Abstract: A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement sensor in a Z axis direction orthogonal to the XY plane and bringing the measurement sensor to face the interior wall; a W axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a ? axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.

Abstract: Disclosed is a method of anonymization of digital images through elimination of the Photo-Response Non Uniformity noise pattern which is unique to the imaging sensor and latent in all digital images taken by digital cameras or devices with imaging sensors.

Abstract: In one embodiment, an optical scanning device includes a board and a light receiving member, the positional accuracy of which is improved. When a length in a scanning direction and a length in an intersection direction of a body portion of the light receiving member are denoted by Lx0 and Ly0, respectively, and a length in the scanning direction and a length in the intersection direction of a through-hole formed in the board are denoted by Lx1 and Ly1, respectively, the lengths Lx0, Ly0, Lx1, and Ly1 satisfy the following formula: (Lx1?Lx0)>(Ly1?Ly0).

Abstract: Microscope and method for high resolution scanning microscopy of a sample, wherein the sample is illuminated; at least one point spot or line spot, which is guided in a scanning manner over the sample, is imaged into a still image; wherein the spot is imaged in a diffraction limited manner into the still image with magnification, and the still image lies still in a plane of detection; the still image is detected for different scan positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited still image, so that a diffraction pattern of the still image is detected; the diffraction pattern of the still image is evaluated for each scan position, and an image of the sample is generated that has a resolution that is increased beyond the diffraction limit, wherein a detector array is provided that has pixels and is larger than the still image; and radiation of the still image from the plane of detecti

Abstract: A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.

Abstract: Implementations of piezoelectric operated microscope focusing devices may include: a first block, having a first side and a second side, the first side coupled to a body of a microscope through four or more screws. The device may also include a second block, having a first surface, a second surface, and a side surface. The side surface may be coupled to the second side of the first block. The second surface of the second block may be configured to couple with an objective of the microscope. A piezoelectric operated microscope focusing device may also include an opening on the first surface of the second block. The opening may be configured to couple to an illuminator of a microscope. The opening may have a substantially rounded portion and an adapter orientated substantially perpendicular to the first block of the device. The adapter may include dove tail projections and mounting screws.

Abstract: An imaging apparatus comprises an image sensor that acquires image data of a physical object, an imaging position change controller that changes imaging position of the image sensor, a memory that stores position of the image sensor that has been changed by the imaging position change controller and control data for controlling imaging conditions at the time of imaging by the image sensor, and a communication circuit that carries out communication with an external terminal, wherein the communication circuit performs communication to carry out positional and imaging control in accordance with position of the image sensor and the imaging conditions that have been stored in the memory, and communicates information that has been acquired as a result of imaging by the image sensor.

Abstract: Embodiments described include a system comprising a position sensing device (PSD) and a light source. The light source is configured to, by passing one or more light beams through the PSD, cause one or more electrical currents to flow through the PSD. The system further comprises a processor, configured to (i) in response to the electrical currents, ascertain an amount of power that is delivered by the light source, and (ii) in response to the amount of power exceeding a threshold amount of power, inhibit the light source from further operation. Other embodiments are also described.

Abstract: An apparatus and method of positioning a probe of an atomic force microscope (AFM) includes using a dual probe configuration in which two probes are fabricated with a single base, yet operate independently. Feedback control is based on interaction between the reference probe and surface, giving an indication of the location of the surface, with this control being modified based on the difference in tip heights of the two probes to allow the sensing probe to be positioned relative to the sample at a range less than 10 nm.

Abstract: Example implementations relate to streak compensation. Some examples may calibrate an initial gain for data from an optical element based on a scan of a first calibration target, obtain an image of a second calibration target from the optical element using the calibrated initial gain, and detect at least one streak in the image of the second calibration target. Some examples may also record data representing the at least one detected streak and may calibrate a final gain for the optical element based on the initial gain and the data representing the at least one detected streak.

Abstract: Provided is a laser scanning microscope including a stage on which a sample is placed, an objective lens that is disposed below the stage and that focuses laser light from a light source onto the sample, a scanner that scans the laser light focused by the objective lens over the sample, a condenser lens disposed opposite the objective lens with the stage interposed therebetween, and a light blocking cover that is disposed in an optical path between the condenser lens and the stage and that blocks external light entering the objective lens or the condenser lens from above the sample via the stage.

