With Probe, Prod Or Terminals Patents (Class 324/149)
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Patent number: 8988065Abstract: According to an embodiment, a microprobe includes a base and a lever. The base includes a first electrode provided on a surface thereof. The lever is supported by the base and includes a second electrode and a third electrode. The second electrode is connected between the first electrode and the third electrode. The third electrode is formed to project from the second electrode in a first direction in a main surface of the lever. A width of the third electrode in a second direction perpendicular to the first direction in the main surface defines a width of an electrical contact area when a scanning operation is performed by use of the third electrode in a third direction perpendicular to the main surface.Type: GrantFiled: February 27, 2014Date of Patent: March 24, 2015Assignee: Kabushiki Kaisha ToshibaInventors: Yongfang Li, Yasushi Tomizawa
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Publication number: 20150069999Abstract: A method for contacting at least two metal electrodes, wherein the metal electrodes are located in a cavity of a basic body of sintered ceramic and frontal end faces of the metal electrodes. The metal electrodes are arranged essentially planparallel to an outer surface of the basic body. The method includes steps as follows: introducing a solder into at least one hole of the basic body, wherein the hole is so embodied that it leads to a rear portion of the metal electrode away from the frontal end face of the metal electrode wherein the solder can wet the rear portion of the metal electrode, wherein the metal electrodes are in their longitudinal direction shorter than the basic body, especially have only ? of the length of the basic body; introducing a cable into the hole at least until the cable extends into the solder; and heating the basic body with solder and cable above the solidification temperature of the solder.Type: ApplicationFiled: September 8, 2014Publication date: March 12, 2015Inventors: Stephan Buschnakowski, Alexander Serfling
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Publication number: 20150048815Abstract: A probe assembly can be connected and disconnected from its electrical harness within a vacuum chamber so that the probe assembly with the work piece mounted can be rotated and tilted without interference from a cable, and can then be reconnected without opening the vacuum chamber. Also described is a means of grounding a sample and probes when the probe assembly is disconnected from its electrical harness and a means of preventing damage to the probe mechanism and the probe itself by ensuring that the probes are not sticking up too far during operations.Type: ApplicationFiled: August 14, 2014Publication date: February 19, 2015Applicant: FEI CompanyInventors: Paul Johannes L. Barends, Mathijs P.W. van den Boogaard, Philip Brundage
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Publication number: 20150042315Abstract: This disclosure relates to bioelectric signal detecting circuits, lead wire detecting circuits and medical devices. The lead wire detecting circuit may include a reference voltage generator, at least one comparator, and a logic control module, wherein input ends of the comparator are connected to an output end of the reference voltage generator and an signal output end of a lead wire, respectively, for inputting a reference voltage and a lead signal, and the comparator compares the lead signal with the reference voltage and changes an output voltage at an output end of the comparator according to a comparison result; wherein an input end of the logic control module is connected to the output end of the comparator, and the logic control module determines whether the lead wire is in a connected state or disconnected state by the output voltage at the output end of the comparator.Type: ApplicationFiled: October 27, 2014Publication date: February 12, 2015Inventors: Jian Cen, Qiling Liu, Xiaoyu Wu, Bing Wang
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Patent number: 8952681Abstract: A measuring device for the measurement of differential signals including a real-time portion, which contains two probes, a signal adder and a triggering device. The probes each record a partial signal of a differential signal. The signal adder adds the partial signals to form a differential signal. The triggering device implements a triggering on the basis of the differential signal.Type: GrantFiled: January 25, 2010Date of Patent: February 10, 2015Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Thomas Kuhwald, Johann Huber, Michael Reinhold, Wolfgang Herbordt, Markus Freidhof
