Abstract: A probe system for connecting a measurement apparatus to a DUT includes an AC probe having an AC shield conductor and an AC probe conductor shielded by the AC shield; a first DC probe having a first DC probe conductor and a first guard conductor for guarding the first DC probe conductor when a virtual version of a voltage on the first DC probe conductor is applied to the first guard conductor; a second DC probe having a second DC probe conductor and a second guard conductor for guarding the second DC probe conductor when a virtual version of a voltage on the second DC probe conductor is applied to the second guard conductor; a first capacitive connection between the AC shield conductor and the first guard conductor; a second capacitive connection between the AC shield conductor and the second guard conductor; a third capacitive connection between the first guard conductor and the first DC probe conductor; and a fourth capacitive connection between the second guard conductor and the second DC probe conductor,

Abstract: A system for operating a differential probe which includes a first metal extension and a second metal extension having the same structures is disclosed. Each of the metal extensions includes a rotatable arm, a rotatable base, and a contact end. The rotatable base and contact end of each of the metal extensions extend from two ends of the corresponding rotatable arm at an angle, the contact ends and the rotatable bases of the metal extensions are parallel to each other. The system controls a mechanical arm to adjust a vertical distance between the contact ends to be equal to a required vertical distance by rotating the first metal extension around the rotatable base of the second metal extension clockwise by a rotated angle, and rotating the second metal extension around the rotatable base of the first metal extension counterclockwise by the rotated angle.

Abstract: Disclosed is a method for using at least one static probe during polymerization in a fluid bed polymerization reactor system to monitor a coating on a surface of the reactor system and a distal portion of each static probe, wherein the coating is exposed to flowing fluid within the reactor system during the reaction. The surface may be a reactor bed wall (exposed to the reactor's fluid bed) and the coating is exposed to flowing, bubbling fluid within the fluid bed during the reaction. The method may include steps of: during the polymerization reaction, operating the static probe to generate a sequence of data values (“high speed data”) indicative of fluid flow variation (e.g., bubbling or turbulence), and determining from the high speed data at least one electrical property of the coating (e.g., of a portion of the coating on the distal portion of the static probe).

Abstract: The fabrication and use of a multifunctional micropipette biological sensor for in-situ detection of temperature changes, ion conductivity, and light is described herein.

Abstract: In an oscilloscope probe with a transistor amplifier constructed on a semiconductor substrate using integrated circuit technology, at least one part of the input-voltage divider is also constructed together with the amplifier using integrated-circuit technology on the semiconductor substrate.

Abstract: A printed circuit board including a P1 connector, a P2 connector, and a first common connector configured to connect an application-specific connector to the printed circuit board.

Abstract: An electric field detection probe includes a cable including an internal conductor line, an insulating layer that coats a surface of the internal conductor line and exposes a tip end of the internal conductor line, an external conductor layer that coats a surface of the insulating layer and exposes the tip end, and an electric field diaphragm wherein the electric field diaphragm is electrically coupled to the external conductor layer, covers the tip end surface of the cable except for an opening.

Abstract: An aspect of the invention provides a method for measuring I-V characteristics of a solar cell, the solar cell comprising a plurality of fine line-shaped electrodes formed on a first surface in a predetermined direction; and a coupling line formed on the first surface that electrically couples at least two fine line-shaped electrodes among the plurality of fine line-shaped electrodes, the coupling line having a line width larger than a line width of the fine line-shaped electrodes. The method includes: contacting a probe pin for voltage measurement with the coupling line; contacting two or more probe pins for current measurement electrically connected to each other with two or more fine line-shaped electrodes including the fine line-shaped electrodes coupled to each other by the coupling line among the plurality of fine line-shaped electrodes; and measuring I-V characteristics while irradiating the first surface with light.

