Abstract: Within examples, devices and methods for providing optical element field of view functionality by providing an optical element into and out of an optical receiving path are described. In one example, a device is provided that comprises an imager die having an optical receiving path, and an actuator coupled to an optical element and configured to cause a change in a position of the optical element into and out of the optical receiving path of the imager die. The actuator is configured to cause the change in the position of the optical element to change a given field of view setting of the device. In some examples, a device may be configured to include dual-setting field of view functionality.

Abstract: An optoelectronic module includes a beam transmitter, which emits at least one beam of light along a beam axis, and a receiver, which senses the light received by the module along a collection axis of the receiver, which is parallel to the beam axis within the module. Beam-combining optics direct the beam and the received light so that the beam axis is aligned with the collection axis outside the module. The beam-combining optics include multiple faces, including at least a first face configured for internal reflection and a second face comprising a beamsplitter, which is intercepted by both the beam axis and the collection axis.

Abstract: We have invented a method of sensing a surface by driving a resonator with two or more frequencies and exploiting the nonlinear phenomenon of intermodulation. When a resonator (for example an oscillating cantilever) with a sharp tip is brought close to a surface, the non-linear tip-surface interaction generates intermodulation response of the resonator. The measured frequency spectrum of intermodulation response contains much information about the material composition of the surface. When the resonator is scanned over the surface, the intermodulation spectrum can be used to make an image of the surface with enhanced contrast for different materials on the surface, or it can be used to extract the tip-surface interaction at every point on the surface.

Abstract: An integrated apertured micromirror is provided in which the micromirror is monolithically integrated with a micro-optical bench fabricated on a substrate using a lithographic and deep etching technique. The micromirror has an aperture therein and is oriented such that the micromirror is optically coupled to receive an incident beam having an optical axis in a plane of the substrate and to at least partially transmit the incident beam therethrough via the aperture.

Abstract: The present disclosure relates to a technique for, in an image scanner and an image forming apparatus equipped with the image scanner, detecting that dew condensation occurs on a transparent member for placing a document thereon.

Abstract: An instrument and method for scanning a large microscope specimen uses a light source and at least one lens to focus light from the specimen onto a detector array. The specimen holder is located on a scanning stage and the detector array is dynamically tilted about a scan direction during the scan to maintain focus across the width of the scan strip as the scan proceeds. A degree of tilt varies during the scan as is required to maintain lateral focus relative to the detector array.

Abstract: A probe needle is successively moved to a plurality of measurement points set in a measurement region on a sample so as to measure a z-displacement amount. An excitation control unit feedback-controls a piezoelectric element so that a vibration amplitude of a cantilever is constant in accordance with the detection output by a displacement detection unit. Moreover, a vertical displacement control unit feedback-controls a vertical position scan unit so as to obtain a constant distance between the probe needle and the sample according to a frequency shift by a frequency detection unit. When changes of outputs of two feedback loops at a certain measurement point are both within a predetermined range, a main control unit issues an instruction to a horizontal position control unit to rapidly move to the next measurement point. As a result, it is possible to adaptively decide such a measurement time that both of the two feedback controls at respective measurement points are established.

Abstract: Systems and methods provide for illuminating a subject using a light pipe that transmits light from a source. A method includes providing a light pipe, the light pipe defining an inner lumen through which the image sensor views the subject; providing a light source in alignment with a proximal portion of the light pipe; and using the light source, projecting a light into the light pipe and through the light pipe, the light pipe including a distal portion for providing a high-angle bright field illumination pattern on the subject with a first portion of the light and for reflecting a second portion of the light for providing a low-angle dark field illumination pattern on the subject.