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Publication number: 20150002138Abstract: Various techniques are disclosed for providing electrical current and/or voltage sensor probes or tags integrated with measurement circuitry. For example, an electrical sensor is provided that includes a probe adapted to be arranged to at least partially encircle a conductor to be measured, wherein the probe has a proximal end and a distal end, the proximal end terminating in a base portion that houses measurement circuitry. The base portion may also include electrical components suitable for displaying, wirelessly transmitting, and/or otherwise conveying the measured electrical parameters. In some embodiments, the distal end of the probe may be removably received by the base portion, such that the probe forms a loop encircling the conductor when measuring it. In other embodiments, the probe may resiliently clip on to the conductor. In another example, an electrical sensor includes an attachable tag that can be mounted to the conductor to be measured.Type: ApplicationFiled: September 15, 2014Publication date: January 1, 2015Inventor: Michael Fox
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Patent number: 8922196Abstract: A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a second end including an alligator clamp having a pair of jaws, with a compression spring normally biasing the thumb press away from the housing, and normally biasing the alligator clamp substantially within the hollow bore proximate the open end. A point plunger is also carried in the bore, with a first end including a thumb press, and a second end terminating in a point, with a second compression spring normally biasing the thumb press away from the housing, and biasing the point within the hollow bore proximate the open end.Type: GrantFiled: March 15, 2013Date of Patent: December 30, 2014Inventors: Paul Nicholas Chait, Stanley Chait
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Publication number: 20140375337Abstract: A probe sensor has a printed circuit comprising a coplanar transmission line, a ground plane, a plated-through contact via, and a part-circular ring of ground vias surrounding the contact via. The coplanar transmission line and ground plane are formed on a first layer of the printed circuit, and the contact via and part-circular ring of ground vias are plated with a conductive biocompatible material on a second layer of the printed circuit. A system uses a network analyzer with the probe to measure electrical properties of biological tissue. Also described is a method of using the system to determine qualities of stored blood.Type: ApplicationFiled: May 11, 2012Publication date: December 25, 2014Applicant: THE TRUSTEES OF DARTMOUTH COLLEGEInventors: Paul M. Meaney, Tina Zhou, Andrea Borsic, Alexander T. Farkas, Keith D. Paulsen
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Patent number: 8917084Abstract: The present invention is an efficient high voltage sensing mechanism that operates only when an individual needs to test the voltage across a wire. The present invention attaches around a tested wire using a jaw and a hook. The hook is tensioned using an expansion spring. The operator propels the hook outwards from the jaw, around the tested wire; thereafter, the expansion spring retracts to latch onto the tested wire against the jaw. An on-off switch is integrated into the mechanical hook device. As the hook is propelled outwards, the on-off switch moves into the “on” position, which powers the electrical processing and voltage analysis equipment. Once the hook is returned to the initial position, the on-off switch moves to the “off” position. This arrangement allows the present invention to remain unpowered for any instance a wire is not being tested. The present invention detects voltage through capacitive coupling.Type: GrantFiled: July 2, 2012Date of Patent: December 23, 2014Assignee: Synergistic Technology Solutions, Inc.Inventors: John G. Konopka, Alex K. Choi, David A. Konopka
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Patent number: 8912803Abstract: A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.Type: GrantFiled: September 19, 2011Date of Patent: December 16, 2014Assignee: Honeywell International, Inc.Inventor: Vasu Mogaveera
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Patent number: 8912787Abstract: A high voltage detection device comprises a probe comprising an electrode for sensing a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing a control for measuring parameters of line voltage. The control comprises an input module for connection to the probe to develop a voltage signal. A signal processing module receives the voltage signal and determines parameters of line voltage and drives an audio module. The audio module provides an audio output representing the determined parameters of line voltage.Type: GrantFiled: April 3, 2012Date of Patent: December 16, 2014Assignee: Honeywell International, Inc.Inventors: Adishesha Cs, Edukondalu Yarlagadda, Michael D. Berg
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Patent number: 8907659Abstract: The retractable test probe includes a main sleeve, a needle and a rotation positioning mechanism. The needle is rooted in the main sleeve. The rotation positioning mechanism includes an eccentric incoaxially fastened to the needle and a flexible sleeve around the eccentric and in the main sleeve. When the needle is turned towards a specific direction, the eccentric will be firmly fastened in the main sleeve through the flexible sleeve, when the needle is turned reversely, the eccentric will be released from the flexible sleeve to be retractably movable.Type: GrantFiled: May 21, 2012Date of Patent: December 9, 2014Assignee: Chung Instrument Electronics Industrial Co., Ltd.Inventor: Shaw-Lin Liu