Abstract: An optical encoder configuration comprises an illumination portion, a scale, and a photodetector configuration. The illumination portion transmits source light to a scale which outputs a periodic scale light pattern to the photodetector configuration. The photodetector configuration comprises a set of N spatial phase detectors arranged in a spatial phase sequence along a direction transverse to the measuring axis comprising two outer spatial phase detectors at a start and end of the sequence along the direction transverse to the measuring axis. At least a majority of the respective spatial phase detectors are relatively elongated along the measuring axis direction and relatively narrow along the direction perpendicular to the measuring axis direction, and comprise periodic scale light receptor areas positioned corresponding to a respective spatial phase of that spatial phase detector relative to the periodic scale light pattern, and are configured to provide a respective spatial phase detector signal.

Abstract: An optical scanning observation apparatus includes a light emission timing controller, a fiber, a driver, a photodetector, an offset processor that corrects an offset value based on an electrical signal output by the photodetector while a light emission timing controller suspends light emission of a light source, and a signal processor that generates an image signal based on the electrical signal for which the offset value was corrected by the offset processor.

Abstract: The invention relates to a method of determining the absolute direction of an object of a scene (1), with a predetermined desired performance.

Abstract: A method of modifying a lithographic apparatus comprising an illumination system for providing a radiation beam, a support structure for supporting a patterning device to impart the radiation beam with a pattern in its cross-section, a first lens for projecting the radiation beam at the patterning device with a first magnification, a substrate table for holding a substrate, and a first projection system for projecting the patterned radiation beam at a target portion of the substrate with a second magnification. The first lens and the first projection system together provide a third magnification. The method comprises reducing by a first factor the first magnification to provide a second lens for projecting the radiation beam with a fourth magnification; and increasing by the first factor the second magnification to provide a second projection system for projecting the patterned radiation beam at the target portion of the substrate with a fifth magnification.

Abstract: An image reading device includes an imaging device to capture an image of a document placed below the imaging device to generate a document image and output an image signal based on the document image, circuitry to determine a size of a fed-sheet based on information on the fed-sheet, the fed-sheet being a sheet to be formed with the document image, generate a frame image for the document image, the frame image having a size equal to the size of the fed-sheet, and synthesize the frame image with the image signal output from the imaging device to generate a synthesized image, and a display to display the synthesized image.

Abstract: An image projection apparatus includes a light emission unit for emitting laser light; a light scanning unit for projecting an image on a drawing area by reflecting the light and scanning the reflected light; a light detection unit arranged outside of the drawing area; a detection unit for detecting, according to a deviation from a desired value of a first pixel detected by the light detection unit when the light is horizontally scanned in a first direction and a deviation from a desired value of a second pixel detected by the light detection unit when the light is horizontally scanned in a second direction, each of a phase deviation of the laser light in a horizontal scanning direction and a swing angle fluctuation of the light scanning unit; and a compensation unit configured to compensate for each of the phase deviation and the swing angle fluctuation.

Abstract: An atomic force microscope is to acquire sample information by a raster scanning of a cantilever with respect to a sample. The atomic force microscope includes a raster-scanning-information generator to generate raster scanning information including timing information. The timing information includes a first timing at which a relative speed between the cantilever and sample decreases lower than a threshold, and a second timing at which the relative speed increases higher than the threshold after the first timing. The atomic force microscope also includes a raster-scanning controller to control the raster scanning, and an interaction controller to decrease the strength of an interaction between the cantilever and sample at the first timing, and increase the strength of the interaction at the second timing.

Abstract: A reading module includes a light source, an optical system for forming an image of reflection light from a document illuminated by the light source, and a sensor including a plurality of sensor chips to convert the image light formed by the optical system into an electric signal. The optical system includes a mirror array including a plurality of reflecting mirrors connected in the main scanning direction, first aperture stops each of which adjusts light amount of the image light reflected from each of the reflecting mirrors, second aperture stops each extending from the opening edge of the first aperture stop toward the mirror array, first light shielding walls each of which extends from a boundary between the sensor chips toward the first aperture stops, and second light shielding walls extending from both sides in the main scanning direction of the first aperture stop toward the sensor chips.

Abstract: An optical fiber scanner including: an optical fiber that guides illumination light; a piezoelectric element that is disposed at an intermediate position on the optical fiber in the long-axis direction and that displaces, due to a bending vibration, an emission end of the optical fiber in a direction intersecting the long axis; a wiring part that is electrically bonded to the piezoelectric element at a location between the piezoelectric element and the optical fiber; a tube-shaped electrically conductive frame that has an inner hole for accommodating the piezoelectric element and the optical fiber; and a holding section that fixes the frame and the piezoelectric element and that conducts electricity between the frame and the piezoelectric element.

