Abstract: A biomarker generator system for producing approximately one (1) unit dose of a biomarker. The biomarker generator system includes a small, low-power particle accelerator (“micro-accelerator”) and a radiochemical synthesis subsystem having at least one microreactor and/or microfluidic chip. The micro-accelerator is provided for producing approximately one (1) unit dose of a radioactive substance, such as a substance that emits positrons. The radiochemical synthesis subsystem is provided for receiving the radioactive substance, for receiving at least one reagent, and for synthesizing the approximately one (1) unit dose of a biomarker.

Abstract: The present invention relates to the method and equipment for inspecting nuclear experimental locales, and particularly relates to the method and system for separating and measuring 37Ar quickly. The method of the invention comprises the steps of sampling, eliminating impurities, separating, purifying, measuring the sum of Ar, collecting Ar, measuring the activity of 37Ar, etc. The control unit in the system of the invention connects respectively to a sampling unit, a separating-purifying unit, and a radioactivity measuring unit which are connected in turn, and a computer and the software of the control unit are in charge of the automatic operation, measurement and data-collection of the whole system. The method and system for quickly separating and measuring 37Ar of the patent can meet the requirements of locales inspection for Comprehensive Test Ban Treaty (CTBT), the sensitivity of measuring 37Ar is high, so do the production and purity of Ar.

Abstract: Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an alpha particle emitter and detector supported by a semiconductor substrate. Some embodiments include an apparatus for obtaining backscatter data from a sample utilizing an alpha particle emission and detection system supported by a semiconductor substrate. Some embodiments include methods of backscatter analysis utilizing a semiconductor substrate containing an alpha particle emitter and an alpha particle sensor.

Abstract: A method and sample for radiation microscopy include a sample source that includes an area of interest, an outer side of a sample formed in the sample source adjacent to the area of interest, an inner side of the sample formed inside the sample source wherein at least a portion of the area of interest is included between the inner side of the sample and the outer side, and a particle beam channel formed inside the sample source for conducting a particle beam to or from the inner side of the sample.

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations in bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer.

Abstract: A portal monitoring system has a cosmic ray charged particle tracker with a plurality of drift cells. The drift cells, which can be for example aluminum drift tubes, can be arranged at least above and below a volume to be scanned to thereby track incoming and outgoing charged particles, such as cosmic ray muons, whilst also detecting gamma rays. The system can selectively detect devices or materials, such as iron, lead, gold and/or tungsten, occupying the volume from multiple scattering of the charged particles passing through the volume and can also detect any radioactive sources occupying the volume from gamma rays emitted therefrom. If necessary, the drift tubes can be sealed to eliminate the need for a gas handling system. The system can be employed to inspect occupied vehicles at border crossings for nuclear threat objects.

Abstract: One embodiment relates to a charged-particle beam apparatus. The apparatus includes at least a source for generating the charged-particle beam, a first deflector, and a second deflector. The first deflector is configured to scan the charged-particle beam in a first dimension. The second deflector is configured to deflect the scanned beam such that the scanned beam impinges telecentrically (perpendicularly) upon a surface of a target substrate. Other embodiments are also disclosed.

Abstract: The present invention discloses an in vitro method to identify a contaminant gas in a specimen comprising a mixture of gases as a function of the decay rate of at least one species of positronium. The positronium is obtained by directing the positrons from a positron source in to a vessel that contains a specimen containing the mixture of gases comprising a contaminant gas to be identified.

Abstract: Method and apparatus for characterizing a recess located on a surface of a substrate are provided. One embodiment of the invention provides a method for characterizing a recess located on a surface of a substrate. In a first step, a measurement tip is positioned directly above the recess. Subsequently, an electrically conductive path is provided between the measurement tip and the bottom of the recess by ionizing a medium located in the recess. A voltage is applied between the measurement tip and the substrate to measure a current flowing between the measurement tip and the bottom of the recess. The recess is characterized on the basis of the magnitude of the measured current. Another embodiment of the invention provides an apparatus for performing the method for characterizing a recess.

Abstract: A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for either simultaneous or immediately consecutive measurements within a single instrument. The filter material can have an antistatic electricity characteristic and can be impregnated with reference material to enable calibration of the composition analyzing unit.

