Abstract: A method of manufacturing a circuit carrier and the use of said method are proposed, said method comprising, after providing a printed circuit board (a), coating the circuit board on at least one side thereof with a dielectric (b), structuring the dielectric for producing trenches and vias therein using laser ablation (c) are performed. Next, a primer layer is deposited onto the dielectric, either onto the entire surface thereof or into the produced trenches and vias only (d). A metal layer is deposited onto the primer layer, with the trenches and vias being completely filled with metal for forming conductor structures therein (e). Finally, the excess metal and the primer layer are removed until the dielectric is exposed if the primer layer was deposited onto the entire surface thereof, with the conductor structures remaining intact (f).

Abstract: A laser beam machining method and a laser beam machining device capable of cutting a work without producing a fusing and a cracking out of a predetermined cutting line on the surface of the work, wherein a pulse laser beam is radiated on the predetermined cut line on the surface of the work under the conditions causing a multiple photon absorption and with a condensed point aligned to the inside of the work, and a modified area is formed inside the work along the predetermined determined cut line by moving the condensed point along the predetermined cut line, whereby the work can be cut with a rather small force by cracking the work along the predetermined cut line starting from the modified area and, because the pulse laser beam radiated is not almost absorbed onto the surface of the work, the surface is not fused even if the modified area is formed.

Abstract: One embodiment of the present invention relates to a system for buried-arc welding with thru-the-arc seam tracking. Another embodiment of the present invention relates to a method for buried-arc welding with thru-the-arc seam tracking.

Abstract: A controller for a welding system adapted to determine a value of a weld secondary parameter across a weld secondary component based on a sensed parameter is provided. The controller may also be adapted to compare the determined value to a reference value range and to alert a user to a presence and location of a weld secondary error when the determined value is outside the referenced value range.

Abstract: A method and apparatus for welding is disclosed. The output is preferably a cyclical CV MIG output, and each cycle is divided into segments. An output parameter is sampled a plurality of times within one or more of the segments. The CV output is controlled within the at least one segment in response to the sampling. The parameter is output power, a resistance of the load, an output current, an output voltage, or functions thereof in various embodiments. The control loop is preferably a PI or PID loop. The loop may be applied only within a window. The set point may be taught or fixed. The system can be used to weld with a controlled arc length.

Abstract: A system and method of rating the arc maintainability of an electric arc welding stick electrode by creating an arc between the electrode and a workpiece; moving the electrode along the workpiece while maintaining the arc; decreasing either the current or the voltage until a point is reached where the arc is extinguished; determining the open circuit voltage at the point; and, rating the electrode based upon at least the open circuit voltage point.

Abstract: An auxiliary power unit has an auxiliary engine, an auxiliary compressor, and a generator, and includes fittings for integrating with a vehicle's heating and cooling systems. The fittings may include first and second heater fittings adapted to be operably integrated into the heating system of the vehicle for diverting flow of the radiator fluid to the auxiliary engine. The auxiliary power unit also includes an AC fitting adapted to be operably installed between the evaporator and the vehicle compressor for enabling flow of AC fluid from the evaporator to the auxiliary compressor, and an AC valve adapted to be operably installed between the vehicle compressor and the condenser for enabling flow of the AC fluid from either the vehicle compressor or the auxiliary compressor.

Abstract: The disclosed heating device is to perform a heating process on an exposed substrate formed with a resist film before a developing process, the device including a heating part to perform a heating process on the exposed substrate, the heating part including a plurality of two-dimensionally arranged heating elements; a seating part provided at an upper side of the heating part, on which the substrate is disposed; and a control part to correct a setting temperature of the heating part based on temperature correction values, and to control the heating part based on the corrected setting temperature, during the heating process on one substrate by the heating part, wherein the temperature correction values being previously obtained from measured critical dimensions of the resist pattern in another substrate formed with the resist pattern through the heating process by the heating part and then the developing process.

Abstract: A thermally zoned substrate holder including a substantially cylindrical base having top and bottom surfaces configured to support a substrate. A plurality of temperature control elements are disposed within the base. An insulator thermally separates the temperature control elements. The insulator is made from an insulting material having a lower coefficient of thermal conductivity than the base (e.g., a gas- or vacuum-filled chamber).