Abstract: An optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.

Abstract: In a digital camera having an imaging array including a plurality of pixels arranged in rows and columns, the digital camera having a mechanical shutter, a method for performing neutral density filtering of images captured by the imaging array, the method comprising opening the mechanical shutter, operating each row in the array by resetting all of the pixel sensors in the row, starting exposure for all of the pixel sensors in the row, closing the mechanical shutter, reading pixel values from the pixels in the array after the mechanical shutter has closed at a time unrelated to a time at which any pixel-select signal was de-asserted, and wherein the interval of time between starting exposure for all of the pixel sensors in the row and closing the mechanical shutter for each row a function of a neutral density filter function applied to an image to be captured.

Abstract: The present invention provides a light field display device (300) comprising an array of light field display elements (310) populating a display surface, each display element (310) comprising: a beam generator (522) for generating an output beam of light; a radiance modulator (524) for modulating the radiance of the beam over time; a focus modulator (530) for modulating the focus of the beam over time; and a scanner (504, 506) for scanning the beam across a two-dimensional angular field.

Abstract: A light-emitting module for displaying or projecting a video signal comprises at least one mirror mounted so as to be able to oscillate and at least one light-emitting element, which is directed onto the mirror and is controllable via an input, and a computation unit that is connected to the light-emitting element and is configured to output at least one sample value of the video signal, which sample value appears at the input of said computation unit at a first time within a period of the mirror, at its output as a sample value at a second time, which is different from the first, within the same period according to a mapping function that is stored in the computation unit, wherein the computation unit has a control input that can be used to scale and/or offset the stored mapping function. The invention further comprises a display or projection apparatus having a multiplicity of such light-emitting modules, and a method for calibrating the light-emitting module and the apparatus.

Abstract: An actuator driving device includes: a linearizer configured to linearize a first signal, indicative of a displacement of a lens module, to generate a second signal; a position controller configured to generate a position control signal in response to the second signal and a control input signal indicative of a target location of the lens module; and a driver configured to drive an actuator in response to the position control signal.

Abstract: A scanning endoscope apparatus includes: a light source unit; an illumination fiber inserted inside an insertion portion of an endoscope, the illumination fiber being configured to guide illuminating light from a proximal end to a distal end; an actuator configured to drive the distal end of the optical fiber so that the illuminating light outputted from the illumination fiber is scanned on a subject; a memory configured to store correlation coefficient information on a correlation coefficient between a drive signal for driving the actuator and a displacement amount of the actuator; and a controller, and the controller detects a current of the drive signal for driving the actuator and corrects the drive signal for driving the actuator based on the correlation coefficient information and a value of the detected current so that the displacement amount of the actuator becomes a predetermined value.

Abstract: A non-destructive testing system for propellant for a rocket is provided. The system includes an insertion tube having a first end and a second end in addition to a support sleeve configured to mate with a casing of the rocket. The insertion tube includes a channel that extends from the first end to the second end of the insertion tube to receive a probe and also includes a probe tip generally disposed at the second end of the channel. The support sleeve includes an insertion tube opening configured to receive the insertion tube and allow the insertion tube to slide along the support sleeve.

Abstract: Shape primitives are used for inspection of a semiconductor wafer or other workpiece. The shape primitives can define local topological and geometric properties of a design. One or more rules are applied to the shape primitives. The rules can indicate presence of a defect or the likelihood of a defect being present. A rule execution engine can search for an occurrence of the shape primitives covered by the at least one rule.

Abstract: An object of the application is to provide a head-integrated for an atomic force microscope capable of realizing minimization of a weight and a volume and improvement of structural stability by optimizing a head structure of the atomic force microscope. Another object of the application is to provide a head-integrated atomic force microscope capable of being utilized for imaging a large-area sample by enabling high-rate head scan due to dynamic characteristics improved by mounting the integrated-head described above. Still another object of the application is to provide a composite microscope including a head-integrated atomic force microscope, capable of performing high-rate position search and imaging and performing precise observation of a three-dimensional shape up to an atomic image level in a region of interest by combining the head-integrated atomic force microscope having the improved dynamic characteristics as described above and an electron microscope or an optical microscope with each other.

Abstract: Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction.

Abstract: The present invention relates to a method and an arrangement for measuring the gloss of grains, in particular rice grains.

