Patents by Inventor Yuichiro Ohmae
Yuichiro Ohmae has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20220357245Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying processType: ApplicationFiled: July 26, 2022Publication date: November 10, 2022Inventors: Shogo KUBOTA, Seiya SHINABE, Hiroyuki KOGA, Noriyuki NAKANISHI, Yuichiro OHMAE, Toshihisa TANAKA, Tetsuya ODA
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Publication number: 20220308076Abstract: A quality control method of a specimen analysis system according to one or more embodiments is disclosed. The quality control method may include cooling and storing a quality control material comprising a cell of known concentration; heating the cooled and stored quality control material; transporting the heated quality control material to an analyzer; and measuring the quality control material by the analyzer.Type: ApplicationFiled: March 3, 2022Publication date: September 29, 2022Applicant: SYSMEX CORPORATIONInventors: Yuji WAKAMIYA, Toru UEMURA, Yuichiro OHMAE, Hidetaka HAYAMA
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Publication number: 20220283196Abstract: A method for controlling a specimen analysis system including at least one measurement unit according to one or more embodiments is disclosed. The method may include automatically starting at least one measurement unit according to a schedule registered by a user; automatically supplying a quality control specimen to the measurement unit that is automatically started; and measuring the quality control specimen by the measurement unit.Type: ApplicationFiled: March 3, 2022Publication date: September 8, 2022Applicant: SYSMEX CORPORATIONInventors: Yuji WAKAMIYA, Toru UEMURA, Yuichiro OHMAE, Hidetaka HAYAMA
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Publication number: 20220283194Abstract: A quality control method of a specimen analysis system is disclosed, including: receiving a setting of a quality control measurement condition from a user; determining at least one quality control specimen to be used for quality control measurement from among a plurality of the quality control specimens stored in a storage, according to the quality control measurement condition and information on the quality control specimens that are stored in the storage section; taking out the determined quality control specimen from the storage; transporting the determined quality control specimen to a measurement unit; and measuring the transported quality control specimen by the measurement unit.Type: ApplicationFiled: March 3, 2022Publication date: September 8, 2022Applicant: SYSMEX CORPORATIONInventors: Yuji WAKAMIYA, Toru UEMURA, Yuichiro OHMAE, Hidetaka HAYAMA
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Patent number: 11422072Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying processType: GrantFiled: July 21, 2020Date of Patent: August 23, 2022Assignee: SYSMEX CORPORATIONInventors: Shogo Kubota, Seiya Shinabe, Hiroyuki Koga, Noriyuki Nakanishi, Yuichiro Ohmae, Toshihisa Tanaka, Tetsuya Oda
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Patent number: 11397190Abstract: Provided is a test system operable with a simplified structure. A test system includes a first test device and a second test device each of which transports and tests a sample. The test device includes a master control unit, which performs assignment of samples to the first test device and the second test device, and control of a transport operation of the sample assigned to the test device. The test device includes a slave control unit, which controls a transport operation of the sample assigned to the test device by the master control unit.Type: GrantFiled: August 25, 2015Date of Patent: July 26, 2022Assignee: SYSMEX CORPORATIONInventors: Nobuyoshi Yamakawa, Hiroo Tatsutani, Yuichiro Ohmae
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Patent number: 11340245Abstract: A transport device transports a container used in a sample measurement device or a rack housing the container. The transport device may include: a robotic arm configured to transport the container or the rack between a first sample measurement device and each of other sample measurement devices different from the first sample measurement device; and a controller that controls operation of the robotic arm.Type: GrantFiled: May 10, 2019Date of Patent: May 24, 2022Assignees: SYSMEX CORPORATION, KAWASAKI JUKOGYO KABUSHIKI KAISHAInventors: Takaaki Nagai, Yuichiro Ohmae, Shinji Kamada, Toshiki Sato, Yukio Iwasaki, Satoshi Ouchi
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Patent number: 11181540Abstract: A measurement system according to one or more embodiments may include a measurement unit that measures a sample contained in a sample container; a transport unit including a first transporter that transports a rack holding sample containers in a longitudinal direction of the rack to the measurement unit, and a second transporter that transports the rack from the measurement unit; and a rack export-import unit that sets racks thereon, that is capable of transferring each of the set racks in a lateral direction of the rack, that exports the rack to the first transporter from one end side of the rack export-import unit, and that imports the rack transported by the second transporter from another end side of the rack export-import unit. The rack export-import unit includes a transfer prevention section that prevents the rack imported from the other end side from being transferred from the one end side.Type: GrantFiled: June 15, 2017Date of Patent: November 23, 2021Assignee: SYSMEX CORPORATIONInventors: Yuichiro Ohmae, Hiroo Tatsutani