Abstract: The purpose of the present invention is to inspect the position, number, and size of fine defects in a variety of solid state materials, including a semiconductor device and metallic materials, with a high spatial resolution of nanometer order. The positron irradiation function is installed in the converged electron beam apparatus. The defect location information is obtained from the converged electron beam location information, and the number and size of defects are obtained from the detected information of ?-rays created by pair annihilation of electrons and positrons, and this two-dimensional distribution information is displayed in the monitor. Information on ultra-fine defects in a crystal can be provided with high-speed and high-resolution, and nondestructively in the case of a semiconductor wafer.

Abstract: Beta gauge composition correction is performed using signals from a plurality of detectors that are positioned so that the ratio of radiation received by the detectors depends on the composition of material through which the radiation passes before reaching the detectors. Radiation is measured at the detectors and the differences between radiation received by the detectors is used to compensate the beta gauge to correct for composition variations. An array of detectors is divided into inner detectors generally aligned with the central portion of a beta radiation beam and at least one set of outer detectors surrounding, at least in part, the inner detectors. Measurements are made including all the detectors, the inner detectors and the at least one set of outer detectors with the difference between the measurements made by the inner detectors and the outer detectors being used to compensate the total measurement made by all the detectors.

Abstract: In an embodiment of the present invention, the same provides an edge sensor capable of locating an edge under a substrate. The edge sensor comprises a radiation source, a scanner, a microprocessor, and an indicator. The radiation source emits photons that are scattered back to the direction of the radiation source. The scanner measures the count rate or the amount of radiation back scattered by the substrate along a line on the substrate. After a series of count rates have been measured at various points along a line on the substrate that data is received and the microprocessor calculates a response function centroid which is the position of the edge. The indicator indicates the edge position.

Abstract: A positron source is applicable particularly to solid state physics, including a thin target receiving a continuous or practically continuous 10 MeV electron beam in grazing incidence and generating positrons upon interaction with this beam.

Abstract: A material defect evaluation apparatus using positron for evaluating the degree of deterioration of a specimen by measuring a positron lifetime after irradiating positron to the specimen, includes: a positron source, a positron detector and a &ggr;-ray detector, wherein, the positron source and the positron detector are arranged in a container through which a light is not transmitted, and, a positron transmitting window, through which position emanating from the positron source and transmitting through the positron detector is transmitted outward, is arranged to the container.

Abstract: According to the present invention, there are newly provided in a scanning electron microscope with an in-lens system a first low-magnification mode that sets the current of the object lens to be zero or in a weak excitation state, and a second low-magnification mode that sets the current of the object lens to be a value that changes in proportion to the square root of the accelerating voltage. The scanning electron microscope has a configuration wherein normal sample image (secondary electron image) observation is performed in the first low-magnification mode, and it switches the first low-magnification mode to the second low-magnification mode when X-ray analysis is performed. As a result, both sample image (secondary electron image) observation and X-ray analysis can be performed in low-magnification mode.

Abstract: In an embodiment of the present invention, the same provides an edge sensor capable of locating an edge under a substrate. The edge sensor comprises a radiation source, a scanner, a microprocessor, and an indicator. The radiation source emits photons that are scattered back to the direction of the radiation source. The scanner measures the count rate or the amount of radiation back scattered by the substrate along a line on the substrate. After a series of count rates have been measured at various points along a line on the substrate that data is received and the microprocessor calculates a response function centroid which is the position of the edge. The indicator indicates the edge position.

Abstract: A material defect evaluation apparatus using positron for evaluating the degree of deterioration of a specimen by measuring a positron lifetime after irradiating positron to the specimen, includes: a positron source, a positron detector and a &ggr;-ray detector, wherein, the positron source and the positron detector are arranged in a container through which a light is not transmitted, and, a positron transmitting window, through which position emanating from the positron source and transmitting through the positron detector is transmitted outward, is arranged to the container.

Abstract: The invention relates to wafer inspection by means of a scanning electron microscope (SEM) column in which the secondary electron detector 22, 24 is positioned centrally above the objective lens of the column. Secondary electrons that leave the central part of the specimen in a direction substantially perpendicular to its surface are inevitably collected in the central part of the detector surface where the bore 36 for the primary beam 6 is situated. Consequently, such electrons do not contribute to the detector signal. In order to avoid such a detrimental loss of signal contribution, it is proposed to provide a central electrode 35 in the central bore 36 such that secondary electrons that approach the bore are driven aside towards the electron-sensitive detector region 48.