Abstract: An apparatus for determining and/or monitoring at least one process variable of a medium. The apparatus includes: at least one probe unit; and at least one electronics unit, which supplies the probe unit with an operating signal and which receives from the probe unit a received signal. The probe unit includes at least one probe electrode and at least one guard electrode; and the probe electrode and the guard electrode are surrounded, at least partially, by at least one insulating unit. The the insulating unit has, in the region of the guard electrode, a smaller thickness than in the region of the probe electrode.

Abstract: A probe electrode structure on a substrate is described, comprising a first probe electrode and a neighboring second probe electrode on a layer sequence that generally includes, in a direction from the substrate to the probe electrodes, an electrically conductive bottom layer, an electrically insulating center layer and a electrically conductive top layer. The probe-electrode structure of the invention provides a means to detect an undercutting of the first probe electrode in an etching step that aims at removing the top layer from regions outside the first probe electrode. An undercutting that exceeds an admissible distance from the first edge of the first electrode will remove the first top-layer probe section in the first probe opening, which causes a detectable change of the electrical resistance between the first and second probe electrodes.

Abstract: A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal.

Abstract: An apparatus for testing electrical characteristics includes a probe configured to contact a test object, a DC signal transmission line configured to transmit a DC signal to the probe, a frequency signal transmission line configured to transmit a frequency signal to the probe, and a line selection unit configured to selectively connect only one of the frequency signal transmission line and the DC signal transmission line to the probe at a time in accordance with a selected test.

Abstract: A method of electrosensing an antigen in a test sample using a sensor is disclosed. The sensor has two electrodes electrically disconnected and physically separated from each other and a layer of antibody immobilized on the surface of at least one of the electrodes. The antibody has specific binding reactivity with the antigen. The method comprises tethering conductivity promotion molecules over and/or distributing between the antibody-populated electrodes for improving electrical conductivity characteristics across the two electrodes, and measuring electrically across the electrodes after the test sample comes into contact with the antibody-populated electrodes. The antibody captures the antigen present in the test sample thereby altering the improved electrical conductivity characteristic across the two electrodes in which an amount representative of the altering providing an indication for electrosensing of the antigen.

Abstract: A voltmeter/phaser includes dual hot-stick probes, each carrying a housing including a digital display, one of the housings also having a measurement circuit for measuring the sensed voltage. A plural-conductor cable interconnects the housings and carries, in two separate conductors, current between the probes and display data between the display circuits, so that identical voltage values are always displayed on the two displays.

Abstract: Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.

Abstract: A probe for use in performing impedance measurements on a subject. The probe includes a housing for being held by an operator in use, a contact surface for contacting the subject and a connector for connecting the contact surface to a measuring device.

Abstract: In one embodiment of the present invention, a probe for measuring an electrical field is disclosed, including at least one antenna, a detection circuit for each antenna, which detection circuit is connected to the corresponding antenna for detecting an RF signal, and a housing in which is received a processing circuit for processing a detected signal, wherein the housing is conductive and includes at least partially a substantially spherical surface for the purpose of forming a ground plane for the at least one antenna, wherein the detection circuit is arranged outside the housing and is coupled to the processing circuit via a feedthrough capacitor with a feedthrough terminal and a shield, wherein the feedthrough terminal connects the detection circuit conductively to the processing circuit and the shield is connected conductively to the conductive surface of the housing.

Abstract: A movement and control mechanism for operating a syringe is disclosed. The movement mechanism comprises a rotatable shaft, at least one rod disposed coaxially to the shaft and a plunger associated unit, accommodating the plunger of the syringe and axially translated upon the rotation of the shaft. An electrical sensor system implemented with the movement mechanism for detecting the plunger of the syringe, during the operation of the mechanism, is further disclosed. A control system for the movement mechanism, controlling the operation the thereof is disclosed as well.

Abstract: A device and method for monitoring the material health of a structure, providing a miniaturized MEMS Kelvin probe within a housing, wherein the Kelvin probe comprises a conductive plate formed of a stable metal and positioned substantially parallel to the structure; a piezoelectric vibrator for vibrating the conductive plate; and an electrical circuit connected to the conductive plate and the structure, wherein the conductive plate and the structure form a capacitor. The device is contained in one small, lightweight package that can be placed at one or more locations of interest. The sensor can be left in-place for continuous monitoring or for active testing at desired intervals, or be brought to the aircraft at desired intervals.

