Patents by Inventor Yuto KAZAMA

Yuto KAZAMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230266352
    Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.
    Type: Application
    Filed: April 28, 2023
    Publication date: August 24, 2023
    Inventors: Yuto KAZAMA, Masahiko IIJIMA, Sakuichiro ADACHI
  • Patent number: 11692929
    Abstract: As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.
    Type: Grant
    Filed: November 28, 2016
    Date of Patent: July 4, 2023
    Assignee: Hitachi High-Tech Corporation
    Inventors: Sakuichiro Adachi, Masahiko Iijima, Yuto Kazama
  • Patent number: 11674970
    Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.
    Type: Grant
    Filed: March 10, 2021
    Date of Patent: June 13, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yuto Kazama, Masahiko Iijima, Sakuichiro Adachi
  • Publication number: 20210405079
    Abstract: An automated analyzer includes two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. The automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results.
    Type: Application
    Filed: September 14, 2021
    Publication date: December 30, 2021
    Inventors: Yuto Kazama, Masahiko IIJIMA, Chie YABUTANI, Kenji KOGURE
  • Patent number: 11187712
    Abstract: The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results.
    Type: Grant
    Filed: September 6, 2018
    Date of Patent: November 30, 2021
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuto Kazama, Masahiko Iijima, Chie Yabutani, Kenji Kogure
  • Publication number: 20210190806
    Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.
    Type: Application
    Filed: March 10, 2021
    Publication date: June 24, 2021
    Inventors: Yuto KAZAMA, Masahiko IIJIMA, Sakuichiro ADACHI
  • Patent number: 10976333
    Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: April 13, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yuto Kazama, Masahiko Iijima, Sakuichiro Adachi
  • Publication number: 20200271677
    Abstract: The present invention makes it possible for an automated analyzer including two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer includes, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers, the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results.
    Type: Application
    Filed: September 6, 2018
    Publication date: August 27, 2020
    Inventors: Yuto KAZAMA, Masahiko IIJIMA, Chie YABUTANI, Kenji KOGURE
  • Publication number: 20190162744
    Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.
    Type: Application
    Filed: June 16, 2017
    Publication date: May 30, 2019
    Inventors: Yuto KAZAMA, Masahiko IIJIMA, Sakuichiro ADACHI
  • Publication number: 20190025192
    Abstract: As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.
    Type: Application
    Filed: November 28, 2016
    Publication date: January 24, 2019
    Inventors: Sakuichiro ADACHI, Masahiko IIJIMA, Yuto KAZAMA