Abstract: An information processing apparatus includes a user interface, an authentication unit, a controller, a restriction unit, and an authentication termination unit. The user interface accepts a first operation for setting a parameter from a user. The authentication unit authenticates the user. The controller controls the user interface to display the set parameter. The restriction unit restricts, in a case where a first condition is met after the user has been authenticated by the authentication unit, the user interface from accepting the first operation. The authentication termination unit terminates the authentication of the user in a case where a second condition is met while accepting of the first operation is being restricted by the restriction unit. The controller controls the user interface not to display the set parameter in a case where the second condition is met while accepting of the first operation is being restricted by the restriction unit.

Abstract: A microscope probe includes a substrate; an optical resonator disposed on the substrate and including an optical resonance property; a displacement member disposed on the substrate and separated from the optical resonator, the displacement member including: a first end disposed distal to the optical resonator; and a second end disposed proximate to the optical resonator; and a coupling member disposed on the substrate and connecting the displacement member to the substrate, wherein the first end is configured to probe a sample and to be displaced in response to a condition of the sample, the displacement member is configured to communicate displacement of the first end to the second end, and the second end is configured to change the optical resonance property in response to displacement of the second end.

Abstract: An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.

Abstract: An embodiment includes an integrated microscope including scanning probe microscopy (SPM) hardware integrated with optical microscopy hardware, and other embodiments include related methods and devices.

Abstract: The invention relates to processes for the modification of surfaces and on processes for the measurement of adhesion forces and of different forces of interaction (friction forces, adhesion forces) by scanning probe microscopy functioning in continuous <<curvilinear>> mode, as well as to a scanning probe microscope and a device permitting the implementation of said processes.