Patents by Inventor Yunn-En Yeo
Yunn-En Yeo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20160028932Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: ApplicationFiled: July 28, 2014Publication date: January 28, 2016Inventors: Hiok-Nam TAY, Yunn-En YEO
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Patent number: 8792049Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: GrantFiled: March 18, 2013Date of Patent: July 29, 2014Inventors: Hiok-Nam Tay, Yunn-En Yeo
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Publication number: 20130223739Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: ApplicationFiled: March 18, 2013Publication date: August 29, 2013Inventors: Hiok-Nam TAY, Yunn-En YEO
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Patent number: 8451371Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: GrantFiled: September 22, 2011Date of Patent: May 28, 2013Assignee: CANDELA Microsystems (S) Pte. Ltd.Inventors: Hiok-Nam Tay, Yunn-En Yeo
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Patent number: 8334924Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: GrantFiled: May 5, 2012Date of Patent: December 18, 2012Assignee: CANDELA Microsystems (S) Pte. Ltd.Inventors: Yunn-En Yeo, Hiok-Nam Tay
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Patent number: 8264591Abstract: An auto focus image system that includes an image sensor coupled to a controller. The image sensor captures an image that has at least one edge with a width. The controller generates a focus signal that is a function of the edge width. A lens receives the focus signal and adjust a focus. The edge width can be determined by various techniques including the use of gradients. A histogram of edge widths can be used to determine whether a particular image is focused or unfocused. A histogram with a large population of thin edge widths is indicative of a focused image.Type: GrantFiled: April 11, 2008Date of Patent: September 11, 2012Assignee: CANDELA Microsystems (S) Pte. Ltd.Inventors: Yunn-En Yeo, Hiok-Nam Tay
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Patent number: 8264594Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: GrantFiled: July 16, 2008Date of Patent: September 11, 2012Assignee: CANDELA Microsystems (S) Pte. Ltd.Inventors: Yunn-En Yeo, Hiok-Nam Tay
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Publication number: 20120218434Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: ApplicationFiled: May 5, 2012Publication date: August 30, 2012Applicant: CANDELA Microsystems (S) Pte. Ltd.Inventors: Yunn-En YEO, Hiok-Nam TAY
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Publication number: 20120013789Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: ApplicationFiled: September 22, 2011Publication date: January 19, 2012Inventors: Yunn-En Yeo, Hiok-Nam Tay
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Publication number: 20090102963Abstract: An auto focus image system that includes an image sensor coupled to a controller. The image sensor captures an image that has at least one edge with a width. The controller generates a focus signal that is a function of the edge width. A lens receives the focus signal and adjust a focus. The edge width can be determined by various techniques including the use of gradients. A histogram of edge widths can be used to determine whether a particular image is focused or unfocused. A histogram with a large population of thin edge widths is indicative of a focused image.Type: ApplicationFiled: April 11, 2008Publication date: April 23, 2009Inventors: Yunn-En Yeo, Hiok-Nam Tay
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Publication number: 20090027545Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.Type: ApplicationFiled: July 16, 2008Publication date: January 29, 2009Inventors: Yunn-En Yeo, Hiok-Nam Tay