
    Type: Grant
    Filed: September 1, 2016
    Date of Patent: June 11, 2019
    Assignee: TOSHIBA MEMORY CORPORATION
    Inventors: Masaki Hirano, Yuichi Kuroda
  • Publication number: 20180165804
    Abstract: At a first timing when a tightening machine temporarily tightens a bolt, a distance sensor acquires a first distance image. A distance sensor controller measures a first recess amount of the head of the bolt at the first timing by the first distance image. A manipulator controller is configured to change a relative posture of an image sensor relative to the head of the bolt in accordance with a rotation angle by which the bolt is rotated from the first timing to a second timing. The distance sensor acquires a second distance image at the second timing, and the distance sensor controller measures a second recess amount of the head of the bolt at the second timing by the second distance image, so as to measure an axial tension of the bolt by use of a difference between the first recess amount and the second recess amount.
    Type: Application
    Filed: December 6, 2017
    Publication date: June 14, 2018
    Applicant: Toyota Jidosha Kabushiki Kaisha
    Inventors: Masahito SAKAKIBARA, Yuichi Hirano
  • Patent number: 9805459
    Abstract: An axial force measurement method includes: a step of calculating an average value of the height of pixels positioned inside a minimum circle, which is centered on a gravity center position of a head, as a minimum point; a step of extracting pixels with a relatively large height from the pixels on the basis of a pixel value of the pixels and calculating an average value of the height of the extracted pixels as a maximum point; a step of calculating a displacement amount of the head on the basis of a difference between the minimum point and the maximum point; and a step of calculating an axial force by substituting the displacement amount of the head into a relational expression of an axial force and the displacement amount of the head.
    Type: Grant
    Filed: October 16, 2014
    Date of Patent: October 31, 2017
    Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Hisanori Nakamura, Masahito Sakakibara, Tatsuro Mori, Yuichi Hirano, Yusuke Matsumoto, Takashi Sakui
  • Publication number: 20160267645
    Abstract: An axial force measurement method includes: a step of calculating an average value of the height of pixels positioned inside a minimum circle, which is centered on a gravity center position of a head, as a minimum point; a step of extracting pixels with a relatively large height from the pixels on the basis of a pixel value of the pixels and calculating an average value of the height of the extracted pixels as a maximum point; a step of calculating a displacement amount of the head on the basis of a difference between the minimum point and the maximum point; and a step of calculating an axial force by substituting the displacement amount of the head into a relational expression of an axial force and the displacement amount of the head.
    Type: Application
    Filed: October 16, 2014
    Publication date: September 15, 2016
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Hisanori NAKAMURA, Masahito SAKAKIBARA, Tatsuro MORI, Yuichi HIRANO, Yusuke MATSUMOTO, Takashi SAKUI
  • Publication number: 20160043221
    Abstract: A semiconductor device includes a semiconductor substrate having a main surface, a MONOS-type memory cell formed over the main surface and having a channel, an n-channel transistor formed over the main surface, and a p-channel transistor formed over the man surface. Nitride films are formed in a manner to contact the top surfaces of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor. The nitride films apply stress to the channels of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor.
    Type: Application
    Filed: October 16, 2015
    Publication date: February 11, 2016
    Inventor: Yuichi HIRANO
  • Patent number: 9190333
    Abstract: A semiconductor device includes a semiconductor substrate having a main surface, a MONOS-type memory cell formed over the main surface and having a channel, an n-channel transistor formed over the main surface, and a p-channel transistor formed over the man surface. Nitride films are formed in a manner to contact the top surfaces of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor. The nitride films apply stress to the channels of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor.
    Type: Grant
    Filed: November 14, 2014
    Date of Patent: November 17, 2015
    Assignee: RENESAS ELECTRONICS CORPORATION
    Inventor: Yuichi Hirano
  • Publication number: 20150064862
    Abstract: A semiconductor device includes a semiconductor substrate having a main surface, a MONOS-type memory cell formed over the main surface and having a channel, an n-channel transistor formed over the main surface, and a p-channel transistor formed over the man surface. Nitride films are formed in a manner to contact the top surfaces of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor. The nitride films apply stress to the channels of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor.
    Type: Application
    Filed: November 14, 2014
    Publication date: March 5, 2015
    Inventor: Yuichi HIRANO
  • Patent number: 8912590
    Abstract: A semiconductor device includes a semiconductor substrate having a main surface, a MONOS-type memory cell formed over the main surface and having a channel, an n-channel transistor formed over the main surface, and a p-channel transistor formed over the man surface. Nitride films are formed in a manner to contact the top surfaces of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor. The nitride films apply stress to the channels of the MONOS-type memory cell, the n-channel transistor, and the p-channel transistor.
    Type: Grant
    Filed: May 15, 2012
    Date of Patent: December 16, 2014
    Assignee: Renesas Electronics Corporation
    Inventor: Yuichi Hirano
  • Patent number: 8878301
    Abstract: A semiconductor device includes core transistors for forming a logic circuit, and I/O transistors for forming an input/output circuit. A distance from the main surface to a lowermost part of an n-type impurity region NR of the I/O n-type transistor is longer than that from the main surface to a lowermost part of an n-type impurity region NR of the core n-type transistor. A distance from the main surface to a lowermost part of a p-type impurity region PR of the I/O p-type transistor is longer than that from the main surface to a lowermost part of a p-type impurity region of the core p-type transistor. A distance from the main surface to the lowermost part of the n-type impurity region of the I/O n-type transistor is longer than that from the main surface to the lowermost part of the p-type impurity region of the I/O p-type transistor.
    Type: Grant
    Filed: July 19, 2011
    Date of Patent: November 4, 2014
    Assignee: Renesas Electronics Corporation
    Inventor: Yuichi Hirano