Hysteresis Or Eddy Current Loss Testing Patents (Class 324/222)
  • Patent number: 7911205
    Abstract: A method of inspecting a test part is provided. The method includes positioning a coil on a surface of the test part and exciting the coil at a resonance frequency. The method also includes determining at least one of a resonance frequency shift and a quality factor of the coil and estimating an electrical conductivity of the test part based on at least one of the resonance frequency shift and the quality factor of the coil. The method further includes obtaining depth profile of residual stress using conductivity measurements at various resonance frequencies.
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: March 22, 2011
    Assignee: General Electric Company
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Patent number: 7830140
    Abstract: A method of inspecting a test part is provided. The method includes positioning an eddy current probe on a surface of the test part and scanning the test part using the eddy current probe to generate a first signal corresponding to a no lift-off condition of the test part. The method further includes positioning the eddy current probe at a pre-determined distance from the surface of the test part and scanning the test part using the eddy current probe positioned at the pre-determined distance from the test part to generate a second signal corresponding to a lift-off condition of the test part. The method also includes processing the first and second signals to estimate an electrical conductivity of the test part.
    Type: Grant
    Filed: August 7, 2007
    Date of Patent: November 9, 2010
    Assignee: General Electric Company
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Patent number: 7822562
    Abstract: Method for removing air wave noise from shallow water controlled source electromagnetic survey data, using only the measured data and conductivity values for sea water (140) and air. The method is a calculation performed numerically on CSEM data and resulting in an estimate of those data that would have been acquired had the water layer extended infinitely upward from the seafloor. No properties of the sub-sea sediments are used. Synthetic electromagnetic field data are generated for (a) an all water model (141) and (b) an air-water model (146-147) of the survey region. These simulated results are then used to calculate (148-150) electromagnetic field values corresponding to a water-sediment model with water replacing the air half space, which represent measured data adjusted to remove air wave noise.
    Type: Grant
    Filed: May 18, 2007
    Date of Patent: October 26, 2010
    Assignee: ExxonMobil Upstream Research Co.
    Inventor: Willen E. Dennis
  • Patent number: 7795863
    Abstract: A coil for use in an eddy current sensing probe is formed through depositing film traces. The film traces can be directly deposited. The film traces can be deposited on the outer surface of a core or on ends of the core. The film traces can be deposited onto non-planar surfaces other than cores for the inspection of parts having complex geometries. The coil can be used in a single coil probe or in a probe having a sensor array.
    Type: Grant
    Filed: February 23, 2005
    Date of Patent: September 14, 2010
    Assignee: Iowa State University Research Foundation, Inc.
    Inventors: Marcus James Johnson, Norio Nakagawa
  • Patent number: 7755351
    Abstract: Inconsistencies in a reinforced resin matrix part are detected using an inductive coupling probe connected with or part of a tuned resonant circuit. An alternating magnetic field produced by the probe is coupled to the part and produces eddy currents in the part. Inconsistencies in the part result in changes in the complex impedance and/or resonance of the circuit which are detected by a network analyzer.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: July 13, 2010
    Assignee: The Boeing Company
    Inventor: Steven K. Brady
  • Publication number: 20100117636
    Abstract: On a friction stir spot welded workpiece having a first side including a friction stir spot weld hole and an opposing smooth second side, an eddy current probe is passed over the spot weld hole from the second side, and an eddy current signal representative of a material thickness of the workpiece is produced. The eddy current is analyzed via an eddy current analyzer, and a graphic representation of the analyzed eddy current signal is monitored as the probe passes over the spot weld hole, and a local minima of the graphic representation defined by a displayed characteristic J-shaped curve is identified, the local minima defining a remaining material thickness of the workpiece at the bottom of the spot weld hole. From the graphic representation, a value of the remaining material thickness is determined, and a weld strength of the spot weld as a function of the remaining material thickness is determined.
    Type: Application
    Filed: October 12, 2009
    Publication date: May 13, 2010
    Applicant: GM GLOBAL TECHNOLOGY OPERATIONS, INC.
    Inventor: Cameron John Dasch
  • Publication number: 20090263918
    Abstract: Methods and apparatuses are provided for calibrating eddy current sensors. A calibration curve is formed relating thickness of a conductive layer in a magnetic field to a value measured by the eddy current sensors or a value derived from such measurement, such as argument of impedance. The calibration curve may be an analytic function having infinite number terms, such as trigonometric, hyperbolic, and logarithmic, or a continuous plurality of functions, such as lines. Such curves can reduce the number of wafers used in the calibration of the sensors while providing higher accuracy over a larger thickness range. High accuracy allows the omission of optical sensors, and use of eddy current sensors for endpoint detection, transition call detection, and closed loop control in which a process parameter is changed based on the measured magnetic flux density change in one or more processing zones.
