Patents by Inventor Yunn-En Yeo

Yunn-En Yeo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160028932
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Application
    Filed: July 28, 2014
    Publication date: January 28, 2016
    Inventors: Hiok-Nam TAY, Yunn-En YEO
  • Patent number: 8792049
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Grant
    Filed: March 18, 2013
    Date of Patent: July 29, 2014
    Inventors: Hiok-Nam Tay, Yunn-En Yeo
  • Publication number: 20130223739
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Application
    Filed: March 18, 2013
    Publication date: August 29, 2013
    Inventors: Hiok-Nam TAY, Yunn-En YEO
  • Patent number: 8451371
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Grant
    Filed: September 22, 2011
    Date of Patent: May 28, 2013
    Assignee: CANDELA Microsystems (S) Pte. Ltd.
    Inventors: Hiok-Nam Tay, Yunn-En Yeo
  • Patent number: 8334924
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Grant
    Filed: May 5, 2012
    Date of Patent: December 18, 2012
    Assignee: CANDELA Microsystems (S) Pte. Ltd.
    Inventors: Yunn-En Yeo, Hiok-Nam Tay
  • Patent number: 8264591
    Abstract: An auto focus image system that includes an image sensor coupled to a controller. The image sensor captures an image that has at least one edge with a width. The controller generates a focus signal that is a function of the edge width. A lens receives the focus signal and adjust a focus. The edge width can be determined by various techniques including the use of gradients. A histogram of edge widths can be used to determine whether a particular image is focused or unfocused. A histogram with a large population of thin edge widths is indicative of a focused image.
    Type: Grant
    Filed: April 11, 2008
    Date of Patent: September 11, 2012
    Assignee: CANDELA Microsystems (S) Pte. Ltd.
    Inventors: Yunn-En Yeo, Hiok-Nam Tay
  • Patent number: 8264594
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Grant
    Filed: July 16, 2008
    Date of Patent: September 11, 2012
    Assignee: CANDELA Microsystems (S) Pte. Ltd.
    Inventors: Yunn-En Yeo, Hiok-Nam Tay
  • Publication number: 20120218434
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Application
    Filed: May 5, 2012
    Publication date: August 30, 2012
    Applicant: CANDELA Microsystems (S) Pte. Ltd.
    Inventors: Yunn-En YEO, Hiok-Nam TAY
  • Publication number: 20120013789
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Application
    Filed: September 22, 2011
    Publication date: January 19, 2012
    Inventors: Yunn-En Yeo, Hiok-Nam Tay
  • Publication number: 20090102963
    Abstract: An auto focus image system that includes an image sensor coupled to a controller. The image sensor captures an image that has at least one edge with a width. The controller generates a focus signal that is a function of the edge width. A lens receives the focus signal and adjust a focus. The edge width can be determined by various techniques including the use of gradients. A histogram of edge widths can be used to determine whether a particular image is focused or unfocused. A histogram with a large population of thin edge widths is indicative of a focused image.
    Type: Application
    Filed: April 11, 2008
    Publication date: April 23, 2009
    Inventors: Yunn-En Yeo, Hiok-Nam Tay
  • Publication number: 20090027545
    Abstract: A device that analyzes an image. The device includes a circuit that receives an image that includes a plurality of pixels. The circuit creates a histogram of the image and analyzes the histogram to determine an acceptable exposure of the image. The histogram may include a plurality of bins versus a population of pixels associated with each bin. By way of example, the bins may be associated with an intensity of light. The images and histograms may include data defined by low dynamic range number of bits and/or an extended dynamic range number of bits. Certain features and criteria of the image may be determined and analyzed to determine whether the image has an acceptable exposure. If the image is unacceptable, an exposure characteristic can be changed and the process can be repeated until an acceptable image is obtained.
    Type: Application
    Filed: July 16, 2008
    Publication date: January 29, 2009
    Inventors: Yunn-En Yeo, Hiok-Nam Tay