Abstract: An optoelectronic sensor (10), in particular a laser scanner, for the detection of objects in a monitored zone (20) having a more than one scanning plane is provided which comprises a light transmitter (12) for the transmission of a light beam (16), a drive (28) for generating a rotational movement, a deflection unit (18, 62) rotatable about an axis of rotation (30) by the drive (28) for the periodic deflection of the light beam (16), a light receiver (26) for generating a received signal from the light beam (22) remitted or reflected from the monitored zone (20), and comprising an evaluation unit (46) which is configured for the detection of the objects on the basis of the received signal, wherein the deflection unit (18, 62) can be tilted in order to vary the scanning plane. In this connection the drive (28) tilts the deflection unit (18, 62) at the same time as the rotational movement.

Abstract: In an optical scanning device, a lower frame includes a first wall contacting an optical element, a second wall connected to a second-wall connecting portion of the first wall, a third wall connected to a third-wall connecting portion of the first wall, and a biasing member having a first end contacting the optical element and a second end supported by a scanner frame to press the optical element against the first wall. The second wall extends in a traverse direction angled with respect to a direction in which the first wall extends. The third wall extends in a direction facing away from an optical element side of the first wall on which the optical element is located. The optical element is in contact with at least one position of the first wall which position is between the second-wall connecting position and the third-wall connecting position.

Abstract: An optical scanner includes a light source for projecting a light beam, a deflector for deflecting the light beam, a reflective member for reflecting the light beam toward a target, a contact member, and a pressing member. The reflective member includes a reflective plane and a rear plane opposite the reflective plane. The contact member contacts one of the rear plane of the reflective member and a first lateral plane perpendicular to the reflective plane to position the reflective member in place. The pressing member presses the reflective member against the contact member and includes a first pressing portion to press the reflective plane of the reflective member and a second pressing portion to press a ridge of the reflective member at which the reflective plane and a second lateral plane opposite the first lateral plane and perpendicular to the reflective plane of the reflective member meet.

Abstract: There is provided an optical analysis technique enabling the detection of the condition or characteristic of a particle to be observed contained at a low concentration or number density in a sample solution. The inventive optical analysis technique uses an optical system capable of detecting light from a micro region in a solution, such as an optical system of a confocal microscope or a multiphoton microscope, to detect the light from the light-emitting particle to be observed while moving the position of the micro region in the sample solution (while scanning the inside of the sample solution with the micro region), thereby detecting individually the light-emitting particle crossing the inside of the micro region to enable the counting of the light-emitting particle(s) or the acquisition of the information on the concentration or number density of the light-emitting particle.

Abstract: A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

Abstract: An image projection device for displaying an image onto a remote surface. The image projection device employs a scanner to project image beams of visible light and tracer beams of light onto a remote surface to form a display of the image. The device also employs a light detector to sense at least the reflections of light from the tracer beam pulses incident on the remote surface. The device employs the sensed tracer beam light pulses to predict the trajectory of subsequent image beam light pulses and tracer beam light pulses that form a display of the image on the remote surface in a pseudo random pattern. The trajectory of the projected image beam light pulses can be predicted so that the image is displayed from a point of view that can be selected by, or automatically adjusted for, a viewer of the displayed image.

Abstract: A portable scanner includes a housing including a hollow upper housing and a hollow lower housing of which two ends are connected together to define a transmitting passage therebetween, a switching device rotatably mounted inside the upper housing, a first scanning device mounted on the switching device, and a document feeder for transmitting the document automatically through the transmitting passage. A first and a second scanning window are opened in and penetrating through two different sides of the upper housing respectively, wherein the second scanning window is communicated with the transmitting passage. The switching device together with the first scanning device are switched between a first scanning state that is the first scanning device faces the first scanning window for scanning the document manually, and a second scanning state that is the first scanning device faces the second scanning window for scanning the document automatically.

Abstract: A small form-factor gimbal system that provides for stabilization of payload assets in a manner that provides improved stabilization capability. Such a small form-factor gimbal system provides for precision payload asset steering functionality through integration of an inertially stabilized two-axis gimbal in combination with a beam stabilization mechanism (BSM). In a preferred embodiment, such a small form-factor gimbal system has a gimbal diameter of about 5? or less and employs a laser assembly having a Coudé path arrangement in which the laser beam passes from the azimuth subassembly to the elevation subassembly along the elevation subassembly rotational axis.

