Sample holder for ionized sample analysis

- HAMAMATSU PHOTONICS K.K.
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Description

FIG. 1 is a front view of a sample holder for ionized sample analysis including a main body and a separator of the first embodiment of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged view showing a portion of FIG. 7 defined by lines 9-9 and 9′-9′;

FIG. 10 is an enlarged view showing a portion of FIG. 7 defined by lines 10-10 and 10′-10′;

FIG. 11 is an enlarged view showing a portion of FIG. 7 defined by lines 11-11 and 11′-11′;

FIG. 12 is a rear side elevation view of the main body, the separator is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 13 is a top plan view of the main body, the separator is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 14 is a rear side elevation view of the separator, the main body is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 15 is a top plan view of the separator, the main body is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 16 is an enlarged cross-sectional view along the line 16-16 in FIG. 1, in the area designated by 16′-16′ in FIG. 1;

FIG. 17 is an enlarged cross-sectional view along the line 17-17 in FIG. 1, in the area designated by 17′-17′ in FIG. 1;

FIG. 18 is an enlarged cross-sectional view along the line 18-18 in FIG. 1, in the area designated by 18′-18′ in FIG. 1;

FIG. 19 is an enlarged cross-sectional view along the line 19-19 in FIG. 1, in the area designated by 19′-19′ in FIG. 1;

FIG. 20 is an enlarged cross-sectional view along the line 20-20 in FIG. 1, in the area designated by 20′-20′ in FIG. 1;

FIG. 21 is a front view of a sample holder for ionized sample analysis including a main body and a separator of the second embodiment of the present invention;

FIG. 22 is a rear view thereof;

FIG. 23 is a top plan view thereof;

FIG. 24 is a bottom plan view thereof;

FIG. 25 is a right side view thereof;

FIG. 26 is a left side view thereof;

FIG. 27 is a front perspective view thereof;

FIG. 28 is a rear perspective view thereof;

FIG. 29 is an enlarged view showing a portion of FIG. 27 defined by lines 29-29 and 29′-29′;

FIG. 30 is an enlarged view showing a portion of FIG. 27 defined by lines 30-30 and 30′-30′;

FIG. 31 is an enlarged view showing a portion of FIG. 27 defined by lines 31-31 and 31′-31′;

FIG. 32 is a rear side elevation view of the main body, the separator is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 33 is a top plan view of the main body, the separator is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 34 is a rear side elevation view of the separator, the main body is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 35 is a top plan view of the separator, the main body is shown removed from the sample holder for ionized sample analysis to show details not otherwise discernible from the drawings;

FIG. 36 is an enlarged cross-sectional view along the line 36-36 in FIG. 21, in the area designated by 36′-36′ in FIG. 21;

FIG. 37 is an enlarged cross-sectional view along the line 37-37 in FIG. 21, in the area designated by 37′-37′ in FIG. 21;

FIG. 38 is an enlarged cross-sectional view along the line 38-38 in FIG. 21, in the area designated by 38′-38′ in FIG. 21;

FIG. 39 is an enlarged cross-sectional view along the line 39-39 in FIG. 21, in the area designated by 39′-39′ in FIG. 21; and,

FIG. 40 is an enlarged cross-sectional view along the line 40-40 in FIG. 21, in the area designated by 40′-40′ in FIG. 21.

The features shown in evenly-dashed broken lines depict portions of the sample holder for ionized sample analysis that form no part of the claimed design. The dot-dash-dot broken lines depict the boundaries of the claim and form no part thereof. The dash-dot-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dot-dash broken lines form no part of the claimed design.

Claims

The ornamental design for a sample holder for ionized sample analysis, as shown and described.

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Patent History
Patent number: D894421
Type: Grant
Filed: Jul 18, 2018
Date of Patent: Aug 25, 2020
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Takayuki Ohmura (Hamamatsu), Masahiro Kotani (Hamamatsu)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Omeed Agilee
Application Number: 29/656,959