Abstract: An electrical connector adapted for staged disassembly to test for high voltage includes a plug having an enclosed electrical terminal with a first opening exposing the terminal and a socket having another enclosed electrical terminal with an opening exposing the other terminal. The socket opening is substantially complementary to the first opening to receive the plug sufficiently into the socket to electrically engage the terminals in first and second positions. A port in one of the socket or plug provides access to one of the terminals in one of the positions but is obstructed from access to a terminal in the other of the positions. The port is small enough to prevent a finger from accessing a terminal but large enough to receive an electrical meter probe for voltage testing. A latch on the box portions positions the port in each of the two positions.

Abstract: The invention provides a device for measuring the conductivity in a controlled environment and method thereof. The device comprises (i) a sample comprising a first material such as protonic conductor, (ii) an environmental medium comprising a controlled level of a second material such as water vapor, and (iii) a separator such as a sample holder. The separator isolates the sample from the environmental medium; the separator substantially prevents the first material from migrating into the environmental medium; and the separator allows the second material to migrate between the environmental medium and the sample. The invention resolves the problems of e.g. interfacial impedance, humidity equilibration and the loss of contact between the sample and the electrode upon sample shrinking.

Abstract: A nuclear magnetic resonance (NMR) magic angle spinning (MAS) probe head (1; 61) for measuring a measuring substance in an MAS rotor (21a-21c), comprises a bottom box (3) and a tube (2) mounted to the bottom box (3) and projecting from the bottom box, wherein, in the area of the end (5) of the tube (2) facing away from the bottom box (3), an MAS stator (7; 62) is disposed within the tube (2) for receiving an MAS rotor (21a-21c), and with a pneumatic sample changing system for supplying and discharging an MAS rotor (21a-21c) to/from the MAS stator (7; 62). A transport conduit (10) is provided for pneumatically transferring an MAS rotor (21a-21c) within the transport conduit (10), wherein the transport conduit (10) extends in the inside of the tube (2) from the bottom box (3) to the MAS stator (7; 62). The probe head realizes fast change between different MAS rotors and facilitates RF shielding and keeping of defined extreme temperature conditions.

Abstract: An electrical test lead probe for use with a multi-meter provides for releasable retention in and electrical contact with a terminal of an industrial terminal block. The test lead probe includes a self-adjoining electrically conducting tip that is configured for automatic releasable receipt into a terminal block socket of various styles of terminal blocks, the terminal block socket housing a terminal of the terminal block. The present terminal block probe, in one form, is permanently attached to a multi-meter test lead. In another form, the present terminal block probe is coupled to a modular multi-meter test lead. In yet another form, the present terminal block probe has a removable head incorporating an electrically conducting, self-adjoining tip wherein the body is permanently attached to a multi-meter test lead.

Abstract: A connector includes a connector body, a sensor mounted to the connector body, and a connector interface configured to connect to an external device.

Abstract: A probe for temporarily electrically contacting a solar cell for testing purposes, has at least one elastic, electrically conductive contact element for producing the electrical contact, at least one reference sensor for indicating a distance of the contact element to an external reference surface using an electrical signal of the reference sensor, and a mounting plane to which the tip of the contact element is oriented. The probe ensures a secure electrical contact of the solar cell in a testing station with minimal mechanical stress, and is also suitable for use in an industrial continuous production method.

Abstract: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an compliant or high modulus elastomeric material. A standard packaging substrate, such as a ceramic integrated circuit chip packaging substrate is used to provide a space transformer. Wires are bonded to an array of contact pads on the surface of the space transformer. The space transformer formed from a multilayer integrated circuit chip packaging substrate. The wires are as dense as the contact location array. A mold is disposed surrounding the array of outwardly projecting wires. A liquid elastomer is disposed in the mold to fill the spaces between the wires.

