Abstract: Illuminated eyewear is provided. In one form, the temple arm members have all the lighting components mounted thereto including for each temple arm member a light, power source for the light, and electrical connections including a switch for providing power from the power source to the light. In another form, the cross-frame member has blinder portions integrally formed at either end thereof which are configured to block stray light to avoid glare problems. The blinder portions preferably include surfaces that are inclined to generally extend along the light cone generated by an LED light source mounted to the front end portion of each of the temple arm members. In another form, the temple arm members each have a recessed cavity formed in inner surface portion thereof in which the power source and switch components are received with the switch actuator mounted to the inner surface portion so it is hidden from view when the eyewear is worn for enhanced aesthetics.

Abstract: Ophthalmic systems are provided that include both a photochromic component and a blue-blocking component.

Abstract: An eye refractive power measurement apparatus measures both eye refractive powers in cases where a pupil is small and large in diameter with ease. This apparatus includes: a measuring optical system causing an imaging device to capture a ring-shaped image based on measurement light reflected from a fundus of an examinee's eye; a light deflecting member arranged at a position, which is not conjugated with a pupil of the examinee's eye, on an optical path of the measuring optical system; a rotor causing the light deflecting member to rotate about an optical axis of the measuring optical system; and an eccentricity amount changer changing an amount of eccentricity of the measurement light, which is rotated eccentrically on a surface of the pupil, with respect to a center of the pupil, in order to change a region, where the measurement light passes, on the surface of the pupil.

Abstract: A cornea shape measurement apparatus outputs data useful for prescription as well as injection and installation of a TORIC-IOL. This apparatus includes: a projecting optical system projecting an index for measurement onto a cornea; an illuminating optical system illuminating an anterior segment on which a reference mark is placed; an imaging optical system capturing an anterior segment image containing the reference mark and an image of the index reflected from the cornea; an image processor overlaying an astigmatic axis mark indicating a direction of an astigmatic axis of the cornea, which is calculated based on the index image, on the anterior segment image; and a controller displaying the anterior segment image, which contains the astigmatic axis mark, on a display.

Abstract: An optometric apparatus for a subjective binocular visual performance test includes right and left test units including right and left housings, a plurality of optical elements disposed in the right and left housings, right and left test windows provided to the housings, in which desired optical elements selected from the optical elements are to be placed and through the selected optical elements, an optotype is presented to examinee's right and left eyes by an optotype presenting apparatus, right and left polarization plates having polarization axes perpendicular to each other and arranged to be placed in the test windows, and right and left protective covers arranged to be placed in the test windows at a side facing the optotype presenting apparatus and having polarization optical characteristics of changing circularly polarized light that passes through the right and left protective covers into linearly polarized light having polarization axes perpendicular to each other.

Abstract: A projection type image display device using, in a projection optical system thereof, a flat mirror, which is easy to design and manufacture, as a projection mirror is provided. The projection optical system is a diagonal projection optical system and includes plural lenses. Among the plural lenses, the one disposed closest to the flat mirror has an effective area, along the vertical direction of an image, through which a light beam passes and which is off the optical axis, among optical axes of the plural lenses, shared by the most lenses so as not to allow light reflected from the projection mirror to return to the projector body. A polarization converter using, for example, a quarter wavelength plate is provided at an output surface of a crossed prism to decrease reflectance differences between differently colored light and to thereby prevent the occurrence of color unevenness.

Abstract: A projector projecting an image includes: an imaging unit taking an information transmission image which is part of a projected image of the other projector and includes drive condition information of the other projector; and a control unit changing drive conditions of the projector based on the drive condition information included in the information transmission image.

Abstract: A projector device that generates a projection image, photographs this projection image and performs various adjustments to the projection image.

Abstract: A light source controller is configured to control timings of driving the first and second light sources and the light-source light generator, so that the light-source light of two or more colors generated by the light-source light generator and the light-source light emitted from the second light source are cyclically generated, by setting a light-emitting period of at least one light-source light color having a higher luminous efficiency out of the two or more colors generated by the light-source light generator, shorter than those of the other light-source light colors, and setting a drive power of the first light source during generation of the light-source light color whose light-emitting period is set short, greater than a drive power of the first light source during generation of the other light-source light colors.