Abstract: A vehicle event recorder is provided that includes a camera for capturing a video as discrete image frames, and that further includes a managed loop memory and a management system for generating a virtual ‘timeline dilation’ effect. To overcome size limits in the buffer memory of the video event recorder, the maximum time extension of a video series is increased by enabling a reduction in temporal resolution in exchange for an increase in the temporal extension. Memory cells are overwritten in an ‘interleaved’ fashion to produce a reduced frame rate for the recording of certain time periods connected to an event moment. In time periods furthest from the event moment, the resulting frame rate is minimized while in time periods closest to the event moment, the resulting frame rate is maximized.

Abstract: A light scanning device includes a light source, a deflector, a reflection mirror, and a light width regulating portion. The light source includes a plurality of light-emitting elements located at intervals one another. The deflector deflects to scan by reflecting a plurality of light beams. The plurality of light beams are emitted from the respective light-emitting elements. The reflection mirror is located in an optical path between the light source and the deflector and guides the plurality of light beams emitted from the plurality of light-emitting elements to the deflector. The light width regulating portion regulates widths of the plurality of light beams reflected by the reflection mirror in a main-scanning direction. The light width regulating portion is located adjacent to a reflecting surface of the reflection mirror and includes a pair of regulating wall portions located opposed one another in the main-scanning direction.

Abstract: Methods and apparatus for implementing optical chains, e.g., camera modules, which can be used in a camera device are described as well as camera devices including multiple camera modules. In various embodiments one or more camera modules include mirror assemblies which support a movable mirror. The mirror is driven in some embodiments by a linear actuator, e.g., piezo electric actuator with the linear motion of the actuator's push rod being converted into angular mirror rotation by use of hinge, e.g., pivot on which the mirror is mounted. A return spring provide a force contrary to that provided by the actuator. A recess is included in a mounting board to allow the bottom of the mirror or a portion of the mirror mounting hinge to be placed below the surface of the mounting board to which the camera module is secured.

Abstract: Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction.

Abstract: The invention provides imaging apparatus and methods useful for obtaining a high resolution image of a sample at rapid scan rates. A rectangular detector array having a horizontal dimension that is longer than the vertical dimension can be used along with imaging optics positioned to direct a rectangular image of a portion of a sample to the rectangular detector array. A scanning device can be configured to scan the sample in a scan-axis dimension, wherein the vertical dimension for the rectangular detector array and the shorter of the two rectangular dimensions for the image are in the scan-axis dimension, and wherein the vertical dimension for the rectangular detector array is short enough to achieve confocality in a single axis.

Abstract: A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I. 1.5f?L?2.

Abstract: A microscope system for stitching element images to generate a stitched image includes an element image obtaining unit configured to obtain the element image; a user image obtaining unit configured to capture a plurality of user-specified areas being an area of a sample specified by a user to obtain a plurality of user images; a rectangle area deciding unit configured to decide a rectangle area including the plurality of user-specified areas; a candidate area deciding unit configured to decide, as a candidate area, each of a plurality of areas having a size of a field of view of the element image obtaining unit arranged in a grid-like manner in the rectangle area so as to fill the rectangle area; and an element area selecting unit configured to select an element area to obtain the element image, from the plurality of candidate areas.

Abstract: At image formation time, when the light amount setting value used in the image formation is equal to or larger than the light amount value Xm affected by the stray light, a corrected signal width Tw corresponding to the light amount setting value used in the image formation is calculated from the increase ratio ?n of the signal width tn of a detection signal acquired in a region having a light amount value smaller than the light amount value Xm affected by the stray light; and a synchronization signal is generated on the basis of a center position of the corrected signal width Tw.

Abstract: The invention relates to an optical measuring system (1) and to a method for measuring an object (9) in a three-dimensional manner. The measuring system (1) has at least one lens array (5), a first convex lens (6) arranged downstream, a second convex lens (8) which is arranged further downstream and which faces an object (9) to be measured, and additionally a means (7) which absorbs incident light or deflects incident light out of the illuminating beam path and which is arranged upstream of the second convex lens (8) or on the second convex lens (8) on a second convex lens (8) face facing the first convex lens (6) in the region of the optical axis (10).

Abstract: Various techniques are provided to identify anomalous pixels in images captured by imaging devices. In one example, an infrared image frame is received. The infrared image frame is captured by a plurality of infrared sensors based on infrared radiation passed through an optical element. A pixel of the infrared image frame is selected. A plurality of neighborhood pixels of the infrared image frame are selected. Values of the selected pixel and the neighborhood pixels are processed to determine whether the value of the selected pixel exhibits a disparity in relation to the neighborhood pixels that exceeds a maximum disparity associated with a configuration of the optical element and the infrared sensors. The selected pixel is selectively designated as an anomalous pixel based on the processing.