Abstract: A method for inspecting features on a reticle is provided. The method includes providing a layout design of a test feature and transferring the layout design of the test feature onto the reticle. After the test feature is transferred onto the reticle, an image of the transferred layout design is captured to determine whether or not the transfer is acceptable. This determination is made by comparing the captured image of the transferred layout design against the layout design of the test feature. The comparison ascertains deviations between the captured image and the layout design and determines if the deviations fall within a user specified range.

Abstract: A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud is to be compressed producing a thin positron beam which is extracted from the cloud and is smaller in cross-sectional area than the cloud. The positron beam is to be transmitted to a focusing apparatus which transmits the positron beam onto a solid target. The vacuum chamber is to include a cooling gas to be supplied into the vacuum chamber and a compressing device for the positron cloud is to include a rotating electric field. A method for compressing the positron cloud to produce a thin positron beam, which is to be transmitted to a solid for the purpose of analyzing properties of the solid, comprises the steps of supplying a source of positrons within a vacuum environment, forming and containing the positron cloud within a Penning Trap, producing a positron beam, and focusing of that positron beam onto a solid.

Abstract: A radiation source assembly and a connector press used in producing such assemblies. In the radiation source assembly, each of the cap connector and the female connector is provided with internal round threads on its pigtail fitting hole, thus engaging with the large-diameter coil of the pigtail at the internal round threads through a thread engagement prior to a compression process of the press. The assembly also allows a person to know whether both ends of the pigtail fully reach desired points within the two connectors, thus securing a precise compressing target portion during a compression process of the press. The inserted lengths of the pigtail relative to the two connectors are maximize accomplishing a desired linearity of the assembly. In the assembly, a target biasing spring is provided on the capsule lid and allows the disc targets within the source capsule to effectively maintain a desired condition as point sources regardless of the number of targets.

Abstract: A particle beam apparatus for tilted observation of a specimen is capable of producing magnification images of the specimen under tilted observation with high accuracy. The particle beam apparatus includes a source for generating a particle beam, deflection means for tilting the particle beam and a lens for focussing the tilted particle beam onto the specimen. Furthermore, multipole correction means are provided for correcting the lens aberrations occurring due to off-axial intersection of the lens by the tilted particle beam. The lens is an electrostatic, magnetic or combined electrostatic-magnetic objective lens.

Abstract: The invention provides a method and apparatus for facilitating calibration of a nuclear gauge by automating the movement of a source rod between a plurality of source rod positions. The apparatus can include a linearly moveable member, such as a threaded rod, a motorized linear actuator, such as a stepper motor, and a source rod grip attached to the linearly moveable member for affixing the source rod to the member.

Abstract: A holography electron microscope permitting electron holography without limitations on the magnification. An electron biprism is mounted between a system of intermediate lenses and a system of projector lenses. The objective lens and the system of intermediate lenses form a crossover at a given position between intermediate lenses and the electron biprism and, at the same time, focus a magnified image at a certain position between the electron biprism and projector lenses. Since the system of intermediate lenses is made up of three or more stages of lenses, it forms a crossover at a given position and focuses a magnified image at a certain position.

Abstract: According to the present invention, there are newly provided in a scanning electron microscope with an in-lens system a first low-magnification mode that sets the current of the object lens to be zero or in a weak excitation state, and a second low-magnification mode that sets the current of the object lens to be a value that changes in proportion to the square root of the accelerating voltage. The scanning electron microscope has a configuration wherein normal sample image (secondary electron image) observation is performed in the first low-magnification mode, and it switches the first low-magnification mode to the second low-magnification mode when X-ray analysis is performed. As a result, both sample image (secondary electron image) observation and X-ray analysis can be performed in low-magnification mode.

Abstract: An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the ion-induced photons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted photons are collected in the lens system of a conventional optical microscope, and projected on the image plane of a high resolution single photon position sensitive detector. Position signals from this photon detector are then correlated in time with electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these photons initially.