    Type: Application
    Filed: April 17, 2008
    Publication date: October 22, 2009
    Applicant: Novellus Systems, Inc.
    Inventors: Sudeep Kumar Lahiri, Paul Franzen
  • Publication number: 20090251135
    Abstract: The present invention relates to a method for evaluating the SOI wafer in a method for evaluating an SOI wafer in which a sheet resistance of a buried diffusion layer of an SOI wafer that has at least an SOI layer on an insulator layer and has a buried diffusion layer whose impurity concentration is higher than other region of the SOI layer in an interface area with the insulator layer of the SOI layer is evaluated, the method including the steps of measuring a sheet resistance of the whole SOI layer or the whole SOI wafer, and estimating the sheet resistance of the buried diffusion layer by assuming respective layers that compose the SOI wafer to be resistors connected in parallel and converting the measured result of the sheet resistance measurement. As a result of this, there is provided a method for evaluating the SOI wafer that can directly measure the SOI wafer itself to be the product to thereby evaluate the sheet resistance of the buried diffusion layer thereof, without fabricating a monitor wafer.
    Type: Application
    Filed: May 10, 2007
    Publication date: October 8, 2009
    Applicant: SHIN-ETSU HANDOTAI CO., LTD
    Inventor: Kazuhiko Yoshida
  • Patent number: 7573950
    Abstract: An IBOC broadcasting receiver that uses two different bit error rates as threshold values in receiving hybrid broadcasting in a simultaneous broadcasting format, and switches between digital broadcasting reception and analog broadcasting reception based on the two threshold values. The IBOC broadcasting receiver counts the number of occurrences of switching between digital broadcasting reception and analog broadcasting reception in a specified period of time, and increases a hysteresis width between the two threshold values when the number of occurrences of switching counted exceeds a specified number.
    Type: Grant
    Filed: June 16, 2004
    Date of Patent: August 11, 2009
    Assignee: Kabushiki Kaisha Kenwood
    Inventor: Yasuhiro Shimizu
  • Publication number: 20090079424
    Abstract: A method of inspecting a test part is provided. The method includes positioning a coil on a surface of the test part and exciting the coil at a resonance frequency. The method also includes determining at least one of a resonance frequency shift and a quality factor of the coil and estimating an electrical conductivity of the test part based on at least one of the resonance frequency shift and the quality factor of the coil. The method further includes obtaining depth profile of residual stress using conductivity measurements at various resonance frequencies.
    Type: Application
    Filed: September 25, 2007
    Publication date: March 26, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Patent number: 7504262
    Abstract: The present invention generally relates to the field of biomolecule detection. More specifically, the present invention relates to compositions, methods and systems for the detection and manipulation of biomolecules using magnetic particles.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: March 17, 2009
    Inventor: John Fox
  • Publication number: 20090039878
    Abstract: A transparent conductive film roll which has a transparent conductive layer on at least one surface thereof and has an excellent distribution uniformity of surface resistance in longitudinal and lateral directions thereof wherein the distribution uniformity D of surface resistance defined by the following expression (1) is 0.2 or less when the surface resistance of the transparent conductive layer is measured at a total of 33 points within the film roll, and therefore, is suitable especially for a large panel, D=(Rmax?Rmin)/(Rmax+Rmin)??(1) where Rmax and Rmin represent the maximum and minimum values of 33 surface resistance measurement values.
    Type: Application
    Filed: September 17, 2008
    Publication date: February 12, 2009
    Inventors: Toshiyuki OYA, Hideo Murakami, Chikao Morishige, Yuji Kakita, Hideki Jinbou, Kenjiro Ueda, Takahiro Kubota
  • Publication number: 20090039877
    Abstract: A method of inspecting a test part is provided. The method includes positioning an eddy current probe on a surface of the test part and scanning the test part using the eddy current probe to generate a first signal corresponding to a no lift-off condition of the test part. The method further includes positioning the eddy current probe at a pre-determined distance from the surface of the test part and scanning the test part using the eddy current probe positioned at the pre-determined distance from the test part to generate a second signal corresponding to a lift-off condition of the test part. The method also includes processing the first and second signals to estimate an electrical conductivity of the test part.
