Patents by Inventor ZUO BIN XU

ZUO BIN XU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quality detection device, quality detection method, and integrated probe assembly
    Patent number: 11307160
    Abstract: The present disclosure relates to a welding quality detecting field, and specifically relates to a quality detection device. The quality detection device includes an integrated probe set, a driving module and a collecting module. The integrated probe set includes a plurality of integrated probe assemblies. The integrated probe assemblies are disposed in pairs and each integrated probe assembly includes a driving end and a collecting end. The driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly. The collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly.
    Type: Grant
    Filed: April 22, 2020
    Date of Patent: April 19, 2022
    Assignee: HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD
    Inventors: Sheng Lin Wang, Hao Liu, Da Chang Hu, Yong Hu, Peng Fei Lei, Ji Guo Liu, Zuo Bin Xu, Yun Feng Gao
  • QUALITY DETECTION DEVICE, QUALITY DETECTION METHOD, AND INTEGRATED PROBE ASSEMBLY
    Publication number: 20200249189
    Abstract: The present disclosure relates to a welding quality detecting field, and specifically relates to a quality detection device. The quality detection device includes an integrated probe set, a driving module and a collecting module. The integrated probe set includes a plurality of integrated probe assemblies. The integrated probe assemblies are disposed in pairs and each integrated probe assembly includes a driving end and a collecting end. The driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly. The collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly.
    Type: Application
    Filed: April 22, 2020
    Publication date: August 6, 2020
    Inventors: SHENG LIN WANG, HAO LIU, DA CHANG HU, YONG HU, PENG FEI LEI, JI GUO LIU, ZUO BIN XU, YUN FENG GAO