Abstract: A method and an apparatus for inspecting or measuring a sample based on charged-particle beam are provided to relieve charge-up of the sample, so that high-quality electron image is obtained. A UV light irradiation optical system is controlled by an irradiation controller, scanning of the charged-particle beam is controlled by a scanning controller, and the irradiation controller and the scanning controller are controlled by a general controller. They are mutually synchronized, and a signal from an electron detector is imaged by an image slicing circuit and an image processing circuit.

Abstract: A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud is to be compressed producing a thin positron beam which is extracted from the cloud and is smaller in cross-sectional area than the cloud. The positron beam is to be transmitted to a focusing apparatus which transmits the positron beam onto a solid target. The vacuum chamber is to include a cooling gas to be supplied into the vacuum chamber and a compressing device for the positron cloud is to include a rotating electric field. A method for compressing the positron cloud to produce a thin positron beam, which is to be transmitted to a solid for the purpose of analyzing properties of the solid, comprises the steps of supplying a source of positrons within a vacuum environment, forming and containing the positron cloud within a Penning Trap, producing a positron beam, and focusing of that positron beam onto a solid.

Abstract: The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector located at a second position within said housing and adjacent to said base of said housing, a vertically moveable source rod extending into said cavity of said gauge housing, a radiation source operatively positioned within a distal end of said source rod, at least one bearing operatively positioned to guide said source rod within said cavity, and means for vertically extending and retracting said source rod to a plurality of predetermined source rod positions so as to change the spatial relationship between said radiation source and said first and second radiation detectors. The source rod has a maximum radial movement of less than about 0.003 inch at each predetermined position.

Abstract: There is disclosed an OMEGA energy filter comprising three magnetic field regions and producing small aberrations. The electron beam trajectory from the entrance window plane to the slit plane is continuously deflected into an omega-shaped form. Three magnetic field regions M1, M23, and M4 having deflection angles &PHgr;, 2&PHgr;, and &PHgr;, respectively, are arranged in turn from the incident side. The deflection angle &PHgr; is set such that 102°_. . . &PHgr;_. . . 115°. The radius of curvature R3 of the beam in the magnetic field region having the deflection angle 2&PHgr; is set less than the radius of curvature R4 of the beam in the magnetic field regions having the deflection angle &PHgr;.

Abstract: An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the secondary electrons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted secondary electrons are collected in a strong electric field perpendicular to the sample surface and (optionally) projected and refocused by the electron lenses found in a photon emission electron microscope, amplified by microchannel plates and then their exact position is sensed by a very sensitive X Y position detector. Position signals from this secondary electron detector are then correlated in time with nuclear, atomic or electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these secondary electrons in the fit place.

Abstract: The invention relates to a method for defining element contents contained by solid, liquid or slurry-like materials by means of an X-ray fluorescence method in an online analysis. According to the invention a combination of both the energy dispersive (3) and wave dispersive (2) X-ray fluorescence methods are applied in the method, so that by means of the energy dispersive method (3), there are measured such diffraction lines that are located essentially far from each other, whereas by means of the wave dispersive method (2), there are measured such diffraction lines that are located essentially near to each other as well as such diffraction lines where a high resolution and resulting accuracy and sensitivity are required.

Abstract: A method and apparatus for measuring thickness of a fiber material during manufacture of the fiber material, especially paper in a paper-making machine, comprises a gamma radiation transceiver in communication with a processing/control system. The gamma radiation transceiver is placed at a points along the production path of the web of paper being produced and liberates gamma radiation towards the fiber material. Backscatter of gamma radiation is received by the gamma transceiver also which generates corresponding signals that are received by the processing/control system. The processing/control system processes the signals to determine a thickness profile along a cross-section of the web. The processing/control system may be in communication with or considered a subset of a main processing/control system for the paper-making machine. A gamma radiation shield may be used with the gamma transceiver and is mounted on the side of the paper web opposite the gamma transceiver.

Abstract: A method of calibrating and using a radiation detector to quantify the radioactivity in or on a wide variety of objects, over a wide range of object sizes (points to hundreds of cubic meters), over a wide range of energies (e.g., 50-7000 keV photons), where the object can be at any location in a large sphere (e.g. 100 meter diameter) surrounding the detector, and where there can be various absorbers between the radioactive object and the detector (e.g., container, walls, air collimators), in which calibrations have been implemented and expanded following the method of Atrashkevich and Kolotov but without the use of radioactive sources and in minutes, and with no generation of radioactive waste. Such calibration technique can be applied to the quantiative analysis of a spectrum of radioactivity taken from a wide variety of in-situ or laboratory samples.