    Type: Application
    Filed: August 7, 2007
    Publication date: February 12, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Nilesh Tralshawala, Yuri Alexeyevich Plotnikov
  • Patent number: 7486068
    Abstract: A rotating head for a device for the nondestructive testing of metallic test specimens has probe carriers, stray flux or eddy current sensors, a coupling ring and elastic coupling elements. In this way, tandem-like, roughly forced coupling of the pivoting motions of the probe carriers is produced.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: February 3, 2009
    Assignee: Prueftechnik Dieter Bush AG
    Inventor: Bernd Zimmermann
  • Publication number: 20080258717
    Abstract: The present invention relates to a magnetic induction tomography system and method for studying the electromagnetic properties of an object. In order to provide a high resolution MIT technique without the need of increasing the number of coils, a magnetic induction tomography system (1) for studying the electromagnetic properties of an object (2) is suggested, the system comprising one or more generator coils (4) adapted for generating a primary magnetic field, said primary magnetic field inducing an eddy current in the object (2), one or more sensor coils (5) adapted for sensing a secondary magnetic field, said secondary magnetic field being generated as a result of said eddy current, and means (6, 7, 8, 9) for providing a relative movement between one or more generator coils (4) and/or one or more sensor coils (5) on the one hand and the object (2) to be studied on the other hand.
    Type: Application
    Filed: December 14, 2006
    Publication date: October 23, 2008
    Inventors: Claudia Hannelore Igney, Robert Pinter, Olaf Such
  • Publication number: 20080174306
    Abstract: Inconsistencies in a reinforced resin matrix part are detected using an inductive coupling probe connected with or part of a tuned resonant circuit. An alternating magnetic field produced by the probe is coupled to the part and produces eddy currents in the part. Inconsistencies in the part result in changes in the complex impedance and/or resonance of the circuit which are detected by a network analyzer.
    Type: Application
    Filed: January 23, 2007
    Publication date: July 24, 2008
    Inventor: Steven K. Brady
  • Patent number: 7403001
    Abstract: A method of determining a mass variation of a conductive film on a substrate with an area, an edge zone, and a center zone, is disclosed. The method includes providing a measured conductive film mass of a conductive film on a substrate. The method also includes positioning a sensor near a set of positions on the substrate; measuring using the sensor a set of electrical responses; and correlating the set of electrical responses to a set of conductive film thicknesses. The method further includes estimating a volume of the conductive film based at least in part on the set of conductive film thicknesses and the area; and estimating a derived conductive film mass based in part on the volume and a conductive film density, wherein the mass variation is a difference between the measured conductive film mass and the derived conductive film mass.
    Type: Grant
    Filed: March 29, 2005
    Date of Patent: July 22, 2008
    Assignee: Lam Research Corporation
    Inventor: Andrew D. Bailey, III
  • Publication number: 20080100288
    Abstract: A seal inspector and a method of inspecting a seal are described. A seal inspector includes an eddy current sensor for detecting changes in an eddy current within a lid seal of a can. The eddy current sensor includes a signal line for creating a magnetic field, which induces the eddy current. The induced eddy current generates a magnetic field that acts on the alternating current and as a consequence produces an eddy current response. A signal processing control unit receives the eddy current response and determines whether a value associated with the eddy current has surpassed a threshold value. If the associated value has surpassed the threshold value, the can may be ejected from a can conveyor system.
    Type: Application
    Filed: October 25, 2006
    Publication date: May 1, 2008
    Applicant: Campbell Soup Company
    Inventors: Eric Leung, Alexander Skulartz, Bob Aguero, Brad K. Menees, Francis Tan, Frank J. Harder, John Knapp, Tom Braydich
  • Patent number: 7299150
    Abstract: In an ultrasonic flow meter for measuring a flow rate of a fluid flowing through a conduit by detecting a propagating time difference between a forward propagating time of an ultrasonic wave propagating within the conduit in a forward direction and a backward propagating time of an ultrasonic wave propagating within the conduit in a backward direction, forward and backward ultrasonic wave signals generated by ultrasonic vibrating elements are sampled to derive forward and backward digital data series x and y, which are stored in a memory, the forward and backward digital data series x and y are read out of the first and second memory units and total sums of absolute difference values between the forward and backward digital data series x and y are calculated, while data positions of these backward and forward digital data series x and y are relatively shifted, a shift amount of data positions at which a total sum of absolute difference values becomes minimum is detected, an ultrasonic propagating time differe
    Type: Grant
    Filed: November 2, 2006
    Date of Patent: November 20, 2007
    Assignee: Tokyo Keiso Co., Ltd.
