Abstract: A test for screening defects of a transmission/reception circuit in an IC is enabled at low cost, without withstand voltage violation, and without carrying out electrical contacts with many terminals connected to oscillators. In a transmission/reception separation switch circuit using transistors as switch elements, a potential of a gate is lowered in a test more than the potential in a case of reception to avoid gate-source withstand-voltage violation when a large-amplitude signal is input, and an internal-signal loopback test is carried out without destroying a reception circuit.

Abstract: Provided is a probe which transmits an ultrasonic wave to a diagnostic site and receives a reception signal which is a reflected wave.

Abstract: A conventional safe proper becomes useless when unable to be locked or unlocked, thereby causing a waste of resources. Locks capable of being locked/unlocked are provided to unfasten a common fastening member, so as to open a door or lid from the body, allow each lock to be freely mounted on and dismounted from a lock mounting portion, and dispose a false lock on each lock. An operating means of locking/unlocking any one of the locks is provided to enable persistent use of a common latch disposed at an identity opening of a safe proper.

Abstract: A transmit receive switch circuit has a first MOSFET (MN1) and a second MOSFET (MN2), goes into a switch-off state at the time of transmission, and goes into a switch-on state at the time of reception. The first MOSFET (MN1) and the second MOSFET (MN2) are connected between an input terminal (SWIN) and an output terminal (SWOUT). The switch circuit includes a shunt circuit (SHNT) that is connected between a common gate (COMG) and a common source (COMS), the common gate being connected to the gates of the first and second MOSFETs, and the common source being connected to the sources of the first and second MOSFETs. When a signal having a negative voltage relative to a reference voltage is applied to the input terminal, a switch that temporarily turns on causes the shunt circuit to short-circuit the common gate and the common source.

Abstract: An objective of the present invention is to provide an ultrasound system which can correct a positive-negative asymmetry in pulse inversion (PI) and obtain a high-image quality ultrasound image. To carryout an asymmetry correction of a transmission assembly circuit comprising an oscillation adjustment amplifier (10) and an ultrasound oscillator array (90), correction data obtained in a calibration mode is stored in a correction memory (46), and positive-negative asymmetry of an overall receiving assembly circuit comprising a computation unit (45) is corrected in a diagnostic mode of the device using the correction data.

Abstract: Provided is a probe which transmits an ultrasonic wave to a diagnostic site and receives a reception signal which is a reflected wave.

Abstract: Provided is an ultrasonic probe having an adjustable slew rate, the ultrasonic probe having minimal dimensions and circuit sizes. The ultrasonic probe includes: a transducer; a transmitting circuit; a correcting unit; and a distributing unit. The transmitting circuit includes a transducer driving unit and a current source. The transducer driving unit includes a current mirror of a low voltage transistor and a high voltage transistor. The high voltage transistor is connected to the transducer and the current source supplies an operating current to the low voltage transistor of the transducer driving unit. The correcting unit includes a transmission circuit driving unit replica, a bias unit, and an observing unit. The distributing unit transfers a signal to a current source of the transmitting circuit so that the same current value as the current value extracted by the observing unit flows.

Abstract: Amplification of a signal by a small circuit size and reduction of a power are achieved. A current controlling current source unit 53 changes an outputting current based on a transition time setting signal tp. A current controlling current source unit 54 changes a drawing current based on a transition time setting signal tn. An amplitude control unit 55 changes a power source voltage supplied to the current controlling current source unit 53 and changes amplitude of a voltage generated by a current outputted from the current controlling current source unit 53, based on amplitude setting signal ap. An amplitude control unit 56 changes a power source voltage supplied to the current controlling current source unit 54 and changes amplitude of a voltage generated by the current drawn by the current controlling current source unit 54, based on amplitude setting signal an.

Abstract: A conventional safe proper becomes useless when unable to be locked or unlocked, thereby causing a waste of resources. Locks capable of being locked/unlocked are provided to unfasten a common fastening member, so as to open a door or lid from the body, allow each lock to be freely mounted on and dismounted from a lock mounting portion, and dispose a false lock on each lock. Operation of locking/unlocking any one of the locks is provided to enable persistent use of a common latch disposed at an identity opening of a safe proper.

Abstract: A laser unit management system may include a server configured to hold first information provided with access limitation that allows an access with a first access authorization, second information provided with access limitation that allows an access with a second access authorization, and third information provided with access limitation that allows both an access with the first access authorization and an access with the second access authorization; and a laser unit including a laser output section and a controller, the laser output section being configured to output pulsed laser light toward an exposure unit that is configured to perform wafer exposure, the controller being configured to store the first information, the second information, and the third information in the server. The second information may include wafer-exposure-related information on the exposure unit and laser-control-related information on the laser unit that are in association with each other.

Abstract: A laser unit management system may include a server configured to hold first information provided with access limitation that allows an access with a first access authorization, second information provided with access limitation that allows an access with a second access authorization, and third information provided with access limitation that allows both an access with the first access authorization and an access with the second access authorization; and a laser unit including a laser output section and a controller, the laser output section being configured to output pulsed laser light toward an exposure unit that is configured to perform wafer exposure, the controller being configured to store the first information, the second information, and the third information in the server. The second information may include wafer-exposure-related information on the exposure unit and laser-control-related information on the laser unit that are in association with each other.

