Patents by Inventor Yuji Takagi

Yuji Takagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190333661
    Abstract: A sintered magnet contains Sm—Fe—N-based crystal grains and has high coercivity; and a magnetic powder is capable of forming a sintered magnet without lowering the coercivity even if heat is generated in association with the sintering. A sintered magnet comprises a crystal phase composed of a plurality of Sm—Fe—N-based crystal grains and a nonmagnetic metal phase present between the Sm—Fe—N crystal grains adjacent to each other, wherein a ratio of Fe peak intensity IFe to SmFeN peak intensity ISmFeN measured by an X-ray diffraction method is 0.2 or less. A magnetic powder comprises Sm—Fe—N-based crystal particles and a nonmagnetic metal layer covering surfaces of the Sm—Fe—N crystal particles.
    Type: Application
    Filed: July 8, 2019
    Publication date: October 31, 2019
    Applicants: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Murata Manufacturing Co., Ltd.
    Inventors: Kenta TAKAGI, Wataru YAMAGUCHI, Takaaki YOKOYAMA, Kenji SAKAGUCHI, Kazuhiro YOSHII, Yuji YOKOYAMA
  • Publication number: 20190323580
    Abstract: An orifice member is disposed in a plunger including a plunger hole that forms a hydraulic chamber in conjunction with a plunger housing hole in a housing. The orifice member includes a deformed fitting section deformed to fit on the inner circumferential surface of the plunger hole, a communication section that causes a surface in contact with the top surface on the front side of the plunger hole and a surface on the hydraulic chamber side to communicate, and an orifice groove that communicates with the communication section and an external relief hole provided in the plunger on the surface in contact with the top surface on the front side of the plunger hole to constitute an orifice.
    Type: Application
    Filed: February 27, 2019
    Publication date: October 24, 2019
    Applicant: TSUBAKIMOTO CHAIN CO.
    Inventors: Masanori Watanabe, Yudai Takagi, Yuji Kurematsu
  • Patent number: 10436576
    Abstract: To review minute defects that were buried in roughness scattered light with an observation device provided with a dark-field microscope, a scanning electron microscope (SEM), and a control unit, the present invention configures the dark-field microscope by installing a filter for blocking a portion of the scattered light, an imaging lens for focusing the scattered light that has passed through the filter, and a detector for dividing the image of the scattered light focused by the imaging lens into the polarization directions converted by a wavelength plate and detecting the resulting images, and the control has a calculation unit for determining the position of a defect candidate detected by another inspection device using the plurality of images separated into polarization directions and detected by the detector.
    Type: Grant
    Filed: March 19, 2015
    Date of Patent: October 8, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yohei Minekawa, Yuko Otani, Yuji Takagi
  • Publication number: 20190266713
    Abstract: A versatile template generation unit cuts a first region in which a similarity level to a template image is a first similarity level and a second region in which the similarity level to the template image is a second similarity level different from the first similarity level, from an input image including an alignment mark, to generate a versatile template image.
    Type: Application
    Filed: January 30, 2019
    Publication date: August 29, 2019
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Naoaki KONDO, Minoru HARADA, Yuji TAKAGI, Takehiro HIRAI
  • Publication number: 20190237296
    Abstract: A defect observation device detects a defect with high accuracy regardless of a defect size. One imaging configuration for observing an observation target on a sample is selected from an optical microscope, an optical microscope, and an electron microscope, and an imaging condition of the selected imaging configuration is controlled.
    Type: Application
    Filed: January 29, 2019
    Publication date: August 1, 2019
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yuko OTANI, Yohei MINEKAWA, Takashi NOBUHARA, Nobuhiko KANZAKI, Takehiro HIRAI, Miyuki FUKUDA, Yuya ISOMAE, Kaori YAESHIMA, Yuji TAKAGI
  • Publication number: 20190193026
    Abstract: Water is separated into deuterium-depleted water having a low deuterium concentration and deuterium-enriched water having a high deuterium concentration easily and at low cost. A method for separating water into deuterium-depleted water and deuterium-enriched water, the method including: adsorbing water vapor on an adsorbent including a pore body having pores 6 while supplying water vapor to and allowing the water vapor to pass through the adsorbent for a predetermined period of time; recovering deuterium-enriched water containing a large amount of heavy water 8 from the water vapor not adsorbed on the adsorbent; and then recovering deuterium-depleted water containing a large amount of light water 7 from the water vapor adsorbed on the adsorbent.
    Type: Application
    Filed: June 1, 2017
    Publication date: June 27, 2019
    Inventors: Katsumi KANEKO, Toshio TAKAGI, Katsuyuki MURATA, Yuji Ono
  • Patent number: 10297021
    Abstract: To quantify the degree of a defect, and provide information useful for yield management. Disclosed is a defect quantification method wherein: a defect image is classified; a measurement region and a measurement area are set to each of the defect image and a reference image on the basis of defect image classification results, said reference image corresponding to the defect image; and an evaluation value of a defect is calculated using each of the measurement values obtained from each of the measurement areas of the defect image and the reference image, and the defect is quantified.