Abstract: A temperature control circuit for two heating devices respectively provided with a heater and a sensing wire. The sensing wires' ends are respectively connected to a diode. The two diodes' polarity is opposite to that of the sensing wires' connecting ends. Another ends of the sensing wires are connected to a capacitor to form a resistor-capacitor circuit. The heater wires are connected to a diode respectively and then a bi-directional thyristor. The two diodes' polarity is opposite to that of the heater wires' connecting ends. Thereby, the heater wires can be heated up respectively by the positive and negative half-periods of alternating current. When phase shifts occur because of the heater wires' temperature change, the sensing wires can control the bi-directional thyristor via a controller so that the positive or negative half-period are not triggered. Therefore, the heater wires' heating temperatures can be controlled individually.

Abstract: An integrated circuit is provided having an active circuit. A heating element is adjacent to the active circuit and configured to heat the active circuit. A temperature sensor is also adjacent to the active circuit and configured to measure a temperature of the active circuit. A temperature controller is coupled to the active circuit and configured to receive a temperature signal from the temperature sensor. The temperature controller operates the heating element to heat the active circuit to maintain the temperature of the active circuit in a selected temperature range.

Abstract: An electrical heat production device comprising a thin resistive layer sandwiched between a pair of plates having high thermal and electrical conductivity, the stack of layers being insulated around the side surfaces. When a voltage potential is applied across the plates in the disclosed electrical heat production device, an electrical current flows across the resistive layer producing heat within the resistive layer that is conducted through the plates and across the outer surfaces of the plates. A guard heater can be positioned adjacent to one of the outer plate surfaces to bias the heat flow from the resistive layer toward the opposite outer plate surface, such that the apparatus can have a single planar heating surface.

Abstract: A bus bar system includes a non-conductive substrate having a major surface. At least one conductive bus bar is formed over at least a portion of the major surface. A conductive coating is formed over at least a portion of the bus bar and the major surface. An electrically conductive adhesive, such as an isotropically conductive tape or film, is applied over at least a portion of the film/bus bar junction. The system can optionally include a conductive metallic foil adhered to the isotropically conductive adhesive.

Abstract: A sealant curing apparatus is disclosed. In one embodiment, the apparatus includes a processing object panel, a panel supporting unit supporting the processing object panel and a voltage applying unit including a first electrode and a second electrode positioned on the panel supporting unit via the processing object panel interposed therebetween and having different polarities. The processing object panel includes: i) a conductive layer pattern including a heating unit that includes a lattice (grid) pattern, a connecting unit coupled to the first electrode and the second electrode, and a coupling unit connecting the heating unit and the connecting unit and ii) a sealant formed according to the heating unit.

Abstract: Generally and not exclusively, a method for controlling a process condition of at least one item within a microwave chamber may include receiving one or more initial values of one or more dynamically variable heatability properties for the at least one item in the microwave chamber, applying one or more microwave energy beams to the at least one item in the microwave chamber, remotely monitoring a spatial variation of the one or more dynamically variable heatability properties for the at least one item in the microwave chamber at least one of simultaneously with or following the applying of the one or more microwave energy beams, and estimating the process condition for microwaving the at least one item in the microwave chamber based at least partially on the monitoring of the one or more dynamically variable heatability properties for the at least one item in the microwave chamber.

Abstract: An optical device forms a beam path between an optical end element at a beam path end and an object scene into which the beam path is directed via a field of view of the end element. The optical device contains an alignment device for pivoting the field of view relative to a predetermined direction, an end optical unit and an optical articulation for guiding the beam path from the pivoted field of view into the end optical unit. In order to achieve good shielding against spurious radiation, the device has a shielding unit containing a shielding element led partly around the optical articulation, which shielding unit shields the optical articulation against incident radiation that is not incident through the entrance or exit aperture of the optical articulation.

Abstract: Apparatus and a method for intercepting a rocket body during boost phase. A sensor is arranged to detect thermal emission in a range that is characteristic of a firing rocket body. The image detected by the sensor is applied to an analog-to-digital converter for digitization and application to a computer that includes a routine for separating the modulated photon energy of the detected image from the substantially unmodulated photon energy that characterizes rocket body emissions. The unmodulated photon energy, signature of the rocket body, may be utilized by a fire control system for tracking, targeting and aiming munitions at the firing rocket body.

