Magnetic Test Structure Elements Patents (Class 324/262)
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Patent number: 8344725Abstract: A device for nondestructive testing of a pipe made of ferromagnetic steel for detection of longitudinal, transverse or inclined flaws using magnetic or magnetic-induction test procedures is disclosed. The device includes a magnetizing yoke which transmits the magnetic flux contactless into the pipe and at least two magnetic-field-sensitive scanning probes having GMR sensors. The GMR sensors are combined into sensor groups in form of a sensor array and electrically connected in parallel. A single preamplifier connected to each sensor group in one-to-one correspondence. The device further includes an evaluation unit.Type: GrantFiled: February 24, 2010Date of Patent: January 1, 2013Assignee: V & M Deutschland GmbHInventors: Gert Fischer, Sven Gwildies, Michael Kaack, Alfred Graff, Ashraf Koka, Stefan Nitsche
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Patent number: 8339132Abstract: A magnetic detection device of the present invention includes at least one pair of first magnetosensitive bodies each comprising a soft magnetic material extending in a first axis direction and being sensitive to an external magnetic field oriented in the first axis direction; and a magnetic field direction changer comprising a soft magnetic material and changing an external magnetic field oriented in a different axis direction from the first axis direction into a measurement magnetic field having a component in the first axis direction which can be detected by the at least one pair of first magnetosensitive bodies. With this magnetic detection device, the external magnetic field oriented in the different axis direction can be detected by way of the first magnetosensitive bodies. As a result, while attaining magnetic detection with high accuracy, the magnetic detection device can be reduced in size or thickness by omitting a magnetosensitive body extending long in the different axis direction.Type: GrantFiled: March 26, 2010Date of Patent: December 25, 2012Assignee: Aichi Steel CorporationInventors: Yoshinobu Honkura, Michiharu Yamamoto, Norihiko Hamada, Akihiro Shimode, Masayuki Kato
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Patent number: 8330458Abstract: There is provided a nondestructive inspection apparatus using a SQUID magnetic sensor which allows nondestructive and accurate detection of magnetic particles in an insulator such as an electronic device or in a magnetizable member. The nondestructive inspection apparatus using the SQUID magnetic sensor comprises: a magnet for horizontal magnetization 4, the magnet applying a magnetic field to a specimen in the longitudinal direction of the specimen 3?; an inspection unit on which a specimen 3 is set, the specimen 3 being horizontally magnetized in the longitudinal direction by the magnet for horizontal magnetization 4; and belt conveyers 2, 5 for conveying the horizontally magnetized specimen 3; and a gradiometer 8 for detecting a particle horizontally magnetized along with a magnetizable member as the horizontally magnetized specimen 3.Type: GrantFiled: March 5, 2009Date of Patent: December 11, 2012Assignee: National University Corporation TOYOHASHI UNIVERSITY OF TECHNOLOGYInventors: Saburo Tanaka, Yoshimi Hatsukade
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Publication number: 20120256623Abstract: A non-contact magnetic particle inspection apparatus includes a test article support and manipulation system having a first rail that extends along a first axis, a second rail that extends along the first axis, and a third rail that extends a second axis. The third rail includes a first end that extends to a second end through an intermediate portion. The first end is mounted to the first rail and the second end is mounted to the second rail. A mounting fixture is mounted to the third rail. The mounting fixture includes a test article mounting system and a test article orientation system. The test article orientation system is configured and disposed to selectively manipulate a test article within a magnetic field.Type: ApplicationFiled: April 11, 2011Publication date: October 11, 2012Applicant: General Electric CompanyInventor: Robert William Bergman
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Patent number: 8274282Abstract: The invention concerns a method for producing an assembly of at least one transmission coil (B1) and one reception coil (B2) for eddy current testing, the reception coil receiving in the absence of fault a complex amplitude signal VR, subject to a variation ?VR in the presence of a characteristic fault to be detected. The method consists in selecting the distance ?ER between the axes of the transmission coil and the reception coil so as to maximize the ratio I?VR/VRI.Type: GrantFiled: January 27, 2006Date of Patent: September 25, 2012Assignee: Commissariat a l'Energie AtomiqueInventors: Jean-Marc Decitre, Thierry Sollier
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Patent number: 8264219Abstract: An in-line pipe inspection tool has one or more inspection platforms (28, 30) which are connected to an elongate wheeled trolley by link arms (20 to 26). The trolley unit (10, 12) has drive means for driving the point of connection of the first link arm (20, 22) to the trolley (10) relative to the point of connection of the second link arm (24, 26) to the trolley (12), thereby to move the inspection platforms (28, 30) in a direction perpendicular to the direction of elongation of the trolley (10, 12). Thus the inspection platforms (28, 30) are movable which is relative to the trolley (10, 12) to permit the tool to be adapted to pipelines of different diameters. Moreover, the platforms (28, 30) preferably have permanent magnets which contain a rotatable magnet. The rotatable magnet permits the net magnetic field generated by the platform to be varied.Type: GrantFiled: July 23, 2010Date of Patent: September 11, 2012Assignee: PII LimitedInventors: Michael Gibson, Christopher Envy, Paul Mundell