Abstract: A retinal scanning display includes: a light source part which radiates a laser beam; a scanning part which scans the radiated laser beam in two dimensional directions; a projection part which projects the scanned laser beam on a retina of a viewer; a light detection part which is arranged at a position on which the scanned laser beam is incident; and a light blocking part which blocks the scanned laser beam scanned at the timing detection time; and a control part which controls the radiation of the laser beam based on the detected timing of the laser beam by the light detection part. The control part allows the light source part to radiate the laser beam at the timing detection time with intensity which exceeds a maximum value of intensity of the laser beam radiated from the light source part at the image forming time.

Abstract: Multi-color light sources are mixed in a recycling housing to achieve high light output. In one embodiment, the light from each color light source, such as from red, green and blue LEDs, is multiplexed together and a portion of the mixed light passes through an output aperture in the light pipe. A portion of each colored light is recycled back, for example, by a shaped reflective surface and/or a reflective coating adjacent the aperture. The shape of the reflective surface is such as to direct each color of light back to a specific location to maximize the ultimate output light. In one embodiment, the light is directed back from the output side of the housing to an input light source having the same color. In another embodiment, the light is directed back from the output side of the housing to a coating designed to reflect that color light.

Abstract: A light source device includes: a light source section which comprises plural laser diodes; a pulse driving section which divides the laser diodes of the light source section into plural groups, each group having the same number of the laser diodes, and drives the laser diodes of the each group by a pulse having a predetermined period and a predetermined duty ratio; and a light source driving section which controls a phase of the pulse for the each group so that the same number of the laser diodes are emitted in succession when the laser diodes of the each group are driven by the pulse driving section.

Abstract: An illumination arrangement for a projection system is proposed including a light source device and a light collecting, integrating and redirecting device. The light source device comprises at least one solid state light source device. The light collecting, integrating and redirecting device comprises at least one light integrating device, which is adapted to directly receive and to integrate at least a part of primary illumination light generated by and emitted from at least one associated of at least one sold state light source device.

Abstract: A projection display device that displays an image by projecting the image onto a transmissive screen from the rear thereof includes: an illumination optical system for guiding a light beam emitted from a laser light source to the transmissive screen; a projection optical system for enlarging an image formed on a region to be illuminated of an image display element, and projecting the enlarged image on the transmissive screen, the projection optical system being configured such that the product of the F-number and the projection magnification of the projection optical system is less than 400; wherein the transmissive screen includes a Fresnel lens and a lenticular lens respectively equipped with a light diffusion layer for diffusing incident light and causing resultant light to exit the light diffusion layer. The light diffusion layer of the lenticular lens has a thickness of less than 300 ?m.

Abstract: The projection display device includes an imager unit which modulates light from a light source, and a cooling device which cools the imager unit. In this arrangement, the imager unit includes a red imager which modulates light in a red wavelength band, a green imager which modulates light in a green wavelength band, and a blue imager which modulates light in a blue wavelength band. Further, the cooling device includes cooling fans which supply a cooling air to the imager unit. The cooling device is configured in such a manner that at least one of the cooling fans is provided for each of the red imager, the green imager, and the blue imager, and a plurality of the cooling fans is provided for at least the green imager.

Abstract: A projection display device includes a light source having a light emitting portion, a reflector which reflects light emitted from the light emitting portion, and a fixing portion which fixedly mounts the light emitting portion with respect to the reflector.

Abstract: A video projector including a cooling current discharging structure capable of providing a high-speed cooling current and a low-speed cooling current to an optical component of an optical system serving as a cooling subject. The cooling current discharging structure discharges the high-speed cooling current toward a high-temperature region of the optical component and discharges the low-speed cooling current toward a low-temperature region having a relatively low temperature.

Abstract: A projection display device includes a first exhaust fan mainly for exhausting air from a light source and a second exhaust fan mainly for exhausting air from components other than the light source. The second exhaust fan is arranged on an exhaust side of the first exhaust fan so as to overlap partly the first exhaust fan. In addition, a distance between the first exhaust fan and the second exhaust fan is set within a section in variation characteristic of a noise level of the projection display device with respect to the distance, in which the noise level does not vary even with a change in the distance.

Abstract: A projection type image display apparatus includes an image display element, a lens group disposed in a direction of propagation of light with respect to the image display element and being formed with a plural number of lenses, a s reflection mirror configured to reflect light emitted from the lens group thereon so as to project the light on a screen, obliquely, and a housing configured to receive the reflection mirror and the lens group therein. The lens group is fixed on a bottom portion of the housing, and a part of the lens group is configured to enable movement of lenses of the lens group.