Abstract: The present disclosure provides a procedure to obtain the absorption profiles of molecular resonance with ANSOM. The method includes setting a reference field phase to ?=0.5 ? relative to the near-field field, and reference amplitude A?5|?eff|. The requirement on phase precision is found to be <0.3 ?. This method enables ANSOM performing vibrational spectroscopy at nanoscale spatial resolution.

Abstract: The technology can include a retractable rotary turret system. The system includes a base comprising two support arms. The system further includes a turret platform that is a truncated sphere having a substantially flat side and a substantially spherical side. The turret platform includes a turret support ring rotary coupled to the two support arms and a turret device isolatively coupled to the turret support ring. The turret platform is rotatable along a first dimension for deployment of the spherical side and is rotatable along the first dimension for deployment of the flat side.

Abstract: A light tracking device comprising first and second support members and at least one light receiving element supported on each support member by one or more resilient flexible beams which deform upon relative translational displacement of the first and second support members. The first and second support members are arranged such that relative translational displacement of the members generates rotational displacement of the element. One or more resilient flexible beams may comprise spiral arms extending from the first to the second support members.

Abstract: Iterating an optical phase conjugation of ultrasonically-modulated diffuse light emitted by a scattering medium includes illuminating the scattering medium with a light beam from a coherent light source, modulating the diffuse light transmitted through the scattering medium with an ultrasonic wave focused on a region of interest within the scattering medium, fixing a hologram, retro-reflectively illuminating the scattering medium using a phase-conjugated copy of the diffuse light that was ultrasonically modulated, moving the ultrasonic focus, and iterating until light is focused on the final target.

Abstract: The invention provides a spatially-selective reflective structure for the detection of submillimeter electromagnetic waves and systems and methods incorporating spatially-selective reflective structures. One aspect of the invention provides a spatially-selective reflective structure including a partially-conducting slab and a modulating reflector disk adjacent to the partially-conducting slab. The modulating reflector disk includes a plurality of modulations. Another aspect of the invention provides a submillimeter imaging device including submillimeter wave optics, a spatially-selective reflective structure located in the focal plane of the submillimeter wave optics, a submillimeter wave receiver positioned to capture waves reflected from the spatially-selective reflective structure, and a motor configured to rotate the spatially-selective reflective structure.

Abstract: The invention provides for a device comprising an apparatus comprising (a) a transmission grating capable of diffracting a photon beam into a diffracted photon output, and (b) an image detector capable of detecting the diffracted photon output. The device is useful for measuring the spatial profile and diffraction pattern of a photon beam, such as a vacuum ultraviolet (VUV) beam.

Abstract: A light tracking device comprising first and second support members and at least one light receiving element supported on each support member by one or more resilient flexible beams which deform upon relative translational displacement of the first and second support members. The first and second support members are arranged such that relative translational displacement of the members generates rotational displacement of the element. One or more resilient flexible beams may comprise spiral arms extending from the first to the second support members.

Abstract: An apparatus adapted for confocal imaging of a non-flat specimen comprising a coherent light source for producing a light beam, imaging optics adapted to focus the light beam into at least one spot on a surface of a specimen, and a detector adapted to receive and detect light reflected from the specimen surface. The imaging optics comprise at least one optical component located so that the light reflected from the specimen surface passes therethrough on its way to the detector. The optical component is movable so as to move the at least one spot, within a range of movement, to a number of distinct locations in a plane perpendicular to the apparatus' optical axis, within the detector's integration time.

Abstract: Apparatus for location-detection of an object within a region comprising a reflective element mountable on the object, a scanning light source adapted to issue a beam of light in a scanning pattern illuminating a point that moves over the region, a detector for light reflected from the reflective element and a control unit adapted to report the position of an object based on the point in the scanning pattern at which the detector detects light returned from the reflective element relative to at least one point in the scanning pattern at which the detector detects light returned from a reflective object.

