Abstract: An electronic device test fixture deploys a plurality of contact elements in a dielectric housing. The plumb arrangement of contact elements each include an armature or transversal configured to first depress and then slide laterally when urged downward by the external contacts of a device under test. The rotary movement of the transversal is optimized via the configuration of a surrounding forked regulator such that surface oxide deposition on the external device under test terminal is disrupted to reliably minimize contact resistance without damaging or unduly stressing the electrical junction of the device under test.

Abstract: A solar photovoltaic panel test platform includes a test section and a signal processing section. The test section has a frame, a light-emitting unit disposed on the frame, a first angle adjustment unit and a second angle adjustment unit arranged on the frame, an air-cooling unit mounted on the first angle adjustment unit for connecting with a first solar photovoltaic panel, and a water-cooling unit mounted on the second angle adjustment unit for connecting with a second solar photovoltaic panel. The signal processing section is connected to the first and second angle adjustment units, the light-emitting unit, the air-cooling unit, the water-cooling unit, and the first and second solar photovoltaic panels. The signal processing section serves to receive sensing signals and transmit control signals. The solar photovoltaic panel test platform can provide different illuminations, angles of incidence and heat dissipation modes to test the efficiency of the solar photovoltaic panels.

Abstract: A semiconductor test apparatus, semiconductor device, and test method are provided that enable the realization of a high-speed delay test. Semiconductor test apparatuses (1a-1c) include: flip-flops (11) each provided with first input terminal SI, second input terminal D, mode terminal SE that accepts a mode signal indicating either a first mode or a second mode, clock terminal CK that accepts a clock signal, and output terminal Q, the flip-flops (11) selecting first input terminal SI when the mode signal indicates the first mode, selecting second input terminal D when the mode signal indicates the second mode, and holding information being received by the input terminal that was selected based on the mode signal in synchronization with the clock signal and supplying as output from output terminal Q; and hold unit 12 that holds a set value and that provides the set value to first input terminal SI.

Abstract: A stacked semiconductor device includes a first semiconductor device equipped with a first semiconductor chip 14 having a transistor circuit and protection diodes, and a second semiconductor device equipped with a second semiconductor chip 24 having a transistor circuit and protection diodes, and stacked on the first semiconductor device via a connection portion, wherein a power supply line connected to the first and second semiconductor chips is used in common, and a forward ON voltage of the protection diodes of the first semiconductor chip is set higher than a forward ON voltage of the protection diodes of the second semiconductor chip 24. When a connection test is executed, the forward ON voltage of the protection diodes of the first semiconductor chip or the second semiconductor chip is detected and then normal/open is judged.

Abstract: A scan flip-flop circuit includes an input unit and an output unit. The input unit selects one of a data input signal and a scan input signal depending on an operation mode and generates an intermediate signal based on the selected signal. The output unit generates an output signal based on the intermediate signal and selects one of a data output terminal and a scan output terminal depending on the operation mode to provide the output signal through the selected output terminal. A voltage level at the selected output terminal bidirectionally transitions between a first voltage level and a second voltage level. A voltage level at a non-selected output terminal unidirectionally transitions between the first voltage level and the second voltage level.

Abstract: An electronic circuit includes a plurality of programmable components connected in an electronic chain. An interface is adapted to connect the programmable components to an external controller wherein the controller is adapted to program the programmable components. A component isolation element is connected to the interface at an input end and to the electronic chain of the programmable components at an output end wherein the isolation element is adapted to isolate one component of the programmable components from the electronic chain and wherein the one component is a safety component.

Abstract: A differential buffer circuit having increased output voltage swing includes a differential input stage including at least first and second transistors, the first and second transistors being operative to receive first and second signals, respectively. The buffer circuit further includes a bias stage connected between the differential input stage and a first voltage source. The bias stage is operative to generate a quiescent current as a function of a third signal supplied to the bias stage. A load circuit is connected between a second voltage source and the differential input stage, first and second differential outputs of the buffer circuit being generated at a junction between the load circuit and the differential input stage. The load circuit includes first and second switching elements coupled with the first and second transistors, respectively.

