Patents by Inventor Yuichiro Ohmae

Yuichiro Ohmae has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230228780
    Abstract: Disclosed is a specimen testing system that includes: a specimen rearrangement unit configured to transfer a specimen container held in a first rack to a second rack; a specimen processing unit configured to process a specimen in the specimen container held in the second rack; a specimen storage unit configured to transfer the specimen container having been processed by the specimen processing unit from the second rack to a specimen container storage instrument for storage; a transportation unit configured to transport the second rack among the specimen rearrangement unit, the specimen processing unit, and the specimen storage unit; and a transportation control unit programmed to control the transportation unit. The transportation control unit is programmed to control bidirectional transportation of the second rack between the specimen rearrangement unit and the specimen storage unit.
    Type: Application
    Filed: January 6, 2023
    Publication date: July 20, 2023
    Applicant: Sysmex Corporation
    Inventors: Hidetaka HAYAMA, Yuichiro OHMAE, Toshiki SATO, Hiroyuki TSUJI
  • Publication number: 20230228781
    Abstract: Disclosed is a container transfer method for transferring a container from a container holder capable of holding a plurality of containers, by using a holding section capable of performing an opening/closing operation, vertical movement, and horizontal movement. The method includes: moving the holding section downward to a position lower than a head portion of the container, at a position where the container is not held in a plan view; horizontally moving the holding section in an opened state, toward a target container on the container holder; after the horizontal movement of the holding section to the target container, closing the holding section with respect to the target container; and moving upward the holding section in a closed state.
    Type: Application
    Filed: January 6, 2023
    Publication date: July 20, 2023
    Applicant: Sysmex Corporation
    Inventors: Hidetaka HAYAMA, Yuichiro OHMAE, Yuji WAKAMIYA, Tomohiro KUROIWA
  • Publication number: 20230228779
    Abstract: Disclosed is a specimen transfer device connected to a rack transportation path of a specimen testing system, and the specimen transfer device includes: an ascending/descending mechanism configured to move a rack between a first ascending/descending position at which the rack in a first tier is disposed, and a second ascending/descending position at which the rack in a second tier is disposed; a container transfer mechanism configured to transfer a specimen container, to a second rack disposed in the second tier, from a first rack moved by the ascending/descending mechanism from the first ascending/descending position to the second ascending/descending position; a rack waiting region disposed in the first tier and configured to cause the rack to stay in a waiting state between the first ascending/descending position and a carrying-out position to the rack transportation path; and a first transportation mechanism configured to transport the first rack moved by the ascending/descending mechanism from the second
    Type: Application
    Filed: January 6, 2023
    Publication date: July 20, 2023
    Applicant: Sysmex Corporation
    Inventors: Hidetaka HAYAMA, Toshiki SATO, Yuichiro OHMAE
  • Publication number: 20220357245
    Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying process
    Type: Application
    Filed: July 26, 2022
    Publication date: November 10, 2022
    Inventors: Shogo KUBOTA, Seiya SHINABE, Hiroyuki KOGA, Noriyuki NAKANISHI, Yuichiro OHMAE, Toshihisa TANAKA, Tetsuya ODA
  • Publication number: 20220308076
    Abstract: A quality control method of a specimen analysis system according to one or more embodiments is disclosed. The quality control method may include cooling and storing a quality control material comprising a cell of known concentration; heating the cooled and stored quality control material; transporting the heated quality control material to an analyzer; and measuring the quality control material by the analyzer.
    Type: Application
    Filed: March 3, 2022
    Publication date: September 29, 2022
    Applicant: SYSMEX CORPORATION
    Inventors: Yuji WAKAMIYA, Toru UEMURA, Yuichiro OHMAE, Hidetaka HAYAMA
  • Publication number: 20220283194
    Abstract: A quality control method of a specimen analysis system is disclosed, including: receiving a setting of a quality control measurement condition from a user; determining at least one quality control specimen to be used for quality control measurement from among a plurality of the quality control specimens stored in a storage, according to the quality control measurement condition and information on the quality control specimens that are stored in the storage section; taking out the determined quality control specimen from the storage; transporting the determined quality control specimen to a measurement unit; and measuring the transported quality control specimen by the measurement unit.
    Type: Application
    Filed: March 3, 2022
    Publication date: September 8, 2022
    Applicant: SYSMEX CORPORATION
    Inventors: Yuji WAKAMIYA, Toru UEMURA, Yuichiro OHMAE, Hidetaka HAYAMA
  • Publication number: 20220283196
    Abstract: A method for controlling a specimen analysis system including at least one measurement unit according to one or more embodiments is disclosed. The method may include automatically starting at least one measurement unit according to a schedule registered by a user; automatically supplying a quality control specimen to the measurement unit that is automatically started; and measuring the quality control specimen by the measurement unit.