Abstract: A space-saving scanner assembly and method are disclosed. The scanner assembly can be manufactured with optical scanning components typical of flatbed scanners. The scanner may be enclosed within a housing a substantially vertical source-contact surface with a channel and a flap coupled to the source-contact surface. The flap having a source-backing surface substantially parallel to the source-contact surface of the housing and arranged such that the source-contact surface, the source-backing surface, and the channel form an opening for receiving an edge of a source document to be scanned. The housing and the flap are configured with a number of features, which permit an operator to easily place a source over a platen forming a portion of the source-contact surface. A method for operating a space-saving scanner is also presented.

Abstract: A scanning microscope is provided with a scan unit that scans a sample, the scanning microscope including: a transmissive VPH grating for dispersing light from the sample; and a photodetector for detecting the light diffracted by the VPH grating.

Abstract: During one cycle of reciprocating operation of a MEMS mirror, a light receiving sensor detects a falling time at which a laser beam reflected by an upstream-of-sensor mirror and scanned in one direction passes an edge of a regulation portion, and a rising time at which the laser beam scanned in the other opposed direction passes the edge of the regulation portion. A controller executes an arithmetic operation on the basis of the two times detected by the light receiving sensor and controls the operation of the MEMS mirror, which is performed by the driver, such that the detected two times are held at respective setting times.

Abstract: A novel sensor unit actuating mechanism that can cause a sensor unit to leave or enter a frame smoothly even when the thickness of the frame is reduced and that has a mechanism for coping with a prank by a child or the like, such as a push-back of the sensor unit, The sensor unit actuating mechanism includes a frame, a sensor unit including an optical sensor, a spring member configured to expand or contract in a Y direction, actuators configured to contract against the resilience of the spring member when energized, and a guide member for moving the sensor unit linearly in an X direction. When the actuator is energized, the sensor unit, is linearly moved from inside the frame to the measurement position; when the actuator is energized, the sensor unit is linearly moved from the measurement position to inside the frame and stored therein.

Abstract: A photolithographic track system and method for semiconductor wafer manufacture having a plurality of stations for receiving a wafer for sequential processing, including a first group of stations for performing at least a part of a photolithography process. A metrology station is provided in a position of the track system after the first group of stations, for determining whether the processed wafer is within tolerance for at least one critical dimension. If not within tolerance, the wafer is moved by the track system to a stripping station for removal of at least one layer and a return to the beginning of the first group of stations for repeating the performance of a photolithography process. Parameters may also be adjusted for purposes of the repeated performance of the process. If within tolerance, the wafer may be moved for further processing, for example, baking or off loading.

Abstract: Methods correcting wafer position error are provided. The methods involve measuring wafer position error on a robot during transfer to an intermediate station. This measurement data is then used by a second robot to perform wafer pick moves from the intermediate station with corrections to center the wafer. Wafer position correction may be performed at only one location during the transfer process. Also provided are systems and apparatuses for transferring wafers using an intermediate station.

Abstract: In the present invention, a specimen is made to flow on a metal film on a prism, and excitation light (?) is emitted in a predetermined direction. By changing the position of a reflective member that reflects the excitation light (?), and adjusting the orientation of a reflective surface of the reflective member, the incident angle (?) is changed while maintaining a state in which the excitation light (?) that enters the prism is reflected at a specific position on the metal film. The intensity of light to be generated on the metal film is measured, and the reflective member is positioned to match the position of the reflective member and the orientation of the reflective surface when a maximum amount of light is measured.

Abstract: An image reading apparatus capable of reading documents includes a reading unit including a light emitting element, a mechanism configured to move the reading unit, and a control unit configured to control the reading unit and the mechanism both to carry out reading by turning on the light emitting element and moving the reading unit and to temporarily stop moving the reading unit upon occurrence of a predetermined factor. The control unit sets a first current value which is caused to flow through the light emitting element when reading is carried out and sets a second current value which is less than the first current value and which is caused to flow through the light emitting element when the reading unit is temporarily stopped.