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Patent number: 8242776Abstract: A semiconductor process and apparatus provide a high-performance magnetic field sensor from two differential sensor configurations (201, 211) which require only two distinct pinning axes (206, 216), where each differential sensor (e.g., 201) is formed from a Wheatstone bridge structure with four unshielded MTJ sensors (202-205), each of which includes a magnetic field pulse generator (e.g., 414) for selectively applying a field pulse to stabilize or restore the easy axis magnetization of the sense layers (e.g., 411) to eliminate micromagnetic domain switches during measurements of small magnetic fields.Type: GrantFiled: March 26, 2008Date of Patent: August 14, 2012Assignee: Everspin Technologies, Inc.Inventors: Phillip G. Mather, Young Sir Chung, Bradley N. Engel
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Patent number: 8237433Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.Type: GrantFiled: January 19, 2011Date of Patent: August 7, 2012Assignee: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
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Patent number: 8217647Abstract: A method and system for measuring agglutination in a target-induced agglutination assay with one or more magnetic particles is performed in a reaction chamber. After the magnetic particles, which are capable of binding to a target are provided in the assay, an agglutination process is performed resulting in agglutinated particles. Further an alternating current magnetic field (HAC) is applied to the assay. The method further includes measuring an effect of the HAC on the one or more magnetic particles unattached to any surface. The measured effect is indicative of one or more agglutination parameters.Type: GrantFiled: December 18, 2007Date of Patent: July 10, 2012Assignee: Koninklijke Philips Electronics N.V.Inventors: Wendy Uyen Dittmer, Peggy De Kievit, Jeroen Hans Nieuwenhuis, Menno Willem Jose Prins, Leonardus Josephus Van Ijzendoorn, Xander Jozef Antoine Janssen
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Patent number: 8183855Abstract: A measuring arrangement where a magnet moves or is positioned because of the movement or position of an object, and this movement or positioning of the magnet is collected by a sensor, an in particular a non-magnetic dividing wall being provided between the magnet and the sensor. A mechanical converter, in particular a gear, being arranged between the object and the magnet.Type: GrantFiled: February 1, 2007Date of Patent: May 22, 2012Assignee: Sensor-Technik Wiedemann GmbHInventors: Hans-Georg Hornung, Michael Sieber
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Patent number: 8179134Abstract: An upward warp of a terminal pad of a flexible cable which is kept horizontal by a suction head is prevented by a pressing arm which contacts with an upper surface of a rear portion of the flexible cable.Type: GrantFiled: June 24, 2009Date of Patent: May 15, 2012Assignee: Hitachi High-Technologies CorporationInventors: Toshinori Sugiyama, Shinji Honma, Yoshinori Tokumura, Hideki Mochizuki
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Patent number: 8158940Abstract: A magnetic domain imaging system is offered which permits application of a strong magnetic field to a specimen. The imaging system includes a transmission electron microscope having an objective lens. The specimen that is magnetic in nature is placed in the upper polepiece of the objective lens. An electron beam transmitted through the specimen is imaged and displayed on a display device. A field application coil assembly for applying a magnetic field to the specimen and two deflection coil assemblies for bringing the beam deflected by the field applied to the specimen back to the optical axis are mounted in the upper polepiece.Type: GrantFiled: May 17, 2010Date of Patent: April 17, 2012Assignee: JEOL Ltd.Inventor: Takeshi Tomita
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Patent number: 8148976Abstract: The invention relates to a method and arrangement for the contactless determination of conductivity-influencing properties and their spatial distribution over the entire cross section of an electrically conductive substance moving in a primary magnetic field (B). The substance may be a liquid or a solid. A simultaneous measurement of a number of mechanical state parameters of the magnetic system is performed (three-dimensional components of the force and the torque), said parameters being variable by the effect of a secondary field on the magnetic system, the secondary field being produced on the basis of eddy currents induced in the substance by the primary field (B). To determine the spatial distribution of the property that is sought, the primary field is changed in intensity or form a number of times and a measurement of the state parameters is carried out for each change.Type: GrantFiled: September 21, 2006Date of Patent: April 3, 2012Assignee: Technische Universitat IlmenauInventors: André Thess, Yuri Kolesnikov, Christian Karcher