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Publication number: 20200348214Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying processType: ApplicationFiled: July 21, 2020Publication date: November 5, 2020Inventors: Shogo KUBOTA, Seiya SHINABE, Hiroyuki KOGA, Noriyuki NAKANISHI, Yuichiro OHMAE, Toshihisa TANAKA, Tetsuya ODA
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Patent number: 10801929Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying processType: GrantFiled: February 27, 2018Date of Patent: October 13, 2020Assignee: SYSMEX CORPORATIONInventors: Shogo Kubota, Seiya Shinabe, Hiroyuki Koga, Noriyuki Nakanishi, Yuichiro Ohmae, Toshihisa Tanaka, Tetsuya Oda
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Patent number: 10723552Abstract: A sample measurement system includes: a measurement unit that measures a sample stored in a sample container; a transport unit that transports a rack capable of holding sample containers via the measurement unit; a first transport-in/transport-out unit and a second transport-in/transport-out unit in each of which racks can be set alongside in a first direction, and that send the set racks to be transported to the measurement unit and receive the racks transported from the measurement unit; and a controller that controls the first transport-in/transport-out unit and the second transport-in/transport-out unit so that the racks are sequentially sent from the first transport-in/transport-out unit and the second transport-in/transport-out unit. The first transport-in/transport-out unit and the second transport-in/transport-out unit are disposed alongside in a second direction crossing the first direction, and each send the racks from one side in the first direction, and receive the racks from the other side.Type: GrantFiled: September 14, 2017Date of Patent: July 28, 2020Assignee: SYSMEX CORPORATIONInventors: Hiroo Tatsutani, Yuichiro Ohmae, Atsushi Kumagai
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Patent number: 10683166Abstract: A sample measurement system includes: a measurement unit that measures a sample stored in a sample container; a transport unit that transports a rack capable of holding sample containers via the measurement unit; a first transport-in/transport-out unit and a second transport-in/transport-out unit in each of which racks can be set alongside in a first direction, and that send the set racks to be transported to the measurement unit and receive the racks transported from the measurement unit; and a controller that controls the first transport-in/transport-out unit and the second transport-in/transport-out unit so that the racks are sequentially sent from the first transport-in/transport-out unit and the second transport-in/transport-out unit. The first transport-in/transport-out unit and the second transport-in/transport-out unit are disposed alongside in a second direction crossing the first direction, and each send the racks from one side in the first direction, and receive the racks from the other side.Type: GrantFiled: September 14, 2017Date of Patent: June 16, 2020Assignee: SYSMEX CORPORATIONInventors: Hiroo Tatsutani, Yuichiro Ohmae, Atsushi Kumagai
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Publication number: 20190346465Abstract: A transport device transports a container used in a sample measurement device or a rack housing the container. The transport device may include: a robotic arm configured to transport the container or the rack between a first sample measurement device and each of other sample measurement devices different from the first sample measurement device; and a controller that controls operation of the robotic arm.Type: ApplicationFiled: May 10, 2019Publication date: November 14, 2019Applicants: SYSMEX CORPORATION, KAWASAKI JUKOGYO KABUSHIKI KAISHAInventors: Takaaki NAGAI, Yuichiro OHMAE, Shinji KAMADA, Toshiki SATO, Yukio IWASAKI, Satoshi OUCHI
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Patent number: 10145768Abstract: The time period necessary for a staining process is shortened, and the apparatus is downsized. This smear preparation apparatus includes: a staining vessel for storing a staining liquid therein so as to allow a plurality of glass slides each having a sample smeared thereon to be immersed therein; and a transfer unit for holding and transferring each glass slide. The staining vessel includes a plurality of first holders configured to hold the glass slides. The staining vessel is configured such that a plurality of glass slides held by a plurality of the first holders are immersed in the stored staining liquid, and the transfer unit is configured to put in/take out the glass slides one by one with respect to a plurality of the first holders of the staining vessel.Type: GrantFiled: May 19, 2017Date of Patent: December 4, 2018Assignee: SYSMEX CORPORATIONInventors: Yuichiro Ohmae, Seiya Shinabe, Kosuke Sekizuka
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Patent number: 10099866Abstract: A transport apparatus transports sample holder racks. The apparatus employs a first transport unit that moves the rack in a path between two ends of the transport apparatus, a rack sender unit that extends in a first direction that intersects the path, a second transport unit dimensioned parallel to the first transport unit and with the rack sender unit interposed therebetween, which locates the sample container held in the rack at a sample loading position of a measurement device, and a first movable member capable of moving in the first direction between the first and the second transport units. The apparatus has movable portions that alternately stop the rack movement, and push the rack such that optimal movement is achieved whereby the rack moves beyond the rack sender unit to the second transport unit as the first movable member moves in the first direction.Type: GrantFiled: August 28, 2015Date of Patent: October 16, 2018Assignee: SYSMEX CORPORATIONInventors: Yuichiro Ohmae, Hiroo Tatsutani, Nobuyoshi Yamakawa
