Patents by Inventor Yuto KAZAMA
Yuto KAZAMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12146890Abstract: An automated analyzer includes two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. The automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results.Type: GrantFiled: September 14, 2021Date of Patent: November 19, 2024Assignee: Hitachi High-Tech CorporationInventors: Yuto Kazama, Masahiko Iijima, Chie Yabutani, Kenji Kogure
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Publication number: 20240272187Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.Type: ApplicationFiled: April 23, 2024Publication date: August 15, 2024Inventors: Yuto KAZAMA, Masahiko IIJIMA, Sakuichiro ADACHI
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Patent number: 11971425Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.Type: GrantFiled: April 28, 2023Date of Patent: April 30, 2024Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Yuto Kazama, Masahiko Iijima, Sakuichiro Adachi
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Publication number: 20230266352Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.Type: ApplicationFiled: April 28, 2023Publication date: August 24, 2023Inventors: Yuto KAZAMA, Masahiko IIJIMA, Sakuichiro ADACHI
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Patent number: 11692929Abstract: As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.Type: GrantFiled: November 28, 2016Date of Patent: July 4, 2023Assignee: Hitachi High-Tech CorporationInventors: Sakuichiro Adachi, Masahiko Iijima, Yuto Kazama
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Patent number: 11674970Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.Type: GrantFiled: March 10, 2021Date of Patent: June 13, 2023Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Yuto Kazama, Masahiko Iijima, Sakuichiro Adachi
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Publication number: 20210405079Abstract: An automated analyzer includes two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. The automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results.Type: ApplicationFiled: September 14, 2021Publication date: December 30, 2021Inventors: Yuto Kazama, Masahiko IIJIMA, Chie YABUTANI, Kenji KOGURE
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Patent number: 11187712Abstract: The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results.Type: GrantFiled: September 6, 2018Date of Patent: November 30, 2021Assignee: Hitachi High-Technologies CorporationInventors: Yuto Kazama, Masahiko Iijima, Chie Yabutani, Kenji Kogure
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Publication number: 20210190806Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.Type: ApplicationFiled: March 10, 2021Publication date: June 24, 2021Inventors: Yuto KAZAMA, Masahiko IIJIMA, Sakuichiro ADACHI
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Patent number: 10976333Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.Type: GrantFiled: June 16, 2017Date of Patent: April 13, 2021Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Yuto Kazama, Masahiko Iijima, Sakuichiro Adachi
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Publication number: 20200271677Abstract: The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results.Type: ApplicationFiled: September 6, 2018Publication date: August 27, 2020Inventors: Yuto KAZAMA, Masahiko IIJIMA, Chie YABUTANI, Kenji KOGURE
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Publication number: 20190162744Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.Type: ApplicationFiled: June 16, 2017Publication date: May 30, 2019Inventors: Yuto KAZAMA, Masahiko IIJIMA, Sakuichiro ADACHI
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Publication number: 20190025192Abstract: As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.Type: ApplicationFiled: November 28, 2016Publication date: January 24, 2019Inventors: Sakuichiro ADACHI, Masahiko IIJIMA, Yuto KAZAMA