Abstract: A projection system includes a projection screen defining a shape and a projector configured to project an image onto the projection screen. The projector may project a static or dynamic image that has substantially the same shape as the projection screen or otherwise block portions of the projected image that are projected outside of the projection screen with the aid of a virtual mask. The virtual mask and the projection screen may be created based on a virtual shape template that defines the desired shape for the projection screen, such as with a vector outline. In some embodiments, the virtual mask and the projection screen are created based on the same virtual shape template. The virtual shape template may define a cutting path for extracting the projection screen from a suitable material.

Abstract: An object of the invention is to reduce the size and weight of a video projector by shortening the length of the arm of a mirror rotator and reducing the size of a mirror. A video projector comprises a plurality of projection lenses through which image light rays from a liquid crystal panel are extracted in a magnified manner; a reflective mirror for reflecting the extracted image light rays onto a screen; and a mirror rotator for rotating the reflective mirror so that the extracted image light rays can be reflected in particular directions. Among the projection lenses, some of the projection lenses located farther away from the liquid crystal penal are partially cut such that areas through which the image light rays do not pass are cut off to create a lens cut-off space. The mirror rotator is placed in the lens cut-off space.

Abstract: To aim to provide a simple high-pressure discharge lamp apparatus. The lamp apparatus suppresses local temperature increase in an arc tube during lighting, and uniforms temperature in the arc tube. A lamp is built into a reflector so as to form a lamp unit such that a central axis of the lamp coincides with an optical axis of the reflector. A pair of rotating bodies with a fixed interval therebetween each has a circular outer circumferential surface, and the optical axis of the reflector coincides with a central axis of the circumferential surface of the rotating bodies. A pair of electrodes is electrically connected to the circumferential surface of each rotating body, and the rotating bodies are placed on two rotating rollers arranged in parallel. A drive motor drives the lamp unit in a fixed direction on the rotating rollers. Feeding members feed the rotating bodies with power.

Abstract: A projection display device includes a light source; an optical system which modulates light from the light source, and emits the modulated light; a projecting portion which enlarges and projects the light emitted from the optical system; a cabinet which houses the light source, the optical system, and the projecting portion; an opening which is formed in one surface of the cabinet to allow mounting or dismounting of an optical component constituting the optical system, or the light source; a cover which covers the opening; and a holding portion which holds the cover in such a manner that the cover is allowed to slide in a direction along the one surface.

Abstract: A lithographic apparatus is provided that includes a substrate holder configured to hold a substrate, and a heat pipe to maintain the substrate holder at a substantially uniform temperature. The heat pipe has a chamber containing a liquid reservoir and a vapor space, and a heating element at least partly in contact with liquid in the chamber.

Abstract: In immersion exposure, a resist pattern forming method suppressing resist pattern defects comprises mounting a substrate formed a resist film thereon and a reticle formed a pattern thereon onto an exposure apparatus, supplying a first chemical solution onto the resist film to selectively form a first liquid film in a local area on the resist film and draining the solution, the first liquid film having a flow and being formed between the resist film and a projection optical system, transferring the pattern of the reticle to the resist film through the first liquid film to form a latent image, supplying a second chemical solution onto the resist film to clean the resist film, heating the resist film, and developing the resist film to form a resist pattern from the resist film.

Abstract: A wafer stage is driven, based on positional information of a wafer stage measured using a measuring system and tilt information of the wafer stage. This allows the wafer stage to be driven with high precision, with the influence on the wafer stage when the wafer stage is tilted being reduced.

Abstract: Catadioptric projection objective (1) for microlithography for imaging an object field (3) in an object plane (5) onto an image field (7) in an image plane (9), including a first partial objective (11) imaging the object field onto a first real intermediate image (13), a second partial objective (15) imaging the first intermediate image onto a second real intermediate image (17) and a third partial objective (19) imaging the second intermediate image onto the image field (7). The second partial objective (15) has exactly one concave mirror (21) and at least one lens (23). The minimum distance between an optically utilized region of the concave mirror (21) and an optically utilized region of a surface (25)—facing the concave mirror—of a lens (23) adjacent to the concave mirror is greater than 10 mm.