Abstract: A device for testing flat materials during production of material webs has a radiation source from which radiation passes through the material under investigation, residual radiation on another side of the material being detected by a gas-filled ionization detector. The detector arrangement has a plurality of interconnected measurement chambers provided with collector electrodes and arranged inside a common housing. The measurement chambers can together be evacuated and filled with an ionizable gas. Each of the measurement chambers is allocated its own radiation inlet window. The radiation source is allocated to the measurement chamber and has a linear radiation distribution.

Abstract: A radioisotope proximity sensor is provided for detecting proximity or distance to a nearby object containing a small radiation source complementary to the sensor. The output of the sensor is amplified or compared to determine the distance or proximity. The radioisotope proximity sensor is unaffected by magnetic fields over the short sensing distances. It is also unaffected by environmental contamination when the appropriate radiosource/detector combination is used. The radioisotope proximity sensor is easily shielded from electrostatic or electromagnetic noise, and the radiation source can be small, easily incorporated, and requires no external power or connections to affect mechanical reliability or impede armature movement.

Abstract: A method and apparatus for detecting beta particles in the presence of high gamma background using secondary electron emission (SEE) as the primary beta particle detector. Diamond-like thin films having coefficients for SEE as high as 50 are preferably used in a small hand-held probe whereby radiolabeled malignancies as small as 3 mm in diameter can be detected. An electron multiplier amplifies the secondary electron signal for generation of an audible signal or a display indicative of the level of beta radiation passing through the air-vacuum interface of the hand-held probe.

Abstract: A positron source with high intensity and low energy bandwidth and small spatial dimensions, has a positron emitter of high specific activity and, following the positron emitter, a reflection moderator with a hole. The hole diameter on the emitter side of the reflection moderator is smaller than 0.4 mm, preferably below 0.1 mm. Because of the small hole diameter and the small energy spread, the phase space of the positrons coming from the positron source corresponds to the phase space of the electrons emitted by a conventional thermionic cathode. The positron source can therefore be used in a conventional scanning electron microscope, which can be selectively changed over between positron operation and electron operation. Two adjusting units and are provided for adjustment of the positron source.

Abstract: An improved method is disclosed which investigates the surface layer of a material. A pulsed slow positron beam having a pulse duration in a nanosecond range is focused and irradiated on the reverse surface of a thin-film-like sample, and a probe is brought into contact with the front surface of the sample. Surface positrons are swarmed in a gap space at the contact point so as to form positronium molecules Ps.sub.n (n is an integer equal to or greater than 2). Coherent annihilation gamma-rays generated due to annihilation of the positronium molecules Ps.sub.n are detected so as to discriminate the positronium molecules Ps.sub.n from positrons and positroniums Ps, thereby measuring on an atomic scale the physical properties of the surface layer of the material with a response time shorter than 1 nanosecond.

Abstract: A near field electromagnetic probe converts an incident energy beam into an interrogating beam which exhibits, in the near field vicinity of the probe, a transverse dimension that is small in relation to the wavelength of the incident energy beam. The probe comprises an energy source for providing the incident energy beam with a wavelength .lambda.. An antenna is positioned in the path of the incident energy beam and comprises at least a first conductive region and a second conductive region, both of which have output ends that are electrically separated by a gap whose lateral dimension is substantially less than .lambda.. The electromagnetic system which produces the incident energy should preferably have its numerical aperture matched to the far-field beam pattern of the antenna. Further, the incident beam should have a direction of polarization which matches the preferred polarization of the antenna.

Abstract: The invention intends to measure true distribution of a radioactive nuclide in respective parts of a subject. A density of each part of a subject sample is measured by measuring the intensity of ionizing radiation for density measurement from a radioactive nuclide for density measurement, which emits the ionizing radiation to each part of the subject sample in the same amount, through the subject sample interposed midway, the intensity of ionizing radiation emitted from another radioactive nuclide existing in each part of the subject sample is measured, and the amount of another radioactive nuclide in each part of the subject sample is determined by compensating the measured intensity of the ionizing radiation from another radioactive nuclide based on the self-absorptivity of each part of the subject sample corresponding to the density thereof.