    Type: Application
    Filed: March 3, 2022
    Publication date: September 8, 2022
    Applicant: SYSMEX CORPORATION
    Inventors: Yuji WAKAMIYA, Toru UEMURA, Yuichiro OHMAE, Hidetaka HAYAMA
  • Patent number: 11422072
    Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying process
    Type: Grant
    Filed: July 21, 2020
    Date of Patent: August 23, 2022
    Assignee: SYSMEX CORPORATION
    Inventors: Shogo Kubota, Seiya Shinabe, Hiroyuki Koga, Noriyuki Nakanishi, Yuichiro Ohmae, Toshihisa Tanaka, Tetsuya Oda
  • Patent number: 11397190
    Abstract: Provided is a test system operable with a simplified structure. A test system includes a first test device and a second test device each of which transports and tests a sample. The test device includes a master control unit, which performs assignment of samples to the first test device and the second test device, and control of a transport operation of the sample assigned to the test device. The test device includes a slave control unit, which controls a transport operation of the sample assigned to the test device by the master control unit.
    Type: Grant
    Filed: August 25, 2015
    Date of Patent: July 26, 2022
    Assignee: SYSMEX CORPORATION
    Inventors: Nobuyoshi Yamakawa, Hiroo Tatsutani, Yuichiro Ohmae
  • Patent number: 11340245
    Abstract: A transport device transports a container used in a sample measurement device or a rack housing the container. The transport device may include: a robotic arm configured to transport the container or the rack between a first sample measurement device and each of other sample measurement devices different from the first sample measurement device; and a controller that controls operation of the robotic arm.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: May 24, 2022
    Assignees: SYSMEX CORPORATION, KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Takaaki Nagai, Yuichiro Ohmae, Shinji Kamada, Toshiki Sato, Yukio Iwasaki, Satoshi Ouchi
  • Patent number: 11181540
    Abstract: A measurement system according to one or more embodiments may include a measurement unit that measures a sample contained in a sample container; a transport unit including a first transporter that transports a rack holding sample containers in a longitudinal direction of the rack to the measurement unit, and a second transporter that transports the rack from the measurement unit; and a rack export-import unit that sets racks thereon, that is capable of transferring each of the set racks in a lateral direction of the rack, that exports the rack to the first transporter from one end side of the rack export-import unit, and that imports the rack transported by the second transporter from another end side of the rack export-import unit. The rack export-import unit includes a transfer prevention section that prevents the rack imported from the other end side from being transferred from the one end side.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: November 23, 2021
    Assignee: SYSMEX CORPORATION
    Inventors: Yuichiro Ohmae, Hiroo Tatsutani
  • Publication number: 20200348214
    Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying process
    Type: Application
    Filed: July 21, 2020
    Publication date: November 5, 2020
    Inventors: Shogo KUBOTA, Seiya SHINABE, Hiroyuki KOGA, Noriyuki NAKANISHI, Yuichiro OHMAE, Toshihisa TANAKA, Tetsuya ODA
  • Patent number: 10801929
    Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying process
    Type: Grant
    Filed: February 27, 2018
    Date of Patent: October 13, 2020
    Assignee: SYSMEX CORPORATION
    Inventors: Shogo Kubota, Seiya Shinabe, Hiroyuki Koga, Noriyuki Nakanishi, Yuichiro Ohmae, Toshihisa Tanaka, Tetsuya Oda
  • Patent number: 10723552
    Abstract: A sample measurement system includes: a measurement unit that measures a sample stored in a sample container; a transport unit that transports a rack capable of holding sample containers via the measurement unit; a first transport-in/transport-out unit and a second transport-in/transport-out unit in each of which racks can be set alongside in a first direction, and that send the set racks to be transported to the measurement unit and receive the racks transported from the measurement unit; and a controller that controls the first transport-in/transport-out unit and the second transport-in/transport-out unit so that the racks are sequentially sent from the first transport-in/transport-out unit and the second transport-in/transport-out unit. The first transport-in/transport-out unit and the second transport-in/transport-out unit are disposed alongside in a second direction crossing the first direction, and each send the racks from one side in the first direction, and receive the racks from the other side.