    Type: Grant
    Filed: June 26, 2015
    Date of Patent: May 21, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yohei Minekawa, Yuji Takagi, Takehiro Hirai
  • Publication number: 20190139210
    Abstract: Provided is a defect classification apparatus classifying images of defects of a sample included in images obtained by capturing the sample, the apparatus including an image storage unit for storing the images of the sample acquired by an external image acquisition unit, a defect class storage unit for storing types of defects included in the images of the sample, an image processing unit for extracting images of defects from the images from the sample, processing the extracted images of defects and generating a plurality of defect images, a classifier learning unit for learning a defect classifier using the images of defects of the sample extracted by the image processing unit and data of the plurality of generated defect images, and a defect classification unit for processing the images of the sample by using the classifier learned by the classifier learning unit, to classify the images of defects of the sample.
    Type: Application
    Filed: May 24, 2016
    Publication date: May 9, 2019
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Naoaki KONDO, Takehiro HIRAI, Minoru HARADA, Yuji TAKAGI
  • Patent number: 10229812
    Abstract: An inspection method uses a charged particle microscope to observe a sample and view a defect site or a circuit pattern. A plurality of images is detected by a plurality of detectors and a mixed image is generated by automatically adjusting and mixing weighting factors required when the plurality of images are synthesized with each other. The sample is irradiated and scanned with a charged particle beam so that the plurality of detectors arranged at different positions from the sample detects a secondary electron or a reflected electron generated from the sample. The mixed image is generated by mixing the plurality of images of the sample with each other for each of the plurality of detectors, which are obtained by causing each of the plurality of detectors arranged at the different positions to detect the secondary electron or the reflected electron. The generated mixed image is displayed on a screen.
    Type: Grant
    Filed: December 21, 2015
    Date of Patent: March 12, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Minoru Harada, Yuji Takagi, Takehiro Hirai
  • Patent number: 10223202
    Abstract: In an optical disc apparatus that records and reproduces data onto and from an optical disc in units of predetermined block, an information divider divides the data so as to reduce an amount of the data included in each of blocks when a recording state of the optical disc does not satisfy a predetermined criterion, and reproduces recording data in units of the block by adding sub-information including a value indicating the amount of the data included in each of the blocks. An error-correction encoder circuit encodes the recording data in a first error-correction code format, and a recorder converts encoded recording data into a recording signal, and records the recording signal onto the optical disc. A quality evaluator circuit produces an evaluation value indicating a recording quality based on a result of reproducing the recording signal recorded on the optical disc.
    Type: Grant
    Filed: January 8, 2018
    Date of Patent: March 5, 2019
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Kohei Nakata, Yuji Takagi
  • Patent number: 10203851
    Abstract: Provided is a GUI including: an unadded pane region that hierarchically displays folders which are sets of images having no class information added thereto; an image pane region that displays the images displayed in the unadded pane region, the displayed images having no classification added thereto; and a class pane region that displays images having classification added thereto, wherein by externally inputting class information for one image having the class information added thereto, the input class information is displayed.
    Type: Grant
    Filed: November 26, 2012
    Date of Patent: February 12, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yohei Minekawa, Yuji Takagi, Minoru Harada, Takehiro Hirai, Ryo Nakagaki
  • Publication number: 20190033728
    Abstract: An overlay measurement method using a reference image is an effective method for an overlay measurement in a product circuit. However, there is a problem that it is not possible to obtain an ideal reference image in a process of prototyping.
    Type: Application
    Filed: January 27, 2016
    Publication date: January 31, 2019
    Inventors: Yuji TAKAGI, Fumihiko FUKUNAGA, Yasunori GOTO
  • Patent number: 10094658
    Abstract: To address the problem in which when measuring the overlay of patterns formed on upper and lower layers of a semiconductor pattern by comparing a reference image and measurement image obtained through imaging by an SEM, the contrast of the SEM image of the pattern of the lower layer is low relative to that of the SEM image of the pattern of the upper layer and alignment state verification is difficult even if the reference image and measurement image are superposed on the basis of measurement results, the present invention determines the amount of positional displacement of patterns of an object of overlay measurement from a reference image and measurement image obtained through imaging by an SEM, carries out differential processing on the reference image and measurement image, aligns the reference image and measurement image that have been subjected to differential processing on the basis of the positional displacement amount determined previously, expresses the gradation values of the aligned differential r
    Type: Grant
    Filed: August 3, 2015
    Date of Patent: October 9, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yuji Takagi, Fumihiko Fukunaga, Yasunori Goto
  • Publication number: 20180240225
    Abstract: A sample observation device images a sample placed on a movable table by irradiating and scanning the sample with a charged particle beam of a microscope. A degraded image having poor image quality and a high quality image having satisfactory image quality which are acquired at the same location of the sample by causing the charged particle microscope to change an imaging condition for imaging the sample are stored. An estimation process parameter is calculated for estimating the high quality image from the degraded image by using the stored degraded image and high quality image. A high quality image estimation unit processes the degraded image obtained by causing the charged particle microscope to image the desired site of the sample by using the calculated estimation process parameter. Thereby, the high quality image obtained at the desired site is estimated, and then the estimated high quality image is output.