Abstract: A method for positioning a substage, supported by a main stage, relative to a reference object, the substage moveable in a direction between a first and second position relative to the main stage. The method includes positioning the first stage using a passive force system that is activated by positioning the main stage. The passive force system includes two magnet systems, each magnet system being configured to apply a force in the direction to the first stage with respect to the second stage in a non-contact manner, the forces resulting in a resultant force applied to the first stage in the direction by the passive force system. A magnitude and/or a direction of the resultant force depends on the position of the first stage relative to the second stage, and the first stage has a zero-force position between the first and second position in which the resultant force is zero.

Abstract: In a method of detecting a workpiece alignment mark for positioning a mask and a workpiece or in an exposure apparatus, a control unit detects a pattern whose positional relationship is determined with respect to the workpiece mark at a low magnification. The pattern is larger than the workpiece mark, and/or the pattern has a high contrast to include a large amount information (a search mark). When the magnification of the microscope is switched to a high magnification, the workpiece is moved to a position where the workpiece mark is within a view of the microscope, according to the positional relationship. Subsequently, the workpiece mark position is detected at the high magnification.

Abstract: An illumination source is optimized by changing the intensity and shape of the illumination source to form an image in the image plane that maximizes the minimum ILS at user selected fragmentation points while forcing the intensity at the fragmentation points to be within a small intensity range. An optimum mask may be determined by changing the magnitude and phase of the diffraction orders to form an image in the image plane that maximizes the minimum ILS at user selected fragmentation points while forcing the intensity at the fragmentation points to be within a small intensity range. Primitive rectangles having a size set to a minimum feature size of a mask maker are assigned to the located minimum and maximum transmission areas ad centered at a desired location. The edges of the primitive rectangle are varied to match optimal diffraction orders O(m,n). The optimal CPL mask OCPL(x,y) is then formed.

Abstract: An image taking system including: a lens apparatus; an image pickup apparatus; an operation angle detection unit detecting an operation angle; a direction storage unit storing an object direction relative to the lens apparatus; an angle-of-field calculation unit calculating an image taking angle of field based on zoom and focus positions; a ranging area setting unit calculating a position of at least one object in a screen based on the operation angle detected by the operation angle detection unit, the object direction stored in the direction storage unit, and the image taking angle of field calculated by the angle-of-field calculation unit, to set a ranging area at the position of the at least one object; an object distance calculation unit calculating an object distance in the ranging area; and an output image generation unit generating an output image and information based on the object distance.

Abstract: An optical system of a shape measuring instrument includes a laser diode, a first optical system irradiating an object to be measured with laser beam, a second optical system focusing reflected light from the object to be measured, and a CCD line sensor portion for detecting a laser beam from the second optical system, where the first optical system includes an optical path displacing unit for displacing an optical path for laser beam, the optical path displacing unit includes a glass plate rotating about a rotating axis extending in a direction perpendicular to a displacement plane of the optical path, a rotating unit for the glass plate, and a rotating unit controller, and the rotating unit controller causes a rotation angle of the rotating unit to coincide with a rotation angle of the rotating unit obtained when the maximum value of an amount of light received by the CCD line sensor according to rotation of the rotating unit is measured by the rotating unit controller.

Abstract: A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.

Abstract: Methods and apparatus to determine the orientation of randomly arranged birefringent fibers are disclosed. One method comprises emitting light, creating Ni polarization states of the emitted light, illuminating the birefringent fibers with the emitted light so polarized, thereby generating IRi internal reflection components of the light in the birefringent fibers, observing the light from the illuminated birefringent fibers, creating Oi polarization states of the observed light, forming Ii images of the observed polarized light, each image comprising an information (Ni, Oi, IRi), wherein i=1, 2, . . . , n and n?3, separating the i-th internal reflection component from the i-th image, and calculating an angle of a neutral axis of the birefringent fibers using the IRi internal reflection components.

Abstract: A system comprises a laser configured to produce a laser beam and to be optically coupled to a first end of an optical fiber of a device under test, a phase mask configured to selectively pass one of a plurality of modes and to be optically coupled to a second end of the optical fiber of the device under test, and a detector optically coupled to the phase mask and configured to determine an intensity of the beam received over the optical connection from the phase mask. The system may further comprise a data analyzer connected to the detector and in selective communication with the phase mask, wherein the data analyzer is configured to set the phase mask to selectively pass a fundamental mode, set the phase mask to selectively pass a higher order mode, receive intensity data from the detector, and determine a performance in the form of at least one performance factor for said device under test according to said intensity data.

