Clamp meter
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Description
The broken lines in the figures illustrate portions of the clamp meter in which the design is embodied that form no part of the claimed design.
Claims
The ornamental design for a clamp meter as shown and described.
Referenced Cited
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Patent History
Patent number: D1049890
Type: Grant
Filed: Mar 18, 2022
Date of Patent: Nov 5, 2024
Assignee: Fluke Corporation (Everett, WA)
Inventor: Wei Liu (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/831,367
Type: Grant
Filed: Mar 18, 2022
Date of Patent: Nov 5, 2024
Assignee: Fluke Corporation (Everett, WA)
Inventor: Wei Liu (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/831,367
Classifications
Current U.S. Class:
Clamp-around Type (D10/79)