Abstract: Focus assist systems and methods for imaging devices are provided. The focus assist systems and methods display focus level data to a user. There are a variety of methods of displaying focus level data to a user, including, but not limited to, graphs, highlights, symbols, and varied levels of brightness or color.

Abstract: Disclosed are methods and systems for optoelectronic detection and location of moving objects. The disclosed methods and systems capture one-dimensional images of a field of view through which objects may be moving, make measurements in those images, select from among those measurements those that are likely to correspond to objects in the field of view, make decisions responsive to various characteristics of the objects, and produce signals that indicate those decisions. The disclosed methods and systems provide excellent object discrimination, electronic setting of a reference point, no latency, high repeatability, and other advantages that will be apparent to one of ordinary skill in the art.

Abstract: An exemplary optical sensor element for use in an optical sample analyzing apparatus, includes a housing that includes at least one optical sensor component. A housing body and a housing lid are removably connected to the housing body so that in an assembled state, the housing body and the housing lid form a fluid-tight housing. The housing lid is equipped with replaceable moisture control elements.

Abstract: A photoelectric switch includes a base having a tubular wall surrounding an axis, and a cover coupled to the base and including a rib unit that cooperates with the tubular wall to confine a rolling chamber. The rib unit has at least one portion overlapping the tubular wall. A light passage extends through the rolling chamber and two diametrically opposite sides of the tubular wall. A photoelectric unit is enclosed by the base and the cover, and includes a light emitter and a light receiver disposed respectively on two opposite ends of the light passage, and a rolling member disposed in the rolling chamber and movable between a blocking position to block the light passage and a non-blocking position to unblock the light passage.

Abstract: A method for correcting detected gamma ray spectra for the effects of energy analyzer pileup includes assigning detected gamma rays to channels in a multichannel analyzer (MCA). A pileup spectrum is estimated. The pileup spectrum is subtracted from the measured spectrum. The result thereof is compared to the preceding estimated pileup free spectrum and the estimating the pileup spectrum, subtracting the pileup spectrum and comparing is repeated until the difference between successive estimates of the pileup-free spectrum falls below a selected threshold.

Abstract: A method for performing composite dose quality assurance with a three-dimensional (3D) radiation detector array includes delivering a radiation fraction to the 3D array according to a radiation treatment (RT) plan, measuring absolute dose per detector of the 3D array, per unit of time, determining a radiation source emission angle per unit of time, synchronizing the RT plan with the measured absolute doses and determined radiation source emission angles to determine an absolute time for a control point of each beam of the synchronized RT plan, converting the beams of the synchronized RT plan into a series of sub-beams, generating a 3D relative dose grid for each of the sub-beams, applying a calibration factor grid to each of the 3D relative dose grids to determine a 3D absolute dose grid for each of the sub-beams, summing the 3D absolute dose grids to generate a 3D absolute dose deposited in the 3D array, and determining a 3D dose correction grid for application to the RT plan based on the 3D absolute dose.

Abstract: A diagnostic apparatus includes a measurement head, a translating calibration element, and a calibration element actuator. The measurement head includes a diagnostic light source, a light sensor, and a measurement head body. The diagnostic light source operates at a diagnostic wavelength ?D and the measurement head body supports the diagnostic light source and the light sensor in a spaced apart relationship across a target fluid passageway to define a diagnostic light path extending from the diagnostic light source to the light sensor. The translating calibration element is partially transparent to light at the diagnostic wavelength ?D and the calibration element actuator is structurally configured to move the translating calibration element into and out of the target fluid passageway. A size and geometry of the translating calibration element is such that the translating calibration element occupies a substantial entirety of the diagnostic light path when moved into the target fluid passageway.

Abstract: An insert apparatus for use in a test formation for a downhole nuclear spectroscopy tool includes an outer liner, and an inner liner defining a cylindrical borehole having a diameter such that the downhole nuclear spectroscopy tool is receivable therein. There is fill material between the outer liner and the inner liner, the material including a formation base material and an elemental standards material. The outer liner, the inner liner, and the fill material are configured such that an elemental standard measurement derived from a test using the insert apparatus is equivalent to an elemental standard measurement from a selected formation.