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Patent number: 8901920Abstract: A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.Type: GrantFiled: January 19, 2012Date of Patent: December 2, 2014Assignee: Fujitsu Component LimitedInventors: Koki Takahashi, Koki Sato, Mitsuru Kobayashi
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Publication number: 20140347038Abstract: A probe, comprising: a shank region having a top surface integrally connected to a bottom surface of a conical region; a pyramidal tip region having a base surface integrally connected to a top surface of the conical region; and wherein the base surface of the pyramidal tip region is contained within a perimeter of the top surface of the conical region. Also a method of fabricating the probe and a method of probing devices under test.Type: ApplicationFiled: May 23, 2013Publication date: November 27, 2014Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David R. Goulet, Walter V. Lepuschenko
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Patent number: 8896305Abstract: A permanent or variable magnetic field circulation sensor including apparatus for magnetic excitation further including at least one elongated excitation coil extending around an elongated supple magnetic core and including a supple magnetic material with low relative magnetic permeability having a supple or flexible matrix in which magnetic particles are dispersed, an excitation current generation unit coupled to the excitation coil to generate an excitation magnetic field in the core over substantially the entire length of the coil, apparatus for measurement including: at least one magnetic measuring transducer magnetically coupled to the apparatus for magnetic excitation, a measuring unit connected to the magnetic measuring transducer and suitable for providing a measurement of magnetic field circulation in the core.Type: GrantFiled: May 22, 2009Date of Patent: November 25, 2014Assignee: NeelogyInventors: Lionel Cima, Yohan Maniouloux
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Publication number: 20140320145Abstract: An oscilloscope system includes a current probe, a processing unit and a display unit. The current probe includes a high and low gain signal paths for receiving simultaneously a signal of interest from a device under test (DUT), and to output amplified small and large current portions of the signal of interest, respectively. The processing unit receives first and second digitized data corresponding to the amplified small and large current portions output by the high and low gain signal paths, respectively, and processes the first and second digitized data for display as zoomed-in and zoomed-out waveform data, respectively. The display unit displays simultaneously a zoomed-in waveform in a first display window, based on the zoomed-in waveform data, and a zoomed-out waveform in a second display window, based on the zoomed-out waveform data, using the same time scale. The small current portion is less than a predetermined threshold.Type: ApplicationFiled: April 30, 2013Publication date: October 30, 2014Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Kenneth W. Johnson, Edward Vernon Brush, IV, Michael T. McTigue
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Publication number: 20140303916Abstract: A probe is configured for measuring an electrical impedance of a workpiece using external testing equipment. The probe includes a non-conducting base and an array of at least four spaced-apart line conductors. The at least four spaced-apart line conductors are disposed generally in parallel to each other along their lengths on a surface of the non-conducting base and are electrically connected to a corresponding array of at least four terminals on the non-conducting base. The non-conducting base is configured to be placed over a surface of the workpiece so that the at least four spaced-apart line conductors contact the surface of the workpiece and the at least four terminals are configured to be connected the external testing equipment.Type: ApplicationFiled: April 4, 2014Publication date: October 9, 2014Applicant: Brigham Young UniversityInventors: Brian Anthony Mazzeo, Dean R. Wheeler
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Publication number: 20140285182Abstract: The invention provides a handheld digital voltmeter approximately the size and shape of a ballpoint pen. When its tip is placed on a live electrical wire, the Accu Volt Meter digitally displays a voltage reading on a small LCD screen and audibly states the voltage reading through an incorporated data to voice software program and a tiny incorporated speaker.Type: ApplicationFiled: March 19, 2014Publication date: September 25, 2014Inventor: Javier Rojas, JR.