    Type: Application
    Filed: February 16, 2018
    Publication date: August 23, 2018
    Inventors: Minoru HARADA, Yuji TAKAGI, Naoaki KONDO, Takehiro HIRAI
  • Patent number: 10054162
    Abstract: A sliding bearing may include vertically-arranged half members obtained by halving a cylinder, wherein a narrow groove is provided circumferentially to both axial direction ends of a lower half member at a downstream side of a rotational direction. A peripheral section may be formed on a surface on an outer side of the narrow groove. The peripheral section may be formed to have a height from an outer peripheral surface of the half member that is shorter than a height of a contact surface from an outer peripheral surface of the half member. An inclined part that is inclined toward an inner peripheral side is provided to a downstream side end, of the narrow groove, and a coating layer is provided to an inner peripheral surface of the half member only part of an inner peripheral surface of the narrow groove including an inner peripheral surface of the inclined part.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: August 21, 2018
    Assignee: TAIHO KOGYO CO., LTD.
    Inventors: Daisuke Seki, Yuji Takagi
  • Patent number: 10054153
    Abstract: A manufacturing method for a sliding bearing including half members, obtained by splitting a cylinder in half in a direction parallel with an axial direction, arranged in an upper and lower direction, may include a first step including forming a narrow groove extending in the circumference direction on an axial direction end of one of the half members on a lower side, on a downstream side in a rotation direction, a second step including performing shot blasting on a surface of the narrow groove; and a third step including forming coating layers on a surface of the half member. The coating layers may be formed only on an upstream-side end and a downstream-side end as parts of the narrow groove.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: August 21, 2018
    Assignee: TAIHO KOGYO CO., LTD.
    Inventors: Daisuke Seki, Yuji Takagi
  • Publication number: 20180174000
    Abstract: In a defect classification operation in which ADC and visual classification are both used, a problem with the visual classification in the related art is solved, and then the high-reliability performance evaluation of the ADC and the update of the ADC learning data set are made possible, using both the ADC and the visual classification, or both the ADC and one other classification apparatus.
    Type: Application
    Filed: June 4, 2015
    Publication date: June 21, 2018
    Inventors: Yuji TAKAGI, Minoru HARADA, Takehiro HIRAI
  • Publication number: 20180129566
    Abstract: In an optical disc apparatus that records and reproduces data onto and from an optical disc in units of predetermined block, an information divider divides the data so as to reduce an amount of the data included in each of blocks when a recording state of the optical disc does not satisfy a predetermined criterion, and reproduces recording data in units of the block by adding sub-information including a value indicating the amount of the data included in each of the blocks. An error-correction encoder circuit encodes the recording data in a first error-correction code format, and a recorder converts encoded recording data into a recording signal, and records the recording signal onto the optical disc. A quality evaluator circuit produces an evaluation value indicating a recording quality based on a result of reproducing the recording signal recorded on the optical disc.
    Type: Application
    Filed: January 8, 2018
    Publication date: May 10, 2018
    Inventors: Kohei NAKATA, Yuji TAKAGI
  • Publication number: 20180119739
    Abstract: It is possible to provide a sliding bearing that can obtain a friction reduction effect, and can suppress the total amount of outflow oil.
    Type: Application
    Filed: February 26, 2016
    Publication date: May 3, 2018
    Inventors: Daisuke SEKI, Yuji TAKAGI
  • Patent number: 9922414
    Abstract: In order to reduce the amount of time it takes to collect images of defects, this defect inspection device is provided with the following: a read-out unit that reads out positions of defects in a semiconductor wafer that have already been detected; a first imaging unit that takes, at a first magnification, a reference image of a chip other than the chip where one of the read-out defects is; a second imaging unit that takes, at the first magnification, a first defect image that contains the read-out defect; a defect-position identification unit that identifies the position of the defect in the first defect image taken by the second imaging unit by comparing said first defect image with the reference image taken by the first imaging unit; a third imaging unit that, on the basis of the identified defect position, takes a second defect image at a second magnification that is higher than the first magnification; a rearrangement unit that rearranges the read-out defects in an order corresponding to a path that goes
    Type: Grant
    Filed: January 27, 2014
    Date of Patent: March 20, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yuji Takagi, Minoru Harada, Masashi Sakamoto, Takehiro Hirai