Abstract: Methods and systems for analyzing optical parameters of a selected optical fiber member are disclosed. A signal input from an optical fiber member may be selected by instructing a corresponding optical separation device. The output from the corresponding optical separation device may be combined with the outputs of other optical separation devices using an optical coupler. A measurement circuit may measure the optical parameter from the output. Proper operation of an optical separation device may be validated by a monitoring circuit. The monitoring circuit may provide an indication to a user or may be processed by a diagnostic processor. A processing circuit may select one of the optical separation devices in order to measure the optical parameter for a corresponding optical fiber member and consequently may instruct an adjustment circuit to cause the selected optical fiber member to conform to a desired value of the optical ameter.

Abstract: A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.

Abstract: Optical fibers comprising a plurality of cleaved facets disposed at one end are disclosed. First and second facets of the plurality of cleaved facets are disposed at different angles. The optical fiber with the plurality of cleaved facets splits light from an optical component between an optical fiber core and a detector such that a portion of the light may be tapped off for monitoring. The first cleaved facet is disposed at a first angle such that a first portion of the light from an optical component is totally internally reflected into the fiber core. A second cleaved facet can be disposed at a second angle that is less than the first angle so that a second portion of light from the optical component refracts through the second facet to a detector. Methods of forming and using angle-cleaved optical fibers having a plurality of cleaved facets are also disclosed.

Abstract: A device that is capable of simultaneously inspecting both sides of surfaces of a magnetic disk to detect defects thereon includes a front-side defect detecting section and a back-side defect detecting section each of which optically detect a scratch and a defect that are present on the front and back surfaces of the magnetic disk, to improve a throughput for inspection. The back-side defect detecting section has an optical path changing section that reflects a laser beam emitted by a laser light source to change an optical path thereof and thereby to direct the laser beam toward the back surface of the magnetic disk and that reflects scattered light that has been collected by a Fresnel lens to change an optical path thereof and thereby to direct the scattered light toward a first photoelectric converter.

Abstract: An apparatus for inspecting a specimen includes a first illumination unit having a laser light source and a first optical component for illuminating a specimen on which patterns are formed with a laser from a first elevation angle direction, a second illuminating unit having a light source and a second optical component for illuminating the specimen from a second elevation angle direction which is greater than the first elevation angle, a first detection optical unit which detects light from the specimen illuminated by the first illumination unit, a second detection optical unit which detects light from the specimen illuminated by the second illumination unit, and a signal processing unit which processes signals output from the first detector to detect defects in a first area on the specimen and processes signals output from the second detector to detect defects in a second area on the specimen.

Abstract: A surface inspection apparatus capable of acquiring scattered light intensity distribution information for each scattering azimuth angle, and detecting foreign matters and defects with high sensitivity. A concave mirror for condensation and another concave mirror for image formation are used to cope with a broad cubic angle. Since mirrors for condensation and image formation are used, a support for clamping the periphery of a lens is unnecessary, and an effective aperture area does not decrease. A plurality of azimuth-wise detection optical systems is disposed and reflected light at all azimuths can be detected by burying the entire periphery without calling for specific lens polishing. A light signal unification unit sums digital data from a particular system corresponding to a scattering azimuth designated in advance in the systems for improving an S/N ratio.

Abstract: A foreign-matter inspection apparatus is implemented which allows the stable detection sensitivity to be maintained. A laser beam emitted from a laser apparatus is applied to a beam irradiation sample via an irradiation unit and a mirror. Then, the laser beam is captured into a beam-capturing camera via an image-forming lens and a beam-direction switching mirror. Based on the captured beam image, an image computational processing unit judges inclination of the laser beam, then adjusting the irradiation unit thereby to correct the inclination of the laser beam. Also, the beam is captured into the beam-capturing camera in specified number-of-times while focus of the laser beam is being changed by an arbitrary amount by the irradiation unit. Based on the captured beam, the focus of the laser beam is corrected by adjusting the irradiation unit.

Abstract: In a defect inspection system using a plurality of detectors such as an upright detector and an oblique detector, if illumination light and wafer height are adjusted to the detection field of view of one detector, a defocused image is detected by other remaining detectors, resulting in degradation of the detection sensitivity. The present invention solves this problem. When a plurality of detectors such as an upright detector and an oblique detector are used in the defect inspection system, the reduction of the inspection sensitivity can be prevented by correcting the field positions of the other remaining detectors with respect to the field of view of the one detector. Further, the variation in optical axis for each inspection system due to the variation in parts and assembly errors can be reduced.