Abstract: An integrated circuit includes a first ODT (On Die Termination) unit and an input buffer. The first ODT unit is configured to receive at least one pull-up code and at least one pull-down code and calibrate a resistance value for impedance matching of a first line transferring data. The input buffer is configured to buffer the data in response to a reference voltage level and drive input data. Herein, the driving of the input data is controlled in response to the pull-up code and the pull-down code.

Abstract: An integrated circuit includes: an on-die-termination (ODT) circuit configured to drive an input signal with drivability adjusted according to an impedance calibration code and a reference voltage; and an input buffer configured to buffer the input signal in response to the reference voltage and generate an output signal.

Abstract: Various techniques are provided to flexibly update data fields stored in multi-bit registers. In one example, a method of updating a control register within an integrated circuit includes storing a plurality of initial bit values in the control register within the integrated circuit. The method also includes receiving a data set comprising one or more corrective bit values and one or more non-corrective bit values. The method also includes performing a logic operation on the received data set and the initial bit values to provide updated bit values. The method also includes replacing the initial bit values with the updated bit values in the control register.

Abstract: An electronic integrated circuit includes a signal path connected between the functional logic (15) thereof and an external output terminal. The signal path includes a switch (S), a bus holder circuit (121B), and an output buffer (19).

Abstract: Quad-state logic elements and quad-state memory elements are used to reduce the wiring density of integrated circuits. The resulting reduction in wiring interconnects between memories and logic elements results in higher speed, higher density, and lower power integrated circuit designs.

Abstract: Circuits that operate with power supplies of less than 1 Volt are presented. More particularly, circuits that operate with supply voltages near or lower than the threshold voltage of the transistors in those circuits are presented. Various circuits and embodiments such as operational transconductance amplifiers, biasing circuits, integrators, continuous-time sigma delta modulators, track-and-hold circuits, and others are presented. The techniques and circuits can be used in a wide range of applications and various transistors from metal-oxide-semiconductor to bipolar junction transistors may implement the techniques presented herein.

Abstract: A differential current signal circuit is described which includes a voltage to differential current converter circuit that generates a differential pair of current output signals in response to receiving a voltage input signal, where the differential pair of current output signals are linearly proportional to the voltage input signal within a voltage operating range from a minimum operating voltage to a maximum operating voltage. The differential pair of current output signals are linear over a wide range of voltage input signals. A correction circuit is included which eliminates voltage offsets in the voltage operating range due to process and temperature variations. The correction circuit also provides the capability to adjust the minimum operating voltage, and eliminates variations in the minimum operating voltage due to process and temperature variations.

Abstract: Each of a plurality of gate driving parts outputs a first potential (2 V) during a period in which the gates of a plurality of thyristors belonging to the corresponding set are driven (S1N=Low) and outputs a second potential (5 V) that is higher than the first potential at a rising part of the anode driving voltage during a period in which the gates of a plurality of thyristors belonging to the corresponding set are not driven (S1N=High). Each of a plurality of gate driving parts outputs a third potential (3 V) that is lower than the second potential at periods other than the rising part of the anode driving voltage during a period in which the gates of a plurality of thyristors belonging to the corresponding set are not driven (S1N=High).

Abstract: A half bridge converter includes a transformer with a high side switch coupled between a first input terminal and a primary winding of the transformer. A low side switch is coupled between a second input terminal and the primary winding. A first control circuit is coupled to the first input terminal and the primary winding to control the high side switch in response to a rate of voltage change with respect to time across the high side switch while the high side switch is off. A second control circuit coupled to the primary winding and the second input terminal to control the low side switch in response to a rate of voltage change with respect to time across the low side switch while the low side switch is off.

Abstract: One or more PLLs are formed on an integrated circuit. Each PLL includes an interpolative divider configured as a digitally controlled oscillator, which receives a reference clock signal and supplies an output signal divided according to a divide ratio. A feedback divider is coupled to the output signal of the interpolative divider and supplies a divided output signal as a feedback signal. A phase detector receives the feedback signal and a clock signal to which the PLL locks. The phase detector supplies a phase error corresponding to a difference between the clock signal and the feedback signal and the divide ratio is adjusted according to the phase error.