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Patent number: 10101346Abstract: In accordance with embodiments, a transport mechanism transports a first sample container to a sample aspiration position. A setting part may set a second sample container, that accommodates a sample to be measured, with priority over a measurement of a sample in a first sample container. A nozzle may be capable of moving a sample from a first sample container at a sample aspiration position, and aspirating the sample from the second sample container. A detector may detect components of the sample. A controller may control a transport mechanism such that the first sample container moves to a position distant from the sample aspiration position, when the first sample container has been transported and when sample aspiration of the second sample container is required. A controller may execute control to move the nozzle above the sample aspiration position in state in which the first sample container is distant from the sample aspiration position.Type: GrantFiled: May 27, 2016Date of Patent: October 16, 2018Assignee: SYSMEX CORPORATIONInventors: Hiroki Koike, Yousuke Matsui, Go Senda, Hiroo Tatsutani, Yuichiro Ohmae, Atsushi Kumagai, Tomoyuki Asahara
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Publication number: 20180188140Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying processType: ApplicationFiled: February 27, 2018Publication date: July 5, 2018Inventors: Shogo KUBOTA, Seiya SHINABE, Hiroyuki KOGA, Noriyuki NAKANISHI, Yuichiro OHMAE, Toshihisa TANAKA, Tetsuya ODA
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Publication number: 20180003729Abstract: A sample measurement system may include: a measurement unit that measures a sample in a sample container; a transport unit that transports a rack that can hold sample containers, via the measurement unit; a collection unit that is detachably provided with a tray in which racks can be set, and that collects the rack transported from the measurement unit by the transport unit and sets the rack in the tray; a storage that stores sample identification information, rack identification information, and tray identification information in association with each other; an input part; a display part; and a controller that, in a condition in which the input part receives input of the sample identification information or the rack identification information, causes the display part to display the tray identification information stored in association with the inputted sample identification information or the inputted rack identification information.Type: ApplicationFiled: September 13, 2017Publication date: January 4, 2018Applicant: SYSMEX CORPORATIONInventors: Hiroo TATSUTANI, Yuichiro OHMAE
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Publication number: 20180002108Abstract: A sample measurement system includes: a measurement unit that measures a sample stored in a sample container; a transport unit that transports a rack capable of holding sample containers via the measurement unit; a first transport-in/transport-out unit and a second transport-in/transport-out unit in each of which racks can be set alongside in a first direction, and that send the set racks to be transported to the measurement unit and receive the racks transported from the measurement unit; and a controller that controls the first transport-in/transport-out unit and the second transport-in/transport-out unit so that the racks are sequentially sent from the first transport-in/transport-out unit and the second transport-in/transport-out unit. The first transport-in/transport-out unit and the second transport-in/transport-out unit are disposed alongside in a second direction crossing the first direction, and each send the racks from one side in the first direction, and receive the racks from the other side.Type: ApplicationFiled: September 14, 2017Publication date: January 4, 2018Applicant: SYSMEX CORPORATIONInventors: Hiroo TATSUTANI, Yuichiro OHMAE, Atsushi KUMAGAI
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Publication number: 20170285053Abstract: A measurement system according to one or more embodiments may include a measurement unit that measures a sample contained in a sample container; a transport unit including a first transporter that transports a rack holding sample containers in a longitudinal direction of the rack to the measurement unit, and a second transporter that transports the rack from the measurement unit; and a rack export-import unit that sets racks thereon, that is capable of transferring each of the set racks in a lateral direction of the rack, that exports the rack to the first transporter from one end side of the rack export-import unit, and that imports the rack transported by the second transporter from another end side of the rack export-import unit. The rack export-import unit includes a transfer prevention section that prevents the rack imported from the other end side from being transferred from the one end side.Type: ApplicationFiled: June 15, 2017Publication date: October 5, 2017Applicant: SYSMEX CORPORATIONInventors: Yuichiro OHMAE, Hiroo TATSUTANI