Abstract: An apparatus adapted for confocal imaging of a non-flat specimen comprising a coherent light source for producing a light beam, imaging optics adapted to focus the light beam into at least one spot on a surface of a specimen, and a detector adapted to receive and detect light reflected from the specimen surface. The imaging optics comprise at least one optical component located so that the light reflected from the specimen surface passes therethrough on its way to the detector. The optical component is movable so as to move the at least one spot, within a range of movement, to a number of distinct locations in a plane perpendicular to the apparatus' optical axis, within the detector's integration time.

Abstract: A gantry positioning device for connecting a gantry and a supporter together of an imaging system includes: a linear translation positioner for translating the gantry vertically with respect to the supporter; a first rotation positioner for rotating the gantry about a first axis which passes horizontally an iso-center of the gantry with respect to the supporter; and a second rotation positioner for rotating the gantry about a second axis which passes vertically the iso-center of the gantry with respect to the supporter. The first rotation positioner includes: a tilt guide which is formed along an arc having a center on the first axis; and a tilt block which is connected to the tilt guide so as to be rotatable about the first axis.

Abstract: The disclosure provides an apparatus for reducing speckle in a projection visual display (PVD) system, a method of reducing visible speckle in a PVD system and a PVD system incorporating the method or apparatus. In one embodiment, the apparatus includes a diffuser interposable in an optical path of a PVD system and a diffuser actuator having a single drive axis configured to cause the diffuser to travel in a Lissajous curve at least partially transverse to the optical path.

Abstract: A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

Abstract: A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

Abstract: Provided is a scanning near-field optical microscope capable of obtaining, in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscope 100 according to the present invention includes: a light irradiating part 102 for emitting illumination light toward a sample 107; a light receiving part 112 for receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating part 102 and an incident side of the light receiving part 112; and an ultrahigh-wavenumber transmitting medium 108 for transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.

Abstract: A system for investigating a plurality of samples having varying positions or orientations moving with respect to the system, the system including an emitter of terahertz radiation for irradiating a sample provided in a sample space; a detector of terahertz radiation configured to detect radiation reflected from said sample space; and determining means to determine if radiation reflected from said sample space is from a sample with a predetermined orientation in the sample space.

Abstract: A scanning probe microscope compensates for relative drift between its upper structure that includes a probe and a scanner that scans the probe in a straight line and a lower structure that includes a sample stage and a scanner that scans the sample stage in a plane. A light beam from the upper structure is initially aligned with a center of a position sensitive photo detector (PSPD) disposed on the lower structure at a predetermined position of the sample stage and any subsequent misalignments of the light beam with the center of the PSPD at the predetermined position of the sample stage are determined to be caused by drift and compensated by the scanning probe microscope.

Abstract: A multi-beam exposure scanning method includes: simultaneously emitting a plurality of beams with an interval between scanning lines toward a recording medium; and performing engraving on a surface of the recording medium by performing exposure scanning a plurality of times with a same scanning line, the method further includes: repeatedly performing interlaced exposure using a beam group with an interval between adjacent beams N times (N is an integer equal to 2 or more) larger than the interval between the scanning lines N×m times (m is an integer equal to 2 or more) on a first area surrounding a flat-shaped target area to be left on the surface, to expose each of the scanning lines m times; and performing non-interlaced exposure using a beam group with an interval between adjacent beams equal to the interval between the scanning lines on a second area, which is outside the first area.

Abstract: An optical assembly is provided wherein the optical assembly includes a first optical element configured to receive light and alter a transmission path of the light through the first optical element in a first direction and a second direction, and a second optical element in optical communication with the first optical element, the second optical element configured to receive the light from the first optical element, and alter a transmission path of the light through the second optical element in the first and second directions, wherein the light is passed through the second optical element, such that a sensor receives light from a field of view that is approximately 30 degrees to 60 degrees offset from a field of view of the sensor.