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Patent number: 8063634Abstract: An electronic circuit includes a primary magnetoresistance element for providing a first output signal proportional to a magnetic field. The primary magnetoresistance element has a primary maximum response axis. The primary magnetoresistance element also has a hysteresis characteristic. The electronic circuit also includes a reset conductor disposed proximate to the magnetoresistance element. The electronic circuit also includes a secondary magnetic field sensing element for providing a second output signal proportional to a magnetic field. The secondary magnetic field sensing element has a secondary maximum response axis, which, in some embodiments, is substantially perpendicular to the primary maximum response axis. In operation, the primary magnetoresistance is reset in accordance with an excessive magnetic field sensed by the secondary magnetic field sensing element.Type: GrantFiled: July 31, 2008Date of Patent: November 22, 2011Assignee: Allegro Microsystems, Inc.Inventors: John Sauber, William P. Taylor
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Patent number: 8063630Abstract: In testing thin-film magnetic heads, first, a back surface opposite to a medium facing surface of each of a plurality of thin-film magnetic heads is attached to a first surface of a first plate of a jig, the jig including the first plate of rubber having the first and second surfaces facing toward opposite directions, and a second plate greater in rigidity than the first plate and bonded to the second surface of the first plate. Next, the plurality of thin-film magnetic heads and the jig are mounted on a metal plate having a flat top surface, such that the medium facing surfaces of the thin-film magnetic heads touch the top surface of the metal plate. Next, heat-generating components of the plurality of thin-film magnetic heads mounted on the metal plate are energized.Type: GrantFiled: March 14, 2008Date of Patent: November 22, 2011Assignee: TDK CorporationInventors: Takamitsu Kamimura, Masato Sugahara, Kenji Yumoto
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Patent number: 8054069Abstract: An apparatus for providing an indication of rotational position of a shaft by parameter change. The apparatus includes a resilient, serpentine-shaped middle portion, a first end portion located at one end of the middle portion, and a second end portion at another end of the middle portion. The second end portion is for location adjacent to the first end portion to permit securing of the first and second ends together subsequent to the middle portion being resiliently extended around the shaft. The serpentine-shaped middle portion is sized to be taut on the shaft and is shaped to have a plurality of undulations. The undulations providing a plurality of event members each having at least one characteristic that causes a change of a parameter that can be sensed by a sensor when the event member rotates past the sensor.Type: GrantFiled: July 2, 2009Date of Patent: November 8, 2011Assignee: General Electric CompanyInventors: Roger Aloysius Hala, Brooke Margaret Bunzmann
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Patent number: 8049491Abstract: In a position detecting device including a movable member provided in a displaceable manner on a base member, and a proximity sensor which detects the position of the movable member, the proximity sensor includes a magnetic field generating portion, a detecting portion which detects a change in magnetic field according to the displacement of the movable member, and a protruding portion made of a nonmagnetic material, which protrudes toward an object to be detected. A seat position detecting device of a vehicle including the configuration of the position detecting device mentioned above is provided. The base member is comprised of a lower rail which is fixedly installed on a floor of a vehicle body, and the movable member is comprised of an upper rail which is attached to a seat for a vehicle and slidably engaged with the lower rail and which is allowed to be fixed in arbitrary sliding positions on the lower rail.Type: GrantFiled: August 30, 2007Date of Patent: November 1, 2011Assignee: Honda Motor Co., Ltd.Inventor: Harutomi Nishide
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Patent number: 8018228Abstract: Disclosed is a method and an NDT/NDI probe deploying a slit or a flexible joint of probe bending region, preferably between two rows of probe elements to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements. Also disclosed is the use of protective flexible pads to cover the probe elements and other probe components.Type: GrantFiled: June 12, 2009Date of Patent: September 13, 2011Assignee: Olympus NDTInventors: Benoit Lepage, Denis Faucher
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Patent number: 7999539Abstract: In a proximity sensor 20 for detecting the proximity of a member to be detected 8 having a magnet or a magnetic material using a magnetic detection element 26, there are provided elastic members 33 for elastically energizing the magnetic detection element 26 toward the detection surface 26a thereof.Type: GrantFiled: August 20, 2008Date of Patent: August 16, 2011Assignee: Honda Motor Co., Ltd.Inventor: Harutomi Nishide