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Publication number: 20140253103Abstract: A current sensor comprises a housing of plastic, a current conductor with integrally shaped first and second electrical terminals, through which a current to be measured is supplied and discharged, third electrical terminals, and a semiconductor chip having at least one magnetic field sensor, which is sensitive to a component of the magnetic field generated by the current flowing through the current conductor running perpendicularly to the surface of the semiconductor chip. The first and second electrical terminals are arranged at a first side of the housing, the third electrical terminals are arranged at a side of the housing opposite to the first side. The semiconductor chip is mounted as flip chip. The semiconductor chip comprises first bumps, which make electrical connections to the third terminals, and second bumps located above the current conductor and electrically separated from the semiconductor chip by an isolation layer.Type: ApplicationFiled: March 5, 2014Publication date: September 11, 2014Applicant: Melexis Technologies NVInventors: Robert Racz, Jian Chen, Mathieu Ackermann
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Patent number: 8829937Abstract: Probes suitable for use with densely packed fine-pitch 2-D contact arrays are provided by use of an electrically insulating guide plate in connection with vertical probes, where the vertical probes have probe flexures that are either vertically folded sections, or coils having a horizontal axis. Preferably, the probes are configured such that the probe flexures are inside the guide plate holes, and the parts of the probes extending past the guide plate are relatively rigid. This configuration alleviates problems associate with probe shorting, because the probe flexures are enclosed by the guide plate holes, and are therefore unable to come into contact with flexures from other probes during probing.Type: GrantFiled: January 27, 2011Date of Patent: September 9, 2014Assignee: FormFactor, Inc.Inventor: January Kister
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Publication number: 20140247037Abstract: A probe apparatus 10 has a movable mounting table 12 that mounts a wafer W on which multiple power devices are formed; a probe card 14 that is provided above the mounting table 12 and has multiple probes 14A; a conductive film electrode 13 formed on a mounting surface of the mounting table 12 and an outer peripheral surface thereof; and a measurement line 16 that electrically connects the conductive film electrode 13 to a tester 17. Further, the probe apparatus measures electrical characteristics of the power devices on the mounting table 12 at a wafer level. Furthermore, the measurement line 16 includes a switch device 18 configured to open and close an electric path of the measurement line 16 between the conductive film electrode 13 and the tester 17.Type: ApplicationFiled: July 30, 2012Publication date: September 4, 2014Applicant: TOKYO ELECTRON LIMITEDInventors: Eiichi Shinohara, Ken Taoka
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Patent number: 8797021Abstract: An electrochemical corrosion potential (ECP) probe assembly for monitoring ECP in a high velocity reactor line includes an airfoil shaped ECP cover that improves the streamlines over and around an ECP sensor. The airfoil shaped cover includes flow holes drilled normal to the surface of the ECP cover. As such, the direction of flow of reactor water into the ECP probe assembly is altered to reduce the flow rate internal to the ECP cover sufficiently to prevent damage to the ECP probes. To facilitate use as a retrofit component, the ECP cover may have an elliptical section that is contiguous to a circular section that conforms to the geometry of existing probe wells and probe sub-assemblies.Type: GrantFiled: February 14, 2011Date of Patent: August 5, 2014Assignee: GE-Hitachi Nuclear Energy Americas LLCInventors: Theron D. Marshall, Adrian M. Mistreanu, Angelito Foz Gonzaga, John S. Bennion
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Patent number: 8786292Abstract: A power distribution monitoring system is provided that can include a number of features. The system can include a plurality of monitoring devices configured to attach to individual conductors on a power grid distribution network. In some embodiments, a monitoring device is disposed on each conductor of a three-phase network. The monitoring devices can be configured to measure and monitor, among other things, current and electric-field on the conductors. Methods of calibrating the monitoring devices to accurately measure electric-field are also provided. In one embodiment, a first monitoring device on a first conductor can transmit a calibration pulse to a second monitoring device on a second conductor. The second monitoring device can determine a degradation of the calibration pulse, and use that degradation to calibrate electric-field measurements around the conductor.Type: GrantFiled: December 6, 2011Date of Patent: July 22, 2014Assignee: Sentient Energy, Inc.Inventor: Mark A. Parsons
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Publication number: 20140197817Abstract: Provided is a current probe which reduces, in current measurement, a measurement error due to an unnecessary magnetic field generated from a subject not to be measured, said subject being adjacent to a subject to be measured. The current probe is characterized in having: a sensor that detects a magnetic field; a transmission path connected to the sensor; and a pair of conductive members, which protrude toward the front from a leading edge portion of the sensor, and are provided to face the sensor. The current probe is also characterized in that a front portion of the sensor, said portion being surrounded by the protruding portions of the conductive members, is opened in the direction of a plane that faces the conductive members.Type: ApplicationFiled: July 20, 2012Publication date: July 17, 2014Applicant: Hitachi, Ltd.Inventors: Hiroki Funato, Takashi Suga