Abstract: In a method and devices for forming a temporary electrical contact to a solar cell for testing purposes, probes form a contact to the electrode terminals of a solar cell held by a sample holder. The probes are held by a probe holder and exhibit an elastic, electrically conductive contact element and at least one reference sensor. In order to form a contact, the solar cell and the probes are positioned in relation to each other, and then a probe is placed on an electrode terminal of the solar cell. To this end, a feed motion of the probe is carried out until a reference sensor of the probe generates a reference signal upon reaching a predefined distance. Then the feed motion is continued by a predefined path that goes beyond the contact element making contact with the electrode terminal, in order to carry out an overtravel.

Abstract: An electrical testing device used for testing an electronic device under test. The electrical testing device includes a cable configured for receiving a test signal and transmitting the received test signal therethrough, and a testing unit connected to the cable and configured for analyzing the test signal. The cable includes a flexible body, a number of first connectors connected to an end of the flexible body configured for receiving a test signal from the electronic device under test, and a second connector connected to the other end of the flexible body configured for transmitting the test signal between the flexible body and the testing unit.

Abstract: An arrangement for measuring process parameters within a processing chamber is provided. The arrangement includes a probe arrangement disposed in an opening of an upper electrode. Probe arrangement includes a probe head, which includes a head portion and a flange portion. The arrangement also includes an o-ring disposed between the upper electrode and the flange portion. The arrangement further includes a spacer made of an electrically insulative material positioned between the head portion and the opening of the upper electrode to prevent the probe arrangement from touching the upper electrode. The spacer includes a disk portion configured for supporting an underside of the flange portion. The spacer also includes a hollow cylindrical portion configured to encircle the head portion. The spacer forms a right-angled path between the o-ring and an opening to the processing chamber to prevent direct line-of-sight path between the o-ring and the opening to the processing chamber.

Abstract: An integrated hybrid microfluidic-IC platform for single cell manipulation and microscopy and method for making the platform. In particular, the integrated platform can incorporate a planar microcoil embedded in a silicon substrate that is subsequently used to fabricate a CMOS IC for the platform. The CMOS IC circuitry provides a two dimensional array of microsites that can incorporate an electrode (microelectrode), sensors, and control logic. A direct conversion receiver (DCR) can also be embedded within the CMOS circuitry to create an integrated IC platform. A microfluidic chamber can be formed on the integrated IC platform. The integrated hybrid platform can provide an increased sensitivity for mass limited samples and high resolution manipulation of biological cells. In addition, individual cell manipulation can be performed via dielectrophoresis (DEP).

Abstract: An NMR probe which includes a probe matrix (24) having a void sample (28) volume therein. A conductive coil (16, 26) can be at least partially embedded in the probe matrix (24). By embedding the conductive coil (16, 26) in the probe matrix (24), the fill-factor can be significantly increased. NMR probes can be formed by a method which includes wrapping a conductive wire (16) around a coil form (18) to produce a coil precursor assembly. The probe matrix (24) can be formed around the conductive wire and coil form with a matrix material using any suitable technique such as soft lithography and/or molding. The coil form can be removed from the probe matrix leaving a void sample volume (28) in the probe matrix. Advantageously, the NMR probes of the present invention allow for fill-factors approaching and achieving 100%.

Abstract: An object of the present invention is to provide a cooled NMR probe including an antenna coil and capable of decreasing an operation temperature of the antenna coil by effectively cooling the antenna coil, thereby increasing detection sensitivity of an NMR signal. To attain this, a probe head according to the present invention includes a coil support member which supports the antenna coil, and a cooling member arranged around at least a portion of the coil support member, the cooling member providing a cooling space between the cooling member and the coil support member, the cooling space allowing a refrigerant to circulate therethrough. The cooling member is coupled to the coil support member such that the refrigerant flowing in the cooling space directly contacts an outer peripheral surface of the coil support member.