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Patent number: 7982460Abstract: In a magnetic sensor module, using die-bond resin as a joining material, a Z-axis magnetic sensor is mounted onto a substrate having a wire formed on its principal surface. The Z-axis magnetic sensor having electrode pads formed on its bottom surface is tilted by 90 degrees and mounted onto the substrate. Therefore, the electrode pads are positioned at a side surface thereof. A joining material accommodation area which the die-bond resin can fill is provided at the surface of the Z-axis magnetic sensor opposing the principal surface of the substrate. This joining material accommodation area has a grooved structure. At the surface of the Z-axis magnetic sensor opposing the principal surface of the substrate, the grooved structure is provided at an end portion near the wire formed on the substrate.Type: GrantFiled: December 6, 2010Date of Patent: July 19, 2011Assignee: Alps Electric Co., Ltd.Inventors: Toshiaki Konno, Naoki Kitaura, Nobuaki Haga
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Patent number: 7977940Abstract: A receiver system (18) for an electromagnetic prospecting system is disclosed. The electromagnetic prospecting system comprises a transmitter for transmitting a primary electromagnetic field so as to generate a secondary electromagnetic field from a terrain that is being prospected, the secondary electromagnetic field having a transient, decaying time domain profile. The receiver system (18) comprises first and second sensors (20, 22) for detecting the secondary electromagnetic field, wherein the second sensor (22) is less sensitive than the first sensor (20) so as to detect the secondary electromagnetic field over a first time period, with the first sensor (20) being used to detect the secondary electromagnetic field after the first time period. Typically, each sensor (20, 22) comprises three orthogonal SQUID magnetometers, with the second sensor (22) being approximately 10 times less sensitive than the first sensor (20).Type: GrantFiled: March 9, 2006Date of Patent: July 12, 2011Inventors: Andreas Chwala, James McNae, Ronny Stolz
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Patent number: 7944204Abstract: Identification of points of interest in a region of the surface of a part, by bringing a surface reference into intimate contact with the region is disclosed. The surface reference includes a thin film sufficiently flexible to conform to the region and tracks made of electrically conductive material. The passage of an eddy current probe over a track delivers a significant signal representative of the track. This representative signal corresponds to a point of interest thus identified in the region. Thus, it possible to optimize the path and the angular position of an eddy current probe scanning a region of a part to be tested.Type: GrantFiled: May 28, 2008Date of Patent: May 17, 2011Assignee: SNECMAInventor: Sandra Carole Angele Cheynet
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Patent number: 7911206Abstract: The surface length of a metal subject to be inspected is evaluated by detecting an eddy current without using a combination of a scale and visual or liquid penetrant inspection. An exciting coil and a detecting coil are scanned above the subject in a length direction. An eddy current detector measures an output voltage corresponding to scanning positions based on an output from the detecting coil. Based on an output voltage distribution curve indicating a distribution of output voltages corresponding to the scanning positions, position information is extracted corresponding to values which are within a differential voltage range and lower by 12 dB than a maximum value of the output voltages on the left and right sides of the distribution. A distance between the positions included in the extracted information is calculated to evaluate the length of a slit which is a defect present on the subject surface.Type: GrantFiled: June 29, 2007Date of Patent: March 22, 2011Assignee: Hitachi, Ltd.Inventors: Akira Nishimizu, Yoshio Nonaka, Isao Yoshida, Motoyuki Nakamura, Akihiro Taki, Masahiro Koike
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Patent number: 7911740Abstract: Apparatus for receiving and positioning a read/write head to a disk in a test apparatus has a deck and a spindle on the deck and on which a disk can be mounted for rotation of the disk. A gripper is provided for holding a head during testing, the gripper being movable over a surface of the deck. A precisor receives a head and accurately aligns the head, the precisor being movable over a surface of the deck. A pick is operable to pick up and place down a head. The precisor is movable to a position where the pick can pick up a head from the precisor and place down a head on the precisor. The gripper is movable to a position where the pick can pick up a head from the gripper and place down a head on the gripper.Type: GrantFiled: September 8, 2006Date of Patent: March 22, 2011Assignees: Xyratex Technology Limited, Seagate Technology LLCInventor: Ian Stanley Warn
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Patent number: 7885696Abstract: A method of searching for a material fated to generate an interband phase difference soliton includes the steps of generating an AC in a soliton candidate material, identifying a loss of AC magnetic susceptibility of the siliton candidate material due to a turn and a twist cut of a vortex line and judging whether or not the soliton candidate material is capable of generating soliton.Type: GrantFiled: August 14, 2007Date of Patent: February 8, 2011Assignee: National Institute of Advanced Industrial Science and TechnologyInventors: Yasumoto Tanaka, Adrian Crisan, Akira Iyo