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Publication number: 20140191748Abstract: A signal test device includes a probe column, a probe pin, and a cable. The probe pin includes a first end contacted with an electronic device and a second end located inside the probe column. A first conductive piece set in the probe column is connected to a signal line of the cable. A second conductive piece is set apart from and below the first conductive piece in the probe column, and is connected to the second end of the probe pin. When the first end of the probe pin is pressed to the electronic device, the probe pin moves into the probe column and the second conductive piece contacts the first conductive piece. When the second conductive piece contacts with the first conductive piece, a snapshot of a waveform of the electronic device is captured and shown on the oscilloscope.Type: ApplicationFiled: July 26, 2013Publication date: July 10, 2014Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.Inventors: SONG MA, WU ZHOU
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Patent number: 8754636Abstract: A clamp meter with multipoint measurement includes a current-measuring unit, an analog-to-digital converting unit, and a measuring-position judgment unit. The current-measuring unit includes a plurality of current-measuring positions calibrated according to the measuring-position judgment unit. The current-measuring unit measures the current of the current-measuring position judged by the measuring-position judgment unit.Type: GrantFiled: December 7, 2011Date of Patent: June 17, 2014Assignee: Brymen Technology CorporationInventor: Po-Chao Tan
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Publication number: 20140159705Abstract: A wafer examination device includes a probe, a fusion section and a measurement section. The probe is made of a metal which reacts with silicon carbide to produce silicide. The fusion section fuses the probe to a silicon carbide wafer as an examined object. The measurement section measures an electrical property of the silicon carbide wafer through the fused probe.Type: ApplicationFiled: December 9, 2013Publication date: June 12, 2014Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Hirokazu Fujiwara, Narumasa Soejima
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Publication number: 20140125323Abstract: An electrical connecting module includes a first electrical connection terminal with a first connection pole and a second connection pole; a module element with a second electrical connection terminal, which comprises a first connection pole and a second connection pole, and with a third electrical connection terminal, which comprises a first connection pole and a second connection pole. A test channel is provided for accommodating a test probe. wherein the test channel is intended for making electrical contact with the second connection pole of the first connection terminal by means of the test probe when there is an electrical connection between the first connection pole of the first connection terminal and the first connection pole of the third connection terminal and when the electrical connection between the second connection pole of the first connection terminal and the second connection pole of the third connection terminal is disconnected.Type: ApplicationFiled: June 13, 2012Publication date: May 8, 2014Inventors: Roland Tombers, Mark Becker
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Publication number: 20140117976Abstract: An insulator for a test clip is described. The insulator includes a first clip cover configured to removably attach to a top portion of a test clip. The test clip comprises a top portion and a bottom portion pivotally attached to the top portion along a pivot axis. The insulator also comprises a second clip cover configured to removably attach to the bottom portion of the test clip. Each of the first and the second clip cover comprises one or more retaining elements configured to secure the clip cover to its respective portion of the test clip. In some implementations, each of the first and the second clip cover comprises one or more cantilevered retaining segments configured to extend over a portion of the test clip in order to secure the first and the second clip covers to the test clip.Type: ApplicationFiled: September 24, 2013Publication date: May 1, 2014Applicant: WESTEK ELECTRONICS, INC.Inventor: Kevin B. Larkin
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Patent number: 8664938Abstract: A probe head is disclosed that is detachable from a probe body containing electronics. The probe head including a housing enclosing a sensor and at least part of an electrical connector electrically coupled to the sensor. The housing has a coupling member positioned to detachably connect the housing to the probe body, and when the probe head and probe body are coupled, the electrical connector electrically couples the sensor to the electronics in the probe body.Type: GrantFiled: May 5, 2010Date of Patent: March 4, 2014Assignee: YSI IncorporatedInventors: Christopher J. Palassis, Michael T. James