    Type: Grant
    Filed: September 14, 2017
    Date of Patent: July 28, 2020
    Assignee: SYSMEX CORPORATION
    Inventors: Hiroo Tatsutani, Yuichiro Ohmae, Atsushi Kumagai
  • Patent number: 10683166
    Abstract: A sample measurement system includes: a measurement unit that measures a sample stored in a sample container; a transport unit that transports a rack capable of holding sample containers via the measurement unit; a first transport-in/transport-out unit and a second transport-in/transport-out unit in each of which racks can be set alongside in a first direction, and that send the set racks to be transported to the measurement unit and receive the racks transported from the measurement unit; and a controller that controls the first transport-in/transport-out unit and the second transport-in/transport-out unit so that the racks are sequentially sent from the first transport-in/transport-out unit and the second transport-in/transport-out unit. The first transport-in/transport-out unit and the second transport-in/transport-out unit are disposed alongside in a second direction crossing the first direction, and each send the racks from one side in the first direction, and receive the racks from the other side.
    Type: Grant
    Filed: September 14, 2017
    Date of Patent: June 16, 2020
    Assignee: SYSMEX CORPORATION
    Inventors: Hiroo Tatsutani, Yuichiro Ohmae, Atsushi Kumagai
  • Publication number: 20190346465
    Abstract: A transport device transports a container used in a sample measurement device or a rack housing the container. The transport device may include: a robotic arm configured to transport the container or the rack between a first sample measurement device and each of other sample measurement devices different from the first sample measurement device; and a controller that controls operation of the robotic arm.
    Type: Application
    Filed: May 10, 2019
    Publication date: November 14, 2019
    Applicants: SYSMEX CORPORATION, KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Takaaki NAGAI, Yuichiro OHMAE, Shinji KAMADA, Toshiki SATO, Yukio IWASAKI, Satoshi OUCHI
  • Patent number: 10145768
    Abstract: The time period necessary for a staining process is shortened, and the apparatus is downsized. This smear preparation apparatus includes: a staining vessel for storing a staining liquid therein so as to allow a plurality of glass slides each having a sample smeared thereon to be immersed therein; and a transfer unit for holding and transferring each glass slide. The staining vessel includes a plurality of first holders configured to hold the glass slides. The staining vessel is configured such that a plurality of glass slides held by a plurality of the first holders are immersed in the stored staining liquid, and the transfer unit is configured to put in/take out the glass slides one by one with respect to a plurality of the first holders of the staining vessel.
    Type: Grant
    Filed: May 19, 2017
    Date of Patent: December 4, 2018
    Assignee: SYSMEX CORPORATION
    Inventors: Yuichiro Ohmae, Seiya Shinabe, Kosuke Sekizuka
  • Patent number: 10099866
    Abstract: A transport apparatus transports sample holder racks. The apparatus employs a first transport unit that moves the rack in a path between two ends of the transport apparatus, a rack sender unit that extends in a first direction that intersects the path, a second transport unit dimensioned parallel to the first transport unit and with the rack sender unit interposed therebetween, which locates the sample container held in the rack at a sample loading position of a measurement device, and a first movable member capable of moving in the first direction between the first and the second transport units. The apparatus has movable portions that alternately stop the rack movement, and push the rack such that optimal movement is achieved whereby the rack moves beyond the rack sender unit to the second transport unit as the first movable member moves in the first direction.
    Type: Grant
    Filed: August 28, 2015
    Date of Patent: October 16, 2018
    Assignee: SYSMEX CORPORATION
    Inventors: Yuichiro Ohmae, Hiroo Tatsutani, Nobuyoshi Yamakawa
  • Patent number: 10101346
    Abstract: In accordance with embodiments, a transport mechanism transports a first sample container to a sample aspiration position. A setting part may set a second sample container, that accommodates a sample to be measured, with priority over a measurement of a sample in a first sample container. A nozzle may be capable of moving a sample from a first sample container at a sample aspiration position, and aspirating the sample from the second sample container. A detector may detect components of the sample. A controller may control a transport mechanism such that the first sample container moves to a position distant from the sample aspiration position, when the first sample container has been transported and when sample aspiration of the second sample container is required. A controller may execute control to move the nozzle above the sample aspiration position in state in which the first sample container is distant from the sample aspiration position.
    Type: Grant
    Filed: May 27, 2016
    Date of Patent: October 16, 2018
    Assignee: SYSMEX CORPORATION
    Inventors: Hiroki Koike, Yousuke Matsui, Go Senda, Hiroo Tatsutani, Yuichiro Ohmae, Atsushi Kumagai, Tomoyuki Asahara
  • Publication number: 20180188140
    Abstract: Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying process
    Type: Application
    Filed: February 27, 2018
    Publication date: July 5, 2018
    Inventors: Shogo KUBOTA, Seiya SHINABE, Hiroyuki KOGA, Noriyuki NAKANISHI, Yuichiro OHMAE, Toshihisa TANAKA, Tetsuya ODA