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Patent number: 7872472Abstract: An eddy current testing method for a turbine rotor including a disc, a plurality of turbine blades disposed along the periphery of the disc, and a plurality of pins for joining a blade fork portion formed on each of the plurality of turbine blades to a disc fork portion formed on the disc, the method including inserting a probe having an eddy current testing sensor into a hole formed through the disc fork portion and the blade fork portion by pulling out one of the plurality of pins in a state that the blade fork portion is still inserted into the disc fork portion; and performing eddy current testing for at least part of an internal surface of the hole by using the probe.Type: GrantFiled: December 9, 2009Date of Patent: January 18, 2011Assignees: Hitachi, Ltd., Hitachi Engineering & Services Co., Ltd.Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
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Patent number: 7868612Abstract: In a magnetic sensor module, using die-bond resin as a joining material, a Z-axis magnetic sensor is mounted onto a substrate having a wire formed on its principal surface. The Z-axis magnetic sensor having electrode pads formed on its bottom surface is tilted by 90 degrees and mounted onto the substrate. Therefore, the electrode pads are positioned at a side surface thereof. A joining material accommodation area which the die-bond resin can fill is provided at the surface of the Z-axis magnetic sensor opposing the principal surface of the substrate. This joining material accommodation area has a grooved structure. At the surface of the Z-axis magnetic sensor opposing the principal surface of the substrate, the grooved structure is provided at an end portion near the wire formed on the substrate.Type: GrantFiled: February 17, 2010Date of Patent: January 11, 2011Assignee: Alps Electric Co., Ltd.Inventors: Toshiaki Konno, Naoki Kitaura, Nobuaki Haga
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Patent number: 7852073Abstract: Sensor assemblies and methods are described that facilitate the use of a long-range torsional guided-wave inspection system for inspecting pipes, tubes, or other longitudinal cylindrical structures, with a partial excitation and detection around the pipe circumference. The sensor assemblies comprise a plate-type magnetostrictive sensor probe positioned beneath a compressible/expandable bladder and an inverted U-shaped frame that retain and position the sensor probe against the external wall of the pipe under inspection. Preferably, a magnetostrictive strip is positioned in direct contact with the pipe wall over which the plate magnetostrictive sensor probe is positioned. The probe is preferably curved to match the curvature of the external surface of the pipe. A pad may be positioned between the probe and the magnetostrictive strip to improve compliance with irregular pipe surfaces.Type: GrantFiled: June 25, 2007Date of Patent: December 14, 2010Assignee: Southwest Research InstituteInventors: Hegeon Kwun, Hirotoshi Matsumoto, James F. Crane
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Patent number: 7772840Abstract: The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.Type: GrantFiled: December 9, 2009Date of Patent: August 10, 2010Assignees: Hitachi, Ltd., Hitachi Engineering & Services Co., Ltd.Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
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Patent number: 7761245Abstract: A method for visualizing the eccentricity of cables which is acquired in the eccentricity measurement of the cables, wherein eccentricity measurements take place at the same time on plural locations spaced apart across the perimeter of the cable during the transportation of the cable, and the measurement values are represented graphically on a display after being processed in a computer, characterized in that a frequency distribution of individual eccentricity values acquired during the measurement interval is represented on the display, wherein the scattering caused by measuring instruments is significantly smaller than the scattering of the individual eccentricity values.Type: GrantFiled: August 5, 2008Date of Patent: July 20, 2010Assignee: Sikora AGInventor: Harald Sikora
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Patent number: 7710111Abstract: The present invention nondestructively analyzes the position or corrosion state of a magnetic material present in the interior of a non-magnetic material structure. The magnetic material is magnetized from the outside of the structure, and magnetic flux density of the thus-magnetized magnetic material is measured at the outside of the structure, to thereby specify the position of the magnetic material or to analyze the corrosion state of the magnetic material. The magnetic material is magnetized in two stages. After the position of the magnetic material magnetized through first-stage magnetization is specified through measurement of magnetic flux density of the magnetic material, the magnetic material is demagnetized through application of an alternating magnetic field.Type: GrantFiled: August 8, 2006Date of Patent: May 4, 2010Assignee: Kyushu Institute of TechnologyInventor: Mochimitsu Komori