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Patent number: 8659285Abstract: A current sensor, comprises an input conductor (IN) which is supplied with the current to be sensed and an output conductor (OUT) from which the current to be sensed is output. A conductor path is provided between the input conductor and the output conductor, wherein the path is provided on a first, movable element (1) and a second, fixed element (2). The path defines a pair of adjacent path portions (3,5; 3;4), one of the path portions (4;5) on the fixed element and the other (3) on one side of the movable element. An arrangement detects movement of the movable element to determine the current flowing. This arrangement uses a conductor path which can be part of the circuit being tested, and thereby does not require any additional components, other than the movement detector.Type: GrantFiled: October 9, 2009Date of Patent: February 25, 2014Assignee: NXP B.V.Inventor: Victor Zieren
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Patent number: 8643361Abstract: The present idea refers to a needle head, its use in a probe arrangement, and a method for electrically contacting multiple electronic components. The needle head comprises a body with a lower surface, needle electrodes emerging from the lower surface, and multiple outlets arranged in the lower surface. A channel is arranged between an inlet in the body and the outlets for conveying a medium from the inlet to the outlets. By this means, electronic components arranged in close distance under the lower surface of the needle head are directly exposed to the medium which provides a test environment during a test of the electronic components.Type: GrantFiled: May 19, 2011Date of Patent: February 4, 2014Assignee: Sensirion AGInventors: Markus Graf, Hans Eggenberger, Martin Fitzi, Christoph Schanz
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Publication number: 20140028291Abstract: Disclosed are a sensor for measuring a tilt angle based on electronic textile according to the present invention and a method thereof. A sensor for measuring a tilt angle based on electronic textile according to the present invention includes a plurality of textile electrodes disposed at predetermined uniform intervals on a textile surface; a textile conductive wire of which one end is connected to a center between the plurality of textile electrodes; and a metal bead connected to another end of the textile conductive wire to thereby be connected to the textile surface.Type: ApplicationFiled: January 15, 2013Publication date: January 30, 2014Applicants: GEORGIA TECH RESEARCH CORPORATION, ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEInventors: Hyung Sun LEE, Hyung Cheol Shin, Thad E. Starner, Scott M. Gilliland, Clint Zeagler
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Publication number: 20140015518Abstract: A device for testing a multiplicity of lens modules includes a base, a circuit board, a connection member, and a support assembly. The base includes a support surface. The support surface includes a loading area and a slide area. The circuit board is positioned on the base in the loading area. The circuit board includes a number of signal input interfaces. The connection element includes a shell and a number of elastic and flexible metal elements. Each metal element connects to the number of signal input interfaces. The support assembly supports the lens modules, and can slide in the slide area to bring the metal elements into electrical contact with the lens modules.Type: ApplicationFiled: February 28, 2013Publication date: January 16, 2014Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventors: MENG-YU TSAI, YU-HAN CHEN
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Patent number: 8624617Abstract: A test probe for testing an object electrically includes a main body, a first probe pin mounted to and protruding out of the main body, and at least one second probe pin coupled to the main body. The at least one second probe pin is changeable from a first state of being folded into the main body to a second state of being unfolded to protrude out of the main body. When the at least one second probe pin is in the first state, the first probe pin is used to contact the object, and when the at least one second probe pin is in the second state, the at least one second probe pin takes the place of the first probe pin in making electrical connection with the object.Type: GrantFiled: June 20, 2011Date of Patent: January 7, 2014Assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventors: Mao-Sheng Huang, Chuang Yue
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Publication number: 20130328549Abstract: A probing rod includes a main casing and a rotating mobile probe, and the rotating mobile probe includes a conductive tube, a needle and a rotating mobile structure, and the conductive tube is contained in the main casing; the rotating mobile structure includes an outer thread formed on the needle and an inner thread formed on the conductive tube, and the outer thread and the inner thread are screwed with each other, such that the needle can perform a linear movement with respect to the conductive tube. Therefore, the needle can be moved with respect to the main casing to achieve the effect of adjusting the length of the probe that extends out from the main casing.Type: ApplicationFiled: June 7, 2012Publication date: December 12, 2013Inventor: Shaw-Lin LIU
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Publication number: 20130320962Abstract: A measuring instrument, in particular a voltage tester, is provided having two probes which are arranged in separate housings through which connecting cables extend. The housings are magnetically attractive, because of either a first magnet arranged on a first one of the housings for cooperation with the magnetic material of the other housing, or a corresponding pair of opposed magnets provided in magnetically attractive relation on the two housings, respectively. Recesses are provided in the second housing opposite the corresponding magnets of the first housing. Corresponding pivot ribs extend circumferentially around the housings in the space between the first one magnet and the adjacent probe end, thereby to permit accurate spacing of the probes during the taking of a test measurement.Type: ApplicationFiled: May 27, 2013Publication date: December 5, 2013Inventors: Grit Rother, Andreas Giese, Herbert Ehlers, Lars Topp, Lars Kuehne, Armin Herzog