Abstract: A leak detector (190) includes a sensor head (260), a light source (200) optically coupled to the sensor head and operable to generate excitation light. A detector (205) is optically coupled to the sensor head and operable to detect fluorescence light. A signal processing unit (210) is coupled to the detector and operable to signal a leak condition responsive to an intensity of the fluorescence light exceeding a threshold. A fluid-tight enclosure (235) encloses at least the light source, the detector, and the signal processing unit.

Abstract: A method for identifying ions that generated mass spectral data, comprises acquiring raw mass spectral data in profile mode containing at least one ion of interest; performing at least one of mass spectral calibration involving peak shape and a determination of actual peak shape function associated with the acquired raw mass spectral data; considering at least one possible elemental composition of the ion; calculating theoretical mass spectral data for said elemental composition using the actual peak shape function; performing a normalization between corresponding parts of the theoretical mass spectral data and that of the raw or calibrated mass spectral data; and displaying mass spectral congruence between at least two mass spectra where one spectrum is the normalized version of the other corresponding to said possible elemental composition. The unique display and method assist in readily identifying ions.

Abstract: A mass spectrometry method of the present invention is such that a sample is heated to generate a gas and an ion that is produced from the gas is introduced into a mass spectrometer by using DART so that mass spectrometry is conducted.

Abstract: After a first injection of a sample, amount of change between a highest intensity and each of two ion intensities before and after a voltage showing the highest intensity is calculated for each CE voltage. If the change is equal to or less than a threshold the CE voltage showing the highest intensity in the coarse control mode is selected as the optimal value, without performing a measurement in a fine control mode. If the change in the ion intensity exceeds the threshold, a narrower CE-voltage range and a smaller step size are determined from the measurement result obtained for the first injection of the sample, and after a second injection of the sample, the ion intensity is measured while the CE voltage is varied in the fine control mode.

Abstract: Methods are provided for acquiring sum spectra in a time-of-flight mass spectrometer with orthogonal pulsed acceleration, where each of the sum spectra is obtained from a plurality of summed individual spectra. The mass spectrometer has an ion storage device that collects the ions temporarily before they are transferred to an ion pulser, which pulses out the ions orthogonally. Acquisition conditions such as, for example, delay times between opening the ion storage device and the pulsed ejection in the ion pulser are varied for the individual spectra, which are added together to form the sum spectrum of ions with light masses and high masses.

Abstract: An ionization chamber side voltage contact point is formed so as to protrude from the compartment in the ionization chamber, a mass spectrometric unit side voltage contact point 92 is formed in the hole created in the housing of the mass spectrometric unit, and a predetermined distance is provided between the inner periphery of the hole and the outer periphery of the mass spectrometric unit side voltage contact point in the structure, which allows the ionization chamber side voltage contact point to be inserted into the hole so to be connected to the mass spectrometric unit side voltage contact point when the ionization chamber is in the analysis position and allows the ionization chamber side voltage contact point to be pulled out from the hole so as to be disconnected from the mass spectrometric unit side voltage contact point the ionization chamber is in the maintenance position.

Abstract: A charged particle device includes a cylindrical column (102), a charged particle beam optical system disposed in the column; a sample stage (103) disposed on the column, and a support device (211, 212) supporting the column. The support device includes a simply supported structure that simply supports the column at a plurality of support points set along an axial line direction of the column. The support points for the column are disposed at positions corresponding to the positions of nodes of vibration of the column. In this way, the rigidity of the column can be increased without increasing the weight of the column itself, whereby vibrations acting on the column can be decreased.

Abstract: In conventional electron microscopes, orthogonality has been defined for each electron microscope individually in such a manner that a lattice sample is observed, and correction is applied to a control circuit so that the sample is observed as being orthogonal on a screen. Further, the correction has been determined by visual observation on a screen, and manually performed by a human operator. However, in this method, due to manufacturing variation of a lattice sample, the orthogonality may vary between devices. Further, there has been a problem in that the accuracy of correction varies by manually performing the correction. In order to solve the above problems, a particulate sample is used instead of a lattice sample for defining orthogonality, and adjustment is performed so that an image that should be a circle is observed as a circle, thereby making it possible to define the orthogonality.