Abstract: In one embodiment, multiple (serializer/deserializer) SERDES channels are aligned by selectively slipping one or more of the incoming serial data streams one bit at a time prior to deserialization. Within each SERDES channel, a slip circuit slips the corresponding serial data stream by one bit (i.e., one unit interval (UI)) by extending the high portion of the duty cycle of a corresponding clock signal. The high portion of the clock signal is extended using a 3-to-1 mux that selects a fixed high signal, such as the high power supply rail, as an intermediate mux output signal whenever transitioning between two different applied clock signals that are offset from one another by one UI. In this way, the slip circuit avoids glitches that might otherwise result from switching directly between the two clock signals.

Abstract: An integrated control circuit according to aspects of the present invention includes an oscillator, a capacitor, and a logic gate. The oscillator generates a periodic timing signal that cycles between a first logic state for a first time duration and a second logic state for a second time duration. The capacitor receives a charge current in response to the periodic timing signal transitioning to the first logic state, where a voltage on the capacitor increases for the first time duration to an initial value. The logic gate generates a periodic output signal having a duty ratio that is responsive to a time that it takes the capacitor to discharge from the initial value to a reference voltage. A period of the periodic output signal is the period of the periodic timing signal.

Abstract: A data holding circuit including a first input terminal through which data is inputted; at least one delay element for delaying the data inputted through the first input terminal; and a first element for holding data, wherein, when the data inputted through the first input terminal and the data delayed by the delay element are equal to each other, the first element holds data corresponding to the data inputted through the first input terminal and wherein, when the data inputted through the first input terminal and the data delayed by the delay element are different from each other, the first element continues to hold the data presently held by the first element.

Abstract: A delay generator comprises: a current source for supplying a current; a first delay portion, connected to the current source, comprising at least a plurality of inverters and a first capacitor having a first capacitance; and a second delay portion, connected to the current source, comprising at least a plurality of inverters and a second capacitor having a second capacitance, wherein the first capacitance is the same as the second capacitance, wherein the first delay portion generates a first delay by discharging of the first capacitor, wherein the second delay portion generates a second delay by charging of the second capacitor, and wherein the total delay generated by the delay generator is obtained by summation of the first delay and the second delay.

Abstract: A timing generator that outputs a timing signal obtained by delaying an input signal, comprising first and second period delay sections that each output a rate signal obtained by delaying the input signal by a delay amount corresponding to an integer multiple of a period of an operation clock supplied thereto; a first high-accuracy delay section that outputs the timing signal obtained by delaying a signal input thereto by a delay amount that is less than the period of the operation clock; and a mode switching section that switches between a low-speed mode, in which the rate signal output by the first period delay section is input to the first high-accuracy delay section, and a high-speed mode, in which a signal obtained by interleaving the rate signals output by the first period delay section and the second period delay section is input to the first high-accuracy delay section.

Abstract: Provided is a PMOS resistor. The PMOS resistor includes a PMOS transistor pair, a switching unit, and a negative feedback unit. The PMOS transistor pair is symmetrically connected between first and second nodes. The switching unit compares a voltage of the first node and a voltage of the second node to output one of the voltages of the first and second nodes. The negative feedback unit receives an output of the switching unit to control a current which flows in the PMOS transistor pair, for maintaining a constant resistance value.

Abstract: In one example, a chip includes an integrated analog component configured to communicate over an internal analog bus of the chip. A plurality of I/O pads located on the chip is configured to provide a connected device access to the integrated analog component. A plurality of transmission gates configured to selectively connect the I/O pads to a bus line of the analog bus.

Abstract: Dual path level shifter methods and devices are described. The described level shifter devices can comprise voltage-to-current and current-to-voltage converters.

Abstract: Power consumption is increased in an interface circuit having a signal processing function for waveform shaping due to influence of a circuit added for waveform shaping. Also, since a plurality of boards are connected to a backplane in a system, they are not exchanged in accordance with distances while there are boards being far or near are mixed, but a common board is used. Thus, it is necessary to prepare a configuration of an interface circuit meeting the longest transfer distance. An interface circuit disabling a part of or all of operations of a waveform shaping circuit is provided. Accordingly, in accordance with transfer distances, switching of operation ranges of waveform shaping circuit inside the interface circuit is possible, and operation ranges of the waveform shaping circuit can be limited, and power consumption of the interface circuit, an LSI including the interface circuit, and a server device can be reduced.