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Publication number: 20130307527Abstract: The retractable test probe includes a main sleeve, a needle and a rotation positioning mechanism. The needle is rooted in the main sleeve. The rotation positioning mechanism includes an eccentric incoaxially fastened to the needle and a flexible sleeve around the eccentric and in the main sleeve. When the needle is turned towards a specific direction, the eccentric will be firmly fastened in the main sleeve through the flexible sleeve, when the needle is turned reversely, the eccentric will be released from the flexible sleeve to be retractably movable.Type: ApplicationFiled: May 21, 2012Publication date: November 21, 2013Inventor: Shaw-Lin LIU
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Publication number: 20130265076Abstract: An adapter board includes a PCB, a first gold finger mounted on the PCB, and a plurality of first connectors mounted on the PCB. The first gold finger includes a first ground pin and a plurality of power pin groups. Each first connector includes a load connection pin and a second ground pin electronically connected to the first ground pin, the load connecting pin of each first connector is electronically connected to a load, a oscilloscope, and a corresponding power pin group.Type: ApplicationFiled: April 2, 2013Publication date: October 10, 2013Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.Inventors: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
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Publication number: 20130257413Abstract: An embodiment of a system includes a utility meter having an enclosure, a first component and a second component in the enclosure, and a mounting assembly configured to couple the first and second components together in the enclosure. The mounting assembly includes a first mount having first and second prongs disposed about an intermediate space, a second mount configured to extend bi-directionally into the intermediate space between the first and second prongs in opposite first and second directions, and a snap-fit fastener. The snap-fit fastener includes first and second snap portions configured to bi-directionally engage one another in the opposite first and second directions to secure the first and second mounts.Type: ApplicationFiled: March 30, 2012Publication date: October 3, 2013Applicant: GENERAL ELECTRIC COMPANYInventor: Rathindra Nahar
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Publication number: 20130257414Abstract: A high voltage detection device comprises a probe comprising an electrode for sensing a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing a control for measuring parameters of line voltage. The control comprises an input module for connection to the probe to develop a voltage signal. A signal processing module receives the voltage signal and determines parameters of line voltage and drives an audio module. The audio module provides an audio output representing the determined parameters of line voltage.Type: ApplicationFiled: April 3, 2012Publication date: October 3, 2013Inventors: Adishesha CS, Edukondalu Yarlagadda, Michael D. Berg
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Publication number: 20130249532Abstract: A method includes bonding a first package component on a first surface of a second package component, and probing the first package component and the second package component from a second surface of the second package component. The step of probing is performed by probing through connectors on the second surface of the second package component. The connectors are coupled to the first package component. After the step of probing, a third package component is bonded on the first surface of the second package component.Type: ApplicationFiled: March 23, 2012Publication date: September 26, 2013Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Jing-Cheng Lin, Szu Wei Lu
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Publication number: 20130249533Abstract: A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a second end including an alligator clamp having a pair of jaws, with a compression spring normally biasing the thumb press away from the housing, and normally biasing the alligator clamp substantially within the hollow bore proximate the open end. A point plunger is also carried in the bore, with a first end including a thumb press, and a second end terminating in a point, with a second compression spring normally biasing the thumb press away from the housing, and biasing the point within the hollow bore proximate the open end.Type: ApplicationFiled: March 15, 2013Publication date: September 26, 2013Inventors: Paul Nicholas Chait, Stanley Chait
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Patent number: 8536858Abstract: An oscilloscope includes a number of probe assemblies. Each probe assembly includes a probe and a connecting member. The connecting member includes a first connecting portion that may be coiled around the probe and a second connecting portion. The probes are connected together by the connecting members, and can be grounded by soldering one of the second connecting portions to a ground plane.Type: GrantFiled: August 27, 2010Date of Patent: September 17, 2013Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: Chun-Yuan Tien