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Patent number: 7710112Abstract: An apparatus for measuring a strength of a magnetic field, including a switch including contacts configured to change position when a switching threshold is reached, wherein the switching threshold is reached by modifying an external magnetic field around the switch, and a coil wound around the switch, wherein the coil is used to modify the external magnetic field, wherein a first current is driven through the coil wound around the switch until a first switching threshold is obtained, wherein a second current is driven through the coil wound around the switch until a second switching threshold is obtained, and wherein a value of the first current when the first switching threshold is reached and a value of the second current when the second switching threshold is reached are used to determine the strength of the magnetic field.Type: GrantFiled: August 31, 2007Date of Patent: May 4, 2010Assignee: Thermo Fisher Scientific Inc.Inventors: Nikolay Baturin, Alexander J. Esin, Alex Kulik, Michael Masterov
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Patent number: 7705588Abstract: An apparatus and method for testing a component of a magnetic disk drive in which one or more drive-based components is used in the testing process. Each of the drive-based components is based on a corresponding one of the components of the magnetic disk drive. During testing, the component to be tested and at least one of the drive-based components are selectively engaged.Type: GrantFiled: October 5, 2005Date of Patent: April 27, 2010Assignee: Seagate Technology LLCInventors: Robert Eaton, Gang Herbert Lin, Tao Lin, Amir Ali Companieh, Rob Milby, Ron Carroll, Robert Kimball
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Patent number: 7696748Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.Type: GrantFiled: October 12, 2004Date of Patent: April 13, 2010Assignee: Jentek Sensors, Inc.Inventors: Darrell E. Schlicker, Neil J. Goldfine, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Andrew P. Washabaugh, Vladimir Tsukernik, Mark D. Windoloski, Ian C. Shay
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Publication number: 20100045287Abstract: The invention relates to a sensor arrangement (1) comprising a magnet (2), a magnetic field sensor (3) and a twistable or rotatable rod (4), characterized in that the magnet (2) is arranged below the magnetic field sensor (3) and the twistable or rotatable rod (4) is arranged above the magnetic field sensor (3), wherein the rod (4) comprises a lower surface (6) generating a tilt angle between the surface and the plane of the magnetic field sensor.Type: ApplicationFiled: December 11, 2007Publication date: February 25, 2010Applicant: NXP, B.V.Inventor: Hans Van Zon
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Patent number: 7622915Abstract: A magnetic head assembly having a mounting base in which a mounting hole having a protruded peripheral edge is formed is easily mounted on a head clamp table positioning the magnetic head assembly by fitting the mounting hole on a boss pin or a receiving hole of a tray, with a pin or a hole on a mounting table and with a positioning pin on a head clamp table and positioning a suction collet with using a boss pin or a receiving hole of a tray as references, and sucking the mounting base of the magnetic head assembly by a handling robot without requiring high positioning accuracy.Type: GrantFiled: June 26, 2008Date of Patent: November 24, 2009Assignee: Hitachi High-Technologies CorporationInventors: Toshinori Sugiyama, Hideki Mochizuki, Shinji Honma, Yoshinori Tokumura
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Patent number: 7595637Abstract: A Apparatus for Digital measurement of Quick break voltage and Magnetic pulse duration with microcontroller performs detection and measurement of both shot time (pulse duration) and quick break voltage, absolute value circuit makes detection polarity insensitive, allowing the magnetic pick up probe to be oriented either way in the customer's magnetizing unit coil, precision analog to digital convertor allows software peak detection of quick break voltage under software control of microcontroller, precision timebase of microcontroller allows accurate shot time (pulse duration) measurement, magnetic pick up probe serves as the input transducer for the for the noise free measurement of both shot time and quick break voltage, and microcontroller provides input blanking to ensure capturing the correct voltage spike for quick break voltage detection.Type: GrantFiled: July 24, 2007Date of Patent: September 29, 2009Inventor: Gregory James Falk
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Patent number: 7579957Abstract: Bi-axial tilt monitoring apparatus and method for bi-axial tilt monitoring of an article using a single-axis tilt monitoring device. A bi-axial tilt monitoring apparatus according to exemplary embodiments includes a single-axis tilt monitoring device and a support member supporting the single-axis tilt monitoring device and mountable to an article to be monitored. The support member has a supporting surface for supporting the single-axis tilt monitoring device at an acute angle relative to a substantially vertical surface of the article to be monitored when the tilt monitoring apparatus is mounted to the article to be monitored.Type: GrantFiled: October 24, 2006Date of Patent: August 25, 2009Assignee: International Business Machines CorporationInventors: Hideo Igami, Yuhta Ishii, Robert Tucker Sanders
