Patents by Inventor Yuichi Naitou

Yuichi Naitou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning probe microscope with probe formed by single conductive material
    Patent number: 6888135
    Abstract: In a scanning probe microscope a probe associated with its sharp end includes a single conductive material.
    Type: Grant
    Filed: October 18, 2001
    Date of Patent: May 3, 2005
    Assignee: NEC Corporation
    Inventors: Yuichi Naitou, Norio Ookubo
  • Coaxial probe with cantilever and scanning micro-wave microscope including the same
    Patent number: 6715345
    Abstract: A coaxial probe includes a coaxial cable including an electrical conductor extending therethrough and projecting therefrom at an end thereof, a planar waveguide on which the electrical conductor projecting from the coaxial cable is mounted, and a sensor electrically connected to the electrical conductor through the planar waveguide. The planar waveguide may be comprised of a substrate, and a strip line formed on the substrate, the strip line being electrically connected at one end to the sensor and at the other end to the electrical conductor. The sensor may be comprised of a cantilever supported at a distal end thereof on the planar waveguide, and a probe mounted on a free end of the cantilever.
    Type: Grant
    Filed: April 20, 2001
    Date of Patent: April 6, 2004
    Assignee: NEC Corporation
    Inventors: Norio Ookubo, Noriyuki Kodama, Hiroaki Kikuchi, Yuichi Naitou
  • Coaxial probe and scanning micro-wave microscope including the same
    Publication number: 20030034453
    Abstract: A coaxial probe includes a coaxial cable including an electrical conductor extending therethrough and projecting therefrom at an end thereof, a planar waveguide on which the electrical conductor projecting from the coaxial cable is mounted, and a sensor electrically connected to the electrical conductor through the planar waveguide. The planar waveguide may be comprised of a substrate, and a strip line formed on the substrate, the strip line being electrically connected at one end to the sensor and at the other end to the electrical conductor. The sensor may be comprised of a cantilever supported at a distal end thereof on the planar waveguide, and a probe mounted on a free end of the cantilever.
    Type: Application
    Filed: April 20, 2001
    Publication date: February 20, 2003
    Applicant: NEC Corporation
    Inventors: Norio Ookubo, Noriyuki Kodama, Hiroaki Kikuchi, Yuichi Naitou
  • Scanning probe microscope with probe formed by single conductive material
    Publication number: 20020043101
    Abstract: In a scanning probe microscope a probe associated with its sharp end includes a single conductive material.
    Type: Application
    Filed: October 18, 2001
    Publication date: April 18, 2002
    Applicant: NEC Corporation
    Inventors: Yuichi Naitou, Norio Ookubo