Abstract: A system (100) including a catheter mounted magneto sensor (114), such as a superconducting quantum interference device (SQUID), and methods using the system are disclosed, where the system and method are designed to detect changes in a magnetic field in a body of interest, such as a patient, to detect changes in a magnetic field in a patient, to identify loci in a target body that accumulate magnetic particles or to identify vulnerable plague in a patient.

Abstract: A marine electromagnetic acquisition apparatus includes a sensor module having at least one sensor associated therewith. A sensor arm assembly is coupled to the sensor module. The sensor arm assembly has at least one sensor arm and at least one sensor disposed along the at least one sensor arm. An actuator is coupled to the sensor arm assembly for moving the sensor arm assembly between a folded position and an unfolded position.

Abstract: The subject of the invention is superparamagnetic nanoparticle probes based on iron oxides, to advantage magnetite or maghemite, with modified surface, coated with mono-, di- or polysaccharides from the group including D-arabinose, D-glucose, D-galactose, D-mannose, lactose, maltose, dextrans and dextrins, or with amino acids or poly(amino acid)s from the group including alanine, glycine, glutamine, asparagine, histidine, arginine, L-lysine, aspartic and glutamic acid or with synthetic polymers based on (meth)acrylic acid and their derivatives selected from the group containing poly(N,N-dimethylacrylamide), poly(N,N-dimethylmethacrylamide), poly(N,N-diethylacrylamide), poly(N,N-diethylmethacrylamide), poly(N-isopropylacrylamide), poly(N-isopropylmethacrylamide), which form a colloid consisting of particles with narrow distribution with polydispersity index smaller than 1.3, the average size of which amounts to 0.5-30 nm, to advantage 1-10 nm, the iron content is 70-99.9 wt. %, to advantage 90 wt.

Abstract: A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling.

Abstract: A magnetic field probe comprises a sample (4) that exhibits magnetic resonance at an operating frequency, an electrically conductive structure (8) surrounding the sample for receiving a magnetic resonance signal therefrom, and a solid jacket (12) encasing the sample and the conductive structure. The jacket is made of a hardened two-component epoxy system containing a paramagnetic dopant dissolved therein, with the concentration of the dopant being chosen such that the jacket has a magnetic susceptibility that is substantially identical to the magnetic susceptibility of the conductive structure.

Abstract: The present invention relates to a method and apparatus for enhancing the electron transport property measurements of a molecule when the molecule is placed between chemically functionalized carbon-based nanoscopic electrodes to which a suitable voltage bias is applied. The invention includes selecting a dopant atom for the nanoscopic electrodes, the dopant atoms being chemically similar to atoms present in the molecule, and functionalizing the outer surface and terminations of the electrodes with the dopant atoms.

Abstract: A probe for measuring electrical characteristics of an excitation current of a plasma is provided. The probe is mounted on a conductive line that includes an inner conductor and an outer conductor. The probe includes a current sensor and a voltage sensor. The current sensor includes a groove formed in the ground of one of the conductors in order to form a detour for the current flowing through the conductor, and a point for measuring electric voltage between a ground connected to the conductor and a point of the groove. The current sensor thus is able to measure a voltage proportional to the first time derivative of intensity (Iplasma) of the excitation current. The voltage sensor is a shunt sensor capable of measuring a voltage proportional to the first time derivative of the voltage (Vplasma) of the excitation current. A plasma reactor including a probe of the aforementioned type is also provided.

Abstract: A method of enabling triggering an oscilloscope includes placing a tip portion of a probe, electrically connected to the oscilloscope, on an electrical circuit, applying pressure to the probe tip, and establishing an electrical contact inside the probe as a result of pressure applied to the probe tip. The electrical contact closes an electrical circuit that triggers the oscilloscope.

Abstract: Disclosed are various embodiments of methods and systems related to stimulus responsive nanoparticles. In one embodiment includes a stimulus responsive nanoparticle system, the system includes a first electrode, a second electrode, and a plurality of elongated electro-responsive nanoparticles dispersed between the first and second electrodes, the plurality of electro-responsive nanorods configured to respond to an electric field established between the first and second electrodes.