Abstract: A laser projector can generate a pulse signal capable of being generated according to the resolution of the clock signal, the pulse signal having a basic period and a basic pulse width each infinitely approximated to the characteristics of the resonance frequency. Moreover, because the laser projector can generate a pulse signal capable of correcting the errors led to be included in the approximated pulse signal, the laser projector can drive the scanning section with a horizontal vibration width corresponding to the resonance frequency, and can suitably display a projected image on a projection plane.

Abstract: An optical image capturing lens assembly includes four non-cemented lens elements, in order from an object side to an image side: a first lens element, a second lens element, a third lens element and a fourth lens element. The first lens element with positive refractive power has a convex object-side surface. The second lens element with negative refractive power has a concave object-side surface and a convex image-side surface. The third lens element with positive refractive power has a convex object-side surface and a convex image-side surface, and is made of plastic material, wherein the surfaces of the third lens element are aspheric. The fourth lens element with negative refractive power has a concave object-side surface and a convex image-side surface, and is made of plastic material, wherein the surfaces of the fourth lens element are aspheric.

Abstract: To date, the probes of scanning near-field optical microscopes were aimed at creating electromagnetic field characteristics that are maximally localized near a nano-sized point (miniature apertures and tips, fluorescent nano-particles and molecules, dielectric and metal corners). Alternatively, the probe field, which is distributed within a larger area, can ensure the super-resolution as well. For this purpose, the field spectrum should be enriched with high spatial frequencies corresponding to small sample dimensions. As examples of such near-field probes, we propose and theoretically study the models of optical fibers with end-faces containing sharp linear edges and randomly distributed nanoparticles. These probes are more robust than the conventional probes and their fabrication is not concerned with nanoscale precision. The probes enable waveguiding of light to and from the sample with marginal losses distributing and utilizing the incident light more completely.

Abstract: Apparatus for location-detection of an object within a region comprising a reflective element mountable on the object, a scanning light source adapted to issue a beam of light in a scanning pattern illuminating a point that moves over the region, a detector for light reflected from the reflective element and a control unit adapted to report the position of an object based on the point in the scanning pattern at which the detector detects light returned from the reflective element relative to at least one point in the scanning pattern at which the detector detects light returned from a reflective object.

Abstract: The optical deflector includes a deflector, a vibration detector, a driving signal generator, a modulation timing signal generator, and a deflection detector. The deflector has a vibrational system having a movable body with a light deflecting member, and deflects light from a light source by the movable body. The vibration detector detects the vibration condition of the vibrational system of the deflector. The driving signal generator generates a driving signal for driving the vibrational system of the deflector. The modulation timing signal generator generates a modulation timing signal as the reference time for regulating the amount of light from the light source. The deflection detector detects the deflection condition of light deflected by the deflector.

Abstract: Systems and methods provide for illuminating a subject using a light pipe that transmits light from a source. A method includes providing a light pipe, the light pipe defining an inner lumen through which the image sensor views the subject; providing a light source in alignment with a proximal portion of the light pipe; and using the light source, projecting a light into the light pipe and through the light pipe, the light pipe including a distal portion for providing a high-angle bright field illumination pattern on the subject with a first portion of the light and for reflecting a second portion of the light for providing a low-angle dark field illumination pattern on the subject.

Abstract: A fiber scanning system is provided comprising a housing (102) with a fiber (13), the fiber (13) comprising a fixed part and a free end, the fixed part being attached to a bottom of the housing (102) and the fiber (13) extending parallel to the wall of the housing (102). At least one electrical coil (12) is attached to the wall at a position in between the fixed part and the free end of the fiber (13), a winding of the electrical coil (12) being in a plane parallel to the fiber (13). A magnet (11) is attached to the fiber (13), such that the electrical coil (12) may induce a force on the magnet (11). The magnet (11) is attached to the fiber (13) at a position just before or after the electrical coil (12), a width of the magnet (11) being such that the magnet (11) extends over the electrical coil (12).