Abstract: An ultrasound diagnosis device includes: an ultrasound probe which transmits an ultrasound wave toward a examinee and receives a reflected wave from the examinee; and a main device which controls the transmitting and receiving of the ultrasound waves from the ultrasound probe and is operated to receive a receiving signal obtained by receiving the reflected wave from the examinee by the ultrasound probe, to generate an ultrasound image of the examinee, and to display the ultrasound image on a display screen, wherein the ultrasound probe includes a plurality of subarrays having a plurality of element circuits transmitting and receiving ultrasound signals and a plurality of reference voltage sources, and the plurality of subarrays and the plurality of reference voltage sources have a one-to-one correspondence.

Abstract: A retrieving device includes: a classifying unit that classifies document data made up of a plurality of items on the basis of a degree of matching of a first item in which a combination of one or more symbol strings is described in a database in which the document data is stored; and an extracting unit that extracts a group of keywords included in a second item from pieces of document data in a same group classified by the classifying unit as related words for retrieval. Moreover, when the retrieving device is implemented as a distributed system on a network, it is possible to create related words for a plurality of machines and to store the related word data and to enable a plurality of users to use the distributed system.

Abstract: A diagnostic service system includes one or plurality of factory monitoring systems configured to perform monitoring of at least one machine; a service center management device that is connected with the one or plurality of factory monitoring systems via a network; one or plurality of service centers that are connected with the service center management device; and a plurality of service terminals connected with one service center or each of the plurality of service centers via a service control. The plurality of service terminals are used by each responder capable of fault diagnosis of the machine, and when fault of a machine occurs, one of the plurality of service terminals is selected via the service center management device and the one service center or plurality of service centers.

Abstract: A test for screening defects of a transmission/reception circuit in an IC is enabled at low cost, without withstand voltage violation, and without carrying out electrical contacts with many terminals connected to oscillators. In a transmission/reception separation switch circuit using transistors as switch elements, a potential of a gate is lowered in a test more than the potential in a case of reception to avoid gate-source withstand-voltage violation when a large-amplitude signal is input, and an internal-signal loopback test is carried out without destroying a reception circuit.

Abstract: A diagnostic service system includes one or plurality of factory monitoring systems configured to perform monitoring of at least one machine; a service center management device that is connected with the one or plurality of factory monitoring systems via a network; one or plurality of service centers that are connected with the service center management device; and a plurality of service terminals connected with one service center or each of the plurality of service centers via a service control. The plurality of service terminals are used by each responder capable of fault diagnosis of the machine, and when fault of a machine occurs, one of the plurality of service terminals is selected via the service center management device and the one service center or plurality of service centers.

Abstract: Provided is an ultrasonic probe having an adjustable slew rate, the ultrasonic probe having minimal dimensions and circuit sizes. The ultrasonic probe includes: a transducer; a transmitting circuit; a correcting unit; and a distributing unit. The transmitting circuit includes a transducer driving unit and a current source. The transducer driving unit includes a current mirror of a low voltage transistor and a high voltage transistor. The high voltage transistor is connected to the transducer and the current source supplies an operating current to the low voltage transistor of the transducer driving unit. The correcting unit includes a transmission circuit driving unit replica, a bias unit, and an observing unit. The distributing unit transfers a signal to a current source of the transmitting circuit so that the same current value as the current value extracted by the observing unit flows.

Abstract: A transmit receive switch circuit has a first MOSFET (MN1) and a second MOSFET (MN2), goes into a switch-off state at the time of transmission, and goes into a switch-on state at the time of reception. The first MOSFET (MN1) and the second MOSFET (MN2) are connected between an input terminal (SWIN) and an output terminal (SWOUT). The switch circuit includes a shunt circuit (SHNT) that is connected between a common gate (COMG) and a common source (COMS), the common gate being connected to the gates of the first and second MOSFETs, and the common source being connected to the sources of the first and second MOSFETs. When a signal having a negative voltage relative to a reference voltage is applied to the input terminal, a switch that temporarily turns on causes the shunt circuit to short-circuit the common gate and the common source.

Abstract: Amplification of a signal by a small circuit size and reduction of a power are achieved. A current controlling current source unit 53 changes an outputting current based on a transition time setting signal tp. A current controlling current source unit 54 changes a drawing current based on a transition time setting signal tn. An amplitude control unit 55 changes a power source voltage supplied to the current controlling current source unit 53 and changes amplitude of a voltage generated by a current outputted from the current controlling current source unit 53, based on amplitude setting signal ap. An amplitude control unit 56 changes a power source voltage supplied to the current controlling current source unit 54 and changes amplitude of a voltage generated by the current drawn by the current controlling current source unit 54, based on amplitude setting signal an.

Abstract: Provided are an ultrasound probe, an element circuit thereof, and an ultrasound diagnostic device, whereby high image quality is possible and reduced size and lower cost are made possible. Provided is an ultrasound probe, comprising: a 2-D array transducer wherein a plurality of transducers are arrayed two-dimensionally; and a 2-D array IC in which are formed, upon an IC substrate, drive circuits which are disposed upon each of the transducers of the 2-D array transducer to drive each of the transducers at different timings with a prescribed delay quantity, and common current sources which supply drive current to the transducers of the 2-D array transducer. The number n of the common current sources which are formed upon the IC substrate is fewer than the number N of the drive circuits which are formed upon the IC substrate.