    Inventors: Tokio Sugi, Tadao Sasaki
  • Patent number: 7289913
    Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: October 30, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark D. Windoloski
  • Patent number: 7288941
    Abstract: A method and related apparatus for non-contact measurement of electrical conductivity of powder-like materials using eddy currents includes the steps of placing a powder to be measured in a hollow dielectric sampling container, the sampling container disposed and freely axially moving within an outer dielectric housing. An eddy-current sensor including a winding is arranged on an outside surface of the housing. Current is forced in the winding to excite the powder to generate eddy currents. The introduced active resistance is measured at the eddy-current sensor and an electrical conductivity of the powder is determined using the measured active resistance. The powder is preferably vibration compacted and the density and electrical conductivity determined at a plurality of stages during the vibration compacting step.
    Type: Grant
    Filed: October 6, 2005
    Date of Patent: October 30, 2007
    Inventors: Volodymyr Redko, Volodymyr Khandetskyy, Peter Novak, Elena Shembel, Satoshi Kohara
  • Patent number: 7267020
    Abstract: An inspection device for performing nondestructive testing on a test subject includes a manually controlled inspection cart. The inspection device also includes a nondestructive testing platform and a computer coupled to the inspection cart. The computer is operable to control the movement of the nondestructive testing device when the inspection device is within a predetermined distance from the test subject.
    Type: Grant
    Filed: August 31, 2005
    Date of Patent: September 11, 2007
    Assignee: Honeywell International, Inc.
    Inventors: David E. Wilcox, Timothy R. Duffy
  • Patent number: 7256577
    Abstract: An eddy current detection system configured in accordance with an example embodiment of the invention employs a high frequency rotary eddy current probe that is capable of detecting very shallow surface imperfections, including imperfections originating at scribe lines located near lap joints on an aircraft fuselage. The rotary eddy current probe includes a differential sensing coil arrangement surrounded by a reflection coil, both of which are located within the probe tip housing of the rotary eddy current probe. The differential sensing coil arrangement and the reflection coil are positioned off-axis within the rotary eddy current probe. In addition, the rotary eddy current probe employs a partial electromagnetic shield that does not completely surround the differential sensing coil arrangement.
    Type: Grant
    Filed: April 7, 2005
    Date of Patent: August 14, 2007
    Assignee: The Boeing Company
    Inventors: John R. Linn, Joseph F. Floyd
  • Patent number: 7256576
    Abstract: A sensor body for use in a pig for determining characteristics of a pipeline wall though which the pig passes includes a circuit board and a single coil wrapped around the circuit board. A microcontroller is mounted to the circuit board and connected to the single coil and configured to induce a waveform on the coil to thereby create an eddy current in the pipeline wall adjacent the sensor body. The microcontroller is also configured to measure changes in a characteristic of the induced waveform on the single coil that correspond to the presence of anomalies on an inside diameter of the pipeline wall. The sensor body also includes a sensor body cover molded about the circuit board, the microcontroller and the single coil. The sensor body cover consists essentially of a wear resistant, non-conductive material that includes a polymer material.
    Type: Grant
    Filed: July 29, 2005
    Date of Patent: August 14, 2007
    Assignee: General Electric Company
    Inventors: Michael William Mandziuk, Paul Douglas Gies
  • Patent number: 7209839
    Abstract: A method for determining a power flow in a distribution network includes the step of determining an admittance matrix for a circuit that includes a floating transformer in an electrical power distribution system. The admittance matrix includes an admittance of a fictitious shunt connected between a non-grounded winding of the floating transformer and ground. The method also includes the step of obtaining real time power measurements from a portion of the electrical power distribution system including the floating load transformer. The method further includes solving the power flow using the admittance matrix and the real time power measurements.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: April 24, 2007
    Assignee: Siemens Power Transmission & Distribution, Inc.
    Inventor: Ilya Roytelman
  • Patent number: 7110897
    Abstract: The subject apparatus and method measures the Total Average Power Loss and isolates the different power loss components of Total Average Loss such as Ton Loss and Toff loss at switching devices such as, MOSFETs, BJTs and IGBTs that may be used in a switching power supply. It provides separation of the components of Total Average Loss as Turn Ton Loss, Turn Toff Loss and allows derivation of conduction loss. It also has the capability to measure Total Average Loss and Switching Loss, while amplitude, duty cycle and frequency of the switching signal is varying in a switching power supply.
    Type: Grant
    Filed: September 20, 2004
    Date of Patent: September 19, 2006
    Assignee: Tektronix, Inc.