Abstract: A scanning transmission electron microscope for imaging a specimen includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A stage is provided to hold a specimen in the path of the electron beam. A beam scanner scans the electron beam across the specimen. A controller may define one or more scanning areas corresponding to locations of the specimen, and control one or more of the beam scanner and stage to selectively scan the electron beam in the scanning areas. A detector is provided to detect electrons transmitted through the specimen to generate an image. The controller may generate a sub-image for each of the scanning areas, and stitch together the sub-images for the scanning areas to generate a stitched-together image. The controller may also analyze the stitched-together image to determine information regarding the specimen.

Abstract: A dual-band wide-angle absorber/thermal emitter includes at least one primary layer having a permittivity described by the Drude-Lorentz model. At least one reflective secondary layer is associated with the primary layer.

Abstract: A thermal infrared sensor includes an infrared ray absorbing film that is thermally separated from a semiconductor substrate by a hollow part; and a temperature sensor configured to detect temperature changes of the infrared ray absorbing film. The infrared ray absorbing film includes an infrared ray antireflection structure configured with a sub wavelength structure, the infrared ray antireflection structure being provided on a surface of the infrared ray absorbing film facing the semiconductor substrate.

Abstract: A general problem occurs when there are multiple High Energy Laser (HEL) systems designed to shoot down threat targets (e.g., rockets, artillery, and mortar (RAM), and unmanned aerial systems (UASs) and vehicles (UAVs)) in scenarios where there are multiple, simultaneous, impending threat targets. To achieve the highest target kill ratio or highest protection force efficiency, the HEL systems need to be independently allocated to unique threat targets at each specific time, such that the case where two or more HEL systems are shooting at the same target is avoided (referred to as “target deconfliction”). The present disclosure teaches an all electro optical (EO) solution that exploits the use and affects of the HELs focused on targets and, thus, eliminates the need for any battle management (BM) and command and control (C2) systems that are currently conventionally used for target deconfliction.

Abstract: The present disclosure is directed to a method of retrofitting an existing single-beam infrared scanner assembly for detecting the temperature of an object. The method may include removing optics and optoelectronic components contained within an existing housing of the single-beam infrared scanner assembly. The optics and optoelectronic components of the single-beam infrared scanner assembly may be replaced with optics and optoelectronic components for a multi-beam infrared scanner assembly. The replacement optics and optoelectronic components for the multi-beam infrared scanner assembly may be installed in the existing housing of the single-beam infrared scanner assembly.

Abstract: A detector array (110) includes a detector (112) configured to detect ionizing radiation and output a signal indicative of the detected radiation, wherein the detector at least includes a semiconductor element (118) and an illumination subsystem (120) configured to generate and transfer sub-band-gap illuminating radiation to selectively illuminate only a sub-portion of the semiconductor element in order to produce a spatially patterned illumination distribution inside the element.

Abstract: A device for detecting alpha-particles, like those emanating from radon. The device includes an electronic circuit (100) having a detection/conversion cell (102) with a forward biased diode (D) with its n-type layer grounded and the input of which is electrically connected to the p-type layer of the diode (D). The cell is designed to recover the charge emitted by the diode (D) and to convert this charge into a representative voltage constituting a dosage signal. The device further includes a comparison circuit (160) designed to compare the level of the dosage signal with a threshold level, and a control circuit (170) to control a protection device in response to the level of the voltage (V) exceeding the threshold value.

Abstract: The purpose of the present invention is to improve energy resolving power and prevent energy resolving power from deteriorating when a thick semiconductor detection element with a wide energy range is used, in a radiation measuring device using a semiconductor detector and a nuclear medicine diagnostic device. With the present invention, the purpose is achieved by pulsed wave value correction employing the difference of (Hs?Hf) between the pulsed wave height value Hs obtained from the slow speed shaping circuit, and the pulsed wave height value Hf obtained from the fast speed shaping circuit and normalized with respect to Hs. An even more desirable result may be obtained by employing either (Hs?Hf)/Hf or exp(k(Hs?Hf)/Hf), wherein k is a coefficient to be optimized, said optimization being dependent on the measurement assembly.

Abstract: An abridged multipole structure for the transport and selection of ions along a central axis in a vacuum system is constructed from a plurality of rectilinear electrode structures, each having a substantially planar face with a first dimension and a second dimension perpendicular to the first dimension. When a voltage is applied across the second dimension, an electrical potential is produced at the planar face whose amplitude is a linear function of position along the second dimension. Two electrode structures can be arranged parallel to each other with the first dimension extending along the central axis or more electrodes structures can be arranged to form multipole structures with various polygonal cross sections. Additional embodiments can act as linear ion traps or Paul ion traps.