Abstract: A method and apparatus are provided for sensing basis weight of a rod of material, such as tobacco, by two basis weight sensing operations which are then combined. A first sensing operation having high accuracy but slow response time is combined with a second sensing operation having low accuracy but fast response time to result in a high accuracy and fast response time output signal. The first sensing operation is performed using a low radiation beta gauge which does not require licensing or safety precautions required by currently used beta gauges. The second sensing operation is performed using a dielectric sensor. The output signals from the first and second sensing operations are time averaged and combined such that the fast response output signals from the second sensing operation are calibrated or biased using the output signals from the first sensing operation to result in a high accuracy and fast response time measurement of the basis weight for a rod of material, such as tobacco.

Abstract: Two parallel cigarette rods are guided in a twin cigarette rod making machine between two stationary ionization chambers of a density measuring apparatus. Two radiation sources are mounted on a carrier between the two rods for movement with the carrier between a first position in which the radiation issuing from the sources penetrates through the adjacent rods and into the respective ionization chambers, and a second position in which the radiation enters the respective chambers by way of passages in the guides for the respective rods.

Abstract: An apparatus for measuring the basis weight of a web-shaped material under test comprises a radioactive .beta. radiation source on one side of the material under test and a .beta. radiation detector on the other side of the material under test. For focusing the electrons emitted by the radioactive .beta. radiation source, a magnetic field is provided, such that for the same source activity, significantly more .beta. particle intensity is available on the material under test for measuring the transmission.

Abstract: Positron annihilation radiation lineshapes from two-dimensional angular correlation and Doppler broadened spectrum measurements are used to monitor specific surface acidity (proton concentration per unit surface area) of catalytic materials with large internal surface areas. Annihilation gamma lineshape parameter increases with internal surface area and decreases with specific surface acidity as a result of oxidation of positronium atoms at the surface by protons. These results point to a new and effective method for specific surface acidity valuations.

Abstract: A cigarette density profile measurement system which utilizes a hopper system for storing a large number of cigarette rods whose density is to be measured which hopper system is used to feed one cigarette rod at a time to a fixed cigarette holder which incorporates a beta gauge system which sequentially irradiates a slice of the cigarette rod with beta particles for measurement of the mass of tobacco contained in that slice of the cigarette rod. By measuring the number of beta particles which pass through each slice of the cigarette rod, the cigarette density profile measurement system is able to determine the density of the tobacco contained in the cigarette rod being measured. A programmed microcomputer is utilized to control the cigarette density profile measurement system and is also provided with additional software for analyzing the density data.

Abstract: A method and apparatus for rapidly yet nondestructively testing a semiconductor wafer is disclosed. A multi-spot positron source assembly directs positrons over an entire semiconductor wafer at one time. A pair of multi-detector assemblies are situated so that each detector within an assembly corresponds physically with a positron source. By measuring the characteristic emission and annihilation energies, the multi-detector assembly pair is capable of detecting the lifetimes of positrons from within each of the areas simultaneously. Longer lifetimes are indicative of defects within the semiconductor wafer. By accumulating and analyzing positron lifetimes from across the entire wafer substantially simultaneously, information about the existence and location of defects in the wafer may be more rapidly determined than is possible with known positron-emission techniques.

Abstract: A basis weight scanner using a beta-ray source and an electron detector on opposite sides of a web of wood pulp sheeting is used to calculate the weight of wood pulp advanced past a measuring location (e.g. into a cellulosic fibre production plant).

Abstract: Apparatus for continuously determining the areal density along a length of a material includes a radioactive source and a scintillating receiver. In a first embodiment, the invention measures the thickness of a traveling web simultaneously at multiple points across its full width. The apparatus includes a radioactive source which extends across one side of the web. A detector array, on the opposite side of the web, detects the emission from the source through the web. The array includes scintillating fibers and multi- or single-anode photomultipliers which may be connected by a scintillating or non-scintillating fiber optic elements to the photomultiplier. In a second embodiment, the invention continuously detects the fill level of a plurality of containers as they are conveyed between the receiver and detector. A scintillating fiber receiver may have its fibers arranged either vertically or horizontally.