Abstract: The invention relates to an inspection and repair module for an internal side wall of a vertically erected structure, with the module including a carrier for supporting at least one data recording mechanism and being securable to a hoist, and for an inspection and repair module for an internal wall of a conduit with the module including propulsion means comprising a set of driven tracked wheels controllable by a controller carried by the carrier and configured to provide, within a conduit, longitudinal forward and reverse motion.

Abstract: An adaptive optics scanning system and method using a beam projection module with four or more axes of motion that can project and control the position and angle of a beam of light to or from an adaptive optics element. The adaptive optics scanning system is compact in size, overcoming the challenges of a traditional lens and mirror based pupil relay design. The adaptive optics scanning system has little to no dispersion, chromatic aberration, and off-axis aberration for improved optical performance. The system and methods for calibrating and optimizing the system are described. A modular adaptive optics unit that scans and interfaces an adaptive optics element is described.

Abstract: In one embodiment, an optical scanning device includes a board and a light receiving member, the positional accuracy of which is improved. When a length in a scanning direction and a length in an intersection direction of a body portion of the light receiving member are denoted by Lx0 and Ly0, respectively, and a length in the scanning direction and a length in the intersection direction of a through-hole formed in the board are denoted by Lx1 and Ly1, respectively, the lengths Lx0, Ly0, Lx1, and Ly1 satisfy the following formula: (Lx1?Lx0)>(Ly1?Ly0).

Abstract: To avoid unstable light radiation during switching of a phase modulation amount and stimulate desired stimulation points simultaneously, provided is a photo-stimulator which includes an AOM switching on/off of radiation of stimulation light to a specimen S; an LCOS-SLM being capable of modulating a phase of stimulation light once radiation to the specimen S has been turned on by the AOM; and a controller controlling the LCOS-SLM to switch a phase modulation amount of stimulation light and controlling the AOM to switch on/off of radiation of stimulation light, wherein the controller causes the AOM to turn off radiation of stimulation light before the LCOS-SLM starts switching a phase modulation amount, and causes the AOM to turn on radiation of stimulation light after the LCOS-SLM completes switching a phase modulation amount.

Abstract: An apparatus and method of performing photothermal chemical nanoidentification of a sample includes positioning a tip of a probe at a region of interest of the sample, with the tip-sample separation being less than about 10 nm. Then, IR electromagnetic energy having a selected frequency, ?, is directed towards the tip. Using PFT mode AFM operation, absorption of the energy at the region of interest is identified. calorimetry may also be performed with the photothermal PFT system.

Abstract: Cantilever probes are formed from a multilayer structure comprising an upper substrate, a lower substrate, an interior layer, a first separation layer, and a second separation layer, wherein the first separation layer is situated between the upper substrate and the interior layer, the second separation layer is situated between the lower substrate and the interior layer, and wherein the first and the second separation layers are differentially etchable with respect to the first and the second substrates, the interior layer. The upper substrate is a first device layer from which a probe tip is formed. The interior layer is a second device layer from which a cantilever arm is formed. The lower substrate is a handle layer from which a handle, or base portion, is formed. Patterning and etching processing of any layer is isolated from the other layers by the separation layers.

Abstract: A wafer probing system includes a probe card assembly having a plurality of individual probe structures configured make contact with a semiconductor wafer mounted on a motor driven wafer chuck, with each probe structure configured with a pressure sensing unit integrated therewith; and a controller configured to drive the probe card assembly with one or more piezoelectric driver units response to feedback from the pressure sensing units of the individual probe structures.

Abstract: Laser diode drivers include switching power supplies situated proximate one or more laser diode arrays so as to provide laser diode drive currents at frequencies of 200 kHz or more. The switching power supplies are generally buck/boost supplies that can provide well regulated outputs even when regulating remote power received from a power supply via a cables having inductances in the hundreds of nH. Multiple laser diode arrays can be driven with independently selectable powers. A drive current for a particular laser array can be controlled so as to reduce voltage drop at voltage control elements such as FETs, leading to increased efficiency, increased product life and decreased sense element failure.

Abstract: Provided is an optical scanning device that can be downsized and improve the reading rate of a laser-type image reading system. This is an optical scanning device that includes a torsion beam, and a variable focus mirror that is supported by the torsion beam. Furthermore, the variable focus mirror is supported at two symmetrical positions with respect to the axis of rotation of the torsion beam.