Abstract: A multi charged particle beam writing apparatus according to the present invention includes an aperture member, in which a plurality of openings are formed, to form multiple beams, a blanking plate having a plurality of blankers to respectively perform blanking deflection of a corresponding beam in multiple beams having passed through the plurality of openings of the aperture member, a blanking aperture member to block each of beams which were deflected to be in a beam off state by the plurality of blankers, a plural stage objective lens to focus multiple beams having passed through the blanking aperture member onto the target object and a plurality of electrostatic lenses, at least one of which is arranged at each stage of the plural stage objective lens, to dynamically correct defocusing of the multiple beams during writing.

Abstract: A ion source comprises: a chamber, an injection to inject matter into the chamber, wherein said matter comprises at least a first species, a tip with an apex located in the chamber, wherein the apex has a surface made of a metallic second species, a generator to generate ions of said species, and a regulation system adapted to set operative conditions of the chamber to alternatively generate ions from the gaseous first species, and ions from the non-gaseous metallic second species.

Abstract: The present invention relates to a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, having the purpose of inducing initial electron emission using a CEM module and by radiating ultraviolet photons emitted from the ultraviolet diode to the entrance of the CEM module to obtain a large amount of amplified electron beams from the exit and to produce electron beams the emission times of which are accurately controlled at low temperature and at low power.

Abstract: A method of performing a hot test of a wafer-level, packaged high-brightness phosphor converted light-emitting diode (pc-HBLED) includes selectively heating portions of the phosphor layer using a laser to provide a predetermined temperature gradient in the phosphor layer. The selective heating can directly heat the silicone in a silicone-based phosphor layer, or directly heat the active ion(s) of the phosphor in a Lumiramic™-based phosphor or even the active ion(s) of a silicone-based phosphor layer. A current is applied to the InGaN film to establish a predetermined temperature at the InGaN film junction, the film junction being adjacent to the phosphor layer. Photometric measurements are performed on the HBLED after the selective heating and during the applied electroluminescent current. This method quickly establishes the temperatures and temperature gradients in the HBLED consistent with those of an operating, product-level HBLED, thereby ensuring accurate binning of the HBLED.

Abstract: A drawing apparatus performs drawing, with an array of charged particle beams, on shot regions arrayed on a substrate in a direction in parallel and with intervention of step movement of the substrate in the direction. The apparatus includes a driving device for relative movement between a stage and a charged-particle optical system in the direction. The optical system causes sub arrays (of charged particle beams), discretely arrayed in the direction, to be incident on the substrate, and includes deflectors configured to respectively deflect sub array sets each including at least one of the sub arrays. A controller controls the optical system and the driving device such that a region at one side of a boundary among the shot regions and a region at the other side are subjected to drawing not in parallel with a sub array existing over the boundary, but sequentially with intervention of the step movement.

Abstract: Systems and methods are provided to perform efficient, automatic adjustment of cyclotron beam currents within a wide range for multiple treatment layers within the same patient and treatment session. In one embodiment, efficient adjustment is achieved by using beam current attenuation by an electrostatic vertical deflector installed in the inner center of the cyclotron. The beam current may, for example, be adjusted by the high voltage applied to the electrostatic vertical deflector. In front of each treatment the attenuation curve of the vertical deflector is recorded. Based on this attenuation curve, the vertical deflector voltage for the needed beam current of each irradiation layer is interpolated. With this procedure the beam current could be automatically adjusted in minimal time over a wide range while maintaining a high level of precision.

Abstract: A method for electron-beam writing to a medium includes positioning the medium within an e-beam writing machine so that the medium is supported by a stage and is exposed to an e-beam source. The method also includes writing a pattern to the medium using a plurality of independently-controllable beams of the e-beam source, in which the pattern comprises a plurality of parallel strips. Each of the parallel strips is written using multiple ones of the independently-controllable beams.

Abstract: A particle beam system includes a charged particle beam source, a beam blanking module connectable to a data network, a focusing lens, a first beam deflection module connectable to the data network, a calculation module configured to determine a deflection time; and an encoding module.