Abstract: An inspection system including a catadioptric objective that facilitates dark-field inspection is provided. The objective includes an outer element furthest from the specimen having an outer element partial reflective surface oriented toward the specimen, an inner element nearest the specimen having a center lens comprising an inner element partial reflective surface oriented away from the specimen, and a central element positioned between the outer lens and the inner lens. At least one of the outer element, inner element, and central element has an aspheric surface. The inner element is spatially configured to facilitate dark-field inspection of the specimen.

Abstract: An optical semiconductor wafer inspection system and a method thereof are provided for classifying and inspecting defects such as scratches, voids and particles produced in a flattening process by a polishing or grinding technique used for semiconductor manufacturing. The present invention is an optical semiconductor wafer inspection system and a method thereof characterized by obliquely illuminating a scratch, void or particle produced on the surface of a polished or ground insulating film at substantially the same velocity of light, detecting scattered light at the time of oblique illumination from the surface of an inspection target at different angles and thereby classifying the scratch, void or particle.

Abstract: Systems, methods and apparatus relate to handling and processing glass, such as glass for use in liquid crystal displays, involving a measurement device, such as a distortion gauge, residing in an environmentally controlled measurement room, and a cassette loading device for storage and conveyance of glass between the measurement device and other components of a glass handling and processing system residing with the cassette loading device in a preparation room. A mail-slot opening may be present in a wall separating the measurement room from the preparation room. A gauge conveyor may convey glass between the cassette loading device and the measurement device. A distortion gauge may measure a reference value of the product glass with respect to reference marks on a glass reference plate of the distortion gauge. Other examples of a measurement device include a warp gauge, a stress gauge, a thickness gauge, and a compaction gauge.

Abstract: A measurement window structure is disclosed for an optical process measurement device. The measurement window structure can include a measurement window made of an optical material and having a measurement surface that is arranged to be placed into a process solution, a sealing surface formed to a frame structure of the optical process measurement device and facing the process solution, the measurement window made of an optical material being arranged to press against the sealing surface, and an attaching device or mechanism for pressing the measurement window made of an optical material against the sealing surface and for attaching it to the frame structure. The sealing surface formed to the frame structure can be a rotationally symmetrical surface and the surface pressing against the sealing surface formed to the frame structure of the measurement window made of an optical material can be a rotationally symmetrical surface.

Abstract: Optical detection systems and optical spectrometric systems are presented. One embodiment is a parallelized optical detection system. The detection system includes collector optics configured to receive an input optical signal, a plurality of optical filters and a plurality of tunable cavities. The collector optics includes at least one collector lens and at least one fiber multiplexer. The plurality of optical filters are configured to receive the input optical signal from the fiber multiplexer, and have serially varying pass band configured to filter the input optical signal at respective bandwidths. Each of the plurality of tunable cavities is optically coupled to each filter of the respective plurality of optical filters to receive a respective filtered output signal. The plurality of tunable cavities have band-pass frequencies with center frequencies staggered.

Abstract: The present invention provides a highly reliable spectral module. When light L1 proceeding to a spectroscopic unit (4) passes through a light transmitting hole (50) in the spectral module (1) in accordance with the present invention, only the light having passed through a light entrance side unit (51) formed such as to become narrower toward a substrate (2) and entered a light exit side unit (52) formed such as to oppose a bottom face (51b) of the light entrance side unit (51) is emitted from a light exit opening (52a). Therefore, stray light M incident on a side face (51c) or bottom face (51b) of the light entrance side unit (51) is reflected to the side opposite to the light exit side unit (52) and thus is inhibited from entering the light exit side unit (52). Therefore, the reliability of the spectral module (1) can be improved.

Abstract: Methods and apparatus to measure visual appearance of randomly arranged birefringent fibers are disclosed. One method comprises emitting light, creating Ni polarization states of the emitted light, illuminating the birefringent fibers with the emitted light so polarized, thereby generating IRi internal reflection components, ERi external reflection components, and Di diffusion components of the light in the birefringent fibers, observing the light from the illuminated birefringent fibers, creating Oi polarization states of the observed light, forming Xi images of the observed polarized light, each image comprising an information (Ni, Oi, IRi, ERi, Di), wherein i=1, 2, . . . n and n?4, measuring the intensity Ii in each pixel in the X, images, and separating the i-th internal reflection component, the i-th external reflection component, and the i-th diffusion component from the i-th image for the Xi images.