Abstract: A cascoded level shifter is subdivided into a first voltage section and a second voltage section, the first voltage section having a lower voltage supply than the second voltage section, and a combined voltage across the first voltage section and the second voltage section corresponding to the high voltage range. The shifter includes an input node receiving an input signal, a cascoded device disposed in one of the first voltage section and the second voltage section, the cascoded device includes a driver switch connected in series with a cascode switch at a midpoint node, the cascode switch switching in dependence on a reference voltage of a reference node and the input signal, and reference voltage perturbation circuitry configured to cause a transient perturbation to the reference voltage in response to a transition of the input signal to cause the cascode switch to switch.

Abstract: A circuit including a first transistor group and a second transistor group. The transistor groups are connected such that they are arranged to be fed with at least one input signal, and such that they are arranged to output at least two currents. At least two transistors are arranged to be biased in such a way that desired signal paths are obtained in the circuit, such that a desired output current ratio is obtained.

Abstract: A system includes a voltage pump to generate a first pump voltage from an analog voltage signal. The system further includes switching pad to receive an analog signal from an external source and route the analog signal to analog processing circuitry over one or more analog signal busses based on the first pump voltage and the analog voltage signal.

Abstract: A high-frequency switch circuit according to the present invention includes at least a first switch connected between a common terminal and a first terminal, and a second switch connected between the common terminal and a second terminal. Each of the first and second switches includes a plurality of field-effect transistors connected in series and each having a body, a source, a drain, and a gate. A compensation capacitance that compensates a parasitic capacitance generated when the first switch is in an off-state is formed between the drain and the body or between the source and the body in the FET of the first switch. A compensation capacitance that compensates a parasitic capacitance generated when the second switch is in an off-state is formed between the drain and the body or between the source and the body in the FET of the second switch.

Abstract: Low leakage diodes and methods of forming the same are disclosed. In one embodiment an apparatus includes a designed or parasitic bipolar transistor having an emitter, a base and a collector. The bipolar transistor is configured to operate as a diode, the diode having reverse-biased and forward-biased modes of operation. The emitter and base operate as first and second terminals of the diode, respectively. The collector is configured to receive a collector bias voltage, which is controlled relative to a voltage of the emitter to reduce a diffusion leakage current of the diode when the diode is in the reverse-biased mode of operation.

Abstract: This invention provides a poly fuse burning system comprising a poly fuse, a controllable power source supplying power for burning the poly fuse, and a monitor circuit monitoring the burning state of the poly fuse, wherein when a targeted burning state is reached, a control signal is output to shut down the controllable power source to stop the burning.

Abstract: A charge pump circuit comprises a plurality of subcircuits, where the subcircuits are connected to each other in a single or a dual array having a repeating pattern. Each of the subcircuits comprises one or more of the following: an X-channel device having an X-gate terminal, an X-source terminal and an X-drain terminal, a Y-channel device having a Y-gate terminal, a Y-source terminal and a Y-drain terminal, and a capacitor; wherein a first end of the capacitor, the X-drain terminal, and the Y-drain terminal are connected with each other to form the common drain terminal; and wherein a second end of the capacitor is the clock terminal.

Abstract: An electronic device generates a current with a predetermined temperature coefficient. The circuit comprises a temperature coefficient (TC) component receiving a bias current, a differential amplifier providing a buffered output voltage based on the voltage across the TC component and a resistor receiving an TC current based on the differential amplifier output voltage. The differential amplifier has a predetermined input related offset which decreases the voltage drop across the resistor. The temperature coefficient component could have either a negative temperature component (NTC) or a positive temperature component (PTC).

Abstract: A temperature independent reference circuit includes first and second bipolar transistors with commonly coupled bases. First and second resistors are coupled in series between the emitter of the second bipolar transistor and ground. The first and second resistors have first and second resistance values, R1 and R2, and third and second temperature coefficients, TC3 and TC2, respectively. The resistance values being such that a temperature coefficient of a difference between the base-emitter voltages of the first and second bipolar transistors, TC1, is substantially equal to TC2×(R2/(R1+R2))+TC3×(R1/R1+R2)), resulting in a reference current flowing through each of the first and second bipolar transistors that is substantially constant over temperature. A third resistor coupled between a node and the collector of the second bipolar transistor has a value such that a reference voltage generated at the node is substantially constant over temperature.

Abstract: According to an example embodiment, an apparatus for controlling a power supply voltage for an integrated circuit may be provided, which may include a plurality of different types of process region detection circuits, each process region detection circuit configured to identify a respective process region of a plurality of process regions. The apparatus may also include a voltage selection circuit configured to determine a highest voltage among the voltages associated with the identified process regions and to select a power supply voltage for the integrated circuit that is equal to the highest voltage, one or more functional test circuits configured to perform a functional test using the selected power supply voltage, and a voltage adjuster circuit configured to increase the selected power supply voltage if the functional test fails.

Abstract: A voltage regulation circuit includes: a first voltage divider that divides a regulation voltage with a predetermined division ratio to generate a division voltage; a first current driving force control unit configured to compare a reference voltage with the division voltage and generate a first control signal; a current driving unit configured to generate a driving current with a variable driving force based on the first control signal and a second control signal, and generate the regulation voltage; and a second current driving force control unit configured to generate the second control signal in accordance with a level variation of the regulation voltage.

Abstract: A reference current generating circuit has: first and second current mirror circuits and first and second output terminals. The first current mirror circuit has: a first transistor of a first polarity being an input-side transistor; and a first resistor connected between a gate of the first transistor and a power supply terminal. The second current mirror circuit has a second transistor of a second polarity being an input-side transistor. An output node of the first current mirror circuit is connected to an input node of the second current mirror circuit, and an input node of the first current mirror circuit is connected to an output node of the second current mirror circuit. A control voltage applied to the gate of the first transistor is output from the first output terminal. A control voltage applied to a gate of the second transistor is output from the second output terminal.

Abstract: A current-mode analog baseband apparatus is provided. The apparatus includes a current-mode low-order filter, a current-mode programmable gain amplifier (PGA) unit and a high-order filter. The input impedance is smaller than the output impedance in the current-mode low-order filter. An input terminal of the current-mode PGA unit is connected to an output terminal of the current-mode low-order filter. An input terminal of the high-order filter is connected to an output terminal of the current-mode PGA unit.

Abstract: In a programmable logic device having high-speed serial interface channels, a clock distribution network for providing one or more high-speed clocks to dynamic phase alignment circuitry of those high-speed serial interfaces includes at least one bus that is segmentable (e.g. using tristatable buffers). This allows the bus to be divided into different portions that can be connected to different clock sources when the high-speed serial interfaces are running at different speeds. In one embodiment, the segmenting elements (e.g., the aforementioned buffers) are located between selected channels (e.g., every fourth channel), limiting the size of the different segments. In another embodiment, segmenting elements are located between each channel, allowing complete user freedom in selecting the sizes of the segments. Thus, instead of providing a bus for every clock source, multiple clocks can be made available to different channels by segmenting a single bus.

Abstract: In one embodiment the present invention includes a switching circuit. The circuit comprises a first transistor, a second transistor, and a boost circuit. The first transistor couples a first power source to a first intermediate node during a first phase of operation and the second transistor couples a second intermediate node to the first intermediate node during a second phase of operation. The boost circuit is coupled to the second intermediate node and provides a second power source by a transferring of energy from the first power source. The transferring of energy includes an inductor receiving energy from the first power source during the first phase of operation and providing a portion of said energy to the boost circuit during the second phase of operation. The boost circuit provides a biasing to enable deactivation of the second transistor during the first phase of operation.

Abstract: A distributed power amplifier may include a plurality of switching power amplifier sub-circuits, and a plurality of connection network sub-circuits, each of the plurality connection network sub-circuits having a characteristic impedance, wherein each of the plurality of connection network sub-circuits combines two or more of the plurality of switching power amplifier sub-circuits into a parallel or series configuration, wherein the plurality of switching power amplifier sub-circuits, the plurality of connection network sub-circuits and the characteristic impedance of each of the plurality of connection network sub-circuits are configured to present each of the plurality of switching power amplifier sub-circuits with a substantially equivalent load impedance.

Abstract: A push-pull low noise amplifier (LNA) includes at least one amplifier block. Each amplifier block includes a bypass stage and at least one gain cell. The bypass stage has a first node and a second node. The gain cell has an input terminal and an output terminal, comprising a loading stage and a driving stage. When the push-pull LNA is in a first gain mode, the loading stage is enabled and the bypassing stage is disabled; and when the push-pull LNA is in a second gain mode, the loading stage is disabled and the bypassing stage is enabled.

Abstract: An amplifier comprises: an input stage for receiving incoming signals; a high gain stage coupled to the input stage and providing driving signals in response to the incoming signals to an output driver stage; and an output terminal coupled to the output driver stage. The output driver stage comprises a high side driver circuit having a first terminal receiving a first driving signal pdrive from the high gain stage, a second terminal coupled VDD through a first voltage drop, and a third terminal coupled to the output terminal of the amplifier.

Abstract: A system includes a power amplifier, a preamplifier, a first temperature sensor, and a bias generator. The power amplifier has a first gain, which is a function of a temperature of the power amplifier. The preamplifier has a second gain, amplifies an input signal, and outputs an amplified signal to the power amplifier. The first temperature sensor senses the temperature and generates a first signal. The bias generator generates a first biasing signal to bias the power amplifier, generates a second biasing signal to bias the preamplifier, and adjusts the second gain by adjusting the second biasing signal based on the first signal. The adjusted second gain compensates a change in the first gain due to the change in the temperature.

Abstract: The disclosed multi-stage amplifier (200) comprises several amplifier stages (201-203) which, together with an output network, form different branches. A first branch comprises a first and a second amplifier (201, 202) having their outputs connected to each other via a quarter-wave transmission line. The first branch is connected to a load via a first offset-transmission-line (0.1). A second branch comprises a third amplifier stage (203) and a second offset-transmission line (0.22) which are also connected to the load.

Abstract: An amplifier device includes an initial amplifier stage configured to receive a differential input signal at a first leg and a second leg; a final amplifier stage coupled to outputs of the initial amplifier stage, the final amplifier stage including a primary signal amplifier and an error amplifier in each of the first and second legs; and wherein an output of the error amplifier of the first leg is combined with an output of the primary signal amplifier in the second leg, and an output of the error amplifier of the second leg is combined with an output of the primary signal amplifier in the first leg.

Abstract: A signal processing module with a timing comparator such as a time to digital converter is provided. The timing comparator comprises an error cancellation stage to remove a predicted effect of the imparted jitter from the timing comparator output signal. A jitter detector is used to detect the jitter from the comparator output signal, preferably residual jitter after the predicted effect of the jitter has been removed. Synchronous detection, such as correlation with the predicted jitter may be used to detect the jitter. The jitter detector adjusts a calibration factor of the timing comparator dependent on the detected jitter.

Abstract: A voltage-controlled oscillator circuit comprises an output terminal for providing an oscillatory output signal thereat, a first inductor, a varactor, and a negative-resistance element. The varactor's capacitance is a function of a tuning potential applied at a first terminal of the varactor. A bias branch is present for coupling a second terminal of the varactor to a bias potential. The bias branch comprises a second inductor or a transmission line. The bias branch may comprise a transmission line the length of which is one quarter wavelength associated with the resonance frequency of the voltage-controlled oscillator circuit. A radar system including a VCO circuit is further disclosed.

Abstract: An isolator that includes first and second substantially identical circuitry galvanically isolated from each other and each having at least one communications channel thereon for communicating signals across an isolation boundary therebetween and each of said first and second circuitry having configurable functionality associated with the operation thereof. A coupling device is provided for coupling signal across the isolation boundary between the at least one communication channels of the first and second circuitry. First and second configuration memories are provided, each associated with a respective one of the first and second circuitry. First and second configuration control devices are provided, each associated with a respective one of the first and second circuitry and each configuring the functionality of the associated one of the first and second circuitry.