Abstract: A probe (100) is provided with: a support member having a through-hole in at least one portion thereof; a projection standing on the support member with its tip facing a medium; and a conductive film formed to cover at least a partial surface of the support member including a side surface of the through-hole.

Abstract: A differential probe device is provided that has a scissor-type configuration that allows the inter-tip ground path length to be very short, thereby ensuring that the probe device will have a small ground inductance. Providing the probe device with a small ground inductance ensures that the ground inductance will not cause the bandwidth of the probe device to be unduly limited, even at higher frequencies. The configuration of the probe device also enables the ground areas on the arms to remain in continuous contact over the range of available span widths between the tips, which also helps to ensure that the ground inductance is kept small and generally fixed. Also, the configuration of the probe device enables the proximal ends of the probe arms to be kept small in size to accommodate DUT layouts having small test features and/or test features that are close together.

Abstract: A determination of an equivalent series resistance (ESR) effect for high frequency filtering performance of a filtered feed-through assembly is described. A low frequency signal is introduced to a filtered feed-through assembly. ESR limit of the filtered feed-through is determined based on the low frequency signal.

Abstract: An electric meter having a detachable measuring bar includes a main body, a first measuring bar and a second measuring bar assembly. One end of the main body is formed with a supporting portion. The first measuring bar has a connecting portion and a probe formed at the other end of the connecting portion. The connecting portion is detachably connected with the supporting portion of the main body. The second measuring bar assembly comprises a second measuring bar and a lead. Both ends of the lead are connected to the main body and the second measuring bar. Via this arrangement, when the first measuring bar is worn or damaged in use, the first measuring bar can be replaced, thereby reducing the purchasing cost of the electric meter.

Abstract: Vertical contactors regularly arrayed over a film is brought into vertical contact with the end faces of wiring terminals formed at one end of a flexible flat cable, and signal lines from a narrowed-pitch contactor array are connected to a printed circuit board. For this purpose, there is to be realized a coordinate transforming apparatus for electrical signal connection including: a device that has probe input terminals and probe output terminals arrayed in narrow-pitch lines which come into contact with and establish continuity to a wafer pad and in which the probe output terminals are arrayed two-dimensionally in a wide pitch over a substantial plane; a y-directional wiring group in which the probe output terminals and transformation wiring input terminals cross each other to come into contact with and establish continuity among each other; and an x-directional wiring group that crosses and establishes continuity to the output terminals of the y-directional wiring group.

Abstract: A monolithic pair of nanoscale probes, including: a substrate having a cavity that extends from a surface of the substrate into its body; a dielectric layer formed on the substrate; a pair of nanoscale probe precursors formed over the dielectric layer; a plurality of sub-monolayers of electrode material selectively atomic layer deposited over the pair of nanoscale probe precursors. The dielectric layer includes a window that extends through it to the cavity of the substrate such that a portion of the dielectric layer adjacent to the window extends over the cavity. The pair of nanoscale probe precursors includes a pair of edges facing each other across the window. These edges correspond to tips of the pair of nanoscale probes. The sub-monolayers of electrode material include the pair of edges, so that a distance between the tips of the nanoscale probes is between about 0.1 nm and about 20 nm.

Abstract: A test pin includes a compression element (110), a first tip (120) physically coupled to a first end (111) of the compression element, a second tip (130) physically coupled to a second end (112) of the compression element, a first arm (140) physically coupled to a first side (121) of the first tip, and a second arm (150) physically coupled to a second side (122) of the first tip.

Abstract: An elongated, spring-biased, connector clip carries, at a distal end thereof, a plurality of electrical contacts. The clip can be used to access a plurality of terminals or contact points in an electrical unit which are not readily accessible. Distal ends of the clip are spring-biased to move toward one another so as to clamp the electrical terminals or contact points of interest. An open region is provided between the elongated fingers of the clip so that other electrical devices in the case can be avoided during insertion and use of the clip for diagnostic or test purposes.

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.