    Inventors: Srikrishna H. Nadig, Godfree Coelho
  • Patent number: 6987390
    Abstract: Testing a transformer by applying to the transformer a test signal, the frequency of which may be lower than the nominal frequency of the transformer. The voltage of the test signal may also be lower than the nominal voltage of the transformer. A number of frequency-dependent parameters are measured, particularly the eddy current resistance and the hysteresis curve of the transformer, in order to derive a simulation model which simulates the behavior of the transformer at different frequencies. Using this simulation model, it is possible to predict operating parameters of the transformer, such as the terminal voltage on the secondary and the terminal current in the secondary, during operation with a frequency deviating from the frequency of the test signal, particularly during operation with the nominal frequency of the transformer.
    Type: Grant
    Filed: September 11, 2003
    Date of Patent: January 17, 2006
    Assignee: Omicron Electronics GmbH
    Inventors: Franz Süss, Michael Krüger, Friedrich Kaufmann
  • Patent number: 6975108
    Abstract: A non-contact printed circuit board (PCB) electromagnetic testing system comprises at least one high resolution transducer operative to induce multi-frequency, multi-amplitude eddy currents in a tested PCB, each such transducer including both a high frequency excitation coil that serves also as a sensing coil and a direct current (DC) bias coil operative to provide an optimal transducer operating regime; a multi-frequency generator for providing AC and DC bias signals to each transducer; and a control mechanism for driving the transducer. Optionally, the system further comprises an external ferrite concentrator that enhances a magnetic field flux focus and depth of focus on the inspected PCB. The multi-frequency, multi-amplitude methods enable three-dimensional mapping of various features in the PCB with both high sensitivity and high resolution in respective operating regimes.
    Type: Grant
    Filed: November 13, 2003
    Date of Patent: December 13, 2005
    Inventors: Yuli Bilik, Eytan Keydar, Vladimir Boroda
  • Patent number: 6851541
    Abstract: A coin discriminator has a coin path along which a coin, containing a first portion and a second portion made of different metals and/or metal alloys, is arranged to pass. An electrical mechanism supplies time-varying drive signals to the coil mechanism. A detection mechanism detects eddy currents induced in the coin by the coil mechanism. The coil mechanism is arranged to induce in the coin an eddy current loop, which in a predetermined region of the coin crosses a bond between the first and the second portions of the coin.
    Type: Grant
    Filed: January 26, 1999
    Date of Patent: February 8, 2005
    Assignee: Scan Coin Industries AB
    Inventor: Geoffrey Howells
  • Patent number: 6850077
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Grant
    Filed: May 30, 2003
    Date of Patent: February 1, 2005
    Assignee: Bently Nevada, LLC
    Inventor: Richard D. Slates
  • Patent number: 6832179
    Abstract: A signal processor, for use with a zero crossing module of a vortex flow meter, includes a peak amplitude detector, a comparator, and a filter module. The filter module is enabled when the comparator determines that the amplitude is less than a low flow rate threshold. The filter module filters a vortex signal and the filtered signal is provided to a frequency estimator that uses a zero crossing algorithm. The signal processor may increase the signal-to-noise ratio at low flow rates for which the frequency estimator may not otherwise be able to accurately estimate the flow rate. Low flow rates may be measured by determining that there is a low flow rate using amplitude detection of a vortex signal, filtering the vortex signal based on the amplitude detection, and using a zero crossing algorithm on the filtered vortex signal.
    Type: Grant
    Filed: June 24, 2002
    Date of Patent: December 14, 2004
    Assignee: Invensys Systems, Inc.
    Inventors: Tarek Ghaoud, David W. Clarke
  • Publication number: 20040100270
    Abstract: An automated tool for performing an EL CID inspection of the step iron region of a generator stator that can be employed with the rotor in place. The tool has a track that is axially cantilevered at one end and supported magnetically within a stator slot adjacent the region to be monitored. The track has a smoothly rounded contour that approximately conforms to the profile of the stator step region. A carriage carrying a pickup coil is slideably mounted on the track and is driven back and forth along the track over the area to be inspected by a remotely-operated drive system. A video camera is mounted on the track and provides a remote visual indication of the location of the carriage relative to the stator.
    Type: Application
    Filed: November 12, 2002
    Publication date: May 27, 2004
    Applicant: Siemens Westinghouse Power Corporation
    Inventors: Mark W. Fischer, George F. Dailey, James A. Bauer
  • Publication number: 20040088139
    Abstract: A method of predicting the performance of certain electromagnetic devices is based on the integrated average core loss (IACL) and the integrated average relative permeability (IAP) of the electromagnetic core material used in the devices. The method includes the steps of establishing the range of induced magnetic fields over which the device is designed to operate, measuring the core loss and relative permeability of the core material over the range of induced fields and calculating the IACL and IAP over the range. Performance parameters can then be predicted using equations based on the IACL and the IAP with coefficients and constants derived through linear regression analysis.
    Type: Application
    Filed: August 15, 2003
    Publication date: May 6, 2004
    Inventor: Kenneth E. Blazek
  • Publication number: 20030173958
    Abstract: Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for grinding burn damage. The sensor arrays can be mounted inside or scanned across the inner surface of test articles and hollow fasteners to monitor stress distributions. A technique for placing eddy-current coils around magnetizable fasteners for load distribution monitoring is also disclosed.
    Type: Application
    Filed: January 24, 2003
    Publication date: September 18, 2003
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, James M. Fisher, David C. Grundy, Darrell E. Schlicker, Vladimir Tsukernik, Robert J. Lyons, Ian C. Shay, Andrew P. Washabaugh
  • Patent number: 6552536
    Abstract: A reference standard and method for inspecting dual-layered coatings. The reference standard has a first layer adherent to a substrate, the first layer has a predetermined thickness that increases in one direction. Adherent to the first layer is a second layer, the second layer has a predetermined thickness that increases in a direction orthogonal with the first layer. The orientation of the first and second layers of the reference standard provides a spectrum of the possible variations of the dual-layered coating.
    Type: Grant
    Filed: June 17, 2002
    Date of Patent: April 22, 2003
    Assignee: General Electric Company
    Inventor: Richard L. Trantow
  • Patent number: 6526114
    Abstract: An inspection apparatus for inspecting welds in a nuclear reactor jet pump includes a probe subassembly rotatably and linearly movably coupled to a frame structure configured to attach to a top flange of the reactor pressure vessel. The probe subassembly includes a plurality of probe arms pivotably coupled to a housing, with each probe arm including a sensor. The probe arms are pivotably movable between a first position where the probe arms are parallel to a longitudinal axis of the probe subassembly, and a second position where the probe arms are at an angle to the longitudinal axis of the probe subassembly. An insertion subassembly couples to the jet pump suction inlet. The insertion subassembly is sized to receive the probe subassembly and guide the probe subassembly into the jet pump through the jet pump suction inlet.
    Type: Grant
    Filed: May 24, 2001
    Date of Patent: February 25, 2003
    Assignee: General Electric Company
    Inventors: Rodolfo Paillaman, Diego Molpeceres Prieto
  • Patent number: 6462538
    Abstract: The sheet resistance meter has: a coil which produces a magnetic field; a sensor head provided to enable the magnetic field to induce eddy currents in a thin film formed on a substrate so that the lines of a magnetic force exerted by the magnetic field extend on one side of the substrate; a control device for detecting the sheet resistance of the thin film according to a variation of the magnetic field caused by the eddy currents; a capacitor for achieving resonance with the coil; and a groove section, a primary air port, an auxiliary air port, and a side air port, provided in the sensor head, for controlling the temperature of the coil. The arrangement stabilizes results of the measurement of a sheet resistance by a sheet resistance meter of a one-sided eddy current detection type when it is used continuously.
    Type: Grant
    Filed: December 6, 2000
    Date of Patent: October 8, 2002
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Yoshinori Harada
  • Patent number: 6100685
    Abstract: A high frequency magnetic properties measuring system is used for measurement of high frequency magnetic properties, for example high frequency core-loss and magnetic hysteresis curve (coercivity force, magnetic flux density, permeability) in soft magnetic materials such as ferrites, permalloy and amorphous magnetic cores used in inductors, transformers and filters of various electric and electromagnetic systems and devices such as computers and multimedia devices. A digital oscilloscope is operated as a waveform detection unit for measuring magnetic fields and magnetic flux density. A signal generator and a power amplifier are operated as a signal input unit. The digital oscilloscope and the signal generator are remotely controlled through a General Purpose Interface Bus by the computer. The high frequency magnetic properties are measured by remote control and the resulting data can be outputted and stored by the computer.
    Type: Grant
    Filed: February 19, 1998
    Date of Patent: August 8, 2000
    Assignee: Korea Electrotechnology Research Institute
    Inventors: Ki Uk Kim, Jae Sung Song
  • Patent number: 5479099
    Abstract: A magnetic inspection head adapted for use with samples having non-planar surfaces. A magnetically permeable core has a pair of poles joined by a magnetically permeable bridge to form a closed magnetic circuit between the pole legs, bridge and the test material. Each pole has magnetically permeable support means terminating in a magnetically permeable deformable surface for engaging the sample. The support means is yieldable such that when the inspection head is placed in contact with the irregular surface of the sample, the deformable surface is deformed to accommodate the shape of the sample with minimal air gaps therebetween. Preferably, the deformable surface is provided by a plurality of pins slidably engaged in a pole structure and urged outwardly for contact with and conformance with a non-planar sample surface.
    Type: Grant
    Filed: October 18, 1993
    Date of Patent: December 26, 1995
    Assignee: Iowa State University Research Foundation, Inc.
    Inventors: David C. Jiles, David A. Kaminski
  • Patent number: 5287056
    Abstract: A method and apparatus are disclosed for measuring the magnetic properties of magnetic materials by generating flux lines through a balanced magnetic core and through a magnetic sample placed adjacent to the core. Increased sensitivity is accomplished through a modulation of the flux in the magnetic core which is measured and subsequently demodulated to yield an electrical signal corresponding to the magnetic properties of the material being tested.
    Type: Grant
    Filed: May 14, 1992
    Date of Patent: February 15, 1994
    Assignee: LDJ Electronics, Inc.
    Inventors: Leon D. Jackson, Dan O. Morris
  • Patent number: 5215603
    Abstract: A method of primary recrystallization annealing grain-oriented electrical steel strip comprises the steps of conducting online measurement of the primary recrystallization grain diameter of the steel after primary recrystallization annealing and, based on the result of this measurement, controlling the primary recrystallization grain diameter of the steel after primary recrystallization annealing by varying either or both of the annealing temperature and the pass velocity during the primary recrystallization annealing. The method enables stable production of grain-oriented electrical steel strip exhibiting good secondary recrystallization and excellent electrical properties.
    Type: Grant
    Filed: July 17, 1991
    Date of Patent: June 1, 1993
    Assignee: Nippon Steel Corporation
    Inventors: Tadashi Nakayama, Yasunari Yoshitomi
  • Patent number: 5193395
    Abstract: A device for the determination of residual stress in a material sample consisting of a sensor coil, adjacent the material sample, whose resistance varies according to the amount of stress within the material sample, a mechanical push-pull machine for imparting a gradually increasing compressional and tensional force on the material sample, and an impedance gain/phase analyzer and PC for sending an input signal to and receiving an input signal from the sensor coil. The PC will measure and record the change in resistance of the sensor coil and the corresponding amount of strain of the sample. The PC will then determine from the measurements of change of resistance and corresponding strain of the sample the point at which the resistance of the sensor coil is at a minimum and the corresponding value and type of strain of the sample at that minimum resistance point thereby enabling a calculation of the residual stress in the sample.
    Type: Grant
    Filed: December 2, 1991
    Date of Patent: March 16, 1993
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Engmin J. Chern, Yury Flom
  • Patent number: 5103173
    Abstract: Permeameter suited for measuring permeability of a small, non-magnetic (i.e., the permeability value is close to 1) object. The probe of the permeameter is of the differential transformer type with an exciting coil and two detecting coils placed at both ends of the exciting coil. The difference in the outputs of the detecting coils is analyzed and the effect of the eddy current is effectively eliminated, whereby the signal representing the permeability of the object is extracted from the difference signal by the phase shift analysis. By reducing the distance between the two detecting coils, the influence of the disturbance of the eddy current at the boundary of the object sample is minimized and the permeameter can measure a small object sample without sacrificing accuracy and sensitivity.
    Type: Grant
    Filed: March 4, 1991
    Date of Patent: April 7, 1992
    Assignees: Aichi Steel Works Ltd., Kebushiki Kaisha Toyota Chuo Kenkyusho
    Inventors: Yoshinobu Honkura, Hideki Fujii, Hideo Arakawa, Kazumasa Sumi
  • Patent number: 5059905
    Abstract: A tool dullness indicator and method comprising the measurement of eddy currents at a known, controlled frequency directly in the tool by measuring the phase angle shift in a coil when a sample is put into or next to the coil. The phase angle change caused by presence of a workpiece is measured when the tool is sharp to provide a reference reading taking into account the surface hardness and other bulk properties of the workpiece, and arriving at a parameter that is dependent on eddy current changes, such as phase angle shift or other measurable changes related to eddy currents in the part, and then analyzing the workpiece, either while working, or at a set programmed check time to determine when the tool is dull as a function of the change in eddy current characteristics caused by work hardening.
    Type: Grant
    Filed: August 28, 1989
    Date of Patent: October 22, 1991
    Assignee: Innovex Inc.
    Inventor: Vladimir Drits
  • Patent number: 4827214
    Abstract: A novel method and system for measuring AC magnetic characteristics is disclosed, in which the loss of a magnetic core is measured by defining the change rate of magnetic flux density, and for this purpose, the duration of a voltage induced in the coil of an object magnetic core during the gate period is detected and controlled by an input voltage, a reset current and a load resistor.
    Type: Grant
    Filed: September 22, 1987
    Date of Patent: May 2, 1989
    Assignee: Hitachi Metals, Ltd.
    Inventors: Shin Nakajima, Kiyotaka Yamauchi
  • Patent number: 4820981
    Abstract: The invention is concerned with a method and apparatus for measuring magnetic losses in a ferromagnetic material specimen. According to the invention, an alternating magnetic field having a predetermined frequency and an amplitude which is modulated at a frequency lower than the predetermined frequency is applied to the specimen, and a temperature modulation at a surface of the specimen having the applied field is measured. The magnitude of magnetic losses in the specimen is determined from the measured surface temperature modulation. The method and apparatus of the invention do not necessitate winding coils around the ferromagnetic material specimen, and also enable one to obtain information about the distribution of magnetic losses in the specimen.
    Type: Grant
    Filed: December 28, 1987
    Date of Patent: April 11, 1989
    Assignee: Canadian Patents and Development Limited/Societe Canadienne des Brevets et d'Exploitation Limitee
    Inventors: Jean F. Bussiere, Martin Lord, Jean-Pierre Monchalin
  • Patent number: 4733190
    Abstract: A local coil assembly for use in NMR imaging includes a base which supports a pair of spaced local coil modules. The size and separation of the local coil modules can be changed without affecting the resonant frequency of the assembly. Each local coil module includes a pair of loop-gap resonators, and the base provides the electrical interconnection of the loop-gap resonators in each module.
    Type: Grant
    Filed: March 16, 1987
    Date of Patent: March 22, 1988
    Assignee: Medical Advances, Inc.
    Inventor: Gerald T. Dembinski
  • Patent number: 4598260
    Abstract: An inductive sine wave oscillator circuit for an eddy current proximeter. The oscillator circuit includes an operational amplifier and a coil. The frequency and amplitude of the output signal produced by the circuit varies with and is controlled by the inductance of the coil. The circuit signal input to the operational amplifier undergoes a phase shift as the signal passes through the amplifier. One advantage of the oscillator circuit is that the frequency and amplitude of the output signal of the circuit for a coil having a particular inductance remains relatively stable and constant when the operating temperature of the coil varies. In addition, the coil can be fabricated from a material having a relatively high electrical resistivity.
    Type: Grant
    Filed: April 18, 1984
    Date of Patent: July 1, 1986
    Assignee: Transducer Limited Partnership
    Inventor: William W. Carr
  • Patent number: 4573012
    Abstract: A core loss tester employs separate cables for excitation and pickup. Testing is performed at a fixed flux density in the ferromagnetic core. A processing circuit on the output of the pickup coil scales the voltage developed so that, when excitation current is increased so that the indicated output of the pickup coil equals the effective cross-sectional area of the flux path, the fixed predetermined value of flux density is produced. When this condition is achieved, the excitation current times the sensed flux-induced voltage provides a measurement of the core loss in watts. Excitation is accomplished with a multi-conductor cable looped once or more times through the core with the conductors in the cable connected in series by mating together of a connector at each end.
    Type: Grant
    Filed: February 14, 1983
    Date of Patent: February 25, 1986
    Assignee: General Electric Company
    Inventors: Donald K. Bisson, Steven A. Nardin
  • Patent number: 4353029
    Abstract: A self inverting gauging system for such parameters as capacitively sensed distance or inductively sensed resistivity in which the sensor provides an output inversely varying with the dimension of interest. The gauge typically includes a dual slope integrator responsive to a reference value on the up integration and to the sensor output on the down integration. The interval of the down integration necessary to reset the integrator to the original value varies directly, rather than inversely, with the dimension of interest and is typically provided as the digital output indication of a counter. In the application to resistivity gauging, the up integration reference signal is preferably provided by the output of a thickness gauge such that the ultimate counter display represents element resistivity compensated for thickness.
    Type: Grant
    Filed: February 29, 1980
    Date of Patent: October 5, 1982
    Assignee: ADE Corporation
    Inventors: Robert C. Abbe, Noel S. Poduje