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Patent number: 8513942Abstract: A probe head can comprise a substrate and electrically conductive structures extending from opposite surfaces of the substrate. The probe head can be made by forming frame structures each comprising a frame to which a row of the conductive structures is coupled. The frame structures can be placed in a stack. A compressible shim or a curable adhesive can be provided between adjacent frames in the stack to control a distance between the contact ends of the conductive structures in adjacent rows of the conductive structures. The frames can include cavities that form a mold while the frames are in the stack, and the substrate can be formed by introducing a moldable material into the mold. After the moldable material hardens, the frame can be removed, leaving the conductive structures embedded in the substrate.Type: GrantFiled: December 21, 2010Date of Patent: August 20, 2013Assignee: FormFactor, Inc.Inventors: Benjamin N. Eldridge, Gaetan L. Mathieu
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Publication number: 20130141077Abstract: Apparatus, usable to measure current in a multiple-conductor cable having supply and return conductors spaced apart by a nominal conductor spacing and carrying respective supply and return currents in opposite directions, includes (1) a non-magnetic body having a cable-engaging portion defining a location and an orientation axis of the multiple-conductor cable relative to the apparatus when the cable-engaging portion engages the cable during use, (2) a planar, multi-turn wire coil supported by the body immediately adjacent to the location and lying in a plane parallel to the orientation axis, the wire coil having a coil diameter at least four times the nominal conductor spacing, and (3) signal conditioning circuitry operative in response to a voltage signal developed across output ends of the wire coil to generate a conditioned voltage signal having a voltage magnitude determined by and indicative of a magnitude of the supply current during use.Type: ApplicationFiled: December 4, 2012Publication date: June 6, 2013Applicant: Brandeis UniversityInventor: Brandeis University
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Patent number: 8456156Abstract: A probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board. An anti-jamming distance between the two detecting probes is a multiple of 5 millimeters and is greater than or equal to 10 millimeters.Type: GrantFiled: April 30, 2010Date of Patent: June 4, 2013Assignees: Tsinghua University, Hon Hai Precision Industry Co., Ltd.Inventors: Xu Gao, Zhi-Jun Zhang, Zheng-He Feng, Steven-Philip Marcher, Zhan Li, Yong Yan
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Patent number: 8446145Abstract: An aspect of the invention provides a method for measuring I-V characteristics of a solar cell, the solar cell comprising a plurality of fine line-shaped electrodes formed on a first surface in a predetermined direction; and a coupling line formed on the first surface that electrically couples at least two fine line-shaped electrodes among the plurality of fine line-shaped electrodes, the coupling line having a line width larger than a line width of the fine line-shaped electrodes. The method includes: contacting a probe pin for voltage measurement with the coupling line; contacting two or more probe pins for current measurement electrically connected to each other with two or more fine line-shaped electrodes including the fine line-shaped electrodes coupled to each other by the coupling line among the plurality of fine line-shaped electrodes; and measuring I-V characteristics while irradiating the first surface with light.Type: GrantFiled: February 5, 2010Date of Patent: May 21, 2013Assignee: Sanyo Electric Co., Ltd.Inventors: Shigeharu Taira, Takeshi Nishiwaki
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Publication number: 20130119976Abstract: An electrical power line voltage measurement device comprises a probe including an insulated shield supporting an electrode to sense voltage from one phase of the power line. The shield houses a high voltage resistor connected in series with the electrode. A meter comprises a housing operatively associated with the shield and enclosing a measurement circuit electrically connected to the high voltage resistor for measuring leakage current. A calibration circuit correlates measured leakage current to approximate power line voltage. A display is driven by the measurement circuit for displaying approximate power line voltage.Type: ApplicationFiled: November 15, 2011Publication date: May 16, 2013Inventor: Vasu Mogaveera
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Patent number: 8441250Abstract: Disclosed is a method for using at least one static probe during polymerization in a fluid bed polymerization reactor system to monitor a coating on a surface of the reactor system and a distal portion of each static probe, wherein the coating is exposed to flowing fluid within the reactor system during the reaction. The surface may be a reactor bed wall (exposed to the reactor's fluid bed) and the coating is exposed to flowing, bubbling fluid within the fluid bed during the reaction. The method may include steps of: during the polymerization reaction, operating the static probe to generate a sequence of data values (“high speed data”) indicative of fluid flow variation (e.g., bubbling or turbulence), and determining from the high speed data at least one electrical property of the coating (e.g., of a portion of the coating on the distal portion of the static probe).Type: GrantFiled: May 14, 2010Date of Patent: May 14, 2013Assignee: Univation Technologies, LLCInventors: Eric J. Markel, Timothy R. Lynn