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Patent number: 7573262Abstract: A magnetic sensor 10 includes GMR elements 11-18, and heating coils 21-24 serving as heat generating elements. The elements 11-14 and 15-18 are bridge-interconnected to constitute X-axis and Y-axis sensors, respectively. The heating coils 21, 22, 23, and 24 are disposed adjacent to the elements 11 and 12, the elements 13 and 14, the elements 15 and 16, and the elements 17 and 18, respectively. The heating coils 21-24, when electrically energized, heat mainly the adjacent elements. Therefore, the elements can be heated and cooled in a short period of time in which constant geomagnetism can be ensured. Data for compensation of temperature-dependent characteristic (ratio of change in sensor output value to variation in element temperature) is obtained on the basis of the temperatures of the elements before and after the heating, and the magnetic sensor outputs before and after the heating. Subsequently, the temperature characteristics of the elements are compensated on the basis of the data.Type: GrantFiled: September 1, 2006Date of Patent: August 11, 2009Assignee: Yamaha CorporationInventor: Hideki Sato
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Patent number: 7564237Abstract: A multi-axis magnetic or other field sensing device and method of fabricating a multi-axis magnetic or other field sensing device. An example sensing device is a 3-axis sensor package on a substrate with sensors on opposing sides of the substrate. One side of the substrate includes an X-axis sensor and a Y-axis sensor (or alternatively an integrated X-Y-axis sensor) and the opposite side of the substrate includes a Z-axis sensor on at least one sloped surface, the surface sloped with respect to both the first and second surface areas. One surface is mechanically and electrically bonded to a circuit board via conductive bumps. The other surface electrically connects to the circuit board through bonded wires and/or vias formed through the substrate.Type: GrantFiled: October 23, 2007Date of Patent: July 21, 2009Assignee: Honeywell International Inc.Inventors: Ryan W. Rieger, Hong Wan, Andrzej Peczalski
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Patent number: 7538546Abstract: A set of magnets, e.g., electromagnets, are used to produce an in-plane magnetic field with respect to an article under test or manufacture. The set of electromagnets includes electromagnets that are positioned above and below the plane of symmetry respectively. The bottom electromagnets may be positioned below the surface of the chuck for example. The plane of the article and/or set of electromagnets are positioned so that the plane of symmetry approximately coincides with the article. The set of electromagnets may include individual electromagnets or C-core electromagnets, which may produce magnetic fields with complementary polarities near the field of symmetry both above and below the field of symmetry. Magnetic fields with the same polarity are positioned near each other on opposite sides of the plane of symmetry to produce the in-plane magnetic field. A second set of electromagnets may be used to provide field rotation if desired.Type: GrantFiled: November 10, 2006Date of Patent: May 26, 2009Assignee: Infinitum Solutions, Inc.Inventors: Henry Patland, Wade A. Ogle
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Patent number: 7486068Abstract: A rotating head for a device for the nondestructive testing of metallic test specimens has probe carriers, stray flux or eddy current sensors, a coupling ring and elastic coupling elements. In this way, tandem-like, roughly forced coupling of the pivoting motions of the probe carriers is produced.Type: GrantFiled: December 20, 2006Date of Patent: February 3, 2009Assignee: Prueftechnik Dieter Bush AGInventor: Bernd Zimmermann
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Patent number: 7471081Abstract: A slider tester includes a driving unit that rotates a test medium, a set plate that detachably supports a slider as a single body, and an investigating apparatus that is electrically connected to the slider supported by the set plate and investigates the characteristics of the slider. A movable support part 30 that tiltably supports the slider is provided on the set plate. There is also provided a pressing mechanism that elastically presses the slider via the movable support part toward a surface of the medium to dispose the slider floating over the surface of the medium. The pressing mechanism includes an elastic body 56 composed of a plate spring that contacts the movable support part and elastically presses the movable support part.Type: GrantFiled: January 6, 2006Date of Patent: December 30, 2008Assignee: Fujitsu LimitedInventors: Norio Kainuma, Kenji Kobae, Hidehiko Kira, Hiroshi Kobayashi, Shuichi Takeuchi, Takayoshi Matsumura, Hirokazu Yamanishi, Shinji Hiraoka, Yoshiaki Yanagida
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Publication number: 20080315872Abstract: Sensor assemblies and methods are described that facilitate the use of a long-range torsional guided-wave inspection system for inspecting pipes, tubes, or other longitudinal cylindrical structures, with a partial excitation and detection around the pipe circumference. The sensor assemblies comprise a plate-type magnetostrictive sensor probe positioned beneath a compressible/expandable bladder and an inverted U-shaped frame that retain and position the sensor probe against the external wall of the pipe under inspection. Preferably, a magnetostrictive strip is positioned in direct contact with the pipe wall over which the plate magnetostrictive sensor probe is positioned. The probe is preferably curved to match the curvature of the external surface of the pipe. A pad may be positioned between the probe and the magnetostrictive strip to improve compliance with irregular pipe surfaces.Type: ApplicationFiled: June 25, 2007Publication date: December 25, 2008Inventors: Hegeon Kwun, Hirotoshi Matsumoto, James F. Crane
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Publication number: 20080272772Abstract: Apparatus and methods for inspecting materials such as cylindrical and tubular members are disclosed. One apparatus includes a frame that supports a magnetic coil and a detector assembly, the detector assembly having one or more magnetic detectors adapted to be spaced a first distance from the material being inspected by one or more substantially frictionless members.Type: ApplicationFiled: July 6, 2008Publication date: November 6, 2008Applicant: Scan Systems, CorpInventors: William T. Walters, Xiaowen Wu
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Publication number: 20080246473Abstract: A frequency doubler circuit includes first and second arrangements of switches connected to the positive and negative inputs of a comparator, respectively, and arranged in such a way that first and third voltages during the first phase of a reference clock signal and second and fourth voltages during a second phase opposite to the first phase are applied to the positive and negative inputs, where the first and second voltages and the third and fourth voltages are shifted with respect to each other at a half-period of the reference clock signal and the ratio between slopes of the voltages is fixed with respect to a selected current.Type: ApplicationFiled: December 8, 2005Publication date: October 9, 2008Inventor: Gilles Masson
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Publication number: 20080238429Abstract: A receiver for electromagnetic measurements includes a polyhedron structure having m faces, where m?4 and m?6: n electrodes each disposed on one face of the polyhedron structure, wherein 3?n?m; and at least one circuitry connected to the n electrodes for signal measurement. A method for electromagnetic measurements includes obtaining a plurality of electric current measurements using a plurality of electrodes each disposed on a surface of a polyhedron receiver, wherein the plurality of electric current measurements comprise at least three different measurements; and determining electric field components in a three dimensional space from the plurality of electric current measurements by using a number of matrices that correlate orientations of surfaces of the polyhedron receiver to a coordinate system in the three dimensional space.Type: ApplicationFiled: March 30, 2007Publication date: October 2, 2008Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: Kambiz Safinya, Edward Nichols, Kamal Babour, Philip Heelan, Christian Besson
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Patent number: 7405558Abstract: A method to determine deposits in a steam generator having the steps of creating a calibration standard having at least two rings of deposit material, subjecting the calibration standard to an eddy current signal, wherein an amplitude of the signal reflected from the calibration standard is used to obtain a polynomial equation fit of the reflected eddy current signals to actual thickness of the rings, obtaining a steam generator with tubes, initiating an eddy current signal into the tubes of the steam generator, detecting and recording reflections of the eddy current signal initiated into the tubes of the steam generator, and determining a thickness of the deposits in the steam generator from the recorded reflections of the eddy current signal and the polynomial equation.Type: GrantFiled: July 10, 2006Date of Patent: July 29, 2008Assignee: Areva NP, Inc.Inventors: Joseph R. Wyatt, John Griffith, Victor Newman, Jeffrey M. Fleck
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Publication number: 20080150523Abstract: The present invention relates to an apparatus for a magnetic field detector holding assembly for manually-operated or automated pass-through flux (PTF) measurement stands for measuring sputter targets. The magnetic field detector holding assembly has an insert with a longitudinal opening, where the opening of the insert allows a magnetic field detector to be located. At least one fastener passes through at least one opening in the magnetic field detector holding apparatus, where the fastener is adapted to be adjusted to mechanically couple with the insert so as to hold the insert at a predetermined location within the magnetic field holding assembly. The insert prevents the magnetic field detector from being damaged by over-tightening of the fasteners, and also prevents scratching of the surface of a sputter target to be tested. The magnetic field detector holding assembly can be used by manually operated mechanical PTF stands or automated PTF stands.Type: ApplicationFiled: December 20, 2006Publication date: June 26, 2008Applicant: Heraeus IncorporatedInventor: Raymond D. Rogers
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Patent number: 7390307Abstract: A system and method for measuring volumes and areas using electromagnetic induction techniques. A current is generated and fed into one of two coil assemblies to induce voltage into another coil assembly to provide accurate values for volume or area.Type: GrantFiled: September 25, 2003Date of Patent: June 24, 2008Assignee: VoluSense ASInventors: Morten Eriksen, Erik Eriksen