Abstract: A locator for detecting an article includes a push-pull measurement bridge configured to actuate a first and a second electromagnetic device in a variable ratio. Depending on the actuation the first electromagnetic device generates an alternating electromagnetic field in the region of the article. The locator further includes a comparator for detecting the article, should the variable ratio differ by more than a predetermined amount from a predetermined ratio.

Abstract: Methods, apparatus, and systems are provided for detecting the presence of a substrate in a load cup. The invention includes a proximity sensor having a detection pad disposed below a contact surface of a load cup assembly and a target disposed on a lever member and adapted to move toward the detection pad when a substrate is placed on the lever member and adapted to move away from the detection pad when a substrate is removed from the lever member. Numerous additional aspects are disclosed.

Abstract: A brushless axial flux electromagnetic resolver comprising a stator carrying output and excitation windings and an inductive rotor having two substantially annular members arranged substantially perpendicular to the axis of rotation of the rotor, wherein each of the annular members has a lobe which is helically skewed along the rotor and wherein the lobes of the annular members are angularly offset from one another to provide a discontinuity in the helical skew between the annular members.

Abstract: An apparatus includes a circuit, a code modulator, and an actuator. The circuit is operable to detect displacements of a rotating object while in motion. The circuit is operable to detect a position of the displacements and to generate a signal associated therewith. The code modulator is operable to generate a modulated signal based on the position and the displacements. The actuator is operable to apply a force to the rotating object, wherein the force is based on the modulated signal.

Abstract: A measuring device for detecting a metal object includes two emission coils configured to produce superimposed magnetic fields, a receiving coil in the region of both magnetic fields, and a control device configured to control the emission coils such that a value of a voltage, which is clock synchronized with alternating voltages and which is induced in the emission coils, is minimized. The control device is configured to detect the metal object when a ratio of the alternating voltages does not correspond to a ratio of distances between the receiving coils and the emission coils.

Abstract: An eddy current flaw detection system includes an eddy current flaw detection probe having a substrate facing an inspection surface, and at least one exciting coil and at least two detecting coils provided on the substrate, a scanning device which scans the probe on the inspection surface, a scan control device which drives and controls the scanning device, an eddy current flaw detection device which acquires results of detection of a plurality of detection points corresponding to combinations of the exciting and detecting coils for each scan position of the probe, and a data processing/display device which processes data from the scan control device and the eddy current flaw detection device and thereby displays a result of flaw detection. The data processing/display device acquires three-dimensional coordinates of the detection points for each scan position of the probe and thereby creates three-dimensional flaw detection data.

Abstract: An optical device, a method of configuring an optical device, and a method of using a fiber Bragg grating is provided. The optical device includes a fiber Bragg grating, a narrowband optical source, and at least one optical detector. The fiber Bragg grating has a power transmission spectrum as a function of wavelength with one or more resonance peaks, each comprising a local maximum and two non-zero-slope regions with the local maximum therebetween. The light generated by the narrowband optical source has a wavelength at a non-zero-slope region of a resonance peak that is selected such that one or more of the following quantities, evaluated at the resonance peak, is at a maximum value: (a) the product of the group delay spectrum and the power transmission spectrum and (b) the product of the group delay spectrum and one minus the power reflection spectrum.

Abstract: A Hall electromotive force signal detection circuit combines offset cancellation means by a spinning current method of a Hall element with a continuous-time signal processing circuit. A first Hall element includes first to fourth terminals, and generates a Hall electromotive force signal voltage Vhall1. A third Hall element generates an other Hall electromotive force signal voltage Vhall3. A first switching circuit selects a terminal position for applying a drive current from the four terminals of the first Hall element. A third switching circuit selects a terminal position for applying a drive current from the four terminals of the third Hall element, which is different from the terminal position selected by the first switching circuit. A chopper clock generation circuit supplies a chopper clock signal ?1, ?2 having two different phases to the switching circuit, and also supplies the chopper clock signal ?1, ?2 to the switching circuit.

Abstract: A probe for scanning a surface of an arbitrarily sized sample in magnetic resonance force microscopy comprising a magnetic sensor having a support element coupled to a magnetic particle, an RF antenna, at least partially circumscribing the magnetic sensor, for emitting an RF magnetic field across a portion of the sample and an optical sensor, positioned proximate the magnetic sensor, for detecting displacement of the support element.

Abstract: A process using Nuclear Magnetic Resonance (NMR) with pre-determined oil specimens at the earth's surface by which to match the location and lateral boundaries of any and every producible oil reservoir responsive to NMR technology, to provide estimates to useable industry standards of porosity and permeability of said reservoirs for exploration purposes by NMR, to detect and identify depth and direction of faults in any given oil area by NMR, to provide mapping of surveyed areas prior to drilling either offset or wildcat ventures resulting from NMR testing, to evaluate reservoir and production potential in existing oil fields by NMR, to detect the existence of natural gas by NMR, and the ability to condemn any proposed drilling location in view of failure.

Abstract: A method for implementing a switching between a body coil and a head coil in a nuclear magnetic resonance imaging system comprising the body coil, the head coil and a power amplifier component, wherein the power amplifier component comprises sets of power amplifiers, each set of power amplifiers comprising channels of power amplifiers combined by a Wilkinson circuit, a combiner configured to combine signals from the sets of power amplifiers and to connect the sets of power amplifiers to the body coil, a first switching device comprising a first terminal configured to be grounded, a second switching device connected in series in a resistor branch of the Wilkinson circuit, and a ¼ wavelength transformation transmission line located between the second switching device and the head coil, the method comprising connecting the power amplifier component to the body coil or the head coil by setting states of both switching devices.

Abstract: A method for imaging a substrate and product over time is provided. The substrate and product are magnetically tagged with at least one magnetic gradient where magnetically tagging provides a tag-dependent signal phase for the substrate and a different tag-dependent signal phase for the product. At least one readout of magnetically tagged substrate and product is provided over time. The tag-dependent signal phase is used to determine product that has been transformed from magnetically tagged substrate and substrate that has been transformed from magnetically tagged product over time.

Abstract: A control apparatus for extracting data from an MRFM system in accordance with exemplary embodiments of the present invention comprising a visualization controller for controlling operation of the MRFM system, an initialization module, coupled to the visualization controller, for retrieving initialization data from a data source, a data collection module, coupled to the visualization controller, for extracting data from the MRFM system and an imaging module for generating image data based on the extracted data.

Abstract: A local coil for an imaging system includes a number of shim coils. A current for generating a shim field in one of the shim coils may be switched on and switched off. A current for generating a shim field in another of the shim coils may be switched on and switched off. The currents may be switched on and switched off independently of one another for generating a respective shim field in the shim coils.

Abstract: Technologies including NMR relaxation time estimation methods and corresponding apparatus are disclosed. Example techniques may generate two or more alternating current transmit pulses with arbitrary amplitudes, time delays, and relative phases; apply a surface NMR acquisition scheme in which initial preparatory pulses, the properties of which may be fixed across a set of multiple acquisition sequence, are transmitted at the start of each acquisition sequence and are followed by one or more depth sensitive pulses, the pulse moments of which are varied across the set of multiple acquisition sequences; and apply processing techniques in which recorded NMR response data are used to estimate NMR properties and the relaxation times T1 and T2* as a function of position as well as one-dimensional and two-dimension distributions of T1 versus T2* as a function of subsurface position.

Abstract: A probe for use in Magnetic Resonance Force Microscopy (MRFM) to provide an image of a sample comprising: a magnetic field source adapted to orient the spin of the nuclei in a sample; a detector capable of detecting a magnetic field comprising an oscillator; at least one conductor substantially surrounding the oscillator for forming a RF antenna for transmitting a radio frequency electromagnetic field; whereby the at least one conductor transmits a radio frequency electromagnetic field that influences the nuclei in the sample, and whereby the detector detects how the nuclei are influenced through the oscillations of the oscillator to provide identification information concerning the content of the sample. Also included is a method for magnetic resonance force microscopy of a sample.

Abstract: A magnetic resonance imaging (MRI) apparatus includes an MRI imaging condition setting unit configured to set an imaging condition frequency-selectively applying a first suppression pulse for suppressing fat and further frequency-selectively applying a second suppression pulse to the fat after applying the first suppression pulse, a slip angle of the second suppression pulse differing from that of the first suppression angle, and the second suppression pulse further suppressing remaining fat after applying the first suppression pulse. The image data acquisition unit acquires image data according to the imaging condition.

Abstract: A magnetic resonance imaging apparatus of an embodiment has a setting unit configured to set a pulse sequence having a pre-pulse for fat suppression and a pulse train for data acquisition for acquiring echo data for image reconstruction, the pulse sequence being provided with a plurality of dummy pulses between the pre-pulse for fat suppression and the head of the pulse train for data acquisition, a data acquisition unit configured to apply an RF pulse and a gradient magnetic field pulse based on the pulse sequence set by the setting unit to a test object so as to acquire the echo data, and an image generation unit configured to reconstruct an image of the test object from the acquired echo data, wherein an application time during which the plural dummy pulses are applied or flip angles of the plural dummy pulses can be adjusted.

Abstract: Disclosed is a device for generating a homogeneous magnetic field component Bz along an axis Oz in a spherical zone of interest of centre O and radius r includes at least one first ring of axis Oz in magnetic material with radial magnetization oriented in a first direction and extending around an opening giving access to the zone of interest ZI, a second ring of axis Oz in magnetic material with radial magnetization oriented in the first direction and offset along axis Oz from the first ring and the zone of interest ZI, the inner radius and the outer radius of the second ring respectively being smaller than the inner radius and outer radius of the first ring.

Abstract: A radio frequency (RF) body coil assembly includes a coil support structure including an inner tubular member, an outer tubular member disposed radially outwardly from the inner tubular member, and a structural material disposed between the inner and outer tubular members, an RF coil mounted to an inner surface of the coil support structure, and a positron emission tomography (PET) detector assembly mounted to an outer surface of the coil support structure. A dual-modality imaging system is also described.

Abstract: In some embodiments, a method of approximating or determining at least one dimension of at least one underground geological feature in a zone of interest proximate to a well bore includes generating an electric field in the zone of interest while the well bore and geological feature at least partially contain conductive fluid. At least two sensing electrodes are provided in the well bore and configured to detect differences therebetween in electric potential caused by at least one target object in the zone of interest and provide data relating thereto to at least one data processing system. The data processing system(s) approximates or determines the dimension(s) of the geological feature(s) based at least partially upon data provided by the sensing electrodes.

Abstract: The present invention is a shrink label with a die cut voltage indicator device integrated therewith.

Abstract: The embodiments described herein include a system and a method. One embodiment provides a sensing apparatus for a battery system having a plurality of cells. The sensing apparatus includes an elongated substrate configured to extend along one side of the plurality of cells and a plurality of sensors, each corresponding to a respective one of the plurality of cells, and each configured to contact its respective cell.

Abstract: Aerosol detection apparatus comprises an aircraft having a dielectric member, such as a window (10), comprised in the body (12) thereof such that a surface of the dielectric member forms part of the exterior surface of the aircraft. Detection means (16), such as a static monitor is located on the inside of the aircraft and arranged to detect an electric field resulting from polarisation of the dielectric member. The output of the static monitor, or the rate of change thereof, correlates closely to particle density as the aircraft is flown though an aerosol, such as a volcanic ash cloud. The apparatus is simple and relatively inexpensive, and may comprise any general purpose aircraft. Aerosol particles may be detected and mapped using apparatus of the invention more easily and quickly than by use of devices such as optical spectrometers mounted on dedicated research aircraft, or static monitors mounted on the exterior of an aircraft.

Abstract: An arrangement to detect a ground fault in an AC electric circuit including an electric machine having a neutral point connecting to a neutral point and a terminal side, and a unit transformer connected to the terminal side of the machine, wherein the arrangement includes a signal injection unit, a voltage transformer having a primary winding connected to the terminal side of the electric machine and a secondary winding that is open delta-connected, an instrument transformer having a primary winding connected to the neutral point of the electric machine and a secondary winding, and a ground fault detecting unit. The signal injection unit is configured to inject a signal to the secondary winding of the voltage transformer. The instrument transformer is configured to measure the resultant injected signal at its secondary winding The ground fault detecting unit is configured to detect a ground fault based on the measured signal.

Abstract: A system and method is disclosed for functional verification of multi-die 3D ICs. The system and method include a reusable verification environment for testing each die in a stack of dies individually without having to simultaneously operate all of the dies in the stack. The system and method includes converting an input/output (“IO”) trace from a die verification test from a first format to a second format to improve performance.

Abstract: A circuit including a first switch receiving an input reference voltage, a second switch receiving an input testing voltage, the first switch and the second switch are electrically connected in parallel. The circuit further includes a first capacitor electrically connected in series with the first switch and the second switch. The circuit further includes a feedback stage comprising a feedback inverter electrically connected in parallel with a feedback switch, where the feedback stage is electrically connected in series with the first capacitor. The circuit further includes a first inverter electrically connected in series to the feedback stage, and a third switch electrically connected in series with the first inverter. The circuit further includes a second inverter electrically connected in parallel to a third inverter, the second inverter and the third inverter are electrically connected in series to the third switch, and the third inverter outputs a first output signal.

Abstract: Techniques to provide calibration of a measurement system in conjunction with measurement operations. The techniques may include providing a reference device in a signal processing chain within the measurement system. An excitation signal may be driven through the reference device while it may be connected to the signal processing chain within the measurement system and a calibration response may be captured. During a measurement operation, the reference device connection may be complemented with a sensor connection in the signal processing chain and the excitation signal may be driven through the signal processing chain. A measurement response may be captured from the system. The measurement system may generate a calibrated measurement signal that accounts for phase and/or amplitude errors within the system from the calibration response and the measurement response.

Abstract: Disclosed are a jig for measuring EMC of a semiconductor chip and a method for measuring EMC that can accurately measure the EMC at a semiconductor chip level. The jig for measuring EMC of a semiconductor chip according to the exemplary embodiment of the present disclosure includes: a chip mount unit on which the semiconductor chip for which the EMC is to be measured is mounted; a memory unit configured to store EMC information of components in a system in which the semiconductor chip is used; and a measurement control unit configured to extract the EMC information stored in the memory unit and provide the extracted EMC information to the chip mount unit at the time of measuring the EMC of the semiconductor chip.

Abstract: A test apparatus for measuring electromagnetic interference (EMI) of an image sensor integrated circuit (IC) device may include an EMI test jig configured to drive a mounted image sensor IC device on one or more test conditions; an electromagnetic (EM) shielding box configured to shield external EM waves from other directions except an upper direction, the EM shielding box accepting the EMI test jig; an EM emission sensing probe configured to sense EM emissions from the image sensor IC device, the EM emission sensing probe being separated from and adjacent to the image sensor IC device in the upper direction when sensing EM emissions; and a spectrum analyzer configured to connect to the EM emission sensing probe, the spectrum analyzer configured to evaluate the EM emissions from the image sensor IC device.

Abstract: A proximity sensor includes a relatively simple temperature compensation circuit, and includes a variable gain oscillator, a temperature sensor circuit, and a proximity determination circuit. The variable gain oscillator has a gain that varies with the proximity of a target to a sensor coil, generates an oscillating electrical signal having a substantially constant amplitude magnitude, and generates an energy signal representative of the electrical energy needed to sustain oscillations. The temperature compensation circuit senses proximity sensor temperature and supplies a temperature signal representative thereof, and the proximity determination circuit, based on the energy signal, supplies a proximity signal representative of target proximity to the sensor coil. The proximity determination circuit includes a comparator and a fixed resistor network. The comparator circuit supplies the proximity signal.

Abstract: A measure initialization path for a delay line structure includes: a forward path, comprising a plurality of delay stages coupled in series; a first output path coupled to at least an output of a delay stage of the forward path, where at least an output of a delay stage is fed forward to the forward path; and a second output path coupled to at least an output of a delay stage of the forward path, where at least an output of a delay stage is fed forward to the forward path. When a signal is propagated through the measure initialization path, the signal successively propagates through a delay stage of the forward path, a delay stage of the first output path and a delay stage of the second output path for performing measure initialization.

Abstract: Disclosed herein are embodiments of devices for measuring electrical current and related systems and methods for forming and using such devices. According to certain embodiments, devices according to the present disclosure may comprise Rogowski coils. Also disclosed are systems and methods for forming a current measuring device using a bobbin that may allow for the use of a continuous length of wire for all windings associated with the current measuring device. Automated manufacturing techniques may be utilized to facilitate the manufacture of devices for measuring electrical current and/or may reduce the cost of such devices. Various embodiments disclosed herein include the use of a bobbin that may be selectively configured between a linear configuration and a closed configuration. One or more current sensors disclosed herein may be utilized in connection with a motor management relay or other type of intelligent electronic device.

Abstract: An novel impedance sensor is provided having a plurality of substantially parallel drive lines configured to transmit a signal into a surface of a proximally located object, and also a plurality of substantially parallel pickup lines oriented substantially perpendicular to the drive lines and separated from the pickup lines by a dielectric to form intrinsic electrode pairs that are impedance sensitive at each of the drive and pickup crossover locations.

Abstract: A capacitive distance sensor is provided. The distance sensor includes a sensor element having an electrically conductive, elongated, flat sensor area which in turn contains a number of holes. The sensor area is completely surrounded by an electrically non-conductive insulating body, with the result that the insulating body completely covers the edge regions of the holes. The sensor element is produced, in particular, by first of all making the holes in the sensor area. In a subsequent step, the sensor area is completely encased by the insulating body which also completely fills the holes in the sensor area.

Abstract: Techniques and circuits are described for approximation of the differential capacitance of a capacitive sensor to, among other things, optimize device operation and power consumption. In particular, feedback techniques are utilized for measurement and approximation of the differential capacitance of the capacitive sensor. In accordance with the disclosure, the capacitance approximation value for a test cycle preceding a given test cycle is utilized to reduce the number of iterations to be performed in a continuous series of test cycles. The capacitance approximation value for the given test cycle is reported as being equivalent to that of the preceding test cycle if the variance between the selected capacitance and the unselected capacitance is less than or equal to a first predefined value.

Abstract: A high-voltage sensing capacitor as an interface apparatus that may be used to attach an indicator unit to a high-voltage AC electrical bus and to provide safety to maintenance personnel. The high-impedance nature of the sensing capacitor effectively isolates the indicator unit from the high-voltage source to which it is connected. The sensing capacitor can be directly mounted between a high-voltage busbar and an indicator unit to provide visual and/or audible alerts to maintenance personnel when high voltage conditions are detected on the busbar. The sensing capacitor is comprised of a portable, unitary capacitive structure that includes a molded insulator body encapsulating two electrodes. The electrodes only partially or incompletely overlap within the insulator body. The electrode spacing and configuration is structured to provide a deliberate amount of coupling between the two electrodes in the presence of an AC electric field.

Abstract: A current detection circuit comprises: a series circuit of a first current detection part series to a first semiconductor and a second current detection part, which detects current having a smaller range than the first current detection part; a second semiconductor device, which is provided with a second drive circuit, connected in parallel with the second current detection part; and a current determination circuit configured to switch between the first current detection part and the second current detection part, based on the magnitude of the detection current of the first current detection part, wherein, when the detection current of the first current detection part is larger than a predetermined value, the voltage from the first current detection part is output, and wherein, when the detection current of the first current detection part is smaller than the predetermined value, the voltage from the second current detection part is output.

Abstract: A method for testing a device-under-test includes receiving, from at least one test channel circuit dedicated to communicate with an input/output pin of the device-under-test by means of at least one hardware resource, at least one logical control command describing a desired operation of the at least one hardware resource, and converting, by means of a resource controller, the at least one logical control command into at least one dedicated control command for the at least one hardware resource, wherein the at least one dedicated control command is adapted to be received by a physical implementation of the at least one hardware resource.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: Disclosed is in particular a device (2) for stressing an integrated circuit (1) including an electronic chip (10) mounted in a housing (12), the device including a source (20) of thermal stress. The device (2) also includes a thermally conductive coupling member (22), designed to be thermally coupled to the source (20) of thermal stress during the stressing operation. The coupling member (22) includes an end (220) whose geometry is suitable for being introduced into an aperture with a predefined geometry, to be made in the housing (12) of the integrated circuit (1) so as to thermally couple a coupling face (222) of this end (220) with a face (102) of the electronic chip (10).

Abstract: An exemplary implementation of the present disclosure includes a testable semiconductor package that includes an active die having interface contacts and dedicated testing contacts. An interposer is situated adjacent a bottom surface of the active die, the interposer providing electrical connections between the interface contacts and a bottom surface of the testable semiconductor package. At least one conductive medium provides electrical connection between at least one of the dedicated testing contacts and a top surface of the testable semiconductor package. The at least one conductive medium can be coupled to a package-top testing connection, which may include a solder ball.

Abstract: System and method for test structure on a wafer. According to an embodiment, the present invention provides a test structure for testing an integrated circuit. For example, the test structure and the integrated circuit are manufactured on a same substrate material and the testing being conducted is in a temperature-controlled environment. The test structure includes a top structure positioned above the integrated circuit, the top structure including a first metal material, which includes a first electrical terminal and a second electrical terminal. The test structure also includes a bottom structure positioned below the integrated circuit, the bottom structure including a first silicon material. A first side structure is positioned between the top structure and the bottom structure and located next to a first side of the integrated circuit. A second side structure is positioned between the top structure and the bottom structure and located next to a second side of the integrated circuit.

Abstract: The test method of this invention is comparatively simpler without high voltages in normal default current tests, high voltages have been replaced by impulse generator employing positive and negative symmetrical voltages mixed with impulse voltages to form asymmetrical forward and reverse high voltages, meanwhile the timing for impulse voltage is flexible, the amplitudes could be continuously adjustable according to specific needs, to make test voltage exactly reach climax upon certain timing, the test is flexible and safe, to be applied to converter valves in different direct currents.

Abstract: A sequential circuit with transition error detector including a sequential element with an input that is asserted to the output during the second clock phase of a two phase clock signal, a transition error detector coupled to the sequential element input to assert an error signal if a transition occurs at the sequential element input during the second clock phase but not to assert during the first clock phase, wherein a transition error detection circuit comprises a current mode circuit as a detection circuit for transition timing error detection from signals derived from the sequential element clock signal and input signals.

Abstract: Electromagnetic radiation (“EMR”) dissipating devices. One example embodiment includes an electrical circuit including an EMR source configured to generate an output signal at an operating bit rate. The output signal may include an EMR component. The electrical circuit may also include an EMR dissipating device electrically coupled to the EMR source and configured to have a resonance frequency corresponding to the operating bit rate.

Abstract: A data output circuit includes a pre-code generation unit configured to generate one of a pre-pull-up code and a pre-pull-down code according to a calibration code in response to a voltage level of input data; and a plurality of main driving units configured to be selectively activated in response to an on-die termination code, wherein respective outputs of the plurality of main driving units are commonly connected to an output node, and wherein activated main driving units drive the output node in response to the pre-pull-up code or the pre-pull-down code.

Abstract: An analog portion of a mixed-mode integrated circuit system includes a plurality of analog input cells, a plurality of analog output cells, and an interconnect array. The input cells are configured to program analog functions. The output cells are configured to provide Analog and digital outputs corresponding to the programmed analog functions. The interconnect array processes the programmed analog functions into signals indicative of the analog functions. The interconnect array selectively provides the signals to the plurality of analog output cells.

Abstract: The driver circuit includes a first controlling circuit that outputs, to a gate of the auxiliary pMOS transistor, a first controlling signal that rises in synchronization with a rising of the first pulse signal and falls after a delay from a falling of the first pulse signal. The driver circuit includes a second controlling circuit that outputs, to a gate of the auxiliary nMOS transistor, a second controlling signal that rises in synchronization with a rising of the second pulse signal and falls after a delay from a falling of the second pulse signal.

Abstract: An integrated circuit (IC) including a core area containing active devices and at least one input/output (I/O) cell configured to transfer signals into and out of the core area. The at least one I/O cell includes a gate orientation, a pre-driver module, and at least one post-driver module. The pre-driver module and the at least one post-driver module are offset from each other by an angle between zero and ninety degrees with respect to the gate orientation. The gate orientation for